Dear Fellow MAS Members, It was an honor to begin my year as President of MAS at the M&M 2012 meeting in Phoenix this past August. It was a very well attended meeting, with a total of over 2,600 participants. This includes about 1,000 people working for vendors and exhibitors. This group makes the extensive trade show that features state-of-the art instrumentation, support equipment and supplies possible. And similar to years past, we saw just short of 1,000 technical presentations, including over 575 invited and contributed plat-

form presentations and over 400 invited and contributed poster presentations. There were even 40 late-breaking posters submitted just prior to the meeting. I would like to thank Vin Smentkowski, MAS Program Co-Chair, for putting together a strong and diverse collection of symposia. I would also like to thank the symposium organiz-ers who worked very hard to be certain the meeting had a large number of high quality sub-missions. There were a variety of new symposia of interest to MAS members, including ‘Helium-Ion Microscopy’, ‘Micro X-Ray Fluorescence’, ‘Channeling Effects in Microscopy and Microanalysis’, ‘TEM Phase Contrast Imaging in Biological and Materials Science’, and ‘Hybrid (Soft-Hard) Materials and Interfaces’. Two additional symposia were designed to have a ‘new twist’ on quantification, including ‘High-Resolution Microcopy and Microanalysis of Me-teorites, Minerals and Aerosols’, and ‘Quantification from the Micro- to the Sub-nano Scales: Pushing the Limits’. As in the past, the content of the M&M meeting was abundant with topics of interest to MAS members. I congratulate Vin and the rest of the Program Committee on a job well done. One of the highlights of the M&M annual meeting is to announce the winners of the Soci-ety’s annual awards. Our most prestigious award is the Duncumb Award for Excellence in Microanalysis, which is sponsored by MAS Sustaining Member Bruker Nano. The Duncumb Award is a career achievement award that recognizes outstanding contributions to our field over a sustained period of time. This year MAS presented the Duncumb Award to James Bentley, a long time researcher at Oak Ridge National Laboratory, for his superior technical accomplishments, leadership, and vision in the field of micro-analysis. This year’s MAS Presidential Science Award went to Nestor Zaluzec, a senior scientist and principle investigator in the Electron Microscopy Center at Argonne National Labora-tory. Nestor has long been involved in the development of

(Continued on page 4)

A Newsletter of the Microanalysis Society

I N S I D E

T H I S I S S U E :

Letter from

the Editor

2

MAS

Elections

2

Letter from

Europe

3

Meet the

Candidates

5

Awards 8

Tour

Speakers

10

AReS

Updates

11

Sustaining

Members

12

MicroNews W W W . M I C R O A N A L Y S I S S O C I E T Y . O R G F A L L 2 0 1 2

MAS President

Kristin Bunker

P A G E 2

Again this year, voting for the election of MAS Officers for terms beginning in 2013 will be held via on-line electronic voting beginning November 1 and run through November 30. At the end of October, Membership Ser-vices will send members an email to advise of the forthcoming email from Electionsonline.us who will provide you with a login, password and simple instructions for easy voting. If you prefer not to vote electronically, you may request a paper ballot by contacting Membership Services at dkremser@columbus.rr.com. A ballot will be sent to you via U.S. mail.

Candidate biographies follow and will be available on the MAS website.

MAS Elections by Dan Kremser

Letter from the Editor by Heather Lowers Your vote will determine the future direction of the Society! Well, not really but your vote is important. Voting instructions and candidate profiles for the positions of President, Treasurer, and two Director positions are in this issue of MicroNews. Also emailed with this latest issue were the minutes from the Busi-ness Meeting held at M&M 2012 in Phoenix. Please review and return correc-tions and comments to Heather Lowers (hlowers678@hotmail.com). The next anticipated issue of MicroNews will be early March. Please submit contributions such as tips and tricks, images, and upcoming meeting announce-ments by February 15. Vendors are welcome to submit a one page product an-nouncement or technical article. If you have questions about a submission or wish to submit please contact Heather Lowers (hlowers678@hotmail.com)

M I C R O N E W S

P A G E 3 F A L L 2 0 1 2

This is hopefully the first in a series of letters exchanged between Europe and the US. To set the scene it seems sensible to start by giving some background on the European Microbeam Analysis Society (EMAS) and how it came into being. Back in the 1980’s there was no real forum for exchanging knowledge in microbeam analysis, except on a limited scale through personal contacts, local user groups or as a by-product of conferences on other subjects. The Mi-crobeam Analysis Society was valuable for keeping up to date with developments in the US but, with only a few dozen members from our side of the pond, it wasn’t effective at spreading knowledge across Europe. In late 1986 Abraham Boekestein started phoning round some of his colleagues and found that others agreed with him that there was a need for a European equivalent to the American MAS to “exchange knowledge and to stimulate thinking about microbeam analysis theory and practice” (A. Boekestein, EMAS News 56, Nov 2007). EMAS was legally formed the following year, with Abraham Boekestein as the inaugural President, Tom Witmer as its first Secretary and Peter Karduck as Treasurer. Unfortunately, Tom’s contribution was cut short by his sudden death, but the fledg-ling Society was able to continue when Renaat Gijbels agreed to take on the role. The addition of board members from all across Europe, including Aldo Armigliato from Italy (who was later to become the Society’s second Presi-dent), Patrick Nicholson from Scotland (as the first Editor of EMAS News), and Jean-Louis Pouchou, Danièle Bênoit and Jacky Ruste from France, ensured the health of the Society. The then President of the American MAS, Chuck Fiori, was also very supportive and we maintain strong co-operation to this day. After two very busy years of seeking funding and membership the very first Workshop was held in 1989 Antwerp in Belgium. The success of this important first meeting was due to the efforts of many people, but especially Renaat Gijbels and Luc Van’t dack. Luc, as the present Secretary, is still very much responsible for the smooth running of the Society (in fact the rest of the Board go white whenever Luc mentions that he will have to retire from the Society at some point). The Society almost foundered two years later in 1991when civil war in the former Yugoslavia threatened the second workshop which was being arranged in Dubrovnik. However, the meeting went ahead and the Society has continued on, holding a European Workshop every two years. At the 1995 Workshop, in St Malo, France, we were able to present Prof. Raymond Castaing, the father of the electron microprobe, with the first Honorary Membership to our Society. In 2007, to celebrate the 20th anniversary of the formation of the Society and the 10th European Workshop, EMAS returned to its first venue in Antwerp. From the very start the aims of the Society have been “Education, communication and innovation” (quoted from the very first EMAS leaflet), and this is reflected in the format of our Workshops, which use tutorial-style lectures interspersed with round table discussions and plenty of opportunity for informal social mixing. In 1994 a new, smaller meeting, the 1st Regional Workshop, was organised in Helsinki, Finland, aimed at introducing basic-level tutorials in microbeam analysis techniques to those new to the field. Every year since then the Society has hosted alternating European and Regional Workshops. Even after over 20 years in microbeam analysis I’m happy to say that I’ve thoroughly enjoyed and learned some-thing new at every workshop I’ve attended and don’t intend to stop going until I’m old and (more) grey. If you’re ever in Europe in the spring I recommend that you come along too. You’ll be very welcomed. If you’re a fan of fine wine then I can certainly recommend the next European Workshop in May next year which is being held in Porto, Portugal, the home of port wine. I can guarantee that we will be applying ourselves to both microbeam analysis and some comparative tastings of the local specialities, all in the interest of science of course. Mike Matthews EMAS President September 2013

Letter from Europe by Mike Matthews

P A G E 4

M I C R O N E W S

state-of-the-art instrumentation, software and techniques for EDS, EELS, and EM. The Kurt Heinrich Award, given annually to a promis-ing early-career researcher, was given to Emmanuelle Marquis, a Dow Corning Assistant Professor of Materials Science and Engineer-ing at the University of Michigan. This was a notable year for the Kurt Heinrich Award, as Emmanuelle is the first woman to receive this award. The MAS Presidential Service Award was given to Cathy Johnson, a Sales Executive in the Nano Technology Division of Leica Microsystems, for her many years of work and dedication to MAS, serving as Director, MAS Sustaining Members Committee Chair, and most recently as President of our Society. The MAS Outstanding Paper Awards, most also sponsored by MAS Sustaining Members, were also presented to papers judged to be the best presented at last year’s meeting, M&M 2011, in four categories. The Castaing Award for best student presentation, which is spon-sored by Cameca Instruments, was awarded to Pinshane Huang of Cornell University. The Macres Award for best instrumentation / software paper, sponsored by Oxford Instruments, was awarded to Ingo Massmann of CEOS GmbH and coworkers. The Birks Award for best contributed paper, which is sponsored by JEOL USA, was awarded to Ray Unocic of Oak Ridge National Laboratory and co-workers. The Society itself sponsored the Cosslett Award for best invited paper, which was awarded to Craig Simmons of the University of Toronto. This year MAS also gave out 12 Distinguished Scholar Awards. These awards are presented annu-ally to students presenting high quality technical papers with significant microanalysis content at the annual meeting. The award is comprised of complimentary registration and significant funds to defray travel expenses to attend the meeting. This year’s awards winners included Shraddha Avasthy of Northwestern University, Ceren Aydin of University of California at Davis, Nathan Bailey of University of California at Berkeley, Phillip Gopon of University of Wisconsin, Megan Holtz of Cornell University, Lewys Jones of University of Oxford, Jason Kawasaki of University of California at Santa Barbara, Ben Miller of Arizona State University, Monika Rathi of South Dakota School of Mines & Technology, Dinushi Samarajeewa of University of Texas at Dallas, Runzhe Tao of University of Illinois at Chicago, and Steffi Woo of McMaster University. Congratulations again to all of the MAS Award Winners! A few other notable highlights of M&M 2012 include the Meal with a Mentor and the MAS Social.

(Continued on page 17)

MAS President’s Letter Con’t

P A G E 5 F A L L 2 0 1 2

MAS Involvement Member since 1982 MAS Director (2005-2007) 2011 Presidential Service Award Chair, Membership Services (2008-2013)

Dan Kremser obtained a B.A. in Geology from the University of Connecticut in 1976 and a Ph.D. in Earth and Planetary Sciences in 1982 from Washington Uni-versity, St Louis.

Dan currently works at Battelle Memorial Institute in Columbus Ohio, where he leads the materials charac-terization facility utilizing FE-SEM, EPMA, XRD, XPS and ICP-MS techniques for both commercial and gov-ernment projects. He is the current President of the Microscopy Society of the Ohio River Valley (MSORV) 2012-2013, Past President of the Microscopy Society of Northeastern Ohio (MSNO), and Past President of the Central States Microscopy and Microanalysis Society (CSMMS).

Treasurer, Dan Kremser

MAS Involvement Member since 1985 2008 MAS Presidential Science Award MAS Director (2010-2012) Chair, Finance Committee (2011-2013)

Thomas F. Kelly received his B.S. in Mechanical Engineering with highest honors from Northeastern University in 1977. He received a Ph.D. in Material Science from M.I.T in 1981.

Tom joined the faculty of the Department of Metallurgical and Mineral Engineering of the University of Wisconsin-Madison in January 1983. He was a Full Professor from 1994 until his departure in 2001. Tom founded Imago Scientific Instruments to commercialize the atom-probe microscope: a technology that enables researchers to analyze materials such as computer chips at the atomic scale. His invention, the Lo-cal Electrode Atom Probe, or LEAP, captures an atom-by-atom "picture" of a material and renders that im-age on a computer screen in 3-D.

President, Tom Kelly

Meet the Candidates

P A G E 6

M I C R O N E W S

Director, Brian Gorman

MAS Involvement Member since 2004 Co-organizer, Microanalytical Reference Materials 2012 Symposium organizer: FIB, M&M 2007, M&M 2008, Atom Probe, M&M

2006, M&M 2011

Brian Gorman obtained a B.S. in Ceramic Engineering in 1996 at the University of Missouri – Rolla (now Missouri S&T), staying on to earn a M.S. in 1999 and a Ph.D. in 2003.

Brian is currently an Associate Professor of Metallurgical and Materials Engineering at the Colorado School of Mines. He is also Interim Director of the Interdisciplinary Materials Science graduate program at Mines. He joined Mines after several years at the University of North Texas and the National Renewable Energy Laboratory, prior to which he worked at Texas Instruments and Los Alamos National Laboratory. His current research areas lie at the intersection between TEM, atom probe tomography, and FIB instru-mentation as applied to photovoltaics, dielectric ceramics, and quantum computation.

MAS Involvement Member since 2007 MAS Treasurer (2011-2012) Symposium organizer: Compositional X-ray Imaging (M&M 2010), Micro-

analysis of Cement & Concrete (M&M 2011), μXRF (M&M 2012)

Jeff Davis began his career at NIST as a summer student in 2000. After completing a B.S. and M.S. in Civil Engineering at Clemson University with an emphasis in con-struction materials, he returned to NIST as a research engineer.

His primary interests are X-ray microanalysis in both the electron probe and in the micro-focused XRF, cement and concrete durability, and forensic investigation of paints, pigments and works of art. Jeff enjoys working collaboratively with a variety of academic and US government institutions, where he contributes new and innovative methods for analyzing complex materials using X-ray microanalysis.

Director, Jeff Davis

Meet the Candidates

P A G E 7 F A L L 2 0 1 2

MAS Involvement Member since 2008 Co-Chair of Bi-Annual Surface Analysis Symposia since 2006 Organizer, Surface Analysis Short Course, M&M 2007 MAS Program Co-Chair, M&M 2012

Vincent S. Smentkowski is a Senior Scientist in the Nanostructures and Surfaces Laboratory at General Electric Global Research (GEGR) where he performs sur-

face analysis to support research programs at GEGR, GE businesses, and strategic partners. Vin obtained a B.S. in Chemistry from Marshall University in 1987 and a Ph.D. in Physical Chemistry from the University of Pittsburgh in 1994. As a postdoctoral researcher at Argonne National Laboratory, he was part of a multi-laboratory team that designed, built, and tested a novel reflectron analyzer for real-time, in-situ, studies of surfaces during film growth - the work resulted in a 1997 R&D 100 Award. Currently, his research is focused on the applications of ToF-SIMS analysis. Vin is also working with exter-nal laboratories to evaluate techniques such as Atom Probe Tomography and Helium Ion Microscopy.

Director, Vin Smentkowski

Director, Yoosuf Picard

MAS Involvement Member since 2008 Co-organizer, EBSD 2012 Symposium organizer: Channeling symposium (M&M 2012) MAS Program Co-Chair, M&M 2014

Yoosuf Picard obtained a B.S. in Mechanical Engineering from Louisiana Tech Uni-versity in 2001 and a Ph.D. in Materials Science and Engineering from the Univer-sity of Michigan in 2006.

During his graduate career, he was a Microsystems Engineering and Science Applications Fellow at Sandia National Laboratories. Following his doctoral research, Yoosuf was a postdoctoral research associate at the U.S. Naval Research Lab (NRL) from 2007-2009. Yoosuf’s research currently involves electron channeling, in-situ electron microscopy, advanced TEM and SEM analysis, and electron backscatter diffraction (EBSD).

Meet the Candidates

P A G E 8

2012 Award Winners and lots of pictures of John Mansfield!

M I C R O N E W S

Presidential Service Award Cathy Johnson

The Duncumb Award (sponsored by Bruker Nano) James Bentley

Presidential Science Award Nestor J Zaluzec

K.F.J. Heinrich Award Emmanulle A Marquis

If you saw a presentation at M&M 2012 appropriate for one of the best paper awards, please email the Chair of the Awards Committee, Paul Kotula (paul.kotula@sandia.gov).

P A G E 9 F A L L 2 0 1 2

Castaing Award for Best Student Presentation Sponsored by Cameca Instruments

Pinshane Huang  

Birks Award for Best Contributed Paper Sponsored by JEOL USA

Ray Unocic

Not pictured Craig Simmons for the Cosslett Award for Best Invited Paper Sponsored by MAS

Macres Award for Best Instrumentation/Software paper Sponsored by Oxford Instruments

Ingo Massmann

MAS Distinguished Scholars – Top Row (L-R): Runzhe Tao, Dimushi Samarajerasa, Benjamin Miller, Lewys Jones, Jason Kawasaki, Monica Rathi, Steffi Woo, MAS President John Mansfield Bottom row (L-R): Shradda Avasthy, Nathan Bailey, Philip Gopon, Megan Holtz, Ceren Aydin

2012 Award Winners and more pictures of John Mansfield!

P A G E 1 0 2012 Tour Speakers

M I C R O N E W S

MAS provides interesting technical speakers for meetings of its Affiliated Regional Societies (AReS). The Tour Speaker Program is most significant tangible benefit that MAS provides to its AReS. This program provides annually at no charge to each AReS a renowned speaker for one of their technical meetings. Moreover, the pool of speakers is chosen by representatives of the AReS at the annual meeting, thus ensuring that the subject matter of the speakers is highly rele-vant to the AReS membership.

The 2011-2012 MAS Tour Speakers still available through 2012 are shown below. All arrange-ments for Tour Speakers must be made through the MAS AReS Director, Valerie Woodward. The slate of speakers for 2012-2013 is not yet finalized. Please check the website often for updates http://microanalysissociety.org/regional/tour-speakers/program2012.htm. If you have a topic or speaker that your local group would like to see added please contact Valerie Wood-ward.

All You Ever Wanted to Know about Silicon Drift Detectors (but Were Afraid to Ask) Richard McLaughlin Oxford Instruments Concord, MA

How the Sausage is Made: A Microanalyst's Time in the White House John Henry Scott NIST Gaithersburg, MD

Reflections on Microscopy & Analysis: From Viewing the Small World to Leading on a Larger Stage Dave Williams The Ohio State University Columbus, OH

Please check your AReS contact information at http://microanalysissociety.org/regional/affiliated-regional-societies-ares If updates are needed please contact Valerie Woodward (valerie.woodward@lubrizol.com)

P A G E 1 1 F A L L 2 0 1 2

Upcoming AReS Meetings Microscopy Society of the Ohio River Valley October 24, 2012, Miami University http://www.msorv.org/meetings.htm Minnesota Microscopy Society November 6, 2012, Bethel University http://www.mnmicroscopy.org/calendar.html Microscopy Society of Northeastern Ohio, Inc. Wednesday, November 7th, 2012 http://www.msneo.org/meetings.html Oklahoma Microscopy Society November 9, 2012, University of Central Oklahoma in Edmond http://www.ou.edu/research/electron/oms/ The Midwest Microscopy and Microanalysis Society November 15, 2012 at Baxter Healthcare, Deerfield, IL. www.midwestmicroscopy.org New England Society for Microscopy November 15-16, UMass Amherst http://nesmicroscopy.org/index.html Colorado Microbeam Analysis Society & Mountains States Society for Electron Microscopy December 13, 2012 Table Mountain Inn, Golden CO Heather Lowers (hlowers@usgs.gov) for more details Australian Microbeam Analysis Society February 4-8, 2013, University of Technology, Sydney http://www.microscopy.org.au/amas/amas12/index.html

P A G E 1 2

Thanks to Our Sustaining Members

Advanced MicroBeam, Inc Contact: Donald P. Lesher 4217C King Graves Road Vienna, OH 44473-0610 Tel: +1 330 394 1255 Fax: +1 330 394 1834 Email: dlesher-at-AdvancedMicroBeam.com www.advancedmicrobeam.com/ Microprobe service, automation, image analysis

Bruker Nano Contact: Doug Skinner or Ted Juzwak 1239 Parkway Avenue Ewing, NJ 08628 Tel: +1 609 771 4427 Fax: +1 609 771 4411 Email: info-at-bruker-axs.com www.bruker.com/ X-ray microanalysis, EBSD, image analysis

CAMCOR, University of Oregon Contact: Melodi Jayne 1241 University of Oregon Eugene, OR 97403-1241 Analytical services, academic and industrial collaboration, scientific research and education Tel: +1 541 346 6447 Fax: +1 541 346 6854 Email: mjayne-at-uoregon.edu

CAMECA Instruments, Inc Contact: Clive Jones 5500 Nobel Drive Madison, WI 53711-4951 Tel: +1 608 229 1933 Fax: +1 608 442 0622 Email: cameca.us-sales-at-ametek.com www.cameca.com/ Manufacturer of Atom Probe, SIMS, and EPMA Instrumentation

Carl Zeiss Microscopy, LLC Contact: Michael Nymick One Zeiss Drive Thornwood, NY 10594 Tel: +1 800 233 2343 Fax: +1 914 681 7379 Email: micro-at-zeiss.com www.zeiss.com/microscopy SEM, TEM, HIM, optical, & correlative microscopy

EDAX Inc Contact: Judy O'Loughlin 91 McKee Drive Mahwah, NJ 07430 Tel: +1 201 529 4880 Fax: +1 201 529 3156 Email: judy.oloughlin-at-ametek.com www.edax.com/ Supplier of EDS, EBSD, WDS & micro-XRF sys-tems

P A G E 1 3

Thanks to Our Sustaining Members

Electron Microscopy Sciences / Diatome US Contact: Stacie Kirsch 1560 Industry Road, PO Box 550 Hatfield, PA 19440 Tel: +1 215 412 8400 Fax: +1 215 412 8450 Email: sgkcck-at-aol.com www.emsdiasum.com/ EM and LM supplies and diamond knives

Energy Beam Sciences Contact: Mike Nesta or Mike Dufraine 29B Kripes Road East Granby, CT 06026-9669 Tel: +1 860 653 0411 / 800 992 9037 Fax: +1 860 653 0422 Email: ebs-at-ebsciences.com www.ebsciences.com/ EDS and digital imaging systems and upgrades

FEI Company Contact: George Scholes or Andre Kraker 5350 NE Dawson Creek Drive Hillsboro, OR 97124 Tel: +1 503 726 7500 Fax: +1 503 726 2615 Email: george.scholes-at-fei.com www.fei.com/ LaB6 & CeB6 tips, FIB & FIB/SEM workstations

Gatan, Inc Contact: John Hyun Corporate Headquarters 5794 West Las Positas Boulevard Pleasanton, CA 94588 Tel: +1 925 463 0200 Fax: +1 925 463 0204 Email: info-at-gatan.com www.gatan.com/ EM instruments and software: specimen preparation, holders, imaging, and analysis

Geller MicroÅnalytical Laboratory, Inc Contact: Joseph D. Geller or Charles Herrington 426E Boston Street (Rt 1) Topsfield, MA 01983-1200 Tel: +1 978 887 7000 Fax: +1 978 887 6671 Email: sales-at-gellermicro.com www.gellermicro.com/ EPMA, SEM/EDS, & Auger services-EM standards

Hitachi High Technologies America Inc Contact: Chad Ostrander 1375 North 28th Avenue Dallas, TX 75261-2208 Tel: +1 512 750 7418 Fax: +1 972 615 9311 Email: chad.ostrander-at-hitachi-hta.com www.hitachi-hta.com/ SEM, TEM, & field-emission SEM and TEM

P A G E 1 4

Thanks to Our Sustaining Members

IBSS Group Contact: Vincent Carlino 1559B Sloat Boulevard, Suite 270 San Francisco, CA 94132-1410 Tel: +1 415 566 5774 Email: vince.carlino-at-ibssgroup.com www.ibssgroup.com

IXRF Systems, Inc Contact: Melissa Ranieri 3019 Alvin DeVane Boulevard Suite 130 Austin TX 78741 Tel: +1 512 386 6100 Fax: +1 512 386 6105 Cell: +1 281 851 2719 Email: melissa-at-ixrfsystems.com www.ixrfsystems.com/ X-ray systems

JEOL USA, Inc Contact: Charles Nielsen or Peter Genovese 11 Dearborn Road Peabody, MA 01960 Tel: +1 978 535 5900 Fax: +1 978 536 2205 Email: eod-at-jeol.com www.jeolusa.com/ EPMA, Auger, SEM, TEM, NMR, mass spec

Lehigh University Contact: Charles Lyman or Chris Kiely Department of Materials Science and Engineering 5 East Packer Avenue Bethlehem, PA 18015 Tel: +1 610 758 4249 Fax: +1 610 758 4244 Email: chris.kiely-at-lehigh.edu www.lehigh.edu/~inmatsci/index.htm Education in SEM, AEM, AFM, & microanalysis

Leica Microsystems, Inc. Contact: Ann Korsen or Pam Jandura 2345 Waukegan Road Bannockburn, IL 60015 Tel: +1 800 248 0665 x5009 Fax: +1 847 236 3061 Email: ann.korsen-at-leica-microsystems.com www.leica-microsystems.com Sample preparation products for all LM, AFM, SEM and TEM applications

Materials Analytical Services, LLC Contact: Phil Russell or Mark Rigler 3945 Lakefield Court Suwanee, GA 30024 Tel: +1 770 866 3200 / +1 800 421 8451 Fax: +1 770 866 3259 Email: mriglermas-at-aol.com www.mastest.com/ FTIR, EDXRF, S(TEM), SEM, FIB, STM & XRD services

P A G E 1 5

Thanks to Our Sustaining Members

Micron, Inc Contact: James F. Ficca, Jr. or James M. Ficca 3815 Lancaster Pike Wilmington, DE 19805-1599 Tel: +1 302 998 1184 Fax: +1 302 998 1836 Email: 102225.3716-at-compuserve.com www.micronanalytical.com/ Analytical services OM, SEM/EDS, TEM, & EPMA

Oxford Instruments Contact: Neil Rowlands or Ruth Murray Microanalysis Group 300 Baker Avenue, Suite 150 Concord, MA 01742-2204 Tel: +1 978 369 9933 / +1 800 447 4717 Fax: +1 978 369 8287 Email: nanoanalysis-at-ma.oxinst.com www.oxford-instruments.com/ Inca EDS, WDS, & EBSD systems for SEM

Probe Software, Inc Contact: John Donovan or Barbara Donovan 885 Crest Drive Eugene, OR 97405 Tel: +1 541 343 3400 Email: donovan-at-probesoftware.com www.probesoftware.com/ Automation & analysis software for JEOL & Cameca microprobes

PulseTor, LLC Contact: Gary Schnerr 1580 Reed Road Suite C-3 Pennington, NJ 08534 Tel: +1 609 303 0578 Fax: +1 609 303 0581 Email: gschnerr-at-pulsetor.com www.pulsetor.com MAXIM high resolution silicon drift detectors, Torrent advanced digital pulse processors

SEMTEC Laboratories, Inc Contact: Ed Holdsworth 5025 S 33rd Street Phoenix, AZ 85040 Tel: +1 602 276 6138 Fax: +1 602 232 2225 Email: semtec-at-semteclaboratories.com www.semteclaboratories.com Materials & failure analysis service lab

SEMTech Solutions, Inc Contact: Gary Brake 6 Executive Park Drive North Billerica, MA 01862 Tel: +1 978 663 9822 x235 Cell: +1 978 828 7648 Fax: +1 978 663 9823 Email: gbrake-at-semtechsolutions.com www.semtechsolutions.com www.sts-elionix.com Specializing in e-beam products and services

P A G E 1 6

Thanks to Our Sustaining Members

South Bay Technology, Inc Contact: Gary Heineman or Scott Walck 1120 Via Callejon San Clemente, CA 92673 Tel: +1 949 492 2600 / +1 800 728 2233 Fax: +1 949 492 1499 Email: info-at-southbaytech.com www.southbaytech.com/index.shtml EM materials preparation equipment and supplies

SPI Supplies / Structure Probe, Inc Contact: Andrew Blackwell 569 East Gay Street West Chester, PA 19380 Tel: +1 610 436 5400 / +1 800 242 4774 Fax: +1 610 436 5755 Email: spi3spi-at-spi.com www.2spi.com/ Microscopy and microanalysis supplies and services

Ted Pella, Inc Contact: Jack Vermeulen or Ted Pella 4595 Mountain Lakes Boulevard Redding, CA 96003 Tel: +1 530 243 2200 / +1 800 237 3526 Fax: +1 530 243 3761 Email: sales-at-tedpella.com www.tedpella.com/ Microscopy tools and supplies

ThermoFisher Scientific Contact: David Rohde 5225 Verona Road, Bldg 4 Madison, WI 53711 Tel: +1 608 276 6395 Fax: +1 608 273 6865 Email: david.rohde-at-thermofisher.com www.thermoscientific.com/microanalysis Microanalysis, EBSD & EDXRF systems, & WDS spectrometers

P A G E 1 7

The Meal with a Mentor is an educational event for students organized by Inga Musselman, the MAS Education Com-mittee Chair. This luncheon provides the opportunity for several experienced MAS members to interact with students and facilitate informal discussions regarding microanalysis opportunities in academia, government, and industry. It was an extremely successful event again this year with 65 students attending the luncheon. Thank you to Inga for her hard work and dedication! And finally, the annual MAS Social, held directly following the MAS Business Meeting, was a fun evening for the over 200 people that attended. One final comment about M&M 2012 is related to our sister societies, the European Microbeam Analysis Society (EMAS) and the Australian Microbeam Analysis Society (AMAS). It was our pleasure to host Mike Matthews, the cur-rent EMAS President, at M&M 2012. Similarly, we look forward to hosting a representative from AMAS next year at M&M 2013. The MAS Awards Committee is currently in the process of selecting a student award winner that will at-tend the AMAS XII meeting to be held in February 2013 in Sydney, Australia as well as another student award winner to attend the EMAS 2013 European Workshop to be held in May 2013 in Porto, Portugal. Additional information about these international meetings can be found on the MAS website. With the conclusion of a successful M&M 2012, there are some important upcoming events. At the annual Business meeting the MAS Nominating Committee presented their slate of candidates for this winter’s election. The following names were approved by the MAS leadership at the summer Council meeting and announced at the Business meeting: Tom Kelly, Cameca, for President-Elect and Dan Kremser, Batelle Memorial Institute, for Treasurer; also announced were four names for the two Director positions, Jeff Davis of NIST, Brian Gorman of the Colorado School of Mines, Yoosuf Picard of Carnegie Mellon University and Vin Smentkowski of GE Global Research. Short biographies of the candidates are available in this issue of MicroNews. Almost half of the membership voted in last year’s election, which is a great turnout! The election is just around the corner, so please take some time and complete the electronic ballot you will receive in the near future. I would also like to take this opportunity to acknowledge and thank a few members of MAS Council. Although still active as this edition of MicroNews is published, I’ll take this opportunity to thank Treasurer Jeff Davis, Past-President John Henry Scott, and outgoing Directors Tom Kelly and Andy Deal for their years of service and dedication to MAS. Your time and contributions are greatly appreciated. I would also like to thank my predecessor, John Mansfield, for his hard work and dedication during his year as MAS President. As we move ahead and into 2013, I look forward to working hard to serve the Society and the membership. I hope to communicate with the members a bit more often via email and provide updates about the activities and progress of the Society. Please do not hesitate to contact me (or other members of MAS Council) directly if you wish to share ideas, offer suggestions, or voice concerns. Sincerely, Kristin Bunker, President Microanalysis Society

MAS President’s Letter Con’t

12th Biennial Australian Microbeam Analysis Society (Sydney, NSW, Australia, from Feb 4 to Feb 8, 2013)

Corals-2013 (Vienna, Austria, on July 03, 2013)

Microscopy & Microanalysis 2013 (Indianapolis, IN from Aug 4 to Aug 08, 2013)

Microscopy & Microanalysis 2014/IUMAS-6 (Hartford, CT from Aug 2 to Aug 07, 2014) IUMAS-VI meeting will be held within the M&M meeting.

Microscopy & Microanalysis 2015 (Portland, OR from Aug 2 to Aug 06, 2015)  

 

Mark Your Calendars

MICROANALYSIS SOCIETY

Phone: 800-462-7636

www.microanalysissociety.org

The purpose of this Society shall be to advance and disseminate knowledge concerning the principles, instrumentation and applications of microanalysis down to the atomic level.