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    Background & Applications

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    Motivation For SAW

    Technology Frequency range from ~ 10 MHz to 3 GHz

    _ Monolithic, solid state

    Standard manufacturing process, similar

    to IC

    Provide complex signal processing

    Mass produced, low cost

    Void of competing technologies

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    SAW Advantage

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    Applications of SAW Devices

    Military Was Initial Motivation

    Pulse Expansion & Compression FiltersRanging

    Pulse Shaping, Matched Filters,

    Programmable Tapped Delay Lines,

    Convolvers, Fast Hop Synthesizer

    Fast Hop Synthesizer

    ECCM

    Direct Sequence Spread Spectrum-

    Fast Frequency Hopping-

    Pulse Memory Delay LineECM Jammers

    Pulse Expansion and Compression

    FiltersRadar Pulse Compression

    Functions PerformedMilitary Applications

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    High Volume Consumer Markets

    Have Driven the Technology

    Custom designs

    Develop unique acoustic component implementations

    Custom materials

    Better manufacturing tolerance

    Low cost, surface mount packaging

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    Hand Set Shipments-World

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    High Volume Applications of

    SAW Devices

    Wireless LANAnalog Cellular

    Base StationsDigital Cordless

    Telephone

    TV IF FilterAnalog Cordless

    Telephone

    Personal Communication

    SystemDigital Cellular

    Consumer ApplicationsConsumer Applications

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    Other Applications of

    SAW Devices

    Oscillators and FiltersRF Synthesizers/Analyzers

    Clock Recovery FilterFiber Optic Repeater

    QAM Spectral ShapingDigital Microwave

    IF Filter, Filter BankSatellite Data Receiver

    VSB Modulator Filters and

    TVRO IF FiltersCATV/MATV Headend

    Functions PerformedCommercial Applications

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    SAW Cost Parameters

    from: RF Monolithics

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    SAW Properties

    Piezoelectric substrate acoustoelectric

    conversion

    Small surface perturbation: 0.1-20 Angstroms

    Wave is trapped to surface (~ 1-15 wavelengths)

    Velocity of ~ 2,500 10,000 m/sec

    Efficient transduction and wave sampling

    Versatile signal processing bandpass filtering,

    resonator frequency control, spread spectrum,

    radar, remote sensing, others

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    SAW Components

    Transducers

    Bidirectional

    Multi-phase

    Unidirectional Single Phase

    Unidirectional

    Reflectors

    Groove Metallic

    Implanted

    Re-Generative

    Elements

    Transducers

    Multistrip Couplers

    Wave Guides

    Beam Compressors

    Convolvers

    Non-linear Elements

    Convolver

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    Surface Wave Particle

    Displacement

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    Bidirectional Apodized SAW Filter

    Schematic diagram of a typical bidirectional SAW filter

    composed of an unweighted input transducer and anapodized transducer. The filter is composed of two

    interdigital transducers (IDT).

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    Electric Field Distribution

    Between Transducer Fingers

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    Transversal Filter

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    SAW Rectangular Time

    Impulse Response

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    SAW Rectangular Time

    Impulse Response

    1 0.5 0 0.5 12

    0

    22

    2

    h1 0 t,( )

    Rect 0 t,( )

    11 t

    h1 x t,( ) a1 cos 2 f0 t( ) Rect x t,( ):=

    Rect x t,( ) if min x( ) t max x( ) 1, 0,( ):=

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    IDT Frequency Domain Response

    From a Rectangular Time Response

    H f( ) 2Sa 2 f f0( ) 2 :=

    Sa x( ) if x 0sin x( )

    x, 1,:=

    0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 250

    4030

    20

    10

    0

    dBH f( )

    H f0( )

    f

    f0

    where

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    Time-Frequency Design Fundamentals

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    Schematic of a Finite Impulse

    Response (FIR) Filter

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    SAW Models

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    MODELS

    Transmission Line

    Uses impedance discontinuitiesto model metallized vs freespace

    Impulse Response/ Superposition

    Models a single element in aperiodic array

    Uses superposition/convolution to

    determine complete response

    Does not handle reflections

    Coupling of Modes

    Analysis via forward and

    reverse traveling waves

    Models transduction and

    reflection

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    SAW Impulse Response

    Transducer Model

    Schematic representation of a SAW IDT and the fundamental wave

    perturbation under the electrode pattern when driven by an impulse.

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    SAW Transducer Impulse Response ModelFor a uniform sampled SAW transducer:

    h(t) =A0 cos[z0t]rect(t/t)

    andA0equals a constant.

    Assume a delta function voltage input, v0(t) = d(t),

    then V0(z) =1. Given h(t), H(z) is known and the

    energy launched as a function of frequency is given

    by (z) = 2 * H(z) . Then

    E(z) =V02(z) * Ga(z) = 1 * Ga(z)

    or

    Ga(z) = 2 * H(z) 2

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    SAW Transducer Impulse Response Model

    Dt= 12*f0 tn=n *Dt N*Dt=t Np * Dt=t/2.where N is the total number of electrodes (half wave-

    lengths) and Np is the total number of electrodepairs.

    H

    (z

    ) =A

    0

    N

    4f0*

    sin(xn)

    xn

    wherexn= (zz0)

    z0 oNp= (ff0)

    f0oNp.

    0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 250

    40

    30

    20

    10

    0

    dBH f( )

    H f0( )

    f

    f0

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    SAW Transducer Impulse Response Model

    The center frequency conductance is given as

    Ga(f0) =G0= 8k2f0CsWaNp2

    or the frequency dependent transducer conductance is

    Ga(f0) =G0 *

    sin2(xn)

    xn2

    The transducer electrode capacitance is given as

    Ce=CsWaNp

    The Hilbert transform susceptance is,

    Ba(z) = 1o

    Ga(u)(uz)du=Ga(z) & 1/oz

    where "*" indicates convolution.

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    SAW Transducer Modeling

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    Transmission Line Model

    -SAW Reflector

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    Transmission Line Model

    -SAW Transducer

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    S11 f( )j K f( ) sinh f( ) Ng p( )

    f( ) cosh f( ) Ng p( ) j f( ) j( ) sinh f( ) Ng p( )+:=

    S12 f( )1( )Ng f( )

    f( ) cosh f( ) Ng p( ) j f( ) j( ) sinh f( ) Ng p( )+:=

    1.45 .108 1.46 .108 1.47 .108 1.48 .108 1.49 .108 1.5.108 1.51 .108 1.52 .108 1.53 .108 1.54 .108 1.55 .1080

    0.5

    1

    0

    1

    S12 f i( )

    S11 f i( )

    fi

    SAW Coupling of Modes

    Model

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    Apodized SAW Transducer Implementations

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    Schematic of a Finite Impulse

    Response (FIR) Filter

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    Apodized SAW Analysis

    (20)h(t) =Si=1

    I

    hi(t)

    and

    (21)H(z) =Si=1

    I

    Hi(z) =Si=1

    I

    t/2

    t/2

    hi(t)ejztdt

    Figure 2. Schematic diagram of a typical SAW filter composed of one

    unweighted interdigital transducer (IDT) and an apodized transducer.

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    SAW Amplitude Beam Profile as a Function of Frequency

    0.25 0 0.25 0.5 0.75 10.5

    0.4

    0.3

    0.2

    0.1

    0

    0.1

    0.2

    0.3

    0.4

    0.5

    Center frequency (f0)

    0.95*f0

    0.93*f0

    0.86*f0

    Wave Amp. vs Beam Position vs. Frequency

    Relative SAW Amplitude

    NormalizedBeamPosition(x/Wa)

    0.75 0.8 0.85 0.9 0.95 1 1.05 1.1 1.15 1.2 1.2550

    40

    30

    20

    10

    0

    Conductance

    Frequency Response

    Ideal H(f) and Conductance: ACOS Fcn.

    Normaliz ed Freque ncy (f/f 0)

    dB

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    20 to 1 Tap Quartz Ang.=3020 to 1 Tap Quartz Ang.=30

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    Acoustic Conductance vs

    Apodization Technique

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    Filter Analysis Model

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    Transducer Time Response

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    Low Shape Factor

    Slant-Apodized Transducer Filter

    Passband Response Wideband Response

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    VSB Filter for CATV - Sawtek

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    Sonet SAW Filter - Sawtek

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    Real Time SAW Fourier Chirp Transform

    Sawtek, Inc.

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    SAW Coded Transducer

    Data

    ClockPulseGenerator

    -1 1 -1 1 -1-1 1-1

    CodedTransducer

    SAW Waveform

    InputTransducer

    SAW Coded Transducer

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    Electrical Network Effects

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    Electrical Network Effects

    SAW equivalent circuit model which includes the

    generator, parasitic resistance, and a tuning inductor

    and)( oa

    so

    fGWaCo

    rQ =

    where Gg is the generator conductance.

    g

    sog

    GWaCQ =

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    Electrical Matching EffectsThe effects of the electrical network can be demonstrated by assuming a

    simple parallel matching inductor, and no parasitic resistance. It will be

    assumed that the transducer can be exactly matched to the real load

    impedance. The transfer function, ignoring the Hilbert transform

    susceptance can be written as

    where .He(z) = Gg/(zoCe)

    bGa(f0)z0Ce

    +Ga(f)Ga(f0)+j[

    zz0

    z0z]

    b=Gg/Ga(f0)

    Figure 8 shows a series of plots of the effects of the electrical network

    transfer function as a function of Q. At center frequency, half the voltage is

    on the SAW conductance, which corresponds to the -6 dB level. Off center

    frequency, the voltage increases which causes a loss in sidelobe rejection.

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    Qr 1:=

    0.6 0.8 1 1.2 1.425

    20

    15

    10

    5

    0Ideal and Complete Matched Response

    Normalized Frequency

    dB Sa x f Qr ,( )( )( )

    dB Ht f Qr ,( )( )

    ff0

    Qr 5:=

    0.6 0.8 1 1.2 1.425

    20

    15

    10

    5

    0Ideal and Complete Matched Response

    Normalized Frequency

    dB Sa x f Qr ,( )( )( )

    dB Ht f Qr ,( )( )

    f

    f0

    Matched Transducer Response

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    Materials

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    Materials Single crystal substrates

    Quartz, Niobates, Tantalates

    Piezoelectric Films ZnO AlN

    Other Substrates Glass

    Si GaAs Diamond LGS, LGN, LGT

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    SAW Filter Process

    Trim (if necessary)

    Dice

    Clean

    Final Trim

    Package

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    Fabrication (3) Electrode Widths

    From: Siemens

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    MATERIAL CONSIDERATIONS

    SAW Material Parameters

    16200.85-140OO 1110Bi12GeO 20

    39775.3-72X128Rotated YLiNbO3(128)

    34884.6-94ZYLiNbO3(YZ)

    32300.74-35ZYLiTaO3(YZ)

    31570.160X+45.75Rotated YQuartz (ST)

    32090.25-32X-20Rotated YQuartz (HC)

    V(m/S)k2(%)TC (ppm/C)PropertyCutMaterial

    For YZ LiNbO3

    For YZ LiNbO3: first letter Cut direction

    2nd letter Prop. direction

    Crystal Planes & Directions

    3D Structure

    1) intercepts: 2a, 4b, 3c

    2) reciprocal: 1/2, 1/4, 1/3

    3) Miller indices: (6, 3, 4)

    smallest integers

    SAW Filt I ti L

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    SAW Filter Insertion Loss vs

    Fractional Bandwidth

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    Computer Generated Filter Layout

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    Mask Structure Device Features

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    Improvement

    in PowerDurability of

    SAW Filters

    T.Nishihara, H.Uchishiba, T.Matsuda, O.Ikata, &Y.Satoh

    Fujitsu Laboratories Ltd.

    Akashi, Japan

    386 1995 IEEE Ultrasonics Symposium

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    Lifetime Dependence on Input Power for

    3-Layered Films with Different

    Intermediate Layers

    Nishihara, et. al.

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    SAW Transversely Coupled Coupled Resonator

    Regions 1 and 11 are free surface; regions 2 and 10 are bus bars;

    regions 3, 5, 7 and 9 are gaps; regions 4 and 8 are the gratings; and

    region 6 is the coupling bar. Each region can have different waveguide

    properties.

    l i Al hi k f Q

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    Velocity vs Al Thickness for Quartz

    0 0.005 0.01 0.015 0.02 0.025 0.03 0.035 0.04

    3100

    3110

    3120

    3130

    3140

    3150

    3160S T-Quartz Grating, Gap and Metal Velocities

    h/lambda

    Velocity(m/sec)

    Velocity versus normalized film thickness . The lower trace is the

    grating velocity, the center trace is the gap region velocity, and the

    upper trace is the solid metal velocity.

    TCR P l S i M t l Thi k

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    0 0.5 1 1.5 2 2.5 3 3.5 4

    0

    0.1

    0.2

    0.3

    0.4

    0.5

    0.6

    0.7

    0.8

    0.9

    1Beam width= 4 to 14 lam0, Step= 2 lam0, CW=1

    Metal thickness, % of h/l

    PoleSpacing,

    MHz

    TCR Pole Spacing vs Metal Thickness

    Figure 4. Pole spacing vs normalized metal fim thickness for a coupling width of 1. Beam

    width is stepped in 2 increments with 4 wavelengths wide for largest pole spacing and 14

    for smallest pole spacing. The crosses mark the maximum pole spacing. The open circles

    are measured data of the pole spacing at a given metal thickness.

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    01

    23

    4

    0

    0.5

    1

    1.5

    2

    0

    0.5

    1

    1.5

    x 10-3

    Delv/v Beam width=6

    Coupling width

    (h/lambda in %)

    ModeSeperation(delf/f0)

    Plot of the normalized mode spacing vs coupling width vs

    normalized film thickness for a transducer aperture of 6

    wavelengths.

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    Effect of Metal Thickness for Reflector

    From: S.Richie

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    Reactive Ion Etching of Quartz

    Test#5: PR/Al mask, 125W, 5SCCM C2F6, P=32 microns, 45 min, graphite plate

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    Packaging{ Currently most high volume packaging use

    surface mount

    {Metal packages are primarily militaryapplications

    {Issues:~Extremely low cost~Hermeticity~Sealing~RF compatibility~Volume (footprint)~Internal matching

    {RF problems in packages is of importance

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    Assembly

    process forflip-chip

    SAW filters

    Miniaturized SAW Filters Using aFlip-Chip Technique

    H.Yatsuda, T.Horishima, T.Eimura

    & T.Ochwa

    1994 Ultrasonics Symposium - 159

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    GSM IF Filters: Evolution of

    Package Size

    Source: Siemens

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    Second Order Effects

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    Approximate Triple Transit

    Analysis

    Simple Triple Transit Level Analysis

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    Simple Triple Transit Level Analysis( (

    ( )

    ( )

    ( )

    ( )( )( )( ) ( ) ( ) ( )

    dBILdBILTTEP

    P

    PILPILILP

    PP

    RP

    PP

    RP

    R

    PR

    R

    RP

    R

    PR

    PP

    o

    oo

    o

    o

    inout

    10forvalid62log10

    41

    41

    21

    21

    21

    21

    21

    21

    21

    21

    21

    21

    2

    1

    2

    1

    2

    1

    21

    todue#[email protected]

    21

    21

    todue#[email protected]

    21

    todue#[email protected]

    21

    21

    1)(port#[email protected]

    21

    21:responseMain.1

    2

    2

    2

    21122

    11122

    1122

    222

    2

    112

    1

    111

    1

    21

    21

    >+==

    =

    =

    ==

    =

    =

    =

    =

    =

    SAW V l i P i

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    SAW Velocity vs Propagation

    Angle ST Quartz

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    SAW Propagation SimulationSAW Propagation Simulation20 Tap to 1 Tap Apodized Transducer on Quartz, PFA=3020 Tap to 1 Tap Apodized Transducer on Quartz, PFA=30oo

    Beam steering-group velocity

    is steering wave upward

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    Slanted SAWFilter Analysis

    With and

    WithoutDiffraction -

    Theoretical

    From: S. Knapp PhD thesis

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    Slanted SAWFilter Analysis

    With

    Diffraction Predicted and

    Experimental

    From: S. Knapp PhD thesis

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    BAW Temperature Coefficient of

    Frequency

    pcv

    hvv

    f

    vfhh

    h

    m

    mmm

    mm

    =

    ==

    ===

    =

    2

    2;2

    knessblank thiccystalBAW

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    BAW Temperature Coefficient of

    Frequency

    pc

    dTdv

    v

    dT

    dh

    hdt

    dv

    vdT

    df

    f

    fvh

    dT

    dh

    h

    v

    dT

    dv

    hdT

    df

    dT

    hv

    d

    dT

    df

    m

    m

    m

    m

    m

    m

    mm

    mmm

    m

    m

    in1Expand

    111

    then,12bysidesbothMultiply

    22

    1

    2

    2

    =

    =

    =

    =

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    BAW Temperature Coefficient of

    Frequency

    +

    =

    =

    =

    =

    =

    dT

    dh

    hdT

    d

    dT

    dc

    cdT

    df

    f

    dTd

    dTdc

    cdTdv

    v

    cv

    dT

    dc

    cdT

    dv

    dT

    cd

    dT

    dv

    m

    m

    m

    m

    m

    m

    m

    11

    2

    11

    2

    11

    11211

    then,1bysidesbothMultiply

    2

    11

    2

    1

    :Expand

    23

    T bl f M i l C f LGS LGN LGT

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    Table of Material Constants for LGS, LGN, LGT

    Ref. Temp=25oC LGT LGN LGS

    RT(x10^10)

    TC1(x10^-6)

    TC2(x10^-9)

    RT(x10^10)

    TC1(x10^-6)

    TC2(x10^-9)

    RT(x10^10)

    TC1(x10^-6)

    TC2(x10^-9)

    C11 (N/m) 18.852 -78.239 -273.644 19.299 -56.335 -5.745 18.849 -43.908 -8.183C66 (N/m) 4.032 -43.633 -901.446 4.116 15.247 -176.812 4.221 -22.432 -64.402C33 (N/m) 26.180 -102.255 -107.715 26.465 -114.656 90.724 26.168 -91.904 -491.305C44 (N/m) 5.110 21.653 -11.987 4.956 -14.137 -379.544 5.371 -44.046 127.130C14 (N/m) 1.351 -359.568 1604.810 1.485 -478.918 -1943.861 1.415 -309.099 261.107C13 (N/m) 10.336 -111.390 -557.682 10.225 -31.269 947.985 9.688 -61.952 -1446.007EXPANSION-Y 0.000 6.087 4.736 0.000 6.673 -4.135 0.000 5.630 5.979EXPANSION-Z 0.000 3.827 5.030 0.000 5.060 0.000 0.000 4.079 4.577

    DENSITY (g/m^3) 6150.400 -16.016 -14.502 6028.900 -18.410 9.010 5739.200 -15.340 -13.460Piezo e11 -0.456 -22.800 -981.000 -0.452 99.300 456.000 -0.402 329.000 199.000Piezo e14 0.094 1587.000 2293.000 0.061 2306.000 5053.000 0.130 -342.000 2287.000Relative epsilon 11 18.271 -65.480 -35.960 20.089 171.400 -290.500 19.620 322.900 -1073.000Relative epsilon 33 78.950 -1417.000 -16.100 79.335 -1596.000 -2935.000 49.410 -737.100 543.900

    Room temperature is 25oC.

    Reference temperature is 25o

    C for all measurements.All values are with respect to the IEEE 176-1949 (R1971)

    Standard on Piezoelectricity

    BAW Temperature Coefficient of Frequency

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    p q y

    versus Propagation Angle

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    RF P b St ti f D t A i iti

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    RF Probe Station for Data Acquisition

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    System Application Driven

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    System Application Driven

    Primary Frequency Range70 MHz - 2.5 GHz

    Fractional Bandwidths

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    Four Principal Saw Properties

    _ Transduction

    _ Reflection

    _ Re-Generation _ Non-Linearities

    All SAW devices implement or exhibit oneor more of these fundamentalacoustic/electrical properties

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    Technology IssuesRF F il ters

    v Low Loss

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    Filter Using Unidirectional

    Transducers (UDT): 3-Phase

    Three Phase UDT Low Loss Filter Results

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    Wide Band

    Filter

    Response

    Narrowband

    Filter

    Response

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    Technological Advances

    Semi-Resonant Devices

    8 Single Phase Unidirectional Transducers (SPUDT)

    8 Natural SPUDT (NSPUDT)

    8 Single Pole Resonators

    8 Multipole Resonators

    8 Transverse Coupled Resonators

    8 Reflector structures

    8 Multitransducer structures

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    Schematic representation of a

    SPUDT. The transducer is

    composed of a transduction and

    reflection structure. The reflecting

    structure may be incorporated into

    the transduction structure or can

    be superimposed onto the

    transduction structure. The

    reflector can be made by mass

    loading of metal or dielectric

    material. (Malocha, 1993)

    SPUDT Schematic Representation

    SPUDT Macroscopic Reflection

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    p

    Figure 5 Macroscopic Reflection. The figure above illustrates how a wave

    propagating under a transducer might be reflected. Note that the incident forward

    waves amplitude is diminished as it propagates under the array of electrodes and

    that the reflected waves amplitude grows as it propagates beneath the array.

    SPUDT Advantages

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    SPUDT Advantages

    Low-loss SAW Filters (~3-15dB)

    Reduced triple transit

    Low pass band amplitude ripple

    Small group delay distortion

    Small size compared to multi-transducer

    approaches

    Simple matching circuits (1-2 reactive elements)

    Relatively insensitive to matching elementvariations

    Easy to fabricate - single level metal

    SPUDT Four Basic Unit Cells

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    SPUDT Four Basic Unit Cells

    Abbott 1989

    A) Transduction and reflector, B) Transduction and no

    reflector, C) Reflector without transduction, and

    D) No transduction and no reflector.

    SPUDT Time Domain

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    S U

    SPUDT Frequency Domain

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    SPUDT Frequency Domain

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    Resonator Equivalent Circuits

    SAW Resonator Filter

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    SAW Resonator Filter

    Typical SAW Resonator Measured

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    Typical SAW Resonator- Measured

    Resonators were designed having a center frequency

    wavelength of 19.22 um.

    Resonator Q~5000

    118 119 120 121 122 123 124 125 126 127 128 12970

    60

    50

    40

    30

    20

    10

    0Narrow Band S21 Graph

    Frequency (MHz)

    A

    mplitude(dB)

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    SAW Transversely Coupled

    Coupled Resonator

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    Ladder Circuit

    Structure

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    SAW Fixed Frequency Oscillator

    From Sawtek, Inc.

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    SAW Voltage Controlled Oscillator

    with permission from Sawtek, Inc.

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    SAW C d D l Li t 856 MH

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    SAW Code Delay Line at 856 MHz

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    RX1000 Block Diagram

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    RX1000 Block Diagram

    SAW Beam Width

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    SAW Beam Width

    Compression Convolver

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    Simple SAW Film Sensor

    SAW B k C d

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    SAW Barker Code

    Generator/Correlator

    Sawtek, Inc.

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    Minimum Shift Key SAW Filter

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    Mask Waveform Generator

    Quadrature System w/ AM

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    h22

    SAW Modulator Filter Pulse Response Derived from Theoretical and Measured Frequency Responses

    Quadrature System w/o AM

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    Figure 83. Three Term Even Series SAW Modulator Filter Pulse Responses Derived from

    Theoretical and Measured Frequency Responses

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    SAW Multichannel Filter Bank

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    SAW Multichannel Filter Bank

    Permission from Sawtek, Inc.

    Compressi e Recei er Technolog

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    Compressive Receiver Technology

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    SAW Up Chirp Dispersive

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    SAW Up-Chirp Dispersive

    Delay Line

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    Road Vehicles- World

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    Handset Vendors-World

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    Wireless Users Worldwide

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    Competition

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    Direct Conversion Receivers Thin Film Bulk Acoustic Wave

    Ceramic Filters

    MEMS DSP