saw tech presentation
TRANSCRIPT
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Background & Applications
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Motivation For SAW
Technology Frequency range from ~ 10 MHz to 3 GHz
_ Monolithic, solid state
Standard manufacturing process, similar
to IC
Provide complex signal processing
Mass produced, low cost
Void of competing technologies
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SAW Advantage
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Applications of SAW Devices
Military Was Initial Motivation
Pulse Expansion & Compression FiltersRanging
Pulse Shaping, Matched Filters,
Programmable Tapped Delay Lines,
Convolvers, Fast Hop Synthesizer
Fast Hop Synthesizer
ECCM
Direct Sequence Spread Spectrum-
Fast Frequency Hopping-
Pulse Memory Delay LineECM Jammers
Pulse Expansion and Compression
FiltersRadar Pulse Compression
Functions PerformedMilitary Applications
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High Volume Consumer Markets
Have Driven the Technology
Custom designs
Develop unique acoustic component implementations
Custom materials
Better manufacturing tolerance
Low cost, surface mount packaging
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Hand Set Shipments-World
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High Volume Applications of
SAW Devices
Wireless LANAnalog Cellular
Base StationsDigital Cordless
Telephone
TV IF FilterAnalog Cordless
Telephone
Personal Communication
SystemDigital Cellular
Consumer ApplicationsConsumer Applications
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Other Applications of
SAW Devices
Oscillators and FiltersRF Synthesizers/Analyzers
Clock Recovery FilterFiber Optic Repeater
QAM Spectral ShapingDigital Microwave
IF Filter, Filter BankSatellite Data Receiver
VSB Modulator Filters and
TVRO IF FiltersCATV/MATV Headend
Functions PerformedCommercial Applications
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SAW Cost Parameters
from: RF Monolithics
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SAW Properties
Piezoelectric substrate acoustoelectric
conversion
Small surface perturbation: 0.1-20 Angstroms
Wave is trapped to surface (~ 1-15 wavelengths)
Velocity of ~ 2,500 10,000 m/sec
Efficient transduction and wave sampling
Versatile signal processing bandpass filtering,
resonator frequency control, spread spectrum,
radar, remote sensing, others
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SAW Components
Transducers
Bidirectional
Multi-phase
Unidirectional Single Phase
Unidirectional
Reflectors
Groove Metallic
Implanted
Re-Generative
Elements
Transducers
Multistrip Couplers
Wave Guides
Beam Compressors
Convolvers
Non-linear Elements
Convolver
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Surface Wave Particle
Displacement
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Bidirectional Apodized SAW Filter
Schematic diagram of a typical bidirectional SAW filter
composed of an unweighted input transducer and anapodized transducer. The filter is composed of two
interdigital transducers (IDT).
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Electric Field Distribution
Between Transducer Fingers
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Transversal Filter
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SAW Rectangular Time
Impulse Response
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SAW Rectangular Time
Impulse Response
1 0.5 0 0.5 12
0
22
2
h1 0 t,( )
Rect 0 t,( )
11 t
h1 x t,( ) a1 cos 2 f0 t( ) Rect x t,( ):=
Rect x t,( ) if min x( ) t max x( ) 1, 0,( ):=
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IDT Frequency Domain Response
From a Rectangular Time Response
H f( ) 2Sa 2 f f0( ) 2 :=
Sa x( ) if x 0sin x( )
x, 1,:=
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 250
4030
20
10
0
dBH f( )
H f0( )
f
f0
where
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Time-Frequency Design Fundamentals
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Schematic of a Finite Impulse
Response (FIR) Filter
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SAW Models
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MODELS
Transmission Line
Uses impedance discontinuitiesto model metallized vs freespace
Impulse Response/ Superposition
Models a single element in aperiodic array
Uses superposition/convolution to
determine complete response
Does not handle reflections
Coupling of Modes
Analysis via forward and
reverse traveling waves
Models transduction and
reflection
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SAW Impulse Response
Transducer Model
Schematic representation of a SAW IDT and the fundamental wave
perturbation under the electrode pattern when driven by an impulse.
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SAW Transducer Impulse Response ModelFor a uniform sampled SAW transducer:
h(t) =A0 cos[z0t]rect(t/t)
andA0equals a constant.
Assume a delta function voltage input, v0(t) = d(t),
then V0(z) =1. Given h(t), H(z) is known and the
energy launched as a function of frequency is given
by (z) = 2 * H(z) . Then
E(z) =V02(z) * Ga(z) = 1 * Ga(z)
or
Ga(z) = 2 * H(z) 2
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SAW Transducer Impulse Response Model
Dt= 12*f0 tn=n *Dt N*Dt=t Np * Dt=t/2.where N is the total number of electrodes (half wave-
lengths) and Np is the total number of electrodepairs.
H
(z
) =A
0
N
4f0*
sin(xn)
xn
wherexn= (zz0)
z0 oNp= (ff0)
f0oNp.
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 250
40
30
20
10
0
dBH f( )
H f0( )
f
f0
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SAW Transducer Impulse Response Model
The center frequency conductance is given as
Ga(f0) =G0= 8k2f0CsWaNp2
or the frequency dependent transducer conductance is
Ga(f0) =G0 *
sin2(xn)
xn2
The transducer electrode capacitance is given as
Ce=CsWaNp
The Hilbert transform susceptance is,
Ba(z) = 1o
Ga(u)(uz)du=Ga(z) & 1/oz
where "*" indicates convolution.
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SAW Transducer Modeling
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Transmission Line Model
-SAW Reflector
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Transmission Line Model
-SAW Transducer
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S11 f( )j K f( ) sinh f( ) Ng p( )
f( ) cosh f( ) Ng p( ) j f( ) j( ) sinh f( ) Ng p( )+:=
S12 f( )1( )Ng f( )
f( ) cosh f( ) Ng p( ) j f( ) j( ) sinh f( ) Ng p( )+:=
1.45 .108 1.46 .108 1.47 .108 1.48 .108 1.49 .108 1.5.108 1.51 .108 1.52 .108 1.53 .108 1.54 .108 1.55 .1080
0.5
1
0
1
S12 f i( )
S11 f i( )
fi
SAW Coupling of Modes
Model
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Apodized SAW Transducer Implementations
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Schematic of a Finite Impulse
Response (FIR) Filter
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Apodized SAW Analysis
(20)h(t) =Si=1
I
hi(t)
and
(21)H(z) =Si=1
I
Hi(z) =Si=1
I
t/2
t/2
hi(t)ejztdt
Figure 2. Schematic diagram of a typical SAW filter composed of one
unweighted interdigital transducer (IDT) and an apodized transducer.
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SAW Amplitude Beam Profile as a Function of Frequency
0.25 0 0.25 0.5 0.75 10.5
0.4
0.3
0.2
0.1
0
0.1
0.2
0.3
0.4
0.5
Center frequency (f0)
0.95*f0
0.93*f0
0.86*f0
Wave Amp. vs Beam Position vs. Frequency
Relative SAW Amplitude
NormalizedBeamPosition(x/Wa)
0.75 0.8 0.85 0.9 0.95 1 1.05 1.1 1.15 1.2 1.2550
40
30
20
10
0
Conductance
Frequency Response
Ideal H(f) and Conductance: ACOS Fcn.
Normaliz ed Freque ncy (f/f 0)
dB
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20 to 1 Tap Quartz Ang.=3020 to 1 Tap Quartz Ang.=30
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Acoustic Conductance vs
Apodization Technique
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Filter Analysis Model
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Transducer Time Response
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Low Shape Factor
Slant-Apodized Transducer Filter
Passband Response Wideband Response
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VSB Filter for CATV - Sawtek
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Sonet SAW Filter - Sawtek
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Real Time SAW Fourier Chirp Transform
Sawtek, Inc.
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SAW Coded Transducer
Data
ClockPulseGenerator
-1 1 -1 1 -1-1 1-1
CodedTransducer
SAW Waveform
InputTransducer
SAW Coded Transducer
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Electrical Network Effects
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Electrical Network Effects
SAW equivalent circuit model which includes the
generator, parasitic resistance, and a tuning inductor
and)( oa
so
fGWaCo
rQ =
where Gg is the generator conductance.
g
sog
GWaCQ =
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Electrical Matching EffectsThe effects of the electrical network can be demonstrated by assuming a
simple parallel matching inductor, and no parasitic resistance. It will be
assumed that the transducer can be exactly matched to the real load
impedance. The transfer function, ignoring the Hilbert transform
susceptance can be written as
where .He(z) = Gg/(zoCe)
bGa(f0)z0Ce
+Ga(f)Ga(f0)+j[
zz0
z0z]
b=Gg/Ga(f0)
Figure 8 shows a series of plots of the effects of the electrical network
transfer function as a function of Q. At center frequency, half the voltage is
on the SAW conductance, which corresponds to the -6 dB level. Off center
frequency, the voltage increases which causes a loss in sidelobe rejection.
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Qr 1:=
0.6 0.8 1 1.2 1.425
20
15
10
5
0Ideal and Complete Matched Response
Normalized Frequency
dB Sa x f Qr ,( )( )( )
dB Ht f Qr ,( )( )
ff0
Qr 5:=
0.6 0.8 1 1.2 1.425
20
15
10
5
0Ideal and Complete Matched Response
Normalized Frequency
dB Sa x f Qr ,( )( )( )
dB Ht f Qr ,( )( )
f
f0
Matched Transducer Response
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Materials
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Materials Single crystal substrates
Quartz, Niobates, Tantalates
Piezoelectric Films ZnO AlN
Other Substrates Glass
Si GaAs Diamond LGS, LGN, LGT
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SAW Filter Process
Trim (if necessary)
Dice
Clean
Final Trim
Package
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Fabrication (3) Electrode Widths
From: Siemens
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MATERIAL CONSIDERATIONS
SAW Material Parameters
16200.85-140OO 1110Bi12GeO 20
39775.3-72X128Rotated YLiNbO3(128)
34884.6-94ZYLiNbO3(YZ)
32300.74-35ZYLiTaO3(YZ)
31570.160X+45.75Rotated YQuartz (ST)
32090.25-32X-20Rotated YQuartz (HC)
V(m/S)k2(%)TC (ppm/C)PropertyCutMaterial
For YZ LiNbO3
For YZ LiNbO3: first letter Cut direction
2nd letter Prop. direction
Crystal Planes & Directions
3D Structure
1) intercepts: 2a, 4b, 3c
2) reciprocal: 1/2, 1/4, 1/3
3) Miller indices: (6, 3, 4)
smallest integers
SAW Filt I ti L
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SAW Filter Insertion Loss vs
Fractional Bandwidth
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Computer Generated Filter Layout
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Mask Structure Device Features
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Improvement
in PowerDurability of
SAW Filters
T.Nishihara, H.Uchishiba, T.Matsuda, O.Ikata, &Y.Satoh
Fujitsu Laboratories Ltd.
Akashi, Japan
386 1995 IEEE Ultrasonics Symposium
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Lifetime Dependence on Input Power for
3-Layered Films with Different
Intermediate Layers
Nishihara, et. al.
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SAW Transversely Coupled Coupled Resonator
Regions 1 and 11 are free surface; regions 2 and 10 are bus bars;
regions 3, 5, 7 and 9 are gaps; regions 4 and 8 are the gratings; and
region 6 is the coupling bar. Each region can have different waveguide
properties.
l i Al hi k f Q
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Velocity vs Al Thickness for Quartz
0 0.005 0.01 0.015 0.02 0.025 0.03 0.035 0.04
3100
3110
3120
3130
3140
3150
3160S T-Quartz Grating, Gap and Metal Velocities
h/lambda
Velocity(m/sec)
Velocity versus normalized film thickness . The lower trace is the
grating velocity, the center trace is the gap region velocity, and the
upper trace is the solid metal velocity.
TCR P l S i M t l Thi k
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0 0.5 1 1.5 2 2.5 3 3.5 4
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1Beam width= 4 to 14 lam0, Step= 2 lam0, CW=1
Metal thickness, % of h/l
PoleSpacing,
MHz
TCR Pole Spacing vs Metal Thickness
Figure 4. Pole spacing vs normalized metal fim thickness for a coupling width of 1. Beam
width is stepped in 2 increments with 4 wavelengths wide for largest pole spacing and 14
for smallest pole spacing. The crosses mark the maximum pole spacing. The open circles
are measured data of the pole spacing at a given metal thickness.
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01
23
4
0
0.5
1
1.5
2
0
0.5
1
1.5
x 10-3
Delv/v Beam width=6
Coupling width
(h/lambda in %)
ModeSeperation(delf/f0)
Plot of the normalized mode spacing vs coupling width vs
normalized film thickness for a transducer aperture of 6
wavelengths.
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Effect of Metal Thickness for Reflector
From: S.Richie
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Reactive Ion Etching of Quartz
Test#5: PR/Al mask, 125W, 5SCCM C2F6, P=32 microns, 45 min, graphite plate
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Packaging{ Currently most high volume packaging use
surface mount
{Metal packages are primarily militaryapplications
{Issues:~Extremely low cost~Hermeticity~Sealing~RF compatibility~Volume (footprint)~Internal matching
{RF problems in packages is of importance
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Assembly
process forflip-chip
SAW filters
Miniaturized SAW Filters Using aFlip-Chip Technique
H.Yatsuda, T.Horishima, T.Eimura
& T.Ochwa
1994 Ultrasonics Symposium - 159
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GSM IF Filters: Evolution of
Package Size
Source: Siemens
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Second Order Effects
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Approximate Triple Transit
Analysis
Simple Triple Transit Level Analysis
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Simple Triple Transit Level Analysis( (
( )
( )
( )
( )( )( )( ) ( ) ( ) ( )
dBILdBILTTEP
P
PILPILILP
PP
RP
PP
RP
R
PR
R
RP
R
PR
PP
o
oo
o
o
inout
10forvalid62log10
41
41
21
21
21
21
21
21
21
21
21
21
2
1
2
1
2
1
21
todue#[email protected]
21
21
todue#[email protected]
21
todue#[email protected]
21
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1)(port#[email protected]
21
21:responseMain.1
2
2
2
21122
11122
1122
222
2
112
1
111
1
21
21
>+==
=
=
==
=
=
=
=
=
SAW V l i P i
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SAW Velocity vs Propagation
Angle ST Quartz
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SAW Propagation SimulationSAW Propagation Simulation20 Tap to 1 Tap Apodized Transducer on Quartz, PFA=3020 Tap to 1 Tap Apodized Transducer on Quartz, PFA=30oo
Beam steering-group velocity
is steering wave upward
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Slanted SAWFilter Analysis
With and
WithoutDiffraction -
Theoretical
From: S. Knapp PhD thesis
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Slanted SAWFilter Analysis
With
Diffraction Predicted and
Experimental
From: S. Knapp PhD thesis
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BAW Temperature Coefficient of
Frequency
pcv
hvv
f
vfhh
h
m
mmm
mm
=
==
===
=
2
2;2
knessblank thiccystalBAW
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BAW Temperature Coefficient of
Frequency
pc
dTdv
v
dT
dh
hdt
dv
vdT
df
f
fvh
dT
dh
h
v
dT
dv
hdT
df
dT
hv
d
dT
df
m
m
m
m
m
m
mm
mmm
m
m
in1Expand
111
then,12bysidesbothMultiply
22
1
2
2
=
=
=
=
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BAW Temperature Coefficient of
Frequency
+
=
=
=
=
=
dT
dh
hdT
d
dT
dc
cdT
df
f
dTd
dTdc
cdTdv
v
cv
dT
dc
cdT
dv
dT
cd
dT
dv
m
m
m
m
m
m
m
11
2
11
2
11
11211
then,1bysidesbothMultiply
2
11
2
1
:Expand
23
T bl f M i l C f LGS LGN LGT
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Table of Material Constants for LGS, LGN, LGT
Ref. Temp=25oC LGT LGN LGS
RT(x10^10)
TC1(x10^-6)
TC2(x10^-9)
RT(x10^10)
TC1(x10^-6)
TC2(x10^-9)
RT(x10^10)
TC1(x10^-6)
TC2(x10^-9)
C11 (N/m) 18.852 -78.239 -273.644 19.299 -56.335 -5.745 18.849 -43.908 -8.183C66 (N/m) 4.032 -43.633 -901.446 4.116 15.247 -176.812 4.221 -22.432 -64.402C33 (N/m) 26.180 -102.255 -107.715 26.465 -114.656 90.724 26.168 -91.904 -491.305C44 (N/m) 5.110 21.653 -11.987 4.956 -14.137 -379.544 5.371 -44.046 127.130C14 (N/m) 1.351 -359.568 1604.810 1.485 -478.918 -1943.861 1.415 -309.099 261.107C13 (N/m) 10.336 -111.390 -557.682 10.225 -31.269 947.985 9.688 -61.952 -1446.007EXPANSION-Y 0.000 6.087 4.736 0.000 6.673 -4.135 0.000 5.630 5.979EXPANSION-Z 0.000 3.827 5.030 0.000 5.060 0.000 0.000 4.079 4.577
DENSITY (g/m^3) 6150.400 -16.016 -14.502 6028.900 -18.410 9.010 5739.200 -15.340 -13.460Piezo e11 -0.456 -22.800 -981.000 -0.452 99.300 456.000 -0.402 329.000 199.000Piezo e14 0.094 1587.000 2293.000 0.061 2306.000 5053.000 0.130 -342.000 2287.000Relative epsilon 11 18.271 -65.480 -35.960 20.089 171.400 -290.500 19.620 322.900 -1073.000Relative epsilon 33 78.950 -1417.000 -16.100 79.335 -1596.000 -2935.000 49.410 -737.100 543.900
Room temperature is 25oC.
Reference temperature is 25o
C for all measurements.All values are with respect to the IEEE 176-1949 (R1971)
Standard on Piezoelectricity
BAW Temperature Coefficient of Frequency
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p q y
versus Propagation Angle
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RF P b St ti f D t A i iti
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RF Probe Station for Data Acquisition
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System Application Driven
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System Application Driven
Primary Frequency Range70 MHz - 2.5 GHz
Fractional Bandwidths
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Four Principal Saw Properties
_ Transduction
_ Reflection
_ Re-Generation _ Non-Linearities
All SAW devices implement or exhibit oneor more of these fundamentalacoustic/electrical properties
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Technology IssuesRF F il ters
v Low Loss
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Filter Using Unidirectional
Transducers (UDT): 3-Phase
Three Phase UDT Low Loss Filter Results
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Wide Band
Filter
Response
Narrowband
Filter
Response
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Technological Advances
Semi-Resonant Devices
8 Single Phase Unidirectional Transducers (SPUDT)
8 Natural SPUDT (NSPUDT)
8 Single Pole Resonators
8 Multipole Resonators
8 Transverse Coupled Resonators
8 Reflector structures
8 Multitransducer structures
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Schematic representation of a
SPUDT. The transducer is
composed of a transduction and
reflection structure. The reflecting
structure may be incorporated into
the transduction structure or can
be superimposed onto the
transduction structure. The
reflector can be made by mass
loading of metal or dielectric
material. (Malocha, 1993)
SPUDT Schematic Representation
SPUDT Macroscopic Reflection
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p
Figure 5 Macroscopic Reflection. The figure above illustrates how a wave
propagating under a transducer might be reflected. Note that the incident forward
waves amplitude is diminished as it propagates under the array of electrodes and
that the reflected waves amplitude grows as it propagates beneath the array.
SPUDT Advantages
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SPUDT Advantages
Low-loss SAW Filters (~3-15dB)
Reduced triple transit
Low pass band amplitude ripple
Small group delay distortion
Small size compared to multi-transducer
approaches
Simple matching circuits (1-2 reactive elements)
Relatively insensitive to matching elementvariations
Easy to fabricate - single level metal
SPUDT Four Basic Unit Cells
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SPUDT Four Basic Unit Cells
Abbott 1989
A) Transduction and reflector, B) Transduction and no
reflector, C) Reflector without transduction, and
D) No transduction and no reflector.
SPUDT Time Domain
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S U
SPUDT Frequency Domain
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SPUDT Frequency Domain
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Resonator Equivalent Circuits
SAW Resonator Filter
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SAW Resonator Filter
Typical SAW Resonator Measured
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Typical SAW Resonator- Measured
Resonators were designed having a center frequency
wavelength of 19.22 um.
Resonator Q~5000
118 119 120 121 122 123 124 125 126 127 128 12970
60
50
40
30
20
10
0Narrow Band S21 Graph
Frequency (MHz)
A
mplitude(dB)
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SAW Transversely Coupled
Coupled Resonator
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Ladder Circuit
Structure
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SAW Fixed Frequency Oscillator
From Sawtek, Inc.
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SAW Voltage Controlled Oscillator
with permission from Sawtek, Inc.
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SAW C d D l Li t 856 MH
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SAW Code Delay Line at 856 MHz
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RX1000 Block Diagram
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RX1000 Block Diagram
SAW Beam Width
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SAW Beam Width
Compression Convolver
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Simple SAW Film Sensor
SAW B k C d
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SAW Barker Code
Generator/Correlator
Sawtek, Inc.
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Minimum Shift Key SAW Filter
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Mask Waveform Generator
Quadrature System w/ AM
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h22
SAW Modulator Filter Pulse Response Derived from Theoretical and Measured Frequency Responses
Quadrature System w/o AM
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Figure 83. Three Term Even Series SAW Modulator Filter Pulse Responses Derived from
Theoretical and Measured Frequency Responses
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SAW Multichannel Filter Bank
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SAW Multichannel Filter Bank
Permission from Sawtek, Inc.
Compressi e Recei er Technolog
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Compressive Receiver Technology
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SAW Up Chirp Dispersive
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SAW Up-Chirp Dispersive
Delay Line
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Road Vehicles- World
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Handset Vendors-World
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Wireless Users Worldwide
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Competition
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Direct Conversion Receivers Thin Film Bulk Acoustic Wave
Ceramic Filters
MEMS DSP