october 29, 2019 intercontinental shanghai pudonghotel archive€¦ · session 3 presentation 1...
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October 29, 2019
InterContinental Shanghai Pudong Hotel
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Cooling Solution for IC Device Testing
Terence Miao, Quynh NguyenSmiths interconnect
Shanghai ▪ October 29, 2019
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Agenda
• Background • Heat Transfer• Structure • Natural Convection• Force Convection (Fan)
Cooling Solution for IC Device Testing2
• Force Convection (Liquid Cooling)
• Force Convection (Fan W/heat pipe)
• Conclusion
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Background
Cooling Solution for IC Device Testing3
• Billions of transistors.• Higher Power, Higher
Dissipation– Test socket probes damage.– IC thermal breakdown &
thermal runaway.– PCB thermal runway.
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Heat Transfer
Cooling Solution for IC Device Testing4
Sometime have phase changes while heat is being transferred.
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Structure
Cooling Solution for IC Device Testing5
• Device can be cooled from bottom side by PCB ground layers.
• Also, device can be cooled from top side by Hand Socket Lid (HSL) for Manual test and Work Press for Handler test.
• HSL or Work Press will have heatsink for heat dissipation by natural or force convection.
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Natural Convection
Cooling Solution for IC Device Testing6
Touching surface: Conduction Fins Area: ConvectionAir flow holesMTG holes
Power: LowHeatsink material: Aluminum, Copper
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Natural Convection
Cooling Solution for IC Device Testing7
Simulated the two different Contact Areaof heatsink & IC top surface.
Definition: Design A1: Area 16.5 mm X 16.5 mmDesign A2: Area 10.0 mm X 10.0 mmHeat resource: 8 W
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Natural Convection
Cooling Solution for IC Device Testing8
Design A1 Design A2
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Natural Convection Result (conduction)
Item Design A1 Design A2Max Temp.(℃) 97.1 100.5
Cooling Solution for IC Device Testing9
q = - kA 𝛻T• q = heat flow vector, (W)• k = thermal conductivity, a thermodynamic property of the
material. (W/m K)• A = Cross sectional area in direction of heat flow. (m^2)• 𝛻 T = Gradient of temperature (K/m)• = ∂T/∂xi + ∂T/∂yj + ∂T/∂zk
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Natural Convection
Cooling Solution for IC Device Testing10
Heatsink can have wall fins, cross-cut fins or cylindrical fins.Refer to top views below for heatsink fins/types:
Design B1 Wall fins
Design B2Cross-cut fins
Design B3Cylindrical fins
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Natural Convection
Cooling Solution for IC Device Testing11
Design B1 Design B2 Design B3
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Natural Convection Result (convection)
Item Design B1 Design B2 Design B3
Max Temp.(℃) 97.1 87.5 77.1
Cooling Solution for IC Device Testing12
Newton’s Law of Cooling: q = h As ∆T• q = heat flow from surface, a scalar, (W)• h = heat transfer coefficient (which is not a thermodynamic property of the
material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid, etc. (W/m^2 K)
• As = Surface area from which convection is occurring. (m^2 )• ∆T = TS – T∞ = Temperature Difference between surface and coolant. (K)
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Fan
Cooling Solution for IC Device Testing13
IC power: MediumComponent: Fan, Heat sinkMedia: Air
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Fan
Cooling Solution for IC Device Testing14
Axial fans are recommended in force convection to cool the device.
Definition: Design C1: Fan 1 Max airflow 10.10 cfm. Design C2: Fan 2 Max airflow 31.30 cfm.Heat resource 20 W
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Fan
Cooling Solution for IC Device Testing15
Design C1 Design C2
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Fan
item Design C1 Design C2
Max Temp.(℃) 61.0 47.4
Cooling Solution for IC Device Testing16
Newton’s Law of Cooling: q = h As ∆T
h = heat transfer coefficient (which is not a thermodynamic property of the material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid, etc. (W/m2K)
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Liquid Cooling
Cooling Solution for IC Device Testing17
IC power: HighComponent: Pump, Heat sink Media: Water
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Liquid Cooling
Cooling Solution for IC Device Testing18
Series grooves: The three paths carry water one by one. Heat resource 300 W, die size 23 X 23 mm2.
Design D1
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Liquid Cooling
Cooling Solution for IC Device Testing19
Parallel grooves: 3 paths have a same start point.Heat resource 300 W die size 23X23 mm2.
Design D2
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Liquid Cooling
item Design D1 Design D2
Max Temp.(℃) 54.4 49.6
Cooling Solution for IC Device Testing20
Newton’s Law of Cooling: q = h As ∆T
h = heat transfer coefficient (which is not a thermodynamic property of the material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid (like as specific heat, thermal conductivity), etc. (W/m2K)
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Comparison
Cooling Solution for IC Device Testing21
Air Water
0
500
1000
1500
2000
2500
3000
3500
0 30 60 90 120 150 180
Spec
ific
heat
(Cp)
[J/(k
g*K
)]
Temperature[°C]
4150
4200
4250
4300
4350
4400
4450
4500
0 30 60 90 120 150 180Sp
ecifi
c he
at (C
p)[J
/(kg*
K)]
Temperature[°C]
Cp-water ≈ 4.2X Cp-air
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Comparison
Cooling Solution for IC Device Testing22
0
0.01
0.02
0.03
0.04
0.05
0 50 100 150 200
Ther
mal
con
duct
ivity
[W/(m
*K)]
Temperature[°C]
0.30
0.40
0.50
0.60
0.70
0.80
0 50 100 150 200
Ther
mal
con
duct
ivity
[W/(m
*K)]
Temperature[°C]
Air Water
K-water ≈ 30X K-air
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Fan W/Heat pipe
Cooling Solution for IC Device Testing23
IC power: high
Component: Fan, HS(heat pipe)+ Fins
Media: Air
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Force Convection: Fan W/Heat pipe
Cooling Solution for IC Device Testing24
Several heat pipesFinsFanothers
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Heat Pipe
Cooling Solution for IC Device Testing25
• Enclosed tube (Copper)• liquids • Phases change• Evaporation-Condensation cycle• Low heat loss
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Fan W/Heat pipe
Cooling Solution for IC Device Testing26
IC heat resource: 100 WDie size 19X18 mm2
Design E1: Heat PipesDesign E2: Copper Rods
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Fan W/Heat pipe
Cooling Solution for IC Device Testing27
Design E1 Design E2
526.5 ºC
Extreme TestingTestConX China 2019Session 3 Presentation 1
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Force Convection: Fan W/Heat pipe
item Design E1 Design E2
Max Temp.(℃) 74.9 526.5
Cooling Solution for IC Device Testing28
Material: E2 is using Copper rods. Copper thermal conductivity is 398 W/(m·K), while heat pipe thermal conductivity is over 10000 W/(m·K). Structure: E1 heat pipes internal liquids change phases while transferring heat but copper pipes not.Since heat pipes utilize phase changes process and benefit from very high heat transfer coefficients during boiling and condensation stages. therefore, heat pipes thermal conductivity is 10x greater than copper. Hence, heat pipes are highly effective thermal conductors.
Extreme TestingTestConX China 2019Session 3 Presentation 1
October 29, 2019TestConX China Workshop TestConX.org
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Conclusion
Cooling Solution for IC Device Testing29
• Fan cooling is using force air convection to improve performance.
• Water cooling is using water special specific heat property to get high performance.
• Heat pipes can transfer amount of heat from one end to another by internal liquids phase change.
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