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Page 1: October 29, 2019 InterContinental Shanghai PudongHotel Archive€¦ · Session 3 Presentation 1 TestConX China Workshop TestConX.org October 29, 2019 12 Natural Convection Result

Archive

October 29, 2019

InterContinental Shanghai Pudong Hotel

Page 2: October 29, 2019 InterContinental Shanghai PudongHotel Archive€¦ · Session 3 Presentation 1 TestConX China Workshop TestConX.org October 29, 2019 12 Natural Convection Result

Extreme TestingTestConX China 2019Session 3 Presentation 1

October 29, 2019TestConX China Workshop TestConX.org

1

Cooling Solution for IC Device Testing

Terence Miao, Quynh NguyenSmiths interconnect

Shanghai ▪ October 29, 2019

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Extreme TestingTestConX China 2019Session 3 Presentation 1

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2

Agenda

• Background • Heat Transfer• Structure • Natural Convection• Force Convection (Fan)

Cooling Solution for IC Device Testing2

• Force Convection (Liquid Cooling)

• Force Convection (Fan W/heat pipe)

• Conclusion

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Background

Cooling Solution for IC Device Testing3

• Billions of transistors.• Higher Power, Higher

Dissipation– Test socket probes damage.– IC thermal breakdown &

thermal runaway.– PCB thermal runway.

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Heat Transfer

Cooling Solution for IC Device Testing4

Sometime have phase changes while heat is being transferred.

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Structure

Cooling Solution for IC Device Testing5

• Device can be cooled from bottom side by PCB ground layers.

• Also, device can be cooled from top side by Hand Socket Lid (HSL) for Manual test and Work Press for Handler test.

• HSL or Work Press will have heatsink for heat dissipation by natural or force convection.

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Natural Convection

Cooling Solution for IC Device Testing6

Touching surface: Conduction Fins Area: ConvectionAir flow holesMTG holes

Power: LowHeatsink material: Aluminum, Copper

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Natural Convection

Cooling Solution for IC Device Testing7

Simulated the two different Contact Areaof heatsink & IC top surface.

Definition: Design A1: Area 16.5 mm X 16.5 mmDesign A2: Area 10.0 mm X 10.0 mmHeat resource: 8 W

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Natural Convection

Cooling Solution for IC Device Testing8

Design A1 Design A2

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Natural Convection Result (conduction)

Item Design A1 Design A2Max Temp.(℃) 97.1 100.5

Cooling Solution for IC Device Testing9

q = - kA 𝛻T• q = heat flow vector, (W)• k = thermal conductivity, a thermodynamic property of the

material. (W/m K)• A = Cross sectional area in direction of heat flow. (m^2)• 𝛻 T = Gradient of temperature (K/m)• = ∂T/∂xi + ∂T/∂yj + ∂T/∂zk

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Natural Convection

Cooling Solution for IC Device Testing10

Heatsink can have wall fins, cross-cut fins or cylindrical fins.Refer to top views below for heatsink fins/types:

Design B1 Wall fins

Design B2Cross-cut fins

Design B3Cylindrical fins

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Natural Convection

Cooling Solution for IC Device Testing11

Design B1 Design B2 Design B3

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Natural Convection Result (convection)

Item Design B1 Design B2 Design B3

Max Temp.(℃) 97.1 87.5 77.1

Cooling Solution for IC Device Testing12

Newton’s Law of Cooling: q = h As ∆T• q = heat flow from surface, a scalar, (W)• h = heat transfer coefficient (which is not a thermodynamic property of the

material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid, etc. (W/m^2 K)

• As = Surface area from which convection is occurring. (m^2 )• ∆T = TS – T∞ = Temperature Difference between surface and coolant. (K)

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Force Convection: Fan

Cooling Solution for IC Device Testing13

IC power: MediumComponent: Fan, Heat sinkMedia: Air

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Force Convection: Fan

Cooling Solution for IC Device Testing14

Axial fans are recommended in force convection to cool the device.

Definition: Design C1: Fan 1 Max airflow 10.10 cfm. Design C2: Fan 2 Max airflow 31.30 cfm.Heat resource 20 W

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Force Convection: Fan

Cooling Solution for IC Device Testing15

Design C1 Design C2

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Force Convection: Fan

item Design C1 Design C2

Max Temp.(℃) 61.0 47.4

Cooling Solution for IC Device Testing16

Newton’s Law of Cooling: q = h As ∆T

h = heat transfer coefficient (which is not a thermodynamic property of the material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid, etc. (W/m2K)

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Force Convection: Liquid Cooling

Cooling Solution for IC Device Testing17

IC power: HighComponent: Pump, Heat sink Media: Water

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Force Convection: Liquid Cooling

Cooling Solution for IC Device Testing18

Series grooves: The three paths carry water one by one. Heat resource 300 W, die size 23 X 23 mm2.

Design D1

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Force Convection: Liquid Cooling

Cooling Solution for IC Device Testing19

Parallel grooves: 3 paths have a same start point.Heat resource 300 W die size 23X23 mm2.

Design D2

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Force Convection: Liquid Cooling

item Design D1 Design D2

Max Temp.(℃) 54.4 49.6

Cooling Solution for IC Device Testing20

Newton’s Law of Cooling: q = h As ∆T

h = heat transfer coefficient (which is not a thermodynamic property of the material, but may depend on geometry of surface, flow characteristics, thermodynamic properties of the fluid (like as specific heat, thermal conductivity), etc. (W/m2K)

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Force Convection: Comparison

Cooling Solution for IC Device Testing21

Air Water

0

500

1000

1500

2000

2500

3000

3500

0 30 60 90 120 150 180

Spec

ific

heat

(Cp)

[J/(k

g*K

)]

Temperature[°C]

4150

4200

4250

4300

4350

4400

4450

4500

0 30 60 90 120 150 180Sp

ecifi

c he

at (C

p)[J

/(kg*

K)]

Temperature[°C]

Cp-water ≈ 4.2X Cp-air

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Force Convection: Comparison

Cooling Solution for IC Device Testing22

0

0.01

0.02

0.03

0.04

0.05

0 50 100 150 200

Ther

mal

con

duct

ivity

[W/(m

*K)]

Temperature[°C]

0.30

0.40

0.50

0.60

0.70

0.80

0 50 100 150 200

Ther

mal

con

duct

ivity

[W/(m

*K)]

Temperature[°C]

Air Water

K-water ≈ 30X K-air

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Force Convection: Fan W/Heat pipe

Cooling Solution for IC Device Testing23

IC power: high

Component: Fan, HS(heat pipe)+ Fins

Media: Air

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Force Convection: Fan W/Heat pipe

Cooling Solution for IC Device Testing24

Several heat pipesFinsFanothers

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Heat Pipe

Cooling Solution for IC Device Testing25

• Enclosed tube (Copper)• liquids • Phases change• Evaporation-Condensation cycle• Low heat loss

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Force Convection: Fan W/Heat pipe

Cooling Solution for IC Device Testing26

IC heat resource: 100 WDie size 19X18 mm2

Design E1: Heat PipesDesign E2: Copper Rods

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Force Convection: Fan W/Heat pipe

Cooling Solution for IC Device Testing27

Design E1 Design E2

526.5 ºC

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Force Convection: Fan W/Heat pipe

item Design E1 Design E2

Max Temp.(℃) 74.9 526.5

Cooling Solution for IC Device Testing28

Material: E2 is using Copper rods. Copper thermal conductivity is 398 W/(m·K), while heat pipe thermal conductivity is over 10000 W/(m·K). Structure: E1 heat pipes internal liquids change phases while transferring heat but copper pipes not.Since heat pipes utilize phase changes process and benefit from very high heat transfer coefficients during boiling and condensation stages. therefore, heat pipes thermal conductivity is 10x greater than copper. Hence, heat pipes are highly effective thermal conductors.

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Conclusion

Cooling Solution for IC Device Testing29

• Fan cooling is using force air convection to improve performance.

• Water cooling is using water special specific heat property to get high performance.

• Heat pipes can transfer amount of heat from one end to another by internal liquids phase change.

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COPYRIGHT NOTICEThe presentation(s)/poster(s) in this publication comprise the Proceedings of the 2019 TestConX China workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2019 TestConX China workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2019 TestConX China workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by TestConX or the workshop’s sponsors.

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