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Tarek R. Abdel-Alim GL Doha Station 1 TOFD BETWEEN SIMPLICITY AND COMPLCITY BY Eng. Tarek R. Abdel-Alim

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TOFD Presentation

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Page 1: TOFD Presentation

Tarek R. Abdel-Alim GL Doha Station 1

TOFD BETWEEN SIMPLICITY AND COMPLCITY

BY

Eng. Tarek R. Abdel-Alim

Page 2: TOFD Presentation

Tarek R. Abdel-Alim GL Doha Station 2

TOFD Introduction

Time of flight Diffraction (TOFD) is an accurate defect sizing UT technique not depend on sound amplitude reflected from defect.

TOFD Uses longitudinal (compression) waves. TOFD Pair of transducers are considered as part of AUT

system arrangements ( one or two channels of the multi channel system).

TOFD could be used with both of Pulse echo or phased Array Techniques.

Sizing of defect not related to its orientation.

Page 3: TOFD Presentation

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The Diffraction Phenomenon

Huygens' principle:

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TOFD CONCEPT & THEORY

The Time of Flight Diffraction technique employs the use of two compressional wave transducers using angles between 30°and 70°set at a calculated distance (Probe Centre Spacing “PSC”) apart in the pitch and catch mode.

When the compressional wave strikes a defect diffracted waves are generated from the extremities of the defect (oscillation of defect ends).

The diffracted waves are detected by the receiving transducer.

Page 5: TOFD Presentation

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TOFD CONCEPT & THEORY

The first signal received (1) is from the lateral wave.This is a creeping wave at the surface with the same velocity of the compressional or longitudinal waves.The second (2) and third (3) signals are the diffractedwaves from the tips of the flaw. The fourth (4) signalis the back-wall representing one complete sound path. The signals past the back-wall are mode converted Shear wave.

Page 6: TOFD Presentation

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TOFD Transducer Arrangement

Dual Transducer Technique.Transmitter and Receiver mounted typically opposite of and symmetrically about the volume of interest.Typically mounted at fixed probe centre spacing (PCS).

Page 7: TOFD Presentation

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Crack Tip Diffraction

Diffraction occurs at both top and bottom tips

Page 8: TOFD Presentation

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Volumetric Discontinuities

Reflection produces response from the top of the discontinuityCreeping wave produces response from the bottom of the discontinuity.

Page 9: TOFD Presentation

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Manual TOFD Hand Scanner

Page 10: TOFD Presentation

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TOFD Standing Wave Pattern

Page 11: TOFD Presentation

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Typical TOFD Display

Page 12: TOFD Presentation

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TOFD Waveform with Mid-wall Discontinuity

Page 13: TOFD Presentation

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TOFD Depth Measurement

Constant depth loci form an ellipse with the beam index points the focal points.Consequently, some minor error for lateral position offset.

Page 14: TOFD Presentation

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Amplitude Independent

•Depth calculations based on pulse transit time•therefore, so long as gain is sufficient for detection•size calculation will not change

Page 15: TOFD Presentation

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TOFD Implementation –Weld Inspection Application

Beam angle, transducer size, and PCS set to flood weld volume.Uni-axial scan along weld length “B or D Scanning mode”.Dead zone near test surface due to inability to resolve flaws from lateral wave.Maximum thickness (single scan) is about 2-2.5 inches.

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Near-Surface Dead Zone

For near-surface flaws, time difference between lateral and flaw is not sufficient to separate the two, therefore, near-surface flaws are hidden by lateral wave.increased PCS worsen the effect.

Page 17: TOFD Presentation

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Improved Near-Surface Detection and Sizing Resolution

• Narrower PCS.• Higher frequency probes.• heavier probe damping (broader bandwidth).

Page 18: TOFD Presentation

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Depth Zone Coverage

Deeper zones generally use:1. larger transducers.2. lower frequency.3. lower refracted angle.4. larger PCS.

Page 19: TOFD Presentation

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TOFD Imaging

Page 20: TOFD Presentation

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2-Dimensional Raster Scan TOFD

Page 21: TOFD Presentation

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TOFD Image Showing No Indications

Page 22: TOFD Presentation

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Creep Macro-Crack

Page 23: TOFD Presentation

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TOFD technique advantages

TOFD technique offers the following advantages in comparison to radiography:

I- Radiation hazard-free area – This allows work to be performed by other personnel in the vicinity of the examination area without any radiation safety precautions.

II- Fast, accurate results – This process provides information at the examination area without the need to develop film, determine radiograph quality conformance (i.e. density and sensitivity) and film interpretation.

III- Less expensive than radiography per foot of weld.

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TOFD technique advantages

IV- Volumetric information – As opposed to radiography that provides a 2-D view of a weldment, and radiography’s detection difficulty with cracks not directly oriented to the cone of radiation, this process can provide accurate length and depth information of recorded indications.

V- Permanent record – The scan image files can be saved for future reference and evaluation.

Page 25: TOFD Presentation

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Codes and standard

British Standard. European ASME ASTM API 1104 “19th Edition”

1. BS 7706 (1993) Guide to calibration and setting-up of the ultrasonic time-of-flight diffraction (TOFD) technique for detection, location, and sizing of flaws. British standards Institute 1993.

Page 26: TOFD Presentation

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Codes and standard

2. pr EN 583-6 (1995) Non-destructive testing ultrasonic examination - Bart 6: Time-of-flight diffraction technique as a method for defect detection and sizing.

3. ASME VIII Code Case 2235 (2000 Edition) Ultrasonic examination to be in accordance with ASME Section V, Article 4 "Alternatively, for techniques that do not use amplitude recording levels, ...'. This has opened the door for TOFD to be used on Section VIII pressure vessels

Page 27: TOFD Presentation

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Codes and standard

4. In 1998 ASTM E-1961 was published describing the various aspects involved in pipeline inspection using mechanised UT.

5. In the 19th edition API 1104 they revised its description of UT requirements to include mechanised systems.

Page 28: TOFD Presentation

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TOFD Limitations

1. Blind area - near surface, back-wall.

2. Weak signals.

3. Couplant loss.

4. Flaw classification limitation.

5. Interpretation of defects.

6. Sensitive to grain noise.

7. Coarse grained materials.