ti information – selective disclosure © robert baumann 9/18/2013 ti information – selective...

TI Information – Selective Disclosure© Robert Baumann

9/18/2013 TI Information – Selective Disclosure© Robert Baumann

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Industrial challenges and trends in terrestrial single-

event effects (SEE) Dr. Robert Baumann

TI/IEEE Fellow, Technology OfficeAerospace & Defense (MHRS Group)High Performance Analog Products

Texas Instruments, Dallas, Texas, USA



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Natural• Terrestrial Background (neutrons and a particles)• Avionics (neutrons)• Space (protons, heavy ions, electrons)

Man-made• Accelerators/Nuclear reactors (x-ray, gamma,

proton, neutron, etc.)• Weapons (x-ray, gamma, neutrons)• Industrial/Security (x-ray, gamma, e-beam)• Medical (x-ray, gamma, protons, neutrons, e-beam)

Radiation Environments



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Flux, Total Ionizing Dose, and Neutron/Proton Dose Comparison

Adapted from M. Brugger (CERN)



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Energetic Ions in MatterGenerated with SRIM 2008

5 MeV He in Silicon

Generated with SRIM 2008

27 um

Silicon surface



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Physical Manifestations of Radiation• Transient Charge Generation

• Charge Trapping/Interface Damage• Nuclear Reactions

• Structural (Lattice) Damage

Dose Effects

Single EventEffects

Dose Rate Effects

stochasticchronic



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Basic Reliability Definitions

Soft Failure (glitch, noise, SEE)An event corrupting only the DATA stored in a device. The device itself is not damaged and functionality is restored when new data is written.

Hard Failure (GOI, EM, NBTI, ESD,…TID, ND, SEE)

An error induced by faulty device operation. DATA is lost AND function is lost and can no longer operate at that location.

hrs.dev10

failure 1 FIT 1

9

1 FIT is 1 failure in 114,155 years!

or 1,000,000 FIT is ~ 1 failure/month



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Who cares about SEE (SEU, SEL)?

Don’t Care Really Care

CatalogDSP,MSP,

MCUs etc.

1 MFIT/chip ok(~1 fail/month)

< 1 kFIT/Chip(~ 1 fail/114 yrs)

• High Reliability• Multi-chip systems• Life support• Safety systems• Medical electronics• Automotive, Avionics

• Consumer Goods

• Single-chip

• Non-critical

• Cell phones

• MP3 Players



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BIG Business Impact

Loss of revenueLoss of customer confidence =

Sun ScreenDaniel Lyons, Forbes Global, 11.13.00

mysterious glitch has been popping up since late last year… for America Online, Ebay and dozens of other major corporate accounts…The SUN (server) has caused crashes at dozens of customer sites. An odd problem involving stray cosmic rays and memory chips in the flagship Enterprise server line…

A dotcom company bought a Sun 6500 server to run…the core of its business. The server crashed and rebooted four times over a few months. "It's ridiculous. I've got a $300,000 server that doesn't work. The thing should be bulletproof," says the company's president.



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Safety Impact: QANTAS Flight 72

Single subatomic event has human-scale impact!

“In-flight upset, 154 km west of Learmonth, WA, 7 Oct. 2008, VH-QPA Airbus A330-303,” ATSB Transp. Safety Report - Aviation Occurrence Invest., AO-2008-070, pp. 1 – 313, Dec. 2011.



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Terrestrial + Avionics Environments

Alpha particles and neutrons



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0

20

40

60

80

100

0 2 4 6 8 10

Alpha Energy (MeV)

Inte

nsi

ty (

arb

itrary

units

)

232Th

Actual & Simulated alpha spectra

0

200

400

600

0 2 4 6 8 10

Alpha Energy (MeV)

Inte

nsity

(ar

bitr

ary

units

)

0

1000

2000

3000

4000

0 2 4 6 8 10

Alpha Energy (MeV)

Inte

nsity

(ar

bitr

ary

units

)

Package-simulation

U:Th (50:50)

Measured Thick 232Th

0

20

40

60

80

100

0.0 2.0 4.0 6.0 8.0 10.0

Alpha Energy (MeV)

Inte

nsi

ty (

arb

itrary

units

)

238U



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Alpha Particles from Materials• Distributed throughout materials

• Flux depends on types of materials & purity

• Most of the alphas are from packaging

• Ultra low alpha materials < 0.002 a/cm2-hr



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Cosmic CascadeSingle Incoming Cosmic Particle

p-

m-

p±

m±e

-

gg

g

po

g

e-

e+

e±

m+

p+

P

N

m-

m+

m+

J. F. Ziegler, “Terrestrial Cosmic Ray Intensities,” IBM J. Res. Develop., Vol. 42(1), p. 125, Jan. 1998.



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Rela

tive

Neu

tron

Flu

x (s

ea-le

vel=

1)

0

50

100

150

200

250

300

350

400

0 5 10 15 20Altitude (km)

.

Flight Altitudes

Terrestrial Altitudes

Effect of Altitude/Latitude

at 3,000 meters relative neutron flux ~ 11x higher than sea-level

Adapted from Eugene Normand, “Single Event Effects in Avionics”, IEEE Trans. Nucl. Sci., 43(2), April 1996, pp. 463.

equatorial polar0.0

1.0

2.0

3.0

4.0

5.0

6.0

0 10 20 30 40 50 60 70 80 90

Latitude (degrees)

Rela

tive

Neu

tron

Flu

x

Sea-level

Flight altitudes

North

South

25

G.A. Glatzmaier and P.H. Roberts, "Rotation and magnetism of Earth's inner core," Science, 274, 1887-1891 (1996).



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10B and Thermal Neutrons10B

Thermal neutron

4He

7Li

Oxy

gen

10-3

10-2

10-1

100

101

102

103

104

s nth

(bar

ns)

Tung

sten

Tita

nium

Arse

nic

Copp

er

Nitr

ogen

Alum

inum

Boro

n-11

Phos

phor

us

Silic

on

BORO

N 1

0

1.47 MeV

0.84 MeV

R. Baumann, T. Hossain, E. Smith, S. Murata, H. Kitagawa, “Boron as a primary source of radiation in high density DRAMs”, IEEE Symp. VLSI Tech., June 1995, pp. 81 - 82

Generated with SRIM



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Single Event Effects (SEEs)

A single event (nuclear reaction or energetic ion) creates transient charge that induces a disruption in circuit operation or data state.

Typically SEE are very rare events (1 per month, etc.)

Of all possible nuclear events only a fraction can cause a SEE

Of all possible SEE only a few will cause machine state failures (derating effects)



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SEU and SEL – Most Common SEE

Ion Track+V

n+ diffusionp- epi

Recombination

Diffusion Collection

Potential Contour

Deformation

Electron-Hole Pairs

Electron

collectionDrift Collection

Reverse-biased N+/P junction

V Ion Track

Parasitic bipolar action

Single Event Upset Single Event Latch Up



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FINFET

Planar

Magnitudes from two different curves cannot be compared as these curves were individually normalized!

SRAM/DRAM Bit SEU Scaling Trend

R. H. Edwards, C. S. Dyer, E. Normand, “Technical standard for atmospheric radiation single event effects, (SEE) on avionics electronics”, IEEE Rad. Effects Data Workshop, 2004, pp. 1 - 5

DRAM sensitivity has been decreasing with scaling

SRAM sensitivity has been decreasing with scaling (since

the 130nm node)



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Future Terrestrial Mechanisms?

n + a SER

When Qcrit reaches 0.2 fC SER will double from muons alone and at 0.1 fC SER will be 5-10x higher. Note: Qcrit for 40nm is ~ 0.5 fC

Adapted from B. Sierawski et al., “Effects of Scaling on Muon-Induced Soft Errors”, 2011 IEEE IRPS, pp. 3C.3.1 - 3C.3.6. (with TI)

Muon SEU

From B. Sierawski et al., “Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions”, IEEE Trans. NS, 56 (6), Part 1, Dec. 2009, pp. 3085 - 3092 (with TI)

Terrestrial Protons may also dominate as Qcrit is reduced due to the much higher cross-section for direct ionization.

Proton SEU

s for direct ionization

s for prior technologies



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Accelerated Testing& Facilities



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Extrapolating Neutron ResultsActual neutron particle flux (≥

10MeV n/hr/cm2) reaching the Sias defined by JEDEC JESD89A

nASER Test

Neutron Sensitivity(errors/neutron/cm2)

Failure rate due to neutrons

(errors/hr)always induce

> 100 upsets per test so that s ≤ 10%)

Neutron beam

Conversion of TTL ULC from U238 foil

to actual n/hr-cm2

(≥ 10MeV)

NYCSea-level

= 13 n/hr/cm2

sources are inexpensive and in-house BUT extrapolating the alpha-particle SEE is much more difficult and requires simulation



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shutter DUT

Tungstenspallation

target

master

shutter

30ºR 15ºR 0º 15ºL

30ºL

Neutron beams

Fission Foil

Proton beam

Accelerated Neutron Testingneutron test procedure in JESD89

and JESD89A

1E-07

1E-06

1E-05

1E-04

1E-03

1E-02

1 10 100 1000

Neutron Energy (MeV)

Neu

tron

s/cm

2-se

c-M

eV

WNR Beam / 1.38E08Atmosphere

Close match between terrestrial background spectrum and Los Alamos means extrapolation is based on a simple multiplication



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Svedberg Laboratory, Uppsala University, Sweden (TSL, ANITA)

Los Alamos Neutron Science Center - Ice House (LANSCE), New Mexico, USA

x Tri-University Meson Facility - Univ. of British Columbia (TRIUMF)

+ Research Center for Nuclear Physics - Osaka University (RCNP)

Vesuvio Beamline - Rutherford Appleton Lab, Oxfordshire, UK (ISIS)

JEDEC JESD89A “standard” flux x (3x108)

From Charlie Slayman, “Theoretical Correlation of Broad Spectrum Neutron Sources for Accelerated Soft Error Testing”, IEEE Nuclear and Space Radiation Effects Conference (NSREC), Denver, July 22, 2010 (to be published Trans. on Nuc. Sci. December 2010)

“Atmospheric” Neutron Test Facilities

Extend En > 800MeVNeed for muon testing will grow



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Summary• SEE sensitivity is decreasing with new generations due to Vdd saturation,

HOWEVER increased bit density leads to similar or increasing system SER.

• Nano-devices may offer improved resilience against SEE (bulk/SOI FinFETs, etc.) but will NOT eliminate them. Protons and muons are a growing concern and 10B reactions with thermal neutrons can still be a risk.

• SER is application-specific so one failure rate specification for all products is NOT viable (e.g. for catalog products). Extensive support for radiation effects engineers needed to extrapolate reliability in a wide variety of environments.

• Vendors that ignore the soft error problem will end up paying for it in loss of customer confidence – leading to significant revenue and market share loss.

• Control and detection electronics in accelerator facilities share many of the problems induced by terrestrial and avionics radiation environments (typically at much higher equivalent fluxes).

• Use of space-grade or enhanced COTS may be required for many accelerator applications and/or fault-tolerant system design.

ti information – selective disclosure © robert baumann 9/18/2013 ti information – selective...

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