quantum fluctuations in low-dimensional superconductors · hamiltonian of a supercondcuting...
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Quantum Fluctuations in Quantum Fluctuations in LowLow--Dimensional SuperconductorsDimensional Superconductors
К. Arutyunov
MIEM HSE & Kapitza Institute, Moscow
Novosibirsk, 22-26.06.2015
Acknowledgements: Eksperiment: M. Zgirski, T. Hongisto, J. Lehtinen and T. Rantala
Discussions:
D. Averin, T. Baturina, F. Hekking, T. Heikkila, L. Ioffe, Y. Nazarov, J. Pekola, V. Vinokur, A. Zaikin
H. K. Onnes,
Commun. Phys. Lab.12,120, (1911)
x(T)
√s < x(T)<< L Long 1D wire of cross section s
If the wire is infinitely long, there is always a finite probability that in some fragment(s) the magnitude of the order parameter instantly becomes zero and the phase changes by 2p
The minimum length the superconductivity can be destroyed is the coherence length x(T)
The minimum energy corresponds to destruction of superconductivity in a volume x(T) s: DF = Bc
2 x(T) s, where Bc(T) is the critical field
In the limit rare events the probability of the process P(T) ~ exp (- DF / E )
Thermal activation: E ~ kBT.
Important at TTc.
Quantum: E ~ D.
Weak temperature dependence, exist even at T0
In current state the particular manifestation of a quantum fluctuation when magnitude of the order parameter momentary nulls and phase changes by ±2π is often called “phase slip”
QPS contributionQPS contribution A. Zaikin, D. Golubev, A. van Otterlo, and G. T. Zimanyi, PRL 78, 1552 (1997)
A. Zaikin, D. Golubev, A. van Otterlo, and G. T. Zimanyi, Uspexi Fiz. Nauk 168, 244 (1998)
D. Golubev and A. Zaikin, Phys. Rev. B 64, 014504 (2001)
Full model (G-Z)
where SQPS = A·[(RQ / x) / (RN / L)], RQ = h / 4e2 = 6.45 kW, D = energy gap,
RN = normal state resistance, L is wire length, x =0.85(x0l)1/2 is coherence length
A ≈ b ≈ 1 are numerical parameters.
Essentially, there is only one fitting parameter: A ≈ 1. For a dirty limit superconductor: GQPS ~ exp (-A’sTc
1/2/rN), where s is the wire diameter and rN is the normal state resitivity.
Materials with low Tc and high resitivity rN are of advantage!
QPS
QPSS
T
LSTbTR 2exp
)(
)()(
2
0
D
x
In the limit R(T)<<RN QPSs are activated at a rate: GQPS = EQPS /h=D0[(RQL2)/(RNx2)] exp (-SQPS)
1D samples: fabrication & shape 1D samples: fabrication & shape controlcontrol
Si
CopPMMA
EBL
patterning
Si
CopPMMA Deposition:
e-gun,
sputtering
Al,Sn,Bi
Si Liftoff
Si IBE
Ar+
~100 nm
Ion beam provides polishing and gradual reduction of the cross-section
Penetration depth of 1 keV Ar+ ions inside Al or Ti matrix < 2 nm
AFM image of a typical Ti nanowire. Inset shows the surface roughness ±1 nm.
Objective: to enable measurements of the same nanowire with progressively reduced diameter
Evolution of Al nanowire after several sessions of ion milling.
TEM analysis of the ion milled nanowire cross sectionTEM analysis of the ion milled nanowire cross section
Dashed lines: thermally activated fluctuations (LAHM) at T ~Tc Solid lines: quantum fluctuations (Golubev – Zaikin) model at T << Tc
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R
(W)
QPS
Nanowire 1
T (K)
d = 29 nm
d = 35 nm
d = 50 nm
d = 54 nm
d = 58 nm LAHM
Aluminium Titanium
M. Zgirski, K.-P. Riikonen, V. Touboltsev, and K. Arutyunov. // Nano Letters 5, 1029--1033 (2005). M. Zgirski, K.-P. Riikonen, V. Touboltsev and K. Yu. Arutyunov.// PRB 77, 054508-1 -- 054508-6 (2008). J. S. Lehtinen, T. Sajavara, K. Yu. Arutyunov, M. Yu. Presnjakov, and A. S. Vasiliev // PRB 85, 094508 (2012).
NbN is a highly disordered (= highly resistive) superconductor
0.8 0.9 1.0
1E-4
1E-3
0.01
0.1
1 RN (W) Tc(K) A
Sample 211 100000 12.0 0.33
Sample 313 83181 12.0 0.30
Sample 315 39436 11.5 0.16
Sample 421 32343 12.8 0.16
Sample 425 21000 13.3 0.11
Sample 116 14200 13.0 0.10
R/R
N
T/Tc
x = 5 nm
L 5 m
We studied more than 40 samples:
4 and 8 nm thick nanowires, width
from 30 nm to 60 nm, length 5 um.
R□ varied from 15 W to 100 W .
The experimental width of the R(T) transition correlates well with the resistance in normal state RN. The shape of the R(T) transition can be nicely fit with the model of QPS. As expected, TAPS model provides much steeper transition.
Samples were fabricated in MPI-Moscow (Goltsman, Korneev, Semenov, An)
In collaboration with A. Zaikin , A. Semenov
& P. Lähteenmäki, T. Nieminen and P. Hakonen
LT Lab, Aalto University, Finland
ExperimentExperiment
Array of 100 parallel wires
Expectations
eV<<kBT (Johnson noise)
Sv
T Tc
Bulk superconductor
eV≥kBT (shot noise)
SI
I Ic
Bulk superconductor
f=Fano factor
QPS nanowire QPS nanowire
Shot noise due to phase slipsShot noise due to phase slips Current shot noise due to charge pulses:
22 2IS eI e f random pulses – white noise
Voltage shot noise due to phase slips:
2
0 02 2VS f V random pulses – white noise
Q Idt
Vdt
0 =2
h
e
Switch to flux quantum:
02
VV
SF
V
0e
ThermallyThermally activated phase slips activated phase slips
00 sinh
2 B
IV
k T
G
2 002 cosh
2V
B
IS
k T
G
0
0
coth2 2
VV
B
S IF
V k T
D.S. Golubev and A.D. Zaikin, Phys. Rev. B 78, 144502 (2008)
0
0 0
(0) 2coth
2 2
V V BV
B
S S I k TF
V k T I
0 2 BI k T
0 2 4 6 8 100.0
0.2
0.4
0.6
0.8
Experimental results: B=0
B=0: ‘Slices’
Johnson noise @ various currents
Finite noise @ T<Tc
Shot noise @ various temperatures
Finite noise @ I<Ic Jump @ I≈Ic
Experimental results: B=35 G
B=35 G: ‘Slices’
Johnson noise @ various currents
Finite noise @ T<Tc (not much difference compared to B=0)
Shot noise @ various temperatures
Finite noise @ I<Ic higher than in normal state!
(0)V VS S
Excess noise vs Excess noise vs biasbias
FanoFano factor of factor of 34 nm wire34 nm wire 10
-910
-80
5000
10000
15000
dV
/dI (W
)
I (A)
10-9
10-8
0
2
4
6
8
F
I (A) Shot noise due to phase slips observed: quantum? Shot noise of phase slips close to the Poissonian value Above the critical current, large shot noise, Fano ~ 5
ConclusionConclusion on transport on transport measurementsmeasurements
In aluminium nanowires with diameters below 15 nm in titanium – below 35 nm and in NbN below 30 nm quantum fluctuations manifest themselves by broadening the R(T) transition. In the thinnest samples zero resistivity is not reached even at T→0.
In thinnest titanium nanowires finite noise is observed at T<<Tc and I<<Ic (?).
Fluctuations of the order parameter D=D0exp(i)
T. Rantala, MSc thesis, University of Jyvaskyla, 2013
Direct Direct determinationdetermination of the of the fluctuatingfluctuating energyenergy gapgap
Superconducting gap can be associated with E/M radiation absorption threshold
dD / D ~ (SQPS ) -1
Characteristic scale D(Al)~80 to100 GHz, D(Ti)~15 to 25 GHz.
dD /D can reach 30% in sufficently thin nanowires
BULK QPS
TunnelingTunneling in NIS and SIS in NIS and SIS systemssystems M. Tinkham, Introduction to supercondcutivity, Mc. Graw-Hill, 1996
Quantum fluctuations of the gap D should lead to extra (size dependent) broadening of the gap edge
NIS SIS
ExperimentExperiment
0 100 200 300 400 5001000
10000
100000
Wire#2 DM31: deff
= 31±3 nm
Wire#4 DM31: deff
= 36±3 nm
Wire#2 DM30: deff
= 37±3 nm
Wire#4 DM30: deff
= 40±3 nm
Wire#5 DM30: deff
= 45±3 nm
R(O
hm
s)
T(mK)
R(T) of each nanowire and I(V) chartacteristic between the nanowire and the aluminium electrode can be measured independently.
R(T) dependencies at these diameters are broad associated with QPS.
Schematic of the experiment
SIS I(V) at various diameters of nanowiresSIS I(V) at various diameters of nanowires
-0.2 -0.1 0.0 0.1 0.2
5.0x10-5
1.0x10-4
1.5x10-4
wire#2, deff
=31 nm
wire#4, deff
=36 nm
dI/dV (S)
V(mV)
T=20 mK
Sample DM31
-0.2 -0.1 0.0 0.1 0.20.0
2.0x10-6
4.0x10-6
6.0x10-6
8.0x10-6
1.0x10-5
1.2x10-5
wire#2, deff
=31 nm
wire#4, deff
=36 nm
dI/dV (S)
V(mV)
T=20 mK
Sample DM31
D1D2 features and Coulomb blockade and/or Josephson current (?)
0.19 0.20 0.21 0.22 0.23 0.24 0.25 0.26 0.27
0.0
5.0x10-5
1.0x10-4
1.5x10-4
wire#2, deff
=31 nm
wire#4, deff
=36 nm
dI/dV (S)
V(mV)
T=20 mK
Sample DM31
D1+D2 features
The smaller the nanowire diameter (1) the smaller the average value <D> and (2) the larger the gap smearing dD.
SimulationsSimulations We simulate I(V) dependencies assuming Gaussian distribution of the
gap fluctuations centered at <D> with standard deviation dD.
0
20
40
60
80
100
35 40 45 50 55 60
N
<D>=48 V dD3 V
Limitations & postulates: • Gaussian distribution of quantum fluctuation amplitude
• Cut-off Dbulk /2 < D < Dbulk
• Finite magnitude of voltage modulation and finite lock-in integration time
0.0E+00
4.0E-05
8.0E-05
1.2E-04
1.6E-04
2.0E-04
2.0E-04 2.2E-04 2.4E-04 2.6E-04
dI/dV (S)
V (V)
DM31, Wire#4 d = 36 ±3 nm
Thick (conventional)
superconducting wire
Thin wire and low-W environment
Very thin wire and high-W environment:
Coulomb blockade
Ti nanowire in Ti nanowire in lowlow--OhmicOhmic environmentenvironment
Differential resistance dV/dI, normalized by the normal state resistance RN, as function of the bias current I.
In ‘thick’ samples one observes the zero resistance state below the critical current. With reduction of the wire diameter the ‘residual’ critical current disappears and the finite resistance is observed .
D. V. Averin and A. A. Odintsov, Phys. Lett. A 140 (1989) 251 J. E. Mooij and Yu. V. Nazarov, Nature Physics 2 (2006) 169
A. M. Hriscu and Yu. V. Nazarov. Phys. Rev. B 83, 174511 (2011)
Hamiltonian of a supercondcuting nanowire in the regime of quantum fluctuations:
is dual to the corresponding Hamiltonian of a Josephson junction:
with the accuracy of substitution:
The extensively developed physics for Josephson systems can be ‘mapped’ on
the superconducting nanowires in the regime of quantum fluctuations.
eqEEEE QPSJLC 2/, , p
EL , EC , EJ and EQPS are the inductive, charging, Josephson coupling and
QPS energies, is phase and q is quasicharge.
A.M. Hriscu and Yu. V. Nazarov. Phys. Rev. B 83, 174511 (2011)
The mandatory requirement for the charge effects
observation is the high impedance of the environment:
current bias charge is a ‘good’ quantum number.
QPS is a dynamic equivalent of a
conventional (static) tunnel junction.
First two terms correspond to linear LC oscillator. If to shift the
charge variable by q/2e, the induced charge disappears from the
oscillator part, while the QPS amplitudes acquire the phase factors:
The charge sensitivity is purely due to the coherent
QPS term: the induced charge q/2e affects the
interference of the phase slips with two opposite
directions ±2π.
Let us consider the simplest case of a QPS Copper pair box:
HighHigh--OhmicOhmic environmentenvironment
Purely dissipative environment: high-Ohmic normal metal probes with Rprobe up to 10 MOhm
24 24 nmnm titaniumtitanium nanowirenanowire, 10 M, 10 MWW contactscontacts
All three neighboring parts of the same multiterminal structure demonstrate the same value of the Coulomb gap. The effect disappears above Tc and/or Hc.
Temperature dependenciesTemperature dependencies
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
I (1
0-1
0 A
)
V
Structure 170212
Sample#3
100 V
23 mK
100 mK
200 mK
300 mK
400 mK
0 200 400 600 800 1000
100000
1000000
1E7
1E8
S3 no sput
S3 8k sput
S2 no sput
dV
/dI(
Ohm
s)
T (K)
RN
-0.02 -0.01 0.00 0.01 0.02
1000000
2E6
3E6
SET170212
Sample#3
B=0
575 mK
500 mK
400 mK
200 mK
23 mK
dV
/dI
(Ohm
s)
Vgate(V)
Ibias
= 0 nA DC + 70 pA AC
The Coulomb gap and the gate modulation
disappear above 450 mK (the Tc of Ti?).
Magnetic field dependenciesMagnetic field dependencies
-0.02 0.00 0.02
2E8
3E8
4E8
B = 68 mT
B = 3.85 T
B = 25 mT
B = 0
dV
/dI(
Oh
ms)
Vgate(V)
SET170212
Sample#2
T=100 mK
0 1 2 3 4
0
5
10
15
20
25
30
SET170212
Sample#2
T=100 mK
dV
CB
(Ib
ias =
0),
uV
B(T)
At a given (low) temperature the Coulomb gap and the gate modulation disappear above certain magnetic field
(the Bc of Ti?).
Digest on QPS Digest on QPS transistortransistor • Quantum phase slip and Josephson tunneling are the
phenomena described by identical Hamiltonians: the quantum dynamics is indistinguishable.
• Supercondcuting nanowire (homogeneous!), in the regime of QPS, is the dynamic equivalent of a Josephson junction.
• Containing no static (in space and time) junctions, QPS nanowire can sustain much higher currents and has no undesired two-level ’fluctuators’ present in tunnel contacts.
• All phenomena, observable in Josephson systems, can be observed in QPS nanowires.
Josephson junction: critical current
QPS wire: critical voltage
Josephson junction: voltage steps
(Shapiro effect)
QPS wire: current steps
Electron transport in a Cooper pair transistor is a periodic process
corresponding to cyclic charging/discharging of the central island by 2e.
Syncronisation of the process with external drive should lead to resonance.
NotNot--tootoo--highhigh--WW environment (50 kenvironment (50 kWW))
0.00 0.34 0.68 1.02 1.36
4.1
4.2
dV
/ d
I (a
rb.
un
its)
I (nA)
TiWire290710_part34_
f(RF) =1GHz
Arrows mark the prediction I =n×2e ×fRF
0 1 2 3 4 5 6 7 8 9 10
1
2
3
TiBi260210
sample#3
T=18 mK
fRF
=350 MHz
VRF
=100 mV
dV
/ d
I (a
rb.
un
its
)
I / (2e)f
dV/dI at fRF=350 MHz and amplitude 100 mV. Current is normalized by (2e)×fRF. One can distingush steps with quantum number n≤8.
RFRF--inducedinduced stepssteps at at highhigh frequencyfrequency With the increase of the RF frequency (= larger value of the current) the width
of the steps increases, but the noise increases and (sub)harmonics appear.
400 450 500 550 600 650
0.00
0.61
1.22
1.83
2.44
3/1
1/1
TiBi260210
sample#1
T=75 mK
fRF
=3.8 GHz
VRF
=45 mV
I
(nA
)
V (mV)
2/1
4/1
1/2
Red arrows correspond to the expectations for charge (2e) and the blue arrows – to single electron oscillations (e).
WidthWidth of the of the currentcurrent stepstep vs. RF vs. RF radiationradiation amplitudeamplitude
Width of the n-th step current step dVn~(-1)nJn(a)sin(q),
where q – quasicharge, a – amplitude of the RF radiation, Jn – Bessel function
[D. V. Averin and A. A. Odintsov, Fizika Nizkix Temperatur, 16, 16 (1990)]
0 50 100 150 200 250 300 350
0
10
20
30
40
50
60
70
80
90
100
110
dV
(m
V)
VRF (mV)
2/1 step
0/1 step x 0.1
(blockade width)
TiBi260210
sample#1
T=18 mK
fRF
=3.8 GHz
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
1/2
3/1
1/1
4/1
TiBi260210
sample#1
T=18 mKI e
xp (
nA
)
2ef (nA)
2/1
Red symbols correspond to Bloch steps (2e), blue – single electron (e), black – 1st subharmonic of single electron oscillations.
SimulatedSimulated BlochBloch stepssteps
C. H. Webster, J. C. Fenton, T. T. Hongisto, S.P. Giblin, A. B. Zorin, and P. A. Warburton, PRB 87 144510 (2013)
Simulated I-V characteristics of a NbSi nanowire for a
continuous-wave ac signal with various amplitudes and
frequency 1 GHz at T= 0, 33, 200 and 500 mK.
where Vn(t) is noise with rms amplitude
Sharpness of the Bloch steps depends on noise. At a finite current I the Joule heating
of the resistor R increases the temperature T, and, hence, broadens the steps.
at temperature T and bandwidth df , I≡dq/dt.
HHighigh impedanceimpedance environmentenvironment M. Watanabe, D. Haviland , PRL 86, 5120 (2001); PRB 67, 094505 (2003); M. Watanabe, PRB 69, 094509 (2004).
1D chain of SQUIDs
At f/f0→p/2 both Rdyn→∞ and LK→∞.
SuperinductanceSuperinductance In more ’complicated’ Josephson systems the EJ(f) dependence can be strongy anharmonic. Within the locus of the anharmonicty the kinetic inductance can be made very large LK→∞.
M. T. Bell, at. al. PRL 109, 137003 (2012) and N. A. Masluk, et.al. PRL 109, 137002 (2012)
HybridHybrid highhigh impedanceimpedance environmentenvironment
High-Ohmic electrodes
Ti-AlOx-Ti SQUIDs
Ti - nanowires
island
High-Ohmic normal metal probes with Rprobe up to 500 KOhm and 1D array of SQUIDs.
Temperature dependence of the Coulomb blockade
The insulating state (Coulomb blockade) disappears above Tc.
Inset: temperature dependencies of the zero-bias dynamic resistance of several nanowires, normalized by the normal state resistance RN. Length L(m), effective diameter s1/2(nm) and high-bias impedance (kW) of
the environment RENV are listed in the inset.
Coulomb blockade in high impedance environment
Coulomb blockade vs. cross section s. Inset: magnetic field dependence of
the Coulomb gap.
Coulomb blockade vs. impedance of the environment Rmin
ENV. Inset: dynamic resistance dV/dI at
various biases for typical SQUID probes.
WidthWidth of the of the BlochBloch stepstep
0.0 0.5 1.0 1.5 2.0
0
2
4
dV
/dI (a
rb. units)
I (nA)
T=70 mK
fRF
=3.12 GHz
Imod
=0.5 pA rms
0.90 0.95 1.00 1.05 1.100
2
4
Imod
=0.5 pA rms
dV
/dI (a
rb. units)
I (nA)
dI=20 pA
Demonstrated accuracy is +/- 2%. Further accuracy improovement is mandatory for practical
metrology.