penn ese370 fall2010 -- dehon 1 ese370: circuit-level modeling, design, and optimization for digital...

50
Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors Details

Upload: candace-spoon

Post on 31-Mar-2015

213 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Penn ESE370 Fall2010 -- DeHon1

ESE370:Circuit-Level

Modeling, Design, and Optimization for Digital Systems

Day 10: September 29, 2010

MOS Transistors Details

Page 2: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Last Time• Focused on I vs V relationships

– Effective resistance– Drive

Penn ESE370 Fall2010 -- DeHon2

Page 3: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Today

• Capacitance– Gate– Source/Drain Contact

• More threshold dependence– VDS

Penn ESE370 Fall2010 -- DeHon3

Page 4: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Theme

• Refining model– Exploring next level of complexity

Penn ESE370 Fall2010 -- DeHon4

Page 5: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

channel

gate

srcdrain

Capacitance

• First order: looks like a capacitor

• Today: – Like resistance, it is not constant– Capacitance not just to src (drain)

Penn ESE370 Fall2010 -- DeHon5

Page 6: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Threshold

• Threshold decreases with VDS

Penn ESE370 Fall2010 -- DeHon6

VT

VDS

Page 7: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Setup

Penn ESE370 Fall2010 -- DeHon7

Page 8: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance

• Argued looked like a capacitor to the channel

• …but the channel isn’t really one of our terminals– Don’t connect directly to it.

Penn ESE370 Fall2010 -- DeHon8

Page 9: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance

• Four Terminals

• How many combinations– 4 things taken 2 at a time

Penn ESE370 Fall2010 -- DeHon9

Page 10: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitances

• GS, GB, GD, SB, DB, SD

Penn ESE370 Fall2010 -- DeHon10

Page 11: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Moving Plates?

• What is distance from gate to conductor?– Depletion?– Strong Inversion?

Penn ESE370 Fall2010 -- DeHon11

Page 12: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Decomposition

Penn ESE370 Fall2010 -- DeHon12

Page 13: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Overlap

• What is the capacitive implication of gate/src and gate/drain overlap?

Penn ESE370 Fall2010 -- DeHon13

Page 14: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Overlap

• Length of overlap?

Penn ESE370 Fall2010 -- DeHon14

Page 15: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Overlap Capacitance

Penn ESE370 Fall2010 -- DeHon15

C = ε rε 0

A

d

Co = ε ox

W Ldrawn−Leffective( ) /2

tox

Page 16: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Overlap Capacitance

Penn ESE370 Fall2010 -- DeHon16

C = ε rε 0

A

d

COX =εOX

tOX

Co = ε ox

W Ldrawn−Leffective( ) /2

tox

Co = CoxW Ldrawn−Leffective( ) /2

Page 17: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance in Strong Inversion(easy case)

• Looks like parallel plate Gate – Channel– What is CGC?

– What is CGB?

Penn ESE370 Fall2010 -- DeHon17

Page 18: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance in Strong Inversion

• Looks like parallel plate Gate – Channel– What is CGC?

– CGB=0

Penn ESE370 Fall2010 -- DeHon18

CGC = CoxWLeffective

Page 19: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance in Strong Inversion

• But channel isn’t a terminal– Split evenly with source and drain

Penn ESE370 Fall2010 -- DeHon19

CGCS = CGCD = 0.5CoxWLeffective

CGC = CoxWLeffective

Page 20: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance in Strong Inversion

• Add in Overlap capacitance

Penn ESE370 Fall2010 -- DeHon20

CGCS = CGCD = 0.5CoxWLeffective

CGS = CGSC +CO = 0.5CoxWLdrawn

Co = CoxW Ldrawn−Leffective( ) /2

Page 21: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Subthreshold

• Need to refine model– What showed on Day 9 not quite right

• Channel doesn’t start depleted– Starts with substrate doping

Penn ESE370 Fall2010 -- DeHon21

Page 22: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Channel Evolution Subthreshold

Penn ESE370 Fall2010 -- DeHon22

Page 23: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Depletion

• What happens to capacitance here?– Capacitor plate distance?

Penn ESE370 Fall2010 -- DeHon23

Page 24: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Depletion

• Capacitance becomes Gate-Body

• Capacitance drops

Penn ESE370 Fall2010 -- DeHon24

Page 25: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance vs VGS

Penn ESE370 Fall2010 -- DeHon25

• G CGC

CGCS=CGCD

CGCB

Page 26: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Saturation Capacitance?

Penn ESE370 Fall2010 -- DeHon26

Page 27: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Saturation Capacitance?

Penn ESE370 Fall2010 -- DeHon27

• Source end of channel in inversion

• Destination end of channel close at threshold

• Capacitance shifts to source– Total capacitance reduced

Page 28: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Saturation Capacitance

Penn ESE370 Fall2010 -- DeHon28

CGC

CGCS

CGCD

VDS/(VGS-VT)

Page 29: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Contact Capacitance

Penn ESE370 Fall2010 -- DeHon29

Page 30: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Contact Capacitance

• n+ contacts are formed by doping = diffusion

• Depletion under contact– Contact-Body capacitance

• Depletion around perimeter of contact– Also contact-Body capacitance

Penn ESE370 Fall2010 -- DeHon30

Page 31: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Contact/Diffusion Capacitance

• Cj – diffusion depletion

• Cjsw – sidewall capacitance

• LS – length of diffusion

Penn ESE370 Fall2010 -- DeHon31

Cdiff = C jLSW +C jsw 2LS +W( )

LS

Page 32: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Capacitance Roundup

• CGS=CGCS+CO

• CGD=CGCD+CO

• CGB=CGCB

• CSB=Cdiff

• CDB=Cdiff

Penn ESE370 Fall2010 -- DeHon32

Page 33: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

One Implication

Penn ESE370 Fall2010 -- DeHon33

Page 34: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Step Response?

Penn ESE370 Fall2010 -- DeHon34

Rsmall

Rlarge

Page 35: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Step Response

Penn ESE370 Fall2010 -- DeHon35

Page 36: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Impact of CGD

• What does CGD do to the switching response here?

Penn ESE370 Fall2010 -- DeHon36

Page 37: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Impact of CGD

Penn ESE370 Fall2010 -- DeHon37

Page 38: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Threshold

Penn ESE370 Fall2010 -- DeHon38

Page 39: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Threshold

• Describe VT as a constant

• Induce enough electron collection to invert channel

Penn ESE370 Fall2010 -- DeHon39

Page 40: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

VDS impact

• In practice, VDS impacts state of channel

Penn ESE370 Fall2010 -- DeHon40

Page 41: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

VDS impact

• Increasing VDS, already depletes portions of channel

Penn ESE370 Fall2010 -- DeHon41

Page 42: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

VDS impact

• Increasing VDS, already depletes portions of channel

• Need less charge, less voltage to invert

Penn ESE370 Fall2010 -- DeHon42

Page 43: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Drain-Induced Barrier Lowering (DIBL)

Penn ESE370 Fall2010 -- DeHon43

VT

VDS

Page 44: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

DIBL Impact

Penn ESE370 Fall2010 -- DeHon44

Page 45: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

In a Gate?

• What does it impact most?– Which device, which state/operation?

Penn ESE370 Fall2010 -- DeHon45

Page 46: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

In a Gate

• VDS largest for off device

– Easier to turn on

Penn ESE370 Fall2010 -- DeHon46

IDS = μnCOX

W

L

⎝ ⎜

⎠ ⎟ VGS −VT( )VDS −

VDS2

2

⎣ ⎢

⎦ ⎥

Page 47: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

In a Gate

• VDS largest for off device

– Easier to turn on– Leak more

Penn ESE370 Fall2010 -- DeHon47

IDS = μnCOX

W

L

⎝ ⎜

⎠ ⎟ VGS −VT( )VDS −

VDS2

2

⎣ ⎢

⎦ ⎥

IDS = ISW

L

⎝ ⎜

⎠ ⎟e

VGS

nkT / q

⎝ ⎜

⎠ ⎟1− e−

VDS

kT / q

⎝ ⎜

⎠ ⎟

⎝ ⎜

⎠ ⎟1+ λVDS( )

Page 48: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

In a Gate

• VDS largest for off device

– Easier to turn on– Leak more

Penn ESE370 Fall2010 -- DeHon48

IDS = ISW

L

⎝ ⎜

⎠ ⎟e

VGS

nkT / q

⎝ ⎜

⎠ ⎟1− e−

VDS

kT / q

⎝ ⎜

⎠ ⎟

⎝ ⎜

⎠ ⎟1+ λVDS( )

IDS = IS′W

L

⎝ ⎜

⎠ ⎟e

VGS −VT

nkT / q

⎝ ⎜

⎠ ⎟1 − e−

VDS

kT / q

⎝ ⎜

⎠ ⎟

⎝ ⎜

⎠ ⎟1+ λVDS( )

Page 49: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Admin

• HW3 due Friday

Penn ESE370 Fall2010 -- DeHon49

Page 50: Penn ESE370 Fall2010 -- DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 10: September 29, 2010 MOS Transistors

Ideas

• Capacitance– To every terminal– Voltage dependent

• Threshold– Voltage dependent

• Generally do manual analysis without

Penn ESE370 Fall2010 -- DeHon50

VT

VDS

CGC

CGCS

CGCB