920-218A-EN

The Standard in Phased Array, Redefined Bright,LargeSizeScreen Fast,IntuitiveTouchScreen

Interface AdvancedWeldOverlay High-CapacityDataStorage FastFileTransfer

PHASED ARRAY FLAW DETECTOR

OmniScan MX2

2 www.olympus-ims.comwww.olympus-ims.com

The result of over 10 years of proven leadership in modular NDT test platforms, the OmniScan MX has been the most successful portable and modular phased array test instrument produced by Olympus to date, with thousands of units in use throughout the world.

Building on a Solid BasisThis second generation OmniScan MX2 increases testing efficiencies, ensuring superior manual and advanced AUT application performance with faster setups, test cycles, and reporting, in addition to uni-versal compatibility with all phased array modules: past, present and future. Designed for NDT phased array leaders, this high-end, scalable platform deliv-ers true next-generation NDT testing.

The OmniScan MX2 offers a high acquisition rate and new powerful software featuresin a portable, modular instrumentto efficiently perform manual and automated inspections.

Faster Is Better!Powerstart your day the right way with the OmniScan MX2. The OmniScan MX2 simplifies and speeds up the setup process with its new Weld Overlay software feature, so you can start testing immediately. Featuring the industry-standard Phased Array User Interface with faster than ever perfor-mance, a bigger and brighter 10.4in. screen, new and unique intuitive touch screen capabilities, and faster data transfer, enabling you to get to your next inspection quicker.

More Rugged than EverThe OmniScan MX2 is now designed for IP66. It is built to endure the drops, spills, and abuse that typically occur in your most demanding inspection environments.

More than an Instrument A Solution ProviderThe OmniScan MX2 is an important part of your in-spection solution that can be combined with other critical components to form a complete inspec-tion system. Olympus offers a complete product range which includes phased array probes, scan-ners, analysis software, and accessories, which are integrated and packaged into rapidly deployable, application-specific solution packages for quick returns on your investment. In addition, Olympus offers a high-quality calibration and repair service worldwide that is backed by a team of phased array application experts to ensure you get the support you need.

The Standard in Phased Array, Redefined

3Life-Size OmniScan MX2

4 www.olympus-ims.comwww.olympus-ims.com

Bright 10.4 in. Screen

Touch Screen InterfaceThe revolutionary touch screen interface offers simple and quick navigation, enhanced text input functions, and easier, faster cursor manipulation and gate setup.

Full-Screen ModeThe unique full-screen mode offers operators increased viewing comfort, in addition to better readability at a distance. This feature can be used in both acquisition and analysis mode.

Weld Overlay WizardThe Weld Overlay Wizard facilitates the creation of industry-standard weld over-lays for analysis assistance and volumetric flaw placement.

OmniScan MX2OmniScan MX

OmniScan MX

OmniScan MX2 50% larger screen

OmniScan MX

OmniScan MX2 100% brighter screen

55

Modular Instrument Backward Compatible. Forward Compatible. An Evolving Platform for your Growing Needs.Designed to secure both your current and future phased array invest-ments, the OmniScan MX2 can house any Olympus phased array mod-ulewhether the reliable, field-proven models currently available, or the next-generation modules of the future. Its open architecture also supports future software updates and phased array module upgrades with configu-rations from 16:64M to 32:128 to ensure that your platform evolves with your testing needs, and that you get the most from your investment.

Module Compatibility OmniScan MX2 OmniScan MXOMNI-M-PA1664M OMNI-M-PA1664 OMNI-M-PA16128 OMNI-M-PA16128PR OMNI-M-PA32128 OMNI-M-PA32128PR OMNI-M-PA3232 OMNI-M-UT OMNI-M-ECT/ECA Software CompatibilityMXU-3.X1 MXU-2.X setup and data file TomoView 2.9R71, 2

1. Older versions are not compatible with the OmniScan MX2.2. Data file compatibility, no data acquisition.

16:64 PA M 16:64 PA16:128 PA

32:32 PA32:128 PA

6 www.olympus-ims.com

Setting Up for SuccessTouch ScreenThe bright 10.4 in. screen with its revolutionary touch screen interface offers simple and quick navigation, enhanced text input functions, and easier, faster cursor navigation and gate setup.

Zooming and Panning

Menu Selection and Parameter Settings

Text and Value Input

Gate Selection and Movement

The touch screens zooming functions can be used to zoom in on a specific area. In Zoom mode, tap, hold, and drag to create a selection rectangle, and then release to zoom in on the area.

In Zoom mode, swipe to pan the window contents.

Tap once on the screen to quickly navigate through menus, sub-menus and param-eters.

Double-tap on a parameter to bring up the keyboard or keypad on which values can be entered.

In Cursor mode, tap once on a cursor to select it. Double-tap on a posi-tion to move the cursor to the desired location.

In Gate mode, tap and hold on a gate to move the gate to a new position.

7SetupGroup Wizard for All Essential Parameters: Material selection, with a database for shear and longitudinal

velocities, and configuration of components for flat or curved surfaces.

Group copy Wizard for fast creation of symmetrical two-probe inspections.

Wedge selection from a database of Olympus wedges. Auto probe detection. Scanner configuration with offsets, skews, and probe positions. Wizard guidance for phased array, conventional UT, and

TOFD channels. Detailed interactive illustrated help menu for every step in the

Wizard. Weld Overlay and RayTracing.

Setup SpeedOmniScan MX

OmniScan MX2 50% faster

S-Scan and A-Scan Display Refresh RateOmniScan MX

OmniScan MX2 300% better

CalibrationCode-Compliant CalibrationThe Calibration Wizards ensure that every focal law in every group is the direct equivalent of a single-channel conventional flaw detector.

Calibration Wizards Calibration Wizards guide the user step-by-step through

Velocity, Wedge Delay, Sensitivity, TCG, DAC, and DGS calibrations.

Enable experimental or theoretical sensitivity and TCG curves based on 2, 3, or all beams for a real or interpolated calibration.

Simple, easy-to-use interface that enables all focal laws to be visualized simultaneously for a particular calibration task.

Interactive help menu with detailed graphics and definitions, which is available in each step of the Wizard.

Scan plan adjustment using the focal law configuration wizard.

Sensitivity calibration for a defined section in a sectorial scan.

Sensitivity calibration for all beams in a sectorial scan.

UT parameter adjustment using the touch screen software keypad.

8 www.olympus-ims.com

Acquisition A scan menu for quick and easy configuration of inspection

parameters for manual, one-line, raster, and helicoidal scans. Encoder configuration for clock, and one- or two-axis

inspections. C-scan configuration for amplitude and position C-scans, and

display setup. Data storage options for full A-scans, S-scans, and/or C-scans. Preconfigured display layouts for easy inspection preparation. PRF auto adjustments for optimized, maximum speed, or

manually-controlled settings. Data storage options for flash card or USB media devices. Real-time data acquisition displays, with the ability to rewrite

data in both scan directions when using an encoder. Easy-to-use interface with mechanized or semi-automated

scanner systems, and simple wheel encoders.

Pulse Repetition Frequency (PRF)OmniScan MX

OmniScan MX2 40% better

Saving Inspection Data File to USB (speed)OmniScan MX

OmniScan MX2 Up to 400% better

Maximum File Size (Mb)OmniScan MX 160 Mb

OmniScan MX2 300 Mb

Analysis An extensive display menu for preconfigured multigroup and

multiprobe inspection layouts. Data, reference, and measurement cursors for defect sizing

and reporting. Extensive Readings database for trigonometry, flaw statistics on

axes, volumetric position information, code-based acceptance criteria, corrosion mapping statistics, etc.

All Readings are available online, or off-line when full A-scans are saved in data files.

Linked displays for interactive analysis on A-scans, B-scans, S-scans, and C-scans for multigroup and multiprobe inspections.

Optimized preconfigured layouts for quick and simple length, depth, and height sizing of flaws for code-based or non-code-based inspections.

Interactive off-line gate repositioning.

Flawless Data ManagementAn SD Card is used to store data for easy transfer to a computer. The SD card can also be inserted and removed without having to reboot the unit. In addition, data can be transferred to exter-nal media using the USB 2.0 port. The OmniScan MX2 provides data transfer speeds up to 400% faster than the OmniScan MX (depending on the device used).

Top: Data acquisition displaying TOFD.

Right: Data acquisition displaying two phased

array channels and TOFD.

Weld inspection display showing the position of indications in the RayTracing display.

99

11-01-13 10:20

Page 1 sur 9

OmniScan ReportReport Date Report Version File Name Inspection Date Inspection Version Save Mode

2011 / 01 / 11 MXU - 3.0B4T12 PV200steph2.opd 2010 / 12 / 20 MXU - 3.0B4T10 Inspection Data

OmniScan Type OmniScan Serial # Module Type Module Serial # Calibration Due Data File Name

N/AOMNI-

EQUX251C AMP127 OMNI-2037 2011/8/12 File####

Group 1

SetupA:70.00 Sk:090 L:001Beam Delay Start (Half Path) Range (Half Path) Max. PRF Type

Averaging Factor

22.1 us11.70 mm 61.40 mm 35

PA1

Scale Type Scale Factor Video Filter Pretrig. Rectification Filter

Compression 12Off

0.00 sFW

None 0.50 - 19.00 MHz

VoltageGain

ModeWave Type Sound Velocity Pulse Width

40 (Low) 40.35 dBPE (Pulse-Echo) Shear

3240.0 m/s 100.00 ns

Scan Offset Index Offset SkewC-scan time resolution

-81.00 mm -21.50 mm 90.010.0 ns

GateStart

WidthThreshold Synchro.

I0.00 mm

11.00 mm 20.00 %Pulse

A7.00 mm

15.00 mm 50.00 %Pulse

B72.71 mm 11.00 mm 30.00 %

Pulse

TCG Point Number Position (Half Path) Gain

10.00 mm

0.0 dB

211.98 mm 1.2 dB

317.88 mm 5.0 dB

CalculatorElement Qty. Used First Element Last Element Resolution Wave Type Material Velocity

161

321.0

Shear3240.0 m/s

Start Angle Stop Angle Angle Resolution Focal Depth Law Configuration

70.00N/A

N/A12.00 mm Linear

Page 9 sur 9

Indication # ScanIndex Group Channel A%

DA^ViA^

VsA^ A%DA^

U(m-r) S(m-r)

1109.00 mm -11.63 mm 2

55.00 67.7 % 5.60 mm -1.77 mm 109.00 mm 67.7 % 5.60 mm 6.84 mm 33.00 mm

Comments

-

The RayTracing is only a graphical representation of the readings approved by the operator.

Technician Name

____________________________________________________________________________________________________________________

Technician Signature ____________________________________________________________________________________________________________________

Contractor____________________________________________________________________________________________________________________

Date

____________________________________________________________________________________________________________________

Indication table built from composite inspection data.

TomoView offers advanced post-processing of OmniScan data. Illustrated here: weld overlay, multiple sector scans, multibeam C-scans, and merging of A-scans with Top and End views (the latter with rebound display).

TomoView is the perfect PC-based companion to the OmniScan family of instruments, and seamlessly imports OmniScan files for advanced processing and analysis in TomoView.

Displays volume-corrected views; views are fully customizable and come with several preconfigured templates.

Corrects potential operator errors in acquisition parameters (incorrect skews, index offsets, etc.) by reading back raw acquisition data without altering original data.

Imports and merges several OmniScan data files. For simplified interpretation, merges several groups into one.

Advanced Inspection ToolsTomoView offers advanced inspection tools to simulate, test, and prepare setups for the OmniScan.

2D matrix Pitch-and-catch, tandem Advanced focusing

Advanced Analysis Tools The TOFD Manager performs TOFD calibration,

lateral wave straightening, lateral wave removal, and the synthetic aperture focusing technique (SAFT).

C-Scan Merge: Merges C-scans based on minimum or maximum amplitude, or time-of-flight (TOF).

Signal-to-noise ratio (SNR): On a C-scan, this tool calculates and displays areas in which SNR is above and/or below a certain threshold.

ReportingCreating a report in TomoView takes just a few clicks. Defects can be added into the indication-table database, the indication table can be customized with additional readings, and you can add comments specific to each indication.

OmniScan Data Analysis and Reporting with TomoView

ReportingThe OmniScan MX2 is designed to inspect, analyze and generate reports directly on the instrument, or off-line on a computer.

The reports created on the OmniScan include an indication table that can be customized with additional readings and comments specific to each indication.

A high resolution image of the current display is included in the report when selected.

The auto-generated report contains relevant parameters for the instrument, software, calibration, UT parameters, phased array parameters, scanner setup, and flaw reporting.

Up to eight readings from the original setup can be displayed using the touch screens simple toggle operations.

Reports are stored and viewed on the instrument, and can also be saved as HTML documents for use on a computer.

Reports are fully customizable and come with several preconfigured templates.

2-D TRL phased array probe (multiple-line scan).

10 www.olympus-ims.com

Typical ApplicationsGirth Weld InspectionThe OmniScan PA is at the heart of the Olympus manual and semiautomated circumferential weld inspection solutions developed for the oil and gas industry. These phased array systems are certified to inspect tubes in compliance with ASME, API, and other code crite-ria. They offer superior inspection speed and detection, and facilitate the interpretation of indications.

Pressure Vessel Weld InspectionA complete inspection of pressure vessel welds can be performed in a single scan using an OmniScan PA and a motorized scanner such as the WeldROVER. By combining TOFD and PA in a single inspection pass, a significant reduction in inspection time can be achieved as compared with conventional raster scanning or radiography. Further-more, inspection results are available immediately, enabling you to detect problems with welding equipment and fix them right away.

Weld Inspection of Small-Diameter PipesWhen coupled with the COBRA manual scanner, the OmniScan flaw detector is capable of inspecting standard pipes ranging from 0.84in. OD to 4.5in.OD. With its very slim design, this manual scanner is capable of inspecting pipes in areas with limited access. Adjacent obstructions such as piping, supports, and structures can be as close as 12mm (0.5in.).

Manual and Semi-Automated Corrosion Mapping The OmniScan PA with the HydroFORM scanner is designed to offer the best inspection solution for detecting wall-thickness reductions resulting from corrosion, abrasion, and erosion. In addition, this system detects mid-wall damage, such as hydrogen-induced blistering or manufacturing-induced laminations, and easily differentiates these anomalies from loss of wall thickness. In this application, phased array ultrasound technology offers superior inspection speed, data point density, and detection.

Composite InspectionParts made of laminate composite materials pose an inspection chal-lenge due to their various shapes and thicknesses. Olympus offers complete solutions for the inspection of carbon fiber reinforced polymer structures. These solutions are based on the OmniScan flaw detector, the GLIDER scanner, and dedicated probes and wedges designed for CFRP flat panel and radius inspection.

Compatible with the Following Inspection Codes:The OmniScan MX2 is compatible with standard industry inspection codes, including, but not limited to:

ASME Section V, Article 4 AWSAll ASME phased array code cases API 1104 and API RP2XASTM E2700-09 CEN EN 583-6ASTM 2591 BSI BS7706ASTM E2491-06 and more

11

OmniScan MX2 Mainframe SpecificationsOverall dimensions (W x H x D)

325 mm x 235 mm x 130 mm (12.8 in. x 9.3 in. x 5.1 in.)

Weight 5 kg (11 lb), including module and one battery

Data StorageStorage devices

SDHC card, most standard USB storage devices, or fast Ethernet

Data file size 300 MB

I/O PortsUSB ports 3

Speaker out Yes

Video output Video out (SVGA)

Ethernet 10/100 Mbps

I/O LinesEncoder

2-axis encoder line (quadrature, up, down, or clock/direction)

Digital input 4 digital TTL inputs, 5 V

Digital output 4 digital TTL outputs, 5 V, 15 mA

Acquisition on/off switch

Remote acquisition enabled TTL, 5 V

Power output line5 V, 500 mA power output line (short-circuit protected)

Alarms 3 TTL, 5 V, 15 mA

Analog output 2 analog outputs (12 bits) 5 V in 10 k

Pace input 5 V TTL pace input

DisplayDisplay size 26.4 cm (10.4 in.) (diagonal)

Resolution 800 pixels x 600 pixels

Brightness 700 cd/m2

Number of colors 16 million

Type TFT LCD

Power SupplyBattery type Smart Li-ion battery

Number of batteries1 or 2 (battery chamber accommodates two hot-swappable batteries)

Battery life Minimum 6 hours with two batteries

Environmental SpecificationsOperating temperature range

0C to 45C; 0C to 35C with 32:128 PA (32F to 113F; 32F to 95F with 32:128 PA)

Storage temperature range

20C to 60C (4F to 140F) with batteries20C to 70C (4F to 158F) without bat-teries

Relative humidity0% to 85% noncondensing No air intake; designed for IP66

Shockproof rating Drop tested according to MIL-STD-810G 516.6

Phased Array Module Specifications (Applies to OMNI-M-PA16128*)Overall dimensions (W x H x D)

244 mm x 182 mm x 57 mm (9.6 in. x 7.1 in. x 2.1 in.)

Weight 1.2 kg (2.6 lb)

Connectors1 OmniScan connector for phased array probes 2 BNC connectors for UT probes

Number of focal laws 256

Probe recognition Automatic probe recognition

Pulser/ReceiverAperture 16 elements

Number of elements 128 elements

PulserVoltage 40 V or 80 V per element

Pulse width Adjustable from 30 ns to 500 ns, resolution of 2.5ns

Pulse shape Negative square wave

Output impedance Less than 25

ReceiverGain 0dB to 74 dB, maximum input signal 1.32Vp-p

Input impedance 75

System bandwidth 0.75MHz to 18 MHz (3 dB)

BeamformingScan type Sectorial and linear

Group quantity Up to 8

Active elements 16*

Elements 128

Data AcquisitionDigitizing frequency 100 MHz (10 bits)

Maximum pulsing rate Up to 10 kHz (C-scan)

Data ProcessingNumber of data points Up to 8,000

Real-time averaging 2, 4, 8, 16

Rectifier RF, full wave, halfwave +, halfwave

FilteringLow-pass (adjusted to probe frequency), digital filtering (bandwidth, frequency range)

Video filtering Smoothing (adjusted to probe frequency range)

Data VisualizationA-scan refresh rate Real time: 60 Hz

Data SynchronizationOn internal clock 1 Hz to 10 kHz

On encoder On 1 or 2 axes

Programmable Time-Corrected Gain (TCG)Number of points 16 (1 TCG curve per channel for focal laws)

AlarmsNumber of alarms 3

Conditions Any logical combination of gates

Analog outputs 2* Models 16:16, 16:16M, 16:64, 16:64M, 32:32, and 32:128 also available.

OmniScan MX2 Specifications

48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-390012569 Gulf Freeway, Houston, TX 77034, USA, Tel.: (1) 281-922-9300

505, boul. du Parc-Technologique, Qubec (Qubec) G1P 4S9, Tel.: (1) 418-872-11551109 78 Ave, Edmonton (Alberta) T6P 1L8

OmniScan_MX2_EN_201105 Printed in the USA Copyright 2011 by Olympus NDT.*All specifications are subject to change without notice. All brands are trademarks or registered trademarks of their respective owners and third party entities.

www.olympus-ims.com

info@olympusNDT.com

isISO9001and14001certified.

Global Presence, Local AssistanceOlympus has an extensive network of direct sales branches and representatives located in many industrial regions around the world. Answers to your questions on products, applications, training, and technologies are just one phone call or e-mail away from our dedicated staff members.

Customer ServiceOlympus is committed to providing the best technical support and after-sales service to reliably meet your needs in a prompt and support-ive fashion. Our professionally staffed service centers are dedicated to helping customers with repair or calibration throughout the life cycle of equipment.

Olympus NDT Training AcademyThe unique Olympus NDT Training Academy offers comprehen-sive courses in phased array technology and applications. Courses range from a two-day Introduction to Phased Array program to a two-week, in-depth Level II Phased Array course. In all cases, students experience practical training using the portable OmniScan phased array unit.

Courses are currently being offered at the training facilities of participating companies, in addition to customer-determined locations worldwide. Customized courses can also be arranged.

Web Based TutorialThe tutorial offered by Olympus provides a basic introduction to the main theories used to make our instruments. These tutorials also present typical applications pertain-ing to the various markets in which Olympus instruments are used.

Phased Array Testing Field GuideOlympus new Phased Array Testing field guide is a convenient resource for customers and anyone else interested in phased array technology. It is designed to be an easy-to follow introduction to ultrasonic phased array testing, both for newcomers and more experienced users who wish to review the basic principles. This guide begins by explaining what phased array testing is and how it works, outlines some considerations for select-ing probes and instruments, and con-cludes with further reference information and a phased array glossary.

This free field guide can be obtained from your local sales representative.

Understanding Phased Array Technology Poster

To support the growing NDT community, Olympus has published the Understanding Phased Array Technology post-er. This poster was designed by field experts to present phased array inspection technology in a concise and clearly illustrated manner.

This free poster can be obtained from your local sales repre-sentative, or directly from our website.

NDT Field Guides

Phased Array Testing

Basic Theory for

Industrial Applications

Copyright 20062009 by Olympus

NDT. All rights reserved.

920-172A_EN - Poster_PA_EN_2009

06

RA, PA, DA, and SA readings allow the

user to accurately

position the defect in real time during

an inspection.

RA: Reference point to the indication i

n gate A

PA: Probe front face to the indication in

gate A

DA: Depth of the indication in gate A

SA: Sound-path length to the indicatio

n in gate A

For manual inspections, real-time read

ings are essential to quickly position

the reflected signal source with

respect to the part geometry and/or p

robe location.

PA

SA

DA

RA

Top

Bottom

Top45

T1

B0

Distance-amplitude curves (DAC) use

d to create

the time-corrected gain (TCG)

www.olympus-ims.com The leader i

n phased array technology for more t

han a decade

PA probeDelay (ns)

Angle steering

Incident wave front

t0t1t2t3tn

Acquisition time

EmissionReception

Pulse-echo

=PA probe

Delay (ns)

Transmitting

delays

Receiving delays

and sum

Probe elements

Pulses

Incident wave front

Reflected wave front

Trigger Flaw

Flaw

Echo signals

Emitting

Acquisition unit

Receiving

Phased array unit

e

g p

A

n = 8Wpassive

Scanning direction

Active group128

1

16

Electronic linear scanning

With electronic scanning, a single foca

l law is multiplexed across

a group of active elements; scanning

is performed at a constant

angle and along the phased array pro

be length (aperture). This

is equivalent to a conventional ultraso

nic transducer performing

a raster scan for corrosion mapping o

r shear-wave inspection. If

an angled wedge is used, the focal law

s compensate for different

time delays inside the wedge.

Sectorial scanningWith sectorial scan

ning (also called azimuthal or angular

scanning), the beam is moved through

a sweep range for a

specific focal depth, using the same el

ements; other sweep

ranges with different focal depths ma

y be added. The angular

sectors may have different values.

Dynamic depth focusing

Dynamic depth focusing (DDF) is a pro

grammable, real-time array

response-on-reception accomplished

by modifying the delay,

gain, and excitation of each element as

a function of time. DDF

replaces multiple focal laws for the sam

e focal range created by

the emitted beam with separate focuse

d beams at the receiving

stage. In other words, DDF dynamically

changes the focal distance

as the signal returns to the phased arra

y probe. DDF significantly

increases the depth of field and signal-

to-noise ratio.

Scanning Patterns

Phased Array Probes

Linear arrays are the most commonly

used phased array probes for industri

al applications. Thus, one of

the important features of linear arrays

is the active probe aperture.

The active aperture (A) is the total activ

e probe length. Aperture length is given

by the following formula:

A = (n 1) p + ewhere n = Numbe

r of elements in the PA probe

p = Elementary pitchdistance betwe

en the centers of

two adjacent elements

e = Element widthwidth of a single pi

ezocomposite

element (a practical value is e < /2)

g = Gap between adjacent elements

= v f

where = Wavelength

v = Material sound velocity

f = Frequency

understanding

Linear

Convex

Skewing

1.5-D array

Concave

Variable angle

2-D array

Annular

Dual linear

Internal focus

Dual 1.5-D

Phased array probes are made in a var

iety of shapes and sizes for

different applications. A few types are

illustrated here:

Types of ProbesAngle Beam

Angle beam probes are used with a

removable or integrated wedge to tran

smit

a refracted shear or longitudinal wave

into

a test piece. They are designed for a w

ide

range of applications and can be used t

o

vary the refracted beam angle or the sk

ew

of the beam, depending on the wedge

orientation. The probe face is acoustica

lly

matched to the wedge material.

Integrated Wedge

This variation of an angle beam probe

integrates the wedge into the probe

housing. The wedge configuration is fi

xed

but offers smaller overall dimensions.

Near Wall

The near wall probe is specifically desig

ned

to minimize the dead zone at probe end

s

by reducing the distance between the l

ast

available element and the external edge

of

the housing. This probe type is useful fo

r

composite radius and corner inspection

s,

or any application requiring close cont

act

to a wall using a 0 wedge.

Immersion

Immersion probes are designed to

be used with a water wedge or in an

immersion tank when the test part is

partially or wholly immersed. The wat

er

acts as a uniform couplant and delay

line.

Immersion probes are longitudinal-w

ave

probes that can be set up for refracte

d

shear-wave inspection under water.

Immersion probes are mostly intende

d

for automated inspections.

2-D and 1.5-D Arrays

Two-dimensional arrays have multiple

strips of linear arrays to allow electron

ic

focusing and steering in both probe

axes. 2-D arrays have the same numbe

r

of elements in both dimensions,

whereas 1.5-D identifies probes with

any combination of uneven numbers

of

elements. The probes can be used for

achieving optimal focusing capability

or

to cover a defined area without probe

movement.

Dual ArraysTwo linear or two 1

.5-D array probes can

be positioned on a roof-angled wedge

with a transmitting probe. The probe

is

paired with a receiving equivalent for

optimal performance in noisy materia

ls

such as austenitic steel. This configura

tion

is a phased-array equivalent to a dual

-

element probe in conventional UT an

d

is widely used in the power-generatio

n

industry.

Basic ConceptsThe distinguishing

feature of phased array ultrasonic tes

ting is the computer-controlled excitat

ion (amplitude

and delay) of individual elements in a

multielement probe. The excitation of

multiple piezocomposite elements

can generate a focused ultrasonic beam

with the possibility of dynamically m

odifying beam parameters such as

angle, focal distance, and focal spot si

ze through software. To generate a be

am in phase by means of constructive

interference, the various active transd

ucer elements are pulsed at slightly d

ifferent times. Similarly, the echo from

the desired focal point hits the variou

s transducer elements with a computa

ble time shift. The echoes received by

each element are time-shifted before

being summed together. The resulting

sum is an A-scan that emphasizes the

response from the desired focal poin

t and attenuates echoes from other po

ints in the test piece.

Examples of focal laws

Delay (ns)

Incident wave front

PA probe

Defect Positioning

Acquisition without DDF Ac

quisition with DDF

Illustration of beam focusing

Illustration of beam steering

0

20

40

60

80

100

120

140

0 4 8 12 16

20 24 28 32

Element number

Tim

e d

elay

[ns]

FD = 15

FD = 30

FD = 60

FD = 15

FD = 30

FD = 60

Delay values (left) and depth scanning

principles (right) for a 32-element line

ar

array probe focusing at 15-mm, 30-mm

,

and 60-mm longitudinal waves.

Electronic linear scanning

Sectorial scanning

Olympus NDT Training Academy

Phased array training is available from

professional companies.

Visit www.olympus-ims.com

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

70

60

45

Time-Corrected Gain

In order to cover the whole volume of

the part with

consistency, each focal law has to be c

alibrated for

attenuation and beam spread. This tim

e-corrected-

gain (TCG) calibration can be perform

ed with a

calibration block having several ident

ical reflectors

(for example, side-drilled holes) at dif

ferent depths.

Using a sectorial scan, the probe is mo

ved back

and forth so that each beam hits each

reflector. The

amplitude of each signal is recorded (

DAC) and

used to construct one TCG curve per f

ocal law.

Once the TCG calibration is completed

, each focal law has one individual TCG

curve. As

a consequence, a reflector will always

yield the same signal amplitude, regar

dless of its

position inside the part and of the be

am that detected it. A defect at 3 mm i

n depth detected

with an angle of 45 degrees will provi

de the same signal amplitude as if it w

ere at 10 mm and

detected at 60 degrees.