ika06n60t data sheets
TRANSCRIPT
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 1/14
IKA06N60T^
TrenchStop series
Power Semiconductors 1 Rev. 2 Oct-04
Low Loss DuoPack : IGBT in Trench and Fieldstop technologywith soft, fast recovery anti-parallel EmCon HE diode
• Very low VCE(sat) 1.5 V (typ.)
• Maximum Junction Temperature 175 °C
• Short circuit withstand time – 5µs
• Designed for :- Variable Speed Drive for washing machines, air
conditioners and induction cooking- Uninterrupted Power Supply
• Trench and Fieldstop technology for 600 V applications offers :- very tight parameter distribution- high ruggedness, temperature stable behavior - very high switching speed- low VCE(sat)
• Low EMI
• Very soft, fast recovery anti-parallel EmCon HE diode• Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/
Type V CE I C;Tc=100°C V CE(sat ),Tj=25°C T j,max Marking Code Package Ordering Code
IKA06N60T 600V 6A 1.5V 175°C K06T60 TO-220-FP Q67040S4678
Maximum Ratings
Parameter Symbol Value Unit
Collector-emitter voltage V C E 600 V
DC collector current, limited by T jmax
T C = 25°C
T C = 100°C
I C
12
6Pulsed collector current, t p limited by T jmax I C p u l s 18
Turn off safe operating area
V CE ≤ 600V, T j ≤ 175°C
- 18
Diode forward current, limited by T jmax
T C = 25°C
T C = 100°C
I F
12
6
Diode pulsed current, t p limited by T jmax I F p u l s 18
A
Gate-emitter voltage V G E ±20 V
Short circuit withstand time1)
V GE = 15V, V CC ≤ 400V, T j ≤ 150°C
t S C 5 µs
Power dissipation
T C = 25°C
P t o t 28 W
Operating junction temperature T j -40...+175
Storage temperature T s tg -55...+175
°C
1)Allowed number of short circuits: <1000; time between short circuits: >1s.
G
C
E
P-TO-220-3-31(TO-220 FullPak)
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 2/14
IKA06N60T^
TrenchStop series
Power Semiconductors 2 Rev. 2 Oct-04
Thermal Resistance
Parameter Symbol Conditions Max. Value Unit
Characteristic
IGBT thermal resistance,
junction – case
R t h J C 5.3
Diode thermal resistance,
junction – case
R t h J C D 6.5
Thermal resistance,
junction – ambient
R t h J A 80
K/W
Electrical Characteristic, at T j = 25 °C, unless otherwise specified
ValueParameter Symbol Conditions
min. typ. max.Unit
Static CharacteristicCollector-emitter breakdown voltage V ( B R ) C E S V G E=0V,
I C=0.25mA 600 - -
Collector-emitter saturation voltage V C E ( s a t ) V G E = 15V, I C=6A
T j=25°C
T j=175°C
-
-
1.5
1.8
2.05
Diode forward voltage V F V G E=0V, I F=6A
T j=25°C
T j=175°C
-
-
1.6
1.6
2.05
-
Gate-emitter threshold voltage V G E ( t h ) I C=0.18mA,
V C E=V G E
4.1 4.6 5.7
V
Zero gate voltage collector current I C E S V C E=600V ,V G E=0V
T j=25°C
T j=175°C
-
-
-
-
40
700
µA
Gate-emitter leakage current I G E S V C E=0V,V GE =20V - - 100 nA
Transconductance g f s V C E=20V, I C=6A - 3.6 - S
Integrated gate resistor R G i n t none
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 3/14
IKA06N60T^
TrenchStop series
Power Semiconductors 3 Rev. 2 Oct-04
Dynamic Characteristic
Input capacitance C i s s - 368 -
Output capacitance C o s s - 28 -
Reverse transfer capacitance C r ss
V C E=25V,
V G E=0V,
f =1MHz - 11 -
pF
Gate charge QG ate V C C=480V, I C=6A
V G E=15V
- 42 - nC
Internal emitter inductance
measured 5mm (0.197 in.) from case
LE P-TO- 220- 3-31 - 7 - nH
Short circuit collector current1)
I C ( S C ) V G E=15V,t S C≤5µsV C C = 400V,
T j = 25°C
- 55 - A
Switching Characteristic, Inductive Load, at T j=25 °C
ValueParameter Symbol Conditions
min. Typ. max.
Unit
IGBT Characteristic
Turn-on delay time t d ( o n ) - 9.4 -
Rise time t r - 5.6 -
Turn-off delay time t d ( o f f ) - 130 -
Fall time t f - 58 -
ns
Turn-on energy E o n - 0.09 -
Turn-off energy E o f f - 0.11 -
Total switching energy E t s
T j=25°C, V C C=400V, I C=6A,V G E=0/15V,
R G=23Ω ,
Lσ
2 )=60nH,
C σ 2 )
=40pFEnergy losses include“tail” and diodereverse recovery. - 0.2 -
mJ
Anti-Parallel Diode Characteristic
Diode reverse recovery time t r r - 123 - nsDiode reverse recovery charge Q r r - 190 - nC
Diode peak reverse recovery current I r r m - 5.3 - A
Diode peak rate of fall of reverserecovery current during t b
di r r /dt
T j=25°C,V R=400V, I F=6A,
di F /dt =550A/ µs
- 450 - A/µs
1)Allowed number of short circuits: <1000; time between short circuits: >1s.
2)Leakage inductance Lσ and Stray capacity C σ due to dynamic test circuit in Figure E.
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 4/14
IKA06N60T^
TrenchStop series
Power Semiconductors 4 Rev. 2 Oct-04
Switching Characteristic, Inductive Load, at T j=175 °C
ValueParameter Symbol Conditions
min. typ. max.
Unit
IGBT Characteristic
Turn-on delay time t d ( o n ) - 8.8 -
Rise time t r - 8.2 -
Turn-off delay time t d ( o f f ) - 165 -
Fall time t f - 84 -
ns
Turn-on energy E o n - 0.14 -
Turn-off energy E o f f - 0.18 -
Total switching energy E t s
T j=175°C, V C C=400V, I C=6A,V G E=0/15V,
R G= 23Ω
Lσ
1 )=60nH,
C σ 1 )
=40pFEnergy losses include“tail” and diodereverse recovery. - 0.335 -
mJ
Anti-Parallel Diode Characteristic
Diode reverse recovery time t r r
- 180 - ns
Diode reverse recovery charge Q r r - 500 - nC
Diode peak reverse recovery current I r r m - 7.6 - A
Diode peak rate of fall of reverserecovery current during t b
di r r /dt
T j=175°C V R=400V, I F=6A,
di F /dt =550A/ µs
- 285 - A/µs
1)
Leakage inductance Lσ and Stray capacity C σ due to dynamic test circuit in Figure E.
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 5/14
IKA06N60T^
TrenchStop series
Power Semiconductors 5 Rev. 2 Oct-04
I C , C O L L E C T O R C U R R E N T
10Hz 100Hz 1kHz 10kHz 100kHz
0A
5A
10 A
15 A
T C=110°C
T C=80°C
I C , C O L L E C T O R C U R R E N T
1V 10V 100V 1000V
0,1A
1A
10A
DC
10µs
t p=1µs
50µs
5ms
5µs
500µs
f , SWITCHING FREQUENCY V CE, COLLECTOR-EMITTER VOLTAGE
Figure 1. Collector current as a function of switching frequency
(T j ≤ 175°C, D = 0.5, V CE = 400V,
V GE = 0/+15V, R G = 23Ω)
Figure 2. Safe operating area
(D = 0, T C = 25°C,
T j ≤175°C;V GE=15V)
P t o t , P O W E R D I S S I P A T I O N
25°C 50°C 75°C 100°C 125°C 150°C0W
5W
10 W
15 W
20 W
25 W
I C , C O L L E C T O R C U R R E N T
25°C 75°C 125°C0A
2A
4A
6A
8A
T C, CASE TEMPERATURE T C, CASE TEMPERATURE
Figure 3. Power dissipation as a function of case temperature
(T j ≤ 175°C)
Figure 4. Collector current as a function of case temperature
(V GE ≥ 15V, T j ≤ 175°C)
I c
I c
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 6/14
IKA06N60T^
TrenchStop series
Power Semiconductors 6 Rev. 2 Oct-04
I C , C O L L E C T O R C U R R E N T
0V 1V 2V 3V
0A
3A
6A
9A
12 A
15 A
15 V
7V
9V
11 V
13 V
V GE=20V
I C , C O L L E C T O R C U R R E N T
0V 1V 2V 3V
0A
3A
6A
9A
12 A
15 A
15 V
7V
9V
11 V
13 V
V GE=20V
V CE, COLLECTOR-EMITTER VOLTAGE V CE, COLLECTOR-EMITTER VOLTAGE
Figure 5. Typical output characteristic(T j = 25°C)
Figure 6. Typical output characteristic(T j = 175°C)
I C , C O L L E C T O R C U R R E N T
0V 2V 4V 6V 8V 10V0A
3A
6A
9A
12A
15A
25°C
T J=175°C
V C E ( s a t ) , C O L L E C T O R - E M I T T S A T U R A T I O N V O L T A G E
-50°C 0°C 50°C 100°C0,0V
0,5V
1,0V
1,5V
2,0V
2,5V
3,0V
I C =6A
I C =12A
I C =3A
V GE, GATE-EMITTER VOLTAGE T J, JUNCTION TEMPERATURE
Figure 7. Typical transfer characteristic(VCE=20V)
Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature(V GE = 15V)
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 7/14
IKA06N60T^
TrenchStop series
Power Semiconductors 7 Rev. 2 Oct-04
t , S W I T C H I N G T I M E S
0A 3A 6A 9A 12A 15A
1n s
10ns
100ns
t r
t d(on)
t f
t d(off)
t , S W I T C H I N G T I M E S
10Ω 30Ω 50Ω 70Ω 90Ω
1ns
10ns
100ns
t f
t r
t d(off)
t d(on)
I C , COLLECTOR CURRENT R G, GATE RESISTOR
Figure 9. Typical switching times as afunction of collector current(inductive load, T J=175°C,V CE = 400V, VGE = 0/15V, R G = 23Ω,Dynamic test circuit in Figure E)
Figure 10. Typical switching times as afunction of gate resistor (inductive load, T J=175°C,V CE = 400V, VGE = 0/15V, I C = 6A,Dynamic test circuit in Figure E)
t , S W I T C H I N G T I M E S
50°C 100°C 150°C1n s
10ns
100ns
t r
t f
t d(on)
t d(off)
V G E ( t h ) , G A T E - E M I T T T R S H O L D V O L T A G E
-50°C 0°C 50°C 100°C 150°C0V
1V
2V
3V
4V
5V
6V
min.
typ.
max.
T J, JUNCTION TEMPERATURE T J, JUNCTION TEMPERATURE
Figure 11. Typical switching times as afunction of junction temperature(inductive load, V CE = 400V,VGE = 0/15V, I C = 6A, R G = 23Ω,Dynamic test circuit in Figure E)
Figure 12. Gate-emitter threshold voltage asa function of junction temperature (I C = 0.18mA)
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 8/14
IKA06N60T^
TrenchStop series
Power Semiconductors 8 Rev. 2 Oct-04
E , S W I T C H I N G E N E R G Y L O S S E S
0A 2A 4A 6A 8A 10A
0,0 mJ
0,1 mJ
0,2 mJ
0,3 mJ
0,4 mJ
0,5 mJ
0,6 mJ
E ts*
E on
*
*) E on
and E ts
include losses
due to diode recovery
E off
E , S W I T C H I N G E N E R G Y L O S S E S
10Ω 30Ω 55Ω 80Ω
0,0 mJ
0,1 mJ
0,2 mJ
0,3 mJ
0,4 mJ
E ts*
E on
*
*) E on
and E ts
include losses
due to diode recovery
E off
I C , COLLECTOR CURRENT R G, GATE RESISTOR
Figure 13. Typical switching energy lossesas a function of collector current(inductive load, T J=175°C,V CE=400V, VGE=0/15V, R G=23Ω,Dynamic test circuit in Figure E)
Figure 14. Typical switching energy lossesas a function of gate resistor (inductive load, T J=175°C,V CE = 400V, VGE = 0/15V, I C = 6A,Dynamic test circuit in Figure E)
E , S W I T C H I N G E N E R G Y L O S S E S
50°C 100°C 150°C0,0mJ
0,1mJ
0,2mJ
0,3mJ
0,4mJ
E ts*
E on
*
*) E on
and E ts
include losses
due to diode recovery
E off
E , S W I T C H I N G E N E R G Y L O S S E S
200V 300V 400V 500V0,0mJ
0,1mJ
0,2mJ
0,3mJ
0,4mJ
0,5mJ
E ts*
E on
*
*) E on
an d E ts
include losses
due to diode recovery
E off
T J, JUNCTION TEMPERATURE V CE , COLLECTOR-EMITTER VOLTAGE
Figure 15. Typical switching energy lossesas a function of junctiontemperature(inductive load, V CE=400V,VGE = 0/15V, I C = 6A, R G = 23Ω,Dynamic test circuit in Figure E)
Figure 16. Typical switching energy lossesas a function of collector emitter voltage(inductive load, T J = 175°C,VGE = 0/15V, I C = 6A, R G = 23Ω,Dynamic test circuit in Figure E)
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 9/14
IKA06N60T^
TrenchStop series
Power Semiconductors 9 Rev. 2 Oct-04
V G E , G A T E - E M I T T E R V O L T A G E
0nC 10nC 20nC 30nC 40nC 50nC0V
5V
10V
15V
480V
120V
c , C A P A C I T A N C E
0V 10V 20V
10pF
100pF
1nF
C rss
C oss
C iss
QGE, GATE CHARGE V CE, COLLECTOR-EMITTER VOLTAGE
Figure 17. Typical gate charge(I C=6 A)
Figure 18. Typical capacitance as a functionof collector-emitter voltage(V GE=0V, f = 1 MHz)
I C ( s c ) , s h o r t c i r c u i t C O L L E C T O R C U R R E N
T
12V 14V 16V 18V0A
20A
40A
60A
80A
t S C , S H O R T C I R C U I T W I T H S T A N D T I M E
10V 11V 12V 13V 14V0µ s
2µ s
4µ s
6µ s
8µ s
10µs
12µs
V GE, GATE-EMITTETR VOLTAGE V GE, GATE-EMITETR VOLTAGE
Figure 19. Typical short circuit collector current as a function of gate-emitter voltage
(V CE ≤ 400V, T j ≤ 150°C)
Figure 20. Short circuit withstand time as afunction of gate-emitter voltage(V CE=600V, start at T J=25°C,T Jmax<150°C)
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 10/14
IKA06N60T^
TrenchStop series
Power Semiconductors 10 Rev. 2 Oct-04
Z t h J C , T R A N S I E N T T H E R M A L R E S I S T
A N C E
10µs 100µs 1ms 10ms 100ms 1s 1
10-1
K/W
100K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D=0.5
Z t h J C , T R A N S I E N T T H E R M A L R E S I S T
A N C E
10µs 100µs 1ms 10ms 100ms 1s 1
10-2
K/W
10-1
K/W
100K/W
single pulse
0.01
0.02
0.05
0.1
0.2
D=0.5
t P, PULSE WIDTH t P, PULSE WIDTH
Figure 21. IGBT transient thermal resistance(D = t p / T )
Figure 22. Diode transient thermalimpedance as a function of pulsewidth(D=t P/T )
t r r ,
R E V E R S E R E C O V E R Y T I M E
200A/µs 400A/µs 600A/µs 800A/µs0ns
50ns
100ns
150ns
200ns
250ns
T J=25°C
T J=175°C
Q r r , R E V E R S E R E C O V E R Y C H A R G E
200A/µs 400A/µs 600A/µs 800A/µs0,0µC
0,1µC
0,2µC
0,3µC
0,4µC
0,5µC
T J=25°C
T J=175°C
di F /dt , DIODE CURRENT SLOPE di F /dt , DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery time asa function of diode current slope(V R = 400V, I F = 6A,Dynamic test circuit in Figure E)
Figure 24. Typical reverse recovery chargeas a function of diode currentslope (V R = 400V, I F = 6A,Dynamic test circuit in Figure E)
R , ( K / W ) τ , ( s )
0.381 1.867*10-2
6
2.57 1.350
0.645 2.208*10-3
1.454 5.474*10-4
0.062 5.306*10-5
0.186 5.926*10-1
C 1=τ 1/R 1
R 1 R 2
C 2=τ 2/R 2
R , ( K / W ) τ , ( s )
0.403 1.773*10
-2
62.57 1.346
0.938 1.956*10-3
2.33 4.878*10-4
0.071 4.016*10-5
175 5.684*10-1
C 1=τ 1 /R 1
R 1 R 2
C 2=τ 2/R 2
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 11/14
IKA06N60T^
TrenchStop series
Power Semiconductors 11 Rev. 2 Oct-04
I r r ,
R E V E R S E R E C O V E R Y C U R R E N T
200A/µs 400A/µs 600A/µs 800A/µs0A
2A
4A
6A
8A
T J=25°C
T J=175°C
d i r r / d
t , D I O D E P E A K R A T E O F F A L L
O F R E V E R S E R E C O V E R Y C U R R E N T
200A/µs 400A/µs 600A/µs 800A/µs0A/µs
-100A/µs
-200A/µs
-300A/µs
-400A/µs
-500A/µs
T J=25°C
T J=175°C
di F /dt , DIODE CURRENT SLOPE di F /dt , DIODE CURRENT SLOPE
Figure 25. Typical reverse recovery currentas a function of diode currentslope(V R = 400V, I F = 6A,Dynamic test circuit in Figure E)
Figure 26. Typical diode peak rate of fall of reverse recovery current as afunction of diode current slope(V R = 400V, I F = 6A,Dynamic test circuit in Figure E)
I F , F O R W A R D C U R R E N T
0,0V 0,5V 1,0V 1,5V 2,0V0A
2A
4A
6A
8A
10 A
25°C
T J =175°C V
F , F O R W A R D V O L T A G E
0°C 50°C 100°C 150°C0,0V
0,5V
1,0V
1,5V
2,0V
6A
I F =12A
3A
V F, FORWARD VOLTAGE T J, JUNCTION TEMPERATURE
Figure 27. Typical diode forward current asa function of forward voltage
Figure 28. Typical diode forward voltage as afunction of junction temperature
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 12/14
IKA06N60T^
TrenchStop series
Power Semiconductors 12 Rev. 2 Oct-04
P-TO220-3-31
dimensions
symbol [mm] [inch]
min max min max
A 10.37 10.63 0.4084 0.4184
B 15.86 16.12 0.6245 0.6345
C 0.65 0.78 0.0256 0.0306
D 2.95 typ. 0.1160 typ.
E 3.15 3.25 0.124 0.128
F 6.05 6.56 0.2384 0.2584
G 13.47 13.73 0.5304 0.5404
H 3.18 3.43 0.125 0.135
K 0.45 0.63 0.0177 0.0247
L 1.23 1.36 0.0484 0.0534
M 2.54 typ. 0.100 typ.
N 4.57 4.83 0.1800 0.1900
P 2.57 2.83 0.1013 0.1113
T 2.51 2.62 0.0990 0.1030
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 13/14
IKA06N60T^
TrenchStop series
Power Semiconductors 13 Rev. 2 Oct-04
Figure A. Definition of switching times
Figure B. Definition of switching losses
I r r m
90% I r r m
10% I r r m
di /dt F
t r r
I F
i,v
t QS
QF
t S
t F
V R
di /dt r r
Q =Q Qr r S F
+
t =t t r r S F
+
Figure C. Definition of diodesswitching characteristics
p(t)1 2 n
T (t) j
τ1
1
τ2
2
n
n
τ
TC
r r
r
r
r r
Figure D. Thermal equivalentcircuit
Figure E. Dynamic test circuit
Leakage inductance Lσ =60nH
and Stray capacity C σ =40pF.
7/27/2019 IKA06N60T Data Sheets
http://slidepdf.com/reader/full/ika06n60t-data-sheets 14/14
IKA06N60T^
TrenchStop series
Power Semiconductors 14 Rev. 2 Oct-04
Published byInfineon Technologies AG, Bereich Kommunikation
St.-Martin-Strasse 53,D-81541 München © Infineon Technologies AG 2004All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as warranted characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits,descriptions and charts stated herein.
Infineon Technologies is an approved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest InfineonTechnologies Office in Germany or our Infineon Technologies Representatives worldwide (see address list).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in questionplease contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express writtenapproval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protecthuman life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.