A 10b Ternary SAR (TSAR) ADC with Decision Time Quantization

Based Redundancy

Jon Guerber, Manideep Gande, Hariprasath Venkatram,

Allen Waters, Un-Ku Moon

Oregon State University, Corvallis OR USA

TSAR Outline

• SAR Motivation

• TSAR Structure and Benefits

• Implementation

• Measured Results

• Conclusions

2

SAR Motivation

• SAR Contributions– Low Power– Scalable– Good Small

Process Node FOM– Little/No Static

Current

• High Efficiency SAR Design Factors– Power: Cap array, comparator, DAC drivers, logic– Speed: Comparator delay, reference settling– Resolution: Settling errors, cap mismatch

SAR

DAC Driver

DAC Driver

Cap DAC

Cap DAC

VIN

DOUT

3

Merged Capacitor Switching SAR

• Merged Capacitor Switching (MCS) – Sampling reference

is Vcm

– Differentially switches DAC

– Minimizes switching power

– Maintains virtual node common mode

[Hariprasath ELetters 2010]

C2^(N-3)C2^(N-2)C

VINP

SAR

DACP

VT

DACN

VINN

C2^(N-3)C2^(N-2)C

VCM

VCMVDD

VDD

4

Comparator Delay Variation per Stage

Comparator Transfer Function

tOUT GV = V exp A - 1 t / τ

Comparator Delay vs. Stage Voltage

• Comparator decision time increases linearly with stage

5

TSAR Outline

• SAR Motivation• TSAR Structure and Benefits

– Redundancy, Speed, and Power– Residue Shaping– Stage Grouping

• Implementation• Measured Results• Conclusions

6

Ternary SAR (TSAR) Architecture

• Ternary SAR (TSAR) uses comparator delay information to create a coarse third level– Middle level is based on input magnitude– DAC operation is skipped for a middle code

Vfs/4

-Vfs/4

Vfs

-Vfs

10

01

00

Subtract Vfs/2 From

Input

Add Vfs/2 to Input

Defer Decision to Next Stage

Digital Output

DAC Action

Time Comp = 1

Voltage Comp = 1

Voltage Comp = 0

Time Comp = 0

7

SAR

DAC Driver

DAC Driver

Cap DAC

Cap DAC

VIN

DOUTTime Comp

Delay

TSAR Redundancy

• TSAR Provides 1.5b/stage redundancy– Tolerates small settling errors, fixes over-range errors– No extra cycles or sub-radix arrays needed– Adds just like conventional 1.5b/stage pipelined ADCs

Vfs/4

-Vfs/4

Vfs

-Vfs

10

01

00

Subtract Vfs/2 From

Input

Add Vfs/2 to Input

Defer Decision to Next Stage

Digital Output

DAC Action

Time Comp = 1

Voltage Comp = 1

Voltage Comp = 0

Time Comp = 0

X XX X

X XX X

d1

d2

d3

d4

b1 b2 b3 b4 b5

8

TSAR Speed Enhancements

• Comparison Time Reduced in Coarse Steps– Codes that take longer then Vfs/4 = middle code– Comparator delay per stage is now reduced– Worst case conversion delay shortened

9

Binary SAR

TSAR

Fixed Conversion Time

TSAR DAC Activity Reduction

• TSAR Switching Activity Reduction– When the input is in the center code, no DAC cap is

switched– Like “Multi-Comparator” Circuit but with no extra

voltage comparators [Liu, VLSI 2010] 10

Switch

Switch

Switch

Stage 1 Stage 2 Stage 3

No Switching

VREF

-VREF

0

Switch

TSAR Residue Shaping

• TSAR Residue Shaping due to 1.5b redundancy– Improves SQNR by 6dB (Reduces DAC spread by ½)– Further reduces latter stage DAC activity

1 -11/2 -1/2

1/2

0

Stage 1

1/4 -1/4

1 -11/2 -1/2

1/2

0

Stage 2

1/4 -1/4

3/2

1 -11/2 -1/2

1/2

0

Stage 3

1/4 -1/4

7/2

11

-1/512 1/512-1/1024 1/10240

.05%.05%

99.9% of CodesStage 9 PDF

TSAR Stage Grouping and Skipping

• TSAR Stage Grouping– Allows for cycle skipping (10b in 8.02 ave. cycles)– Reduces number of distinct reference levels

VFS

-VFS

VFS

-VFS

VFS VFS VFS

-VFS -VFS -VFS

VIN

STAGE: 1 2 3 4 5

Skip

Stage

Don’t

Charge

Caps

ACTION: Normal

Operation

Normal

Operation

Normal

Operation

12

TSAR Stage Grouping and Skipping

• TSAR Stage Grouping– Grouping based on

power simulations– Comparator power

also reduces (20% less on average)

1 2 3 4 5 6 7 8 9Stages:

Delay Reference(As a fraction of Vfs) 1/8 1/10241/32

Comparisons Per Code

13

TSAR Switching and Driver Energy

• TSAR Energy Reductions over the MCS SAR– Average DAC switching energy is reduced by 63.9%– Average driver energy is reduced by 61.3%

DAC Switching Energy per Code Driver Energy per Code

14

TSAR Outline

• SAR Motivation• TSAR Structure and Benefits

• Implementation– Comparator and Logic Modifications– Calibration– Layout

• Measured Results• Conclusions

15

TSAR Implementation

• TSAR Implemented in 0.13µm CMOS – Delay elements consist of current starved inverters– Input switches are bootstrapped [Dessouky JSSC 2001]– Inverter based DAC Drivers

SAR

DAC Driver

DAC Driver

Cap DAC

Cap DAC

VIN

DOUTTime Comp

Delay

16

TSAR Voltage Comparator

• Voltage Comparator– NMOS input devices, PMOS latch only– Uses high VTH devices to read output– Outputs directly feed time comparator 17

CPVINP VINN

CLK CLK

CLK

CLK

CNLatchLatch

TCN TCP

TSAR Time Comparison

• Time references set with internal clocking unit– Current starved

inverter based18

RST

VGP

VGN

Current Starved

Time Latch

Time Latch

To SAR Logic

To SAR Logic

CLK

Internal Clock

Voltage Comparator Regerating

Time Latch Transparent

Voltage Comparator

Resetting

Time Data Latched

Comparator Operations

TSAR Logic Modifications

• Skipping logic blocks determine the next enabled state based on time information 19

DFFD Q

Q

Skipping Logic 1

D Q

DLCH

D Q

DLCH

TP

TN

DFFD Q

Q

Skipping Logic 2

D Q

DLCH

D Q

DLCH

TP

TN

DFFD Q

Q

D Q

DLCH

D Q

DLCH

TP

TN

SLN

SL3

DFF3

UP1 UP2 UPN

DN1 DN2 DNN

CK

DFFS Q

R Q

RST

Time Comp P

Time Comp N

CP

CN

TP

TN

CK

TSAR State Machine Enhancements

• TSPC DFF optimized for SAR ring counter– Reduces energy on “00” state with simple asy. reset– Saves 70% of state machine power – Increases setup time by 50%

bN-1 bN ETSPC EPROP

7.93fJ 0.10fJ

3.67fJ

6.69fJ0.02fJ

3.73fJ

9.10fJ0.02fJ

0

0

11

0

1

01

20

CK

CK

CK

CK

RSTD

Q

TSAR Reference 3 Calibration

• Reference Calibration Sets Third Reference– No static power, reference stored as capacitor voltage– First 2 references are coarse and only used for

redundancy in groups 1 and 2– Works on the principle that latter stage distribution

become more white [Levy TCASI 2011]

Mod-N ACC

Dynamic CP

01 (+1)

10,00 (-1)

Roll Up

Roll DN

VTREF3

For ¼ Time Level, 50% of codes should equal “01”

21

TSAR Die Photo

• Layout Specs– JAZZ 0.13µm

CMOS– Active Area =

0.056mm²

311µm

180µm

Analog CoreSAR and

Logic

Cap Drivers

Capacitor

Array

Capacitor

Array

Calibration

Circuit

200µm x

80µm

Cap Drivers

22

TSAR Outline

• SAR Motivation

• TSAR Structure and Benefits

• Implementation

• Measured Results– Resolution– Power Distribution

• Conclusions23

TSAR Measured Results

TSAR Frequency Response Nyquist ENOB vs. CLK Frequency

8 MHz CLKVDD = 0.8VFOM = 16.9fJ/C-S

24

TSAR Measured Results

TSAR Frequency Response Nyquist ENOB vs. CLK Frequency

8 MHz CLKVDD = 0.8VFOM = 16.9fJ/C-S

25

TSAR Power ConsumptionMeasured TSAR Power vs. Input TSAR Power Breakdown

40%

38%

6%

4%8%

4%

Comparator Cap Array/DriversTime Comparison Bootstrap SwitchSAR Logic Ref/CLK Gen

26

TSAR Performance Summary

CLK Freq. (MHz) 8 8 20 20

Supply (V) 0.8 1.2 0.8 1.2

Input Freq. (MHz) 4 4 10 10

Total Power (µW) 84 231 202 526

SNDR (dB) 57.6 59.6 53.3 55.7

SFDR (dB) 76.1 76.8 74.1 78.6

FOM (fJ/CS) 16.8 36.8 26.8 52.8

27

TSAR Outline

• SAR Motivation

• TSAR Structure and Benefits

• Implementation

• Measured Results

• Conclusions

28

TSAR Summary

• Accuracy Improvements– Redundancy, Residue Shaping, and Calibration

• Speed Improvements– Reduced comp. delay and capacitor settling time

• Power Reduction– Stage Skipping, DAC activity reduction, residue

shaping, and logic modifications

• Implementation– Working chip demonstrated in 0.13um CMOS

29

Questions

30

Backup Slides

31

References I

1. V. Hariprasath, J. Guerber, S.-H. Lee, and U. Moon, “Merged capacitor switching based SAR ADC with highest switching energy-efficiency,” Electron. Lett., vol. 46, pp. 620-621, Apr. 29, 2010.

2. Y. Zhu, C.-H. Chan, et al., “A 10b 100MS/s reference-free SAR ADC in 90nm CMOS,” IEEE J. Solid-State Circuits, vol. 45, pp. 1111-1121, Jun. 2010.

3. J. Yang, T. Naing, and R. Brodersen, “A 1 GS/s 6b 6.7mW successive approximation ADC using asynchronous processing,” IEEE J. Solid-State Circuits, vol. 45, no. 8, pp. 1469-1478, Aug. 2010.

4. C.-C. Liu, S.-J. Chang, et al., “A 1V 11fJ/conversion-step 10b 10MS/s asynchronous SAR ADC in 0.18um CMOS,” IEEE Symp. On VLSI Circuits, June 2010, pp. 241-242.

32

References II

5. B. Levy, “A propagation analysis of residual distribution in pipeline ADCs,” IEEE Trans. Circuits Syst. I, Fundam. Theory Appl., vol. 58, no. 10, pp. 2366-2376, Oct. 2011.

6. M. Dessouky, A. Kaiser, “Very low-voltage digital-audio ΔΣ modulator with 88-dB dynamic range using local switch bootstrapping,” IEEE J. Solid-State Circuits, vol. 36, no. 3, Mar. 2001.

33

TSAR Time Comparator

• Internal Clocking Circuit Details– 2 phases, comparator asynchronously reset

34

SAR Registers,

Phase selector

and Reference selector

RSTVGP

VGN

CKSET

CKRST

CKSET

CKRST

CKRST

CKSET

Current Starved

TSAR Time Comparator

• Time Comparator– Gated Inverter

Based– Device strength

based on speed and accuracy

– Outputs fed to SAR Registers

35

CLK

CP

TNP

Internal Clock

Voltage Comparator Regerating

Time Comparator Transparent

Voltage Comparator

Resetting

Time Data Latched

Comparator Operations

TSAR Time Comparison

• CLK pulse width sets time comparison threshold36

Internal Clock

Voltage Comparator Regerating

Time Latch Transparent

Voltage Comparator

Resetting

Time Data Latched

Comparator Operations