6 delay fault testing tutoria patel
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Delay-Fault Testing Tutorial
Acknowledgement: This presentation is adapted from
Professor Janak Patels tutorial on the same topic available
on the web at:http://courses.ece.uiuc.edu/ece543/docs/DelayFault_6_per_page.pdf
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Delay Fault Testing Tutorial 2
Outline
Common Fault Models (Review)
Defects and Delay Faults
Delay Fault Models Transition Faults
Path Delay Faults
Robust Path Test Non-robust Path Test
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Delay Fault Testing Tutorial 3
Common Fault Models
Fault Model De inition
Stuck-at Fault (S F) Logic line stuck at 0 or 1
(can be single or multiple)
Bridging Signals x and y become
D(x,y) or (x,y)
Stuck-open Signal x stuck in some
previous state
Delay n I/ path bet een clocked
elements has excessive delayCoupling Signals x and y become F(x,y)
attern Inter erence Signals interact in space & time
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Only if no other path delay is increased.
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Delay Fault Testing Tutorial 23
Exercise
Consider the 4-Nand implementation of the
XOR gate in the previous slide. There are
six I/O paths hence 12 path delay faults. For
each of these faults, determine if it isrobustly testable, only non-robustly testable
or not testable (functionally redundant).
Provide justification for your answers.
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Broadside is also called launch-off-capture test.Skewed-Load is also called launch-off-shift test.
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Timing forlaunch-off-captureTransition-delay
fault testing
IC: Initialization ClockLC: Launch Clock
CC: Capture ClockSEN: Scan Enable
This figure is borrowed from the paper, Ahmed et al., ITC-2005, Paper 11.1
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Timing forlaunch-off-shiftTransition-delay
fault testing
IC: Initialization ClockLC: Launch Clock
CC: Capture ClockSEN: Scan Enable
This figure is borrowed from the paper, Ahmed et al., ITC-2005, Paper 11.1
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Delay Fault Testing Tutorial 34(See Prof. Patels website for details on SegmentTest)
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