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Workshop on 3D Imaging and Surface Metrology with Optical Microscopy Tuesday May 27 th , 2014 GENERAL INFORMATION • Objective of the workshop During this workshop the main concepts of imaging and analysis of surfaces with optical microscopy will be introduced and developed, linked with the standards for surface characterization ISO 4287 and ISO 25178. These theoretical concepts will be practiced during hands-on sessions with the new confocal and Interferometric system, the Leica DCM8 and with the new Focus Variation Digital Microscope Leica DMS Series. • Registration: To register, please go to the link below and fill in the online form: www.leica-microsystems.com/metrology_workshop The workshop will be limited to 20 participants to ensure that everyone has plenty of hands-on time with the micro- scopes. Places will be assigned in order of registration. You will receive an acknowledgement after your registration. • Date: Tuesday May 27 th , 2014 • Location: Leica Microsystèmes SAS, 8 avenue de l’lle Saint Martin, 92737 NANTERRE • Contact : Olivier Pigny, Jean-Marc Ellens • Registration deadline: May 23 rd • Analysis of samples during practical sessions: Those participants interested in analyzing their samples should bring them and provide a short description prior to the workshop, to ensure Leica Application Specialist can provide the expected results during the workshop. Sales Representative : Olivier Pigny Jean-Marc Ellens Application Specialists : Patrice Belin & Agnes Landouar www.leica-microsystems.com www.leica-microsystems.com Leica Microsystèmes SAS 8 avenue de l’Ile Saint Martin 92737 NANTERRE +33 1 3056 4112

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Workshop on 3D Imaging and Surface Metrology with Optical Microscopy

Tuesday May 27th, 2014

General InformatIon

• Objective of the workshop During this workshop the main concepts of imaging and analysis of surfaces with optical microscopy will be introduced and developed, linked with the standards for surface characterization ISO 4287 and ISO 25178. these theoretical concepts will be practiced during hands-on sessions with the new confocal and Interferometric system, the Leica DCM8 and with the new focus Variation Digital microscope Leica DMS Series.

• Registration: to register, please go to the link below and fill in the online form: www.leica-microsystems.com/metrology_workshop the workshop will be limited to 20 participants to ensure that everyone has plenty of hands-on time with the micro-scopes. Places will be assigned in order of registration. You will receive an acknowledgement after your registration.

• Date: tuesday may 27th, 2014• Location: leica microsystèmes SaS, 8 avenue de l’lle Saint martin, 92737 nanterre• Contact: olivier Pigny, Jean-marc ellens• Registration deadline: may 23rd

• Analysis of samples during practical sessions: those participants interested in analyzing their samples should bring them and provide a short description prior to the workshop, to ensure leica application Specialist can provide the expected results during the workshop.

Sales Representative : Olivier PignyJean-Marc Ellens

Application Specialists : Patrice Belin & Agnes Landouar

www.leica-microsystems.com

leica microsystèmes SaS8 avenue de l’Ile Saint martin92737 nanterre+33 1 3056 4112