top production and branching ratios
DESCRIPTION
Top production and branching ratios. For DØ collaboration Elizaveta Shabalina University of Illinois at Chicago Wine and Cheese seminar at FNAL 09/16/05. Outline. Introduction Top pair production Dilepton channel Lepton+jets Event kinematics method B-tagging method - PowerPoint PPT PresentationTRANSCRIPT
11
Top production and branching Top production and branching ratios ratios
For DØFor DØ collaboration collaboration
Elizaveta ShabalinaUniversity of Illinois at Chicago
Wine and Cheese seminar at FNALWine and Cheese seminar at FNAL09/16/0509/16/05
09/16/0509/16/05 E. Shabalina Joint Theoretical and Experimental Seminar E. Shabalina Joint Theoretical and Experimental Seminar 22
OutlineOutline
• IntroductionIntroduction
• Top pair productionTop pair production– Dilepton channelDilepton channel– Lepton+jets Lepton+jets
•Event kinematics methodEvent kinematics method
•B-tagging methodB-tagging method
• Top branching ratio Top branching ratio
• Top pair production in all hadronic Top pair production in all hadronic channelchannel
09/16/0509/16/05 E. Shabalina Joint Theoretical and Experimental Seminar E. Shabalina Joint Theoretical and Experimental Seminar 33
• Tevatron was built Tevatron was built more than a decade more than a decade ago to discover top ago to discover top quark successfully quark successfully achieved in 1995 achieved in 1995
• Run I cross sections: Run I cross sections:
– CDF CDF and D0 and D0
• Precision (~25%) was Precision (~25%) was severely statistically severely statistically limitedlimited
Top quark physics todayTop quark physics today• At present At present
– s = 1.96 TeV - 30% higher s = 1.96 TeV - 30% higher production rateproduction rate
– much higher luminositymuch higher luminosity
• Current goal – deliver precision Current goal – deliver precision measurementsmeasurements
• Theoretical prediction of cross Theoretical prediction of cross section – 6.5% accuracysection – 6.5% accuracy
• Tev2000 study: precision of Tev2000 study: precision of ttbar cross section ttbar cross section measurement measurement
• Five W&C seminars since June Five W&C seminars since June 11stst are dedicated to top physics are dedicated to top physics
pbtt 7.14.15.6)(
pbtt 6.17.5)(
1 fb1 fb-1-1 11%11%
10 fb10 fb--
11
5.9%5.9%
09/16/0509/16/05 E. Shabalina Joint Theoretical and Experimental Seminar E. Shabalina Joint Theoretical and Experimental Seminar 44
Top cross section - motivationTop cross section - motivation• Important test of Important test of
perturbative QCDperturbative QCD• Higher production rate Higher production rate
ttbar resonances ttbar resonances (topcolor) (topcolor)
• Measure in different Measure in different channels channels – Exotic top decays (to Exotic top decays (to
charged Higgs or light charged Higgs or light stop) different cross stop) different cross sections in different sections in different channelschannels
– Dilepton to l+jets cross Dilepton to l+jets cross sections ratio tests sections ratio tests top decays without W top decays without W boson in final state boson in final state
• Measure with Measure with different methodsdifferent methods– b-jet tagging method b-jet tagging method
assumes assumes Br Br (t (t Wb) Wb) = 1= 1• an implicit use of the an implicit use of the
SM prediction: |VSM prediction: |Vtbtb||=0.9990 =0.9990 0.9992 (at 0.9992 (at 90%C.L.) 90%C.L.)
– Topological method Topological method is free from this is free from this assumptionassumption
– Using both test of Using both test of top decays without top decays without bb quark in the final quark in the final statestate
Test of S
tandard
Model
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Top productionTop production
• Standard model pair production through strong Standard model pair production through strong interactionsinteractions
• Standard model electroweak productionStandard model electroweak production (single top)(single top)
q-q
~85% ~15%
g-g
Discovered in Run I
To be observed in Run II
= 6.77 ± 0.42 pb for mtop = 175 GeV
=0.88±0.04 pb
=1.98+0.22 pb-0.16
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• Very short lifetime Very short lifetime decays as a free quarkdecays as a free quark
• BrBr (t (t Wb) Wb) 100% 100%
… … and decayand decay• W decay modes W decay modes
determine top quark determine top quark final statefinal state
• Dilepton (ee, Dilepton (ee, μμμμ, e, eμμ))– Both W’s decay Both W’s decay
leptonicallyleptonically– BR = 5%BR = 5%
• Lepton (e or Lepton (e or μμ) + jets) + jets– One W decays leptonically, One W decays leptonically,
another one hadronicallyanother one hadronically– BR = 30%BR = 30%
• All-hadronicAll-hadronic– Both W’s decay Both W’s decay
hadronicallyhadronically– BR = 44%BR = 44%
• ττhadhad +X +X– BR = 23%BR = 23%
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DDØ detectorØ detectorAll detector subsystems are important for high quality top quark measurements • ElectronsElectrons - energy - energy
clusters in EM clusters in EM section of the section of the calorimeter and calorimeter and track in the track in the central tracking central tracking systemsystem
• MuonsMuons - track - track segments in muon segments in muon chambers and chambers and track in the track in the central tracking central tracking systemsystem
• Jets - Jets - clusters of clusters of energy in EM and energy in EM and hadronic parts of hadronic parts of calorimeter calorimeter
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Tuning simulation to dataTuning simulation to data• Monte Carlo simulation is Monte Carlo simulation is
used to calculate selection used to calculate selection efficiencies and to simulate efficiencies and to simulate event kinematicsevent kinematics
• improve the agreement improve the agreement between data and MC:between data and MC:– additional smearing of the additional smearing of the
reconstructed objectsreconstructed objects– correction factors derived correction factors derived
from comparison of Zfrom comparison of Zll ll data and MC events and data and MC events and applied to MCapplied to MC
• Systematic uncertainties – Systematic uncertainties – from uncertainties on the from uncertainties on the smearing parameters smearing parameters and/or from the and/or from the dependence on detector dependence on detector regions, various jet regions, various jet environmentenvironment
SF =
RMS
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Electron Electron • Deposit >90% of energy in the Deposit >90% of energy in the
EM calorimeter within a cone of EM calorimeter within a cone of R<0.2 relative to the shower R<0.2 relative to the shower axisaxis
• Isolated: the ratio of the energy Isolated: the ratio of the energy in the hollow cone 0.2 < in the hollow cone 0.2 < R < R < 0.4 to the reconstructed 0.4 to the reconstructed electron energy ≤ 15%electron energy ≤ 15%
• Transverse and longitudinal Transverse and longitudinal shower shapes consistent with shower shapes consistent with those expected for an electronthose expected for an electron
• Reconstructed track found Reconstructed track found within within R< 0.5 from the shower R< 0.5 from the shower position in the calorimeterposition in the calorimeter
• Discriminant combining Discriminant combining information from central information from central tracking system and calorimeter tracking system and calorimeter is consistent with the is consistent with the expectations for a high-pexpectations for a high-pTT isolated electron isolated electron
Electron and muon Electron and muon identificationidentification
MuonMuon
• a muon track segments are a muon track segments are matched inside and outside of matched inside and outside of the toroidthe toroid
• timing (from associated timing (from associated scintillator hits) is within 10 ns scintillator hits) is within 10 ns of the interaction of the interaction muon muon originates from primary vertexoriginates from primary vertex
• a track reconstructed in the a track reconstructed in the tracking system belonging to tracking system belonging to event vertex is matched to the event vertex is matched to the muon candidate found in the muon candidate found in the muon systemmuon system
• Isolated in calorimeter and in Isolated in calorimeter and in the tracking system; isolation the tracking system; isolation criteria are different for criteria are different for dilepton and l+jets analyses dilepton and l+jets analyses
l o o
s e
t i g
h t
l o o
s e
t i g
h t
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jet
jet
b
b
p p
E T
Dilepton channelsDilepton channels• Selection Selection
– At least two jets (pAt least two jets (pTT>20 GeV, >20 GeV, |y|<2.5) |y|<2.5)
– Two charged opposite sign Two charged opposite sign leptons (pleptons (pTT>15 GeV; e: |>15 GeV; e: |||<1.1 or 1.5<|<1.1 or 1.5<||<2.5; |<2.5; μμ: |: |||<2)<2)
– Lepton quality: “tight” Lepton quality: “tight” μμ,, “tight” e in ee, “loose” e in “tight” e in ee, “loose” e in eeμμ ( (electron discriminant electron discriminant distribution in data is used to distribution in data is used to extract ttbar signal) extract ttbar signal)
– Large missing ELarge missing ETT in ee and in ee and μμμμ channels; no cut in echannels; no cut in eμμ
• and further selections and further selections are optimized for each are optimized for each channel to account for channel to account for difference in backgroundsdifference in backgrounds
• SignatureSignature
_
EETT
pp
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• Drell-Yan Drell-Yan background background rejectionrejection
• ee: ee: – veto events with veto events with
80<M80<Meeee<100<100– >35 GeV(>40 >35 GeV(>40
GeV) for MGeV) for Meeee>100 >100 GeV (MGeV (Meeee<80 GeV) <80 GeV)
• μμμμ::– >35 GeV>35 GeV– is tightened at low is tightened at low
and high values of and high values of azimuthal distance azimuthal distance φφ( ( μμ, , ))
– Remove events with Remove events with φφ((μμ, , )>175°)>175°
BackgroundsBackgrounds• PhysicsPhysics
– Leptons from W/Z decay Leptons from W/Z decay and missing Eand missing ETT from from neutrinos: WW/WZ, neutrinos: WW/WZ, Z/Z/**ll ll
– Estimated from MCEstimated from MC• InstrumentalInstrumental
– jet or lepton in jet fakes jet or lepton in jet fakes isolated lepton (QCD, isolated lepton (QCD, W+jets) W+jets)
– missing Emissing ET T originates originates from resolution effects, from resolution effects, misreconstructed jet or misreconstructed jet or lepton or noise in lepton or noise in calorimeter (Drell-Yan calorimeter (Drell-Yan processes Z/processes Z/**ee(ee(μμμμ) ) (e(eμμ channel is not channel is not affected)affected)
EETT
EETT
EETT
EETT
EETT
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BackgroundsBackgrounds• Fake electron (W+jets, Fake electron (W+jets,
QCD events) QCD events) – Fake rate Fake rate from data from data
sample dominated by fake sample dominated by fake electrons (2 loose EMs, electrons (2 loose EMs, low , outside Z mass low , outside Z mass window)window)
– Measure fraction of loose Measure fraction of loose electrons that pass tight electrons that pass tight criteriacriteria
• Fake isolated muon Fake isolated muon (muons from heavy flavor (muons from heavy flavor decays) decays) – Use loose dimuon eventsUse loose dimuon events– One non-isolated muonOne non-isolated muon– Measure probability that Measure probability that
the other is isolatedthe other is isolated• Multiply by number of loose-Multiply by number of loose-
tight events in data tight events in data
• Fake in Z/Fake in Z/** ee( ee(μμμμ) – ) – primary background in ee(primary background in ee(μμμμ) ) channelschannels– spectrum in MC Z events spectrum in MC Z events
agrees well with dataagrees well with data– μμμμ: : directly from simulation directly from simulation – ee: fake rate is measured in ee: fake rate is measured in
+jet events; multiplied by the +jet events; multiplied by the number of data events that fail number of data events that fail the selection but pass all the selection but pass all others in MCothers in MC
22 cut on fit to Z hypothesis ( cut on fit to Z hypothesis (μμμμ))
EETT
EETT
EETT
EETT
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eeμμ channel channel• The cleanest channelThe cleanest channel• Optimized to minimize total Optimized to minimize total
errorerror• Optimal cut removes Z/Optimal cut removes Z/**
backgroundbackground
• Extract fake electron Extract fake electron background from the fit to the background from the fit to the observed distribution of observed distribution of electron LH in data electron LH in data
• Shape for real electrons – from Shape for real electrons – from Z Z ee data ee data
• Shape for fake electrons – from Shape for fake electrons – from background dominated sample background dominated sample (anti-isolated muon, low (anti-isolated muon, low missing Emissing ETT))
GeVppHj
jT
lT
lT 122
real electrons
fake electrons
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ResultsResults
Background control bin
ttbar signal
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Dilepton events propertiesDilepton events properties
Electron likelihood distribution for data events after full selection
eμ
combined
for tt= 7 pb
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obs
NN
ifakei
N
iefake
obs
N
exBNxSNLBRNN
fakeeobs )(
1
))()((}),,,,{,(
L
• ee and ee and μμ channels – counting experiments– Define likelihood for each channel based on Poisson probability that
expected number of signal + background events j is compatible with observed Nj
obs
– where
• eμ channel – extended unbinned likelihood method
Cross section calculationCross section calculation
bkgjjjjjj NLBR
,!
),(}),,,,{,( j
obsj
eN
NPLBRNNobsj
Nj
jobsjjjj
bkgj
obsjj
L
bkgphyse NBRLN - electron likelihood
distributions for signal and background events
xi – value of electron likelihood for an electron in each event
bkgphysN - number of physics background
eventsFit simultaneously cross section and Nfake
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ee:
Cross sections Cross sections
)(5.0)()(9.7 5.11.1
2.58.3 lumisyststattt
)(1.0)()(8.1 8.11.1
8.40.3 lumisyststattt
μμ:
)(7.0)()(2.10 6.12.1
1.36.2 lumisyststattt
eμ:
For dilepton channel combination minimize the sum of negative log-likelihood functions for individual channels
)(6.0)()(6.8 2.10.1
3.20.2 lumisyststattt
combined dilepton @ m_top = 175 GeV
370 pb370 pb-1-1
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Systematic uncertaintiesSystematic uncertainties
Comparable contributions from all sources
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Lepton+jets channelLepton+jets channel
• SignatureSignature • SelectionSelection– One isolated lepton One isolated lepton
(p(pTT>20 GeV; e: |>20 GeV; e: |||<1.1 or 1.5<|<1.1 or 1.5<|||<2.5; <2.5; μμ: |: ||<2)|<2)
– At least four jets At least four jets (p(pTT>20 GeV, |y|>20 GeV, |y|<2.5)<2.5)
– >20 GeV and not >20 GeV and not collinear with lepton collinear with lepton direction in direction in transverse planetransverse plane
b
bp p
E T
jet
jet
jet
jet
_
_
EETT
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Sample compositionSample composition
Estimate amount of QCD from Matrix Method
Multijet backgroun
d
QCDsig
tightloosesigQCD
NNN
Nloose
Ntight
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Discriminant function definitionDiscriminant function definition
,...),(,...),(
,...),(
2121
21
xxBxxS
xxSD
1)(/)(
)(/)(
iiii i
i iiii
xbxs
xbxs
1))(lnexp(
))(lnexp(
ii
i
ii
i
b
sb
s
1))(lnexp(
))(lnexp(
i
ifitted
i
ifitted
bsbs
– probability density functionsfor signal and background a set of input variables
BS ,
,..., 21 xx
normalized distributions of variable i for signal and background
)(),( iiii xbxs
Transform topological variables to be less sensitive to statistical fluctuations in regions of rapid variations
Build logarithm of the signal to background ratios and fit with polinomial
• Only ttbar and W+jets simulated events are used to build discriminant
• Kinematic properties of multijet background are similar to W+jets
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Discriminating variablesDiscriminating variables• HHTT – scalar sum of the – scalar sum of the
ppTT of four leading jets of four leading jets • Centrality – ratio of Centrality – ratio of
scalar sum of jet pscalar sum of jet pTT to to scalar sum of jet scalar sum of jet energiesenergies
• AplanarityAplanarity• SphericitySphericity•
• Set of variables is Set of variables is chosen chosen – to provide the best to provide the best
separation between separation between ttbar and W+jets ttbar and W+jets backgroundbackground
– to have the least to have the least sensitivity to the sensitivity to the dominant systematic dominant systematic uncertaintiesuncertainties
• Only 4 highest pOnly 4 highest pTT jets jets are used to build are used to build variables variables
((l,l,EETT))• kkTminTmin==RRjjjj
minminppTTminmin/E/ETT
WW, , RRjjjj
minmin maximum maximum separation between pairs separation between pairs of jets, Eof jets, ETT
WW – scalar sum – scalar sum of lepton pof lepton pTT and , p and , pTT
minmin – – ppTT of the lower p of the lower pTT jet jet
EETT
Linear combination of Linear combination of the eigenvalues of a the eigenvalues of a normalized momentum normalized momentum tensortensor
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By construction background peaksat 0, signal – at 1
Discriminant functionDiscriminant function• Fit modeled discriminant function distribution to that of data
• Extract Nttbar, W+jets and multijet events in the sample
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Cross sectionCross section• Define Define
where Poisson probability density for where Poisson probability density for nn observed events observed events given given μμii predicted, predicted, ii runs over all bins of the discriminant, n runs over all bins of the discriminant, nii
obsobs – – content of bin content of bin ii as obtained in selected sample as obtained in selected sample
• Expected number of events in bin Expected number of events in bin ii is a function of number of is a function of number of ttbar, W and QCD events in the selected sample:ttbar, W and QCD events in the selected sample:
• f - fractions in bin f - fractions in bin ii of the ttbar, W and QCD discriminant of the ttbar, W and QCD discriminant templatestemplates
• Second term implements Matrix Method constraint on number of Second term implements Matrix Method constraint on number of QCD events via the Poisson probability of the observed number of QCD events via the Poisson probability of the observed number of events in loose but not tight sampleevents in loose but not tight sample
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ResultsResults
e+jets
μ+jets )(4.0)()(4.5 2.10.1
8.16.1 lumisyststattt
)(5.0)()(2.8 9.13.1
1.29.1 lumisyststattt
e+jets μ+jets
240 pb240 pb-1-1
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Results combinedResults combined
)(4.0)()(7.6 6.11.1
4.13.1 lumisyststattt
For lepton+jets channel combination minimize the sum of negative log-likelihood functions for individual channels
combined @ m_top = 175 GeV
Sample composition:Sample composition:
38% ttbar
44% W+jets
18% multijet background
240 pb240 pb-1-1
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Event kinematicsEvent kinematics
Background
dominatedsig
nal
dominate
d
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Systematic uncertaintiesSystematic uncertainties
By far the largest systematic uncertainty comes from the Jet energy calibration, 90% of total error
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• event has two event has two bb-jets -jets • bb-jets in background -jets in background
processes are seldomprocesses are seldom• Use this feature to Use this feature to
discriminate signal from discriminate signal from backgroundbackground
• Dramatically improves Dramatically improves signal-to-background ratiosignal-to-background ratio
• Signature of a b decay is a displaced vertex – Forms long Forms long lifetime of B-
hadrons (c ~ 450μ) – B-hadrons travel Lxy ~
3mm before decay with large charged track multiplicity
Lepton+jets channel with Lepton+jets channel with bb--taggingtagging
• Use same selection as in topological analysis but – Relax cut on jet transverse
momentum: pT > 15 GeV– Use events with njet3
• Use events with one and two jets as control samples for background estimation
tt
QCD
W+jets
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• Reconstructs secondary vertex– 2 tracks with pT1GeV, 1
SMT hit, impact parameter significance >3.5
• Removes tracks associated with K0
S, 0 and photon conversions ( → e+e-)
• Positive tag: – Secondary vertex within a jet
with a decay length significance Lxy/Lxy>7
• Negative tag: – Secondary vertex within a jet
with a decay length significance Lxy/Lxy<7 (due to resolution effects)
bb-tagging algorithm - SVT-tagging algorithm - SVT
Impact parameter
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Tagging ratesTagging rates• bb-tagging efficiency-tagging efficiency
– Measured in dijet data Measured in dijet data events for jets with events for jets with muon insidemuon inside
– Compare two samples with Compare two samples with different heavy flavor different heavy flavor content (increased by content (increased by tagging the away jet)tagging the away jet)
– Tag jets with two tagging Tag jets with two tagging algorithms SVT and SLT algorithms SVT and SLT (SLT = soft muon with (SLT = soft muon with ppTT
relrel> 0.7 GeV inside a jet) > 0.7 GeV inside a jet) – Solve system of 8 eqs to Solve system of 8 eqs to
extract semileptonic extract semileptonic bb--tagging efficiencytagging efficiency
– Use MC to correct Use MC to correct measured efficiency to measured efficiency to that for inclusive that for inclusive bb-decays-decays
• Light tagging rateLight tagging rate– Measure negative tagging Measure negative tagging
rate in dijet events (low rate in dijet events (low missing Emissing ETT))
– Correct for long-lived Correct for long-lived particles in light jetsparticles in light jets
– Heavy flavor contribution in Heavy flavor contribution in dijet eventsdijet events
• cc-tagging rate-tagging rate– From MC corrected with the From MC corrected with the
SF derived for SF derived for bb-tagging-tagging
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BackgroundsBackgrounds• Calculate QCD (non-Calculate QCD (non-
W) contribution W) contribution from Matrix Method from Matrix Method
• Subtract small Subtract small backgrounds (single backgrounds (single top, VV, Ztop, VV, Z) using ) using known cross known cross sectionssections
• Separate W from Separate W from ttbar using ttbar using difference in their difference in their tagging probabilitytagging probability
• Interpret excess in Interpret excess in observed tagged observed tagged events with events with 3 jets 3 jets over predicted over predicted background as ttbar background as ttbar signal signal
small bkgr
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Event tagging probabilityEvent tagging probabilityDØ RunII Preliminary, 363pb-1
W+jets, W+jets, averageaverage
ttbarttbar
≥≥4j, 1 tag4j, 1 tag 4%4% 44%44%
≥≥4j, 2 tag4j, 2 tag 0.4%0.4% 15%15%
• Use MC to calculate event tagging Use MC to calculate event tagging probabilityprobability
• Depends on the flavor composition Depends on the flavor composition of the jets in the final and on the of the jets in the final and on the overall event kinematics overall event kinematics
• Apply the tagging rates measured Apply the tagging rates measured in data to each jet in MC based on in data to each jet in MC based on its flavor, pits flavor, pT and y and y
• For W+jets, use the ALPGEN MC to For W+jets, use the ALPGEN MC to estimate the fraction of the estimate the fraction of the different W+heavy flavor different W+heavy flavor subprocesses.subprocesses.
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ResultsResults
≥≥3j, 1tag3j, 1tag ≥≥3j, 2tag3j, 2tag ≥≥4j, 1tag4j, 1tag ≥≥4j, 4j, 2tag2tag
Expect bkgExpect bkg 71 ± 971 ± 9 7 ± 17 ± 1 22 22 ± 3± 3 1.51.5±0.3±0.3
S/BS/B 0.60.6 1.61.6 2.32.3 1212
Observed tagsObserved tags 121121 1111 8888 2121
Background dominated
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Kinematics of l+lets tagged Kinematics of l+lets tagged samplesample DØ RunII Preliminary, 363pb-1
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Cross sectionCross section
• Define likelihood based on Poisson probability that expected number of signal + background events j is compatible with observed Nj
obs
• The product is taken over 8 independent channels: e/μ +jets, one-/two-tags, 3rd and 4th jet multiplicity bins
• Multijet background in each tagged sample, and the corresponding samples before tagging, is constrained within errors to the amount obtained from Matrix Method
j
jobsjjjjj
bkgj
obsj NPLBRNN ),()},,,,{,( 8,...,1 L
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Result and systematic Result and systematic uncertaintiesuncertainties• Gaussian term for each source Gaussian term for each source of errors is included (of errors is included (nuisance nuisance parameter methodparameter method))
• Each source is allowed to Each source is allowed to affect the central value of the affect the central value of the cross section cross section
)(5.0)(1.8 3.12.1 lumisyststattt
Systematic and statistical uncertainties are the same ~ 11%
Main sources:
• JES and jet ID
• B-tagging efficiency in data
• W fractions
• Luminosity
• Combined statistical and Combined statistical and systematic error is obtainedsystematic error is obtained
• Individual Individual contributions are obtained by refitting after fixing all but the Gaussian term under study
363 pb363 pb-1-1
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• Probe the assumption Probe the assumption Br(tBr(tWb)=1Wb)=1
• CKM matrix element |VCKM matrix element |Vtbtb|=0.9990|=0.99900.9992 @90% C.L. 0.9992 @90% C.L. R=0.9980R=0.99800.9984. True in SM assuming 0.9984. True in SM assuming
– Three quark generationsThree quark generations– CKM matrix is unitaryCKM matrix is unitary
• For expanded CKM matrix |VFor expanded CKM matrix |Vtbtb|=0.07|=0.070.9993 @90% C.L.0.9993 @90% C.L.• CDF measurement: 162pbCDF measurement: 162pb-1-1
Branching ratio Branching ratio
2222
2
||||||||
||
)(
)(tb
tdtstb
tb VVVV
V
WqtBr
WbtBrR
)(12.1 27.023.0 syststatR
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MethodMethod
bbWWtt
lqbWWtt
2 2 bb-jets-jets
1 1 b, b, 1 light 1 light jetjet
2 light jets2 light jetsll qWqWtt
• Split selected sample Split selected sample into 3 categories: 0,1 into 3 categories: 0,1 and and 2 tags2 tags
• Predicted number of Predicted number of ttbar events depends ttbar events depends on Ron R
• Fit R and Fit R and tttt from the from the number of observed number of observed tagged events and tagged events and the event kinematics the event kinematics in 0 tag sample in 0 tag sample
• Compute probabilities to observe 0, 1 and Compute probabilities to observe 0, 1 and 2 tags for each final ttbar state2 tags for each final ttbar state
• Combine to obtain Combine to obtain PPn-tagn-tag(R), n-tag=0, 1, (R), n-tag=0, 1, 2 2 • Use topological discriminant in 0 tag sample with Use topological discriminant in 0 tag sample with 4 jets to determine ttbar content4 jets to determine ttbar content
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Fitting procedureFitting procedure
• Perform binned maximum Perform binned maximum likelihood fit to data in likelihood fit to data in – 10 bins of discriminant of 10 bins of discriminant of
l+jets 0 tag, Nl+jets 0 tag, Njetjet44– 2 bins of l+jets 0 tag, N2 bins of l+jets 0 tag, Njetjet=3=3– 4 bins of l+jets 1 tag, N4 bins of l+jets 1 tag, Njetjet=3, =3,
44– 4 bins of l+jets 2 tag, N4 bins of l+jets 2 tag, Njetjet=3, =3,
4 4 – Statistical fluctuations of the Statistical fluctuations of the
multijet background are taken multijet background are taken into account by additional 12 into account by additional 12 Poisson terms (0,1, Poisson terms (0,1, 2 tags, 2 tags, nj=3, nj=3, 4, e+jets, 4, e+jets, μμ+jets) +jets)
• Nuisance parameter method Nuisance parameter method to include systematic to include systematic uncertaintiesuncertainties
NNjetjet=3=3
NNjetjet44
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)(03.1)(
)( 19.017.0 syststat
WqtBr
WbtBr
ResultResult
)(5.0)(9.7 7.15.1 lumisyststattt
Statistical uncertainty dominates
230 pb230 pb-1-1
Potential for improvement – include dilepton events
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All hadronic channelAll hadronic channel• Signature: 6 jets, 2 Signature: 6 jets, 2 bb--
quark jetsquark jets• All decay products All decay products
should be visible in the should be visible in the detector, no energetic detector, no energetic neutrinos produced neutrinos produced
• Six jet multijet Six jet multijet production rate is production rate is many orders of many orders of magnitude larger than magnitude larger than ttbarttbar
• Impossible to extract Impossible to extract signal without tagging signal without tagging bb-jets – SVT algorithm -jets – SVT algorithm is used is used
• NNjetsjets 6, p 6, pTT>15 GeV>15 GeV• Suppress multiple Suppress multiple
interactions (second interactions (second interaction is also interaction is also hard QCD process): hard QCD process): – Reject events with Reject events with
several hard primary several hard primary vertices >3 cm apartvertices >3 cm apart
– At least 3 jets assignedAt least 3 jets assigned– Jet is assigned to PV if Jet is assigned to PV if
at least 2 tracks from it at least 2 tracks from it come from PVcome from PV
– Removes 32%Removes 32%• Reject bb background:Reject bb background:
– R(tagged jets)>1.5R(tagged jets)>1.5
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TRF and neural networkTRF and neural network• Derive TRF (tag rate Derive TRF (tag rate
function) in the 6-jet function) in the 6-jet data sample (ttbar data sample (ttbar contribution is ~0.3%) contribution is ~0.3%) in 4 bins of Hin 4 bins of HTT: 0: 0200, 200, 200 200 300, 300 300, 300 400, 400, 400 GeV400 GeV
• Parameterize as a Parameterize as a function of jet pfunction of jet pTT, , γγ, , φφ, , position of primary position of primary vertex along the beamvertex along the beam
• Compare predicted and Compare predicted and observed tagging rates observed tagging rates and obtain correction and obtain correction factorfactor
• Select a set of Select a set of variables variables discriminating signal discriminating signal from backgroundfrom background– Avoid as much as Avoid as much as
possible JES dependent possible JES dependent variablevariable
– Use smallest possible Use smallest possible number of input number of input variables variables
• Combine into Neural Combine into Neural network network
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Discriminating variables
• Energy ScaleEnergy Scale – H – HTT
• Event ShapeEvent Shape – aplanarity – aplanarity• Soft non-leading JetsSoft non-leading Jets – E – ET56 T56
– geometric mean of the – geometric mean of the transverse energies of the transverse energies of the 55thth and 6 and 6thth leading jet leading jet
Variables are designed to address different aspects of the background • Rapidity –Rapidity – < <22> - weighted > - weighted
RMS of RMS of of 6 leading jets of 6 leading jets • Top Properties – Top Properties –
– MMminmin3,43,4 – the second smallest – the second smallest
dijet massdijet mass– Mass likelihood, Mass likelihood, 22-like variable -like variable
calculated from Mcalculated from MWW, , WW, , toptop
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Cross section calculationCross section calculation
• Background was estimated on the Background was estimated on the sample containing signal correct sample containing signal correct cross sectioncross section
TRFTRF – probability to tag ttbar MC event using TRF
btagbtag – probability to tag ttbar event – probability to tag ttbar event using using b,cb,c and light tagging rates and light tagging rates
)1(btag
TRFtt
TRFobstt
L
NN
TRFTRF
0.125±0.00.125±0.00202
btagbtag 0.60±0.010.60±0.01
TRFTRF/TRFTRF 0.207±0.00.207±0.00404
NNobs obs = 541= 541 NNTRF TRF = = 494±8494±8
nn>0.nn>0.99
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Cross section and uncertaintiesCross section and uncertainties
)(3.0)()(2.5 5.10.1
6.25.2 lumisyststattt
At mAt mtoptop = 175 GeV, 350 pb = 175 GeV, 350 pb-1-1
JES error dominates – 70% of total systematic error
)()(7.10.8 3.32.2 syststattt
CDF 311 pb-1 :
~40% relative error
~55% relative error
Potential for Potential for improvement: make improvement: make better use of double better use of double tagged eventstagged events
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SummarySummary
)(4.0)(7.0)(6.01.7 lumisyststattt CDF combined up to 350 pb-1 ~13% relative error
Accepted for publication in PLB
Work in progress on combination of the latest results up to
370 pb-1
Best precision: ~16% l+jets/btag at
363 pb-1
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From TeV2000 to reality From TeV2000 to reality
• Do we meet Do we meet expectations?expectations?
• For 363 pbFor 363 pb-1-1: : – predicted – 180 predicted – 180 bb--
tagged events tagged events (scaled from 500 (scaled from 500 per fbper fb-1-1))
– Observed – 140 Observed – 140 (241 tagged event, (241 tagged event, 101 – expected 101 – expected background) background)
• Can we do better?Can we do better?– Data qualityData quality
• Improved calorimeter Improved calorimeter calibrationcalibration
• Improved performance of Improved performance of SMT is crucialSMT is crucial
– Improved simulationImproved simulation– OptimizationOptimization– Better tools Better tools
• Neural network lifetime Neural network lifetime b-taggerb-tagger
– Fighting major sources of Fighting major sources of systematic uncertaintiessystematic uncertainties
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Glance into the futureGlance into the future• Assumptions:Assumptions:
– Errors from limited MC Errors from limited MC statistics are set to 0statistics are set to 0
– Luminosity dependent Luminosity dependent and constant terms:and constant terms:• JESJES• B-tagging efficiencyB-tagging efficiency• Lepton identificationLepton identification
• Limiting factors: Limiting factors: – Luminosity (6.5%)Luminosity (6.5%)– Heavy flavor fractions Heavy flavor fractions
(5.9%)(5.9%)• Solutions:Solutions:
– Measure ratio of ttbar to Measure ratio of ttbar to W+jets cross sectionW+jets cross section
– Combine channels Combine channels
This will be replaced by a real
plot
Total error on l+jets/btag Total error on l+jets/btag channelchannel
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ConclusionConclusion
• The precision of the latest top pair production The precision of the latest top pair production cross section measurements rapidly cross section measurements rapidly approaches accuracy of theoretical prediction approaches accuracy of theoretical prediction and will allow to probe Standard Modeland will allow to probe Standard Model
• With combination of measurements in With combination of measurements in different channels and using different different channels and using different methods we have an excellent opportunity to methods we have an excellent opportunity to exceed the precision limit set by TeV2000 – exceed the precision limit set by TeV2000 – 11% for 1 fb11% for 1 fb-1-1
• … … and the one for 10 fband the one for 10 fb-1-1 – 5.9% – but – 5.9% – but with less luminosity!with less luminosity!
This is a challenge. Let’s go for This is a challenge. Let’s go for it!it!