×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [vlsi test symposium]
Design and Implementation of Repair-aware Test Flow for Multi-Memory
285 views
April 29, 2001Essentials of Test: Agrawal & Bushnell1 Essentials of Testing Vishwani D. Agrawal Agere Systems, Murray Hill, NJ 47974
[email protected]
Michael
215 views
High-Level Test Generation
36 views
Robust Low Power VLSI ECE 7502 S2015 Memory Built-in-Self Test (MBIST): Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study
214 views
Robust Low Power VLSI ECE 7502 S2015 SmartScan - Hierarchical Test Compression for Pin-limited Low Power Designs ECE 7502 Class Discussion Arijit Banerjee
218 views