×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [linewidth roughness]
ITRS Summer Conference 2007 1 Metrology Roadmap 2007
223 views
EVALUATION OF A CIRCUIT PATH DELAY TUNING TECHNIQUE FOR NANOMETER CMOS Advisor: Dr. Adit D. Singh Committee members: Dr. Vishwani D. Agrawal and Dr. Victor
215 views
EVALUATION OF A CIRCUIT PATH DELAY TUNING TECHNIQUE FOR NANOMETER CMOS
29 views
83250h
217 views