serial ata international organization · january 16, 2006 (version 1.0) initial release, to logo tf...

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1 Tektronix SATA-IO Rev 1.4 Rx/Tx MOI v1.0

Serial ATA

International Organization

Version 1.0

June 25, 2009

Serial ATA Interoperability Program Revision 1.4

Tektronix MOI for Rx/Tx Tests

(DSA/CSA8200 based sampling instrument with IConnect

SW)

This material is provided for reference only. The Serial ATA International Organization Does not endorse the vendors equipment outlined in this document.

This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability

or fitness for a particular purpose. In no event shall SATA-IO or any member of SATA-IO be liable for any direct, indirect, special, exemplary, punitive, or consequential damages,

including, without limitation, lost profits, even if advised of the possibility of such damages

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TABLE OF CONTENTS

TABLE OF CONTENTS.........................................................................................2

MODIFICATION RECORD ..................................................................................3

ACKNOWLEDGMENTS .......................................................................................5

INTRODUCTION....................................................................................................6 INITIAL MEASUREMENT SETUP .................................................................................................... 7

TEST TX-01 - PAIR DIFFERENTIAL IMPEDANCE ........................................................................... 8

TEST TX-02 - SINGLE-ENDED IMPEDANCE (OBSOLETE) ............................................................11

TEST TX-03 - GEN2 (3GB/S) DIFFERENTIAL MODE RETURN LOSS ........................................... 13

TEST TX-04 - GEN2 (3GB/S) COMMON MODE RETURN LOSS ................................................... 15

TEST TX-05 - GEN2 (3GB/S) IMPEDANCE BALANCE .................................................................. 18

TEST TX-06 - GEN-1 (1.5GB/S) DIFFERENTIAL MODE RETURN LOSS ....................................... 20

TEST TX-07 – GEN3 (6GB/S) DIFFERENTIAL MODE RETURN LOSS............................................ 23

TEST TX-08 - GEN3 (6GB/S) IMPEDANCE BALANCE .................................................................. 26

PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6)............................. 27 TEST RX-01 - PAIR DIFFERENTIAL IMPEDANCE......................................................................... 27

TEST RX-02 - SINGLE-ENDED IMPEDANCE (OBSOLETE) ............................................................ 29

TEST RX-03 – GEN2 (3GB/S) DIFFERENTIAL MODE RETURN LOSS ........................................... 32

TEST RX-04 – GEN2 (3GB/S) COMMON MODE RETURN LOSS ................................................... 34

TEST RX-05 – GEN2 (3GB/S) IMPEDANCE BALANCE ................................................................. 36

TEST RX-06 – GEN1 (1.5GB/S) DIFFERENTIAL MODE RETURN LOSS ........................................ 38

TEST RX-07 – GEN3 (6GB/S) DIFFERENTIAL MODE RETURN LOSS ........................................... 40

TEST RX-08 – GEN3 (6GB/S) IMPEDANCE BALANCE ................................................................. 42

APPENDIX A – RESOURCE REQUIREMENTS ............................................ 44

APPENDIX B – TDR ALIGNMENT AND ACQUISITION SETUP .............. 46 Introduction .........................................................................................................................................................46 Match samplers to the ends of the cables.............................................................................................................46 Match the TDR pulses to the ends of the cables ..................................................................................................47

APPENDIX C - TDNA MEASUREMENT SYSTEM ACCURACY............... 49

APPENDIX D - MEASUREMENTS OF THE ACTIVE SATA

TRANSMITTER................................................................................................... 50 MEASUREMENT SETUP ............................................................................................................... 50

VALIDATION RESULTS ................................................................................................................ 51

CONCLUSION.............................................................................................................................. 54

APPENDIX E VERIFICATION OF THE MATED TEST FIXTURE AND

SETUP.................................................................................................................... 55

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MODIFICATION RECORD

January 16, 2006 (Version 1.0) INITIAL RELEASE, TO LOGO TF MOI GROUP Andy Baldman: Initial Template Release

February 2, 2006 (Tektronix Version .9 - beta) INITIAL RELEASE Kees Propstra, John Calvin, Mike Martin: Phy and TSG MOI Contributions

Eugene Mayevskiy: Tx/Rx Phy MOI Contributions

February 8, 2006 (Tektronix Version .91 - beta) Kees Propstra, John Calvin, Mike Martin: Phy and TSG MOI Contributions

Eugene Mayevskiy: Tx/Rx Phy MOI Contributions

February 11, 2006 (Tektronix Version .92 RC) Eugene Mayevskiy: SI01-SI09 Phy MOI Contributions

John Calvin: OOB1-OOB7 MOI Contributions.

February 24 , 2006 (Tektronix Version .93 RC) Kees Propstra: updated Phy02, TSG01-12

Updated AppendixA

Updated Appendix C: long term freq stability, rise fall and amplitude imbalance, differential skew msmt

March 1 , 2006 (Tektronix Version .94 RC) Mike Martin: updated OOB test documentation. Minor formatting changes throughout document.

March 31 , 2006 (Tektronix Version .95 RC) Mike Martin: incorporated reviewer’s feedback

April 12 , 2006 (Tektronix Version .96 RC) Eugene Mayevskiy: incorporated reviewer’s feedback (group 2, 4, 6, appendix E) Kees Propstra: incorporated reviewers’ feedback (group 1, 3, 5, appendix A)

May 17, 2006 (Tektronix Version .97 RC) Eugene Mayevskiy, Mike Martin, Kees Propstra, John Calvin Incorporated changes to track the IW 1.0 unified test specification as well as reviewers comments.

Added Appendix F for Equivalent Time/ TDNA accuracy parameters

Added Appendix G for Real Time accuracy parameters.

May 25, 2006 (Tektronix Version .98 RC-2) John Calvin

Incorporated reviewer feedback and broke document into two separate document which separate the RT centric measurements from the ET based ones Eugene Mayevskiy changed the document according to the suggestions from the reviewer James Ou, Allion who

suggested to change resource requirements and check for the consistency.

May 30, 2006 (Tektronix Version .98 RC-3) John Calvin Review Draft circulated to IW working group.

May 31, 2006 (Tektronix Version .98 RC-4) Eurgene Mayevskiy, re-factored review comments into document, removed change-bars. Prepared document for general distribution.

June 5’th, 2006 (Tektronix Version 1.0 RC) John Calvin, Included notes on Z-Line Peeling and how and why it should be applied to the Rx/Tx measurements outlined in this document. Rolled version number to 1.0 RC, based on roll call vote of IW group on 06-05-2006 voting to approve this document.

September 7, 2006 (Tektronix Version 1.01 RC) Eugene Mayevskiy included the changes for Tx tests requested by PHY group. Those include the preference of TX03 tests with respect to TX01, requirements regarding TDR step amplitude, and recommendation regarding the state of an active transmitter.

September 18, 2006 (Tektronix Version 1.071) John Calvin, Eugene Mayevskiy included the changes to properly reflect SATA PHY ECN21 changes to the base specification.

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Added Rx/TX-06 for a Gen-1 Return loss measurement.

September 20, 2006 (Tektronix Version 1.080) John Calvin, Reviewed with IW group and prepared for 1.08 release. (Added references to worst case port, removed Genxm..

October 31, 2006 (Tektronix Version 1.090) John Calvin, Eugene Mayevskiy: Formal review before combined IW and PHY working groups. Final resolution of 3dB –vs- 6dB TDR attenuation topic.

October 31, 2006 (Tektronix Version 1.091) John Calvin, Eugene Mayevskiy: Editorials and minor content changes from review session.

November 09, 2006 (Tektronix Version 1.0RC) John Calvin final editorials, and roll to version 1.0RC

January 18, 2007 (Tektronix Version 1.00RC2) Introduced Appendix-E to include a lab-load/fixturing validation section. Moved the 135pSec filtering from the instrument to I-

Connect, while leaving a residual 40pSec noise reduction filter in the sampling instrument.

January 18, 2008 (Tektronix UTD 1.3 Version .90) Eugene Mayevskiy edits according to SATA UTD 1.3

February 7, 2008 (Tektronix UTD 1.3 Version .91) Eugene Mayevskiy 2’nd round of edits based on reviews comments from January 31, 2008 review session.

March 17, 2008 (Tektronix UTD 1.3 Version .92) Eugene Mayevskiy 3’rd round of edits based on reviews comments from March 7, 2008 review session.

May 22, 2008 (Tektronix UTD 1.3 Version .93RC) John Calvin, Logo Committee disposition on making this a 1.3 document, and vote to approve. Minor revision to figure 4.2 to remove a residual reference to the 2nS measurement standoff on Impedance measurements.

May 29, 2008 (Tektronix UTD 1.3 Version 1.0RC) John Calvin, Rolled version number with no other changes to 1.0RC.

June 2, 2008 (Tektronix UTD 1.3 Version 1.0RC) Eugene Mayevskiy added an appendix F with schematic of TekExpress automation solution.

May 19, 2009 (Tektronix UTD 1.4 Version .88) Steve Bright added Test TX-07 and RX-07

June 1, 2009 (Tektronix UTD 1.4 Version .88) Steve Bright Added Tet TX-08 and RX-08

June 3, 2009 (Tektronix UTD 1.4 Version .88) Steve Bright Corrections made to Data Rate requirements

June 5, 2009 (Tektronix UTD 1.4 Version .881) Steve Bright Corrections made to Data Rate requirements wording

June 25, 2009 (Tektronix UTD 1.4 Version .881) Steve Bright reviewed by the committee and approved for a 1.0RC release

August 31, 2009 (Tektronix UTD 1.4 Version 1.0RC) Edited by Steve Bright. Voted by the committee and approved for final draft on August 27

th 2009.

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ACKNOWLEDGMENTS

The SATA-IO would like to acknowledge the efforts of the following individuals in the development of this

test suite.

University of New Hampshire InterOperability Laboratory (UNH-IOL) – Creation of MOI template

Andy Baldman

Dave Woolf

Tektronix, Inc. – Creation of this document

John Calvin

Mike Martin

Kees Propstra

Eugene Mayevskiy

Steve Bright

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INTRODUCTION

The tests contained in this document are organized in order to simplify the identification

of information related to a test, and to facilitate in the actual testing process. Tests are separated

into groups, primarily in order to reduce setup time in the lab environment, however the different

groups typically also tend to focus on specific aspects of device functionality.

The test definitions themselves are intended to provide a high-level description of the

motivation, resources, procedures, and methodologies specific to each test. Formally, each test

description contains the following sections:

Purpose

This document outlines precise and specific procedures required to conduct SATA IW

1.1 tests. This document covers the following tests which are all Tektronix CSA8200

based.

PHY TRANSMIT CHANNEL REQUIREMENTS (TX: 1-6)

PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6)

Notes:

Peeling Algorithm developed by Prof. Tripathi at Oregon State University which unlayers the

various reflections in the TDR waveform and therefore shows the true values at each point

without the distortions caused by the reflections.

Rx/Tx measurements for both Devices and Hosts will benefit from the accuracy introduced by

observing Peeling on the raw TDR response. For this reason this methodology will be applied to

all Impedance related measurements in this MOI.

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Initial Measurement Setup

Before connecting the measurement cables and adaptors perform instrument’s warm-up and compensation according

the user manual.

Connect four high quality (rated up to 18GHz) SMA cables to the four channels of the TDR modules (80E04,80E08

and 80E10) and perform deskew procedure for acquisition channels and TDR steps according to procedure

described in Appendix B. Note that TX measurements require the attenuators connected between the TDR heads of

Ch3 and Ch4, and SMA cables. Connect appropriate SATA adaptor to the SMA channels The pair should match

within 2ps.

Connect the PUT according to the Figure 1.1. Ch1 and Ch2 are connected to the RX, while Ch3 and Ch4 are

connected to the TX pair. Set 4000 acquisition points in the “Horizontal” menu of the oscilloscope and 300 averages

in Acquisition menu.

SATA Product

Under Test

Ch1 Ch2 Ch3 Ch4

Figure 1.1. SATA product under test measurement setup. The drive under test (PUT) has to be powered up.

The dashed line shows reference plane for the measurements.

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Test TX-01 - Pair Differential Impedance

Purpose: To verify that the Pair Differential Impedance of the PUT’s transmitter is within the conformance limits1.

References:

[1] SATA Standard, 7.2.1, Table 21 – Transmitter Specifications [2] Ibid, 7.2.2.2.1 – TX Pair Differential Impedance (Gen1i) [3] Ibid, 7.4.22 – TDR Differential Impedance (Gen1i) [4] SATA unified test document, 1.4

Resource Requirements: See Appendix A.

Last Template Modification: April 10, 2006 (Version 1.0)

Discussion:

Reference [1] specifies the Transmitter Specification conformance limits for SATA devices. This

specification includes conformance limits for the Pair Differential Impedance. Reference [2] provides the definition

of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.

This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s or 6Gb/s, this test is not required.

Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern

(MFTP), The amplitude of a TDR pulse or excitation applied to an active transmitter shall not exceed 139mVpp (-

13.2dBm 50 ohms) single ended.

Test Setup: 1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each

pair of the transmitter and receiver to one sampling module. The TDR signal amplitude should be less

than 139mV peak-to-peak single-ended, and this can be achieved by introducing 6dB attenuators in the

measurement path, this will provide approximately 125mV peak-to-peak (single ended) TDR signal

amplitude (delivered to PUT). In cases when the PUT does not support “disconnect” operation, the

measurement setup described in appendix D can be used.

2. Each sampling module of the oscilloscope needs to be deskewed for acquisition using external source

before connecting the fixtures. There is no need to deskew between the modules since the

measurements are done for the pairs within the modules. The sources deskew has to be performed in

odd mode (source steps are of opposite polarity). The step signals should arrive at the PUT at the same

time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane.

3. Set 4000 acquisition points and 1ns/div in “Horizontal” menu and 300 averages in the “Acquisition”

menu of DSA8200. Set math to a difference for TDR signals for each module, and filter this waveform

to 40ps (10-90%) rise time.

4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern.

Test Procedure:

1. This procedure should be applied to the worst case port (in a multi-port system/host) as determined

through the worst case port identification MOI.

2. Acquire the differential open reference using IConnect “Acquisition” tool.

3. Connect the fixtures with the PUT and acquire TDRdd.

4. Filter open reference and TDRdd waveforms to 135ps (10-90%) rise time.

5. Use Z-line tool of IConnect to compute impedance profile. Set Zo equal to 100 Ohm and press the

“Compute” Button. The resulting waveform will be displayed in the time domain viewer window.

1 The amplitude of external excitation applied shall not exceed -13.2dBm 50 ohms (139mVpp) single ended on each

differential port of the transmitter. This number is derived from the maximum reflected signal that can be present at

a transmitter.

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6. Enable IConnect’s cursors by right-clicking the computed Z-waveforms and selecting “Cursor

Readout” option. Using the cursors measure the impedance value at a point 2 ns past the bottom of the

last major capacitive excursion (i.e. dip) that is known to be inside the ASIC device (Figure 2.1).

7. Record the results.

Figure 2.1 Pair differential impedance measurements for transmitter (TX01). The impedance value

measured by the blue cursor is 87 Ohm.

Observable Results:

Verify that both the minimum [TX-01a] and maximum [TX-01b] results for the pair differential impedance

measured between 85 ohms and 115 ohms (for products running at 1.5Gb/s).

The impedance measured at the time value of 2nSec past the bottom of the last major capacitive excursion

(i.e. dip) that is known to be inside the ASIC device constitutes an informative result. See figure 2.1.

NOTE: The verification of this result may not be required. If a product which supports 1.5Gb/s product

passes TX-06, then it is not required that this test be verified. This result must be verified for a 1.5Gb/s product if it

fails TX-06.

Possible Problems:

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1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher

“Threshold” number for Z-line computations.

2. First incident step needs to be windowed out in the instrument’s window; otherwise the measurement

will not be accurate. The correct acquisition window settings are shown in Figure 2.2.

3. When the transmitter does not support “disconnect” operation the test setup described in the Appendix

D can be used.

4. Some PUTs showed significant oscillations at the termination level of the TDR response due to

interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz

to 100kHz, or to another value.

Figure 2.2 Correct acquisition window settings used in IConnect software to compute impedance profile and

S-parameters. Left figure shows incorrect acquisition window; the first incident step is not windowed out,

and the window itself is longer than required. The figure on the right shows the correct settings; first

incident step is windowed out, and all reflections are settled to a steady DC level.

Incorrect window Correct window

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Test TX-02 - Single-Ended Impedance (Obsolete)

Purpose: To verify that the Single-Ended Impedance of the PUT’s transmitter is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 21 – Transmitter Specifications [2] Ibid, 7.2.2.2.2 – TX Single-Ended Impedance (Gen1i) [3] Ibid, 7.4.23 – TDR Single-Ended Impedance (Gen1i) [4] SATA unified test document, 1.4



Discussion:


specification includes conformance limits for the Single-Ended Impedance. Reference [2] provides the definition of

this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.

This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s or 6Gb/s, this test is not required.


pair of the transmitter and receiver to one sampling module. The TDR signal amplitude should be less

than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the measurement

path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In cases when the

PUT does not support “disconnect” operation, the measurement setup described in appendix D can be

used.

2. Each sampling module of the oscilloscope needs to be deskewed for acquisition external signal source

and TDR steps before connecting the fixtures. There is no need to deskew between the modules since

the measurements are done for the pairs within the modules. The deskew procedure is to be performed

in even mode: both sources are positive. The step signals should arrive at the SMA interface at the

same time.


menu of DSA8200. Filter the TDR waveforms to 40ps (10-90%) rise time. The instrument’s settings

can be saved to a file.

4. Power up the product under test (PUT), complete a full OOB sequence and broadcast a MFTP pattern

Test Procedure:



2. Acquire the open references for each TDR channel using IConnect “Acquisition” tool.

3. Connect the PUT and acquire TDR waveforms for each channel using IConnect “Acquisition” tool.

4. Filter open reference and TDR waveforms to 135ps (10-90%) rise time.

5. Use Z-line tool of IConnect to compute impedance profile for each line of the PUT. Set Zo equal to 50

Ohm and press on “Compute” button of IConnect. The resulting impedance waveforms will be

displayed in the time domain viewer.

6. Using cursors measure the minimum impedance value for each line (Figure 2.3).


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Figure 2.3. Single-ended impedance measurements using Z-line tool of IConnect (TX-02). Minimum

impedance for positive line is 49 Ohm, while for negative line the value is 42.4 Ohm.

Observable Results:

• Zs-eTX measured to be at least 40 ohms (for products running at 1.5Gb/s)

• Both the minimum [TX-02a] and the maximum [TX-02b] results shall be captured

Possible Problems: 1. Data noise may cause impedance waveform to oscillate. This is resolved by selecting a higher


2. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The correct acquisition window settings are shown in Figure 2.2.


D can be used.


interactions with Tx pattern, they can be reduced by changing the internal clock of the TDR from

200kHz to 100kHz.

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Test TX-03 - Gen2 (3Gb/s) Differential Mode Return Loss

Purpose: To verify that the Differential Mode Return Loss of the PUT’s transmitter is within the conformance

limits.

References:

[1] SATA Standard, 7.2.1, Table 29 – Transmitter Specifications [2] Ibid, 7.2.2.2.6 – TX Differential Mode Return Loss (Gen2i)

[3] Ibid, 7.4.13 – Return Loss and Impedance Balance [4] SATA unified test document, 1.4



Discussion:


specification includes conformance limits for the Differential Mode Return Loss. Reference [2] provides the

definition of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for

this test.

Calibrate to the end of the SMA cables, but do NOT include (de-embed) the SMA to SATA PCB and the

SATA connector, so the board and the SATA connector are INCLUDED with the product measurement.

This test requirement is only applicable to products that support a maximum operating speed of 3 Gb/s. For products that support a maximum operating speed of 1.5 Gb/s or 6Gb/s this test is not required.





pair of the transmitter and receiver to one sampling module. The TDR single-ended signal amplitude

should be less than 139mV peak-to-peak this can be achieved by introducing 6dB attenuators in the

measurement path, this will provide approximately 125mV peak-to-peak TDR signal amplitude. In

cases when the PUT does not support “disconnect” operation, the measurement setup described in

appendix D can be used.







menu of DSA8200. Set math to a difference for TDR signals for each module. The instrument’s setup

from TX-01 test can be reused (the waveforms were filtered to 40ps (10-90%) rise time).


Test Procedure:




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3. Connect the PUT and acquire TDRdd waveform.

4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the transmitter. The

resulting waveform will be displayed in the frequency domain viewer.

5. Using cursors measure the maximum values for each frequency range given in reference [1].

Differential return loss measurements are shown in Figure 2.4.


Figure 2.4. Differential return loss measurements for TX-03. Cursor 1 reads -7.42dB at 2.37GHz, and cursor

2 reads -6.72dB at 3.97GHz.

Observable Results:

The TX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for Gen2i

products running at 3Gb/s. For convenience, the values are reproduced below.

Test Name Frequency Range Lower Rloss Limit

Tx-03a 150-300 MHz 14 dB

Tx-03b 300-600 MHz 8dB

Tx-03c 600-1200 MHz 6 dB

Tx-03d 1200-2400 MHz 6 dB

Tx-03e 2400-3000 MHz 3 dB (N/A for Gen1m)

Tx-03f 3000-5000 MHz 1 dB (N/A for Gen1m orGen2m)

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Possible Problems: 1. Inclusion of the first incident step in the measurement will results in erroneous S-parameters. The window

needs to be adjusted according the Figure 2.2.

2. When the transmitter does not support “disconnect” operation the test setup described in the Appendix D

can be used.

3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions

with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz or

another value.

Test TX-04 - Gen2 (3Gb/s) Common Mode Return Loss

Purpose: To verify that the Common Mode Return Loss of the PUT’s transmitter is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 29 – Transmitter Specifications [2] Ibid, 7.2.2.2.4 – TX Common Mode Return Loss (Gen2i)




Discussion:


specification includes conformance limits for the Common Mode Return Loss. Reference [2] provides the definition

of this term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.



This test requirement is only applicable to products that support a maximum operating speed of 3 Gb/s. For products that support a maximum operating speed of 1.5 Gb/s or 6.0Gb/s this test is not required..





pair of the transmitter and receiver is connected to one sampling module. The TDR single ended signal

amplitude should be less than 139mV peak-to-peak this can be achieved by introducing 6dB

attenuators in the measurement path, this will provide approximately 125mV peak-to-peak TDR signal

amplitude. In cases when the PUT does not support “disconnect” operation, the measurement setup

described in appendix D can be used.




even mode (source steps are of the same polarity). The step signals should arrive at the PUT at the

same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane.


menu of DSA8200. Set math function of the oscilloscope to the summation of signal sources and filter

the response to 40ps (10-90%) rise time.

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Test Procedure:




3. Connect the PUT and acquire TDR waveform in even mode using IConnect “Acquisition” tool.

4. Use S-parameter tool of IConnect to compute common mode S-parameters of the PUT (Scc11). The





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Figure 2.5. Common mode return loss measurements for TX-04. Cursor 1 reads –3.4dB at 1.18GHzMHz, and

cursor 2 reads -1.49dB at 3.08GHz.

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Observable Results:

The TX Common Mode Return Loss shall be above the minimum limits specified in reference [1] for

Gen2i products running at 3Gb/s. For convenience, the values are reproduced below.


TX-04a 150-300 MHz 8 dB

TX-04b 300-600 MHz 5dB

TX-04c 600-1200 MHz 2 dB

TX-04d 1200-2400 MHz 1 dB

TX-04e 2400-3000 MHz 1 dB

TX-04f 3000-5000 MHz 1 dB

Possible Problems: 1. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The

correct acquisition window settings are shown in Figure 2.2.


D can be used.



200kHz to 100kHz.

Test TX-05 - Gen2 (3Gb/s) Impedance Balance

Purpose: To verify that the Impedance Balance of the PUT’s transmitter is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 29 – Transmitter Specifications [2] Ibid, 7.2.2.2.5 – TX Impedance Balance (Gen2i) [3] Ibid, 7.4.13 – Return Loss and Impedance Balance [4] SATA unified test document, 1.4



Discussion:


specification includes conformance limits for the TX Impedance Balance. Reference [2] provides the definition of


This test requirement is only applicable to products that support a maximum operating speed of 3 Gb/s. For products that support a maximum operating speed of 1.5 Gb/s this test is not required.





pair of the transmitter and receiver is connected to one sampling module The TDR single ended signal

amplitude should be less than 139mV peak-to-peak. This can be achieved by introducing 6dB


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measurements are done for the pairs within the modules. The deskew has to be performed in even

mode: both sources are positive, and the step signals should arrive at the PUT and the same time. The

instrument’s setup can be saved to a file.


menu of DSA8200. Set math 1 function to the sum of the acquired TDR channels, and acquire open

reference waveform at the SMA interface. Set math 2 function the difference of the acquired TDR

channels and filter the response to 40ps (10-90%) rise time.


Test Procedure:



2. Load the open reference for even mode (math 1 function) using IConnect “Acquisition” tool.

3. Connect the fixtures and the PUT then acquire math 2 waveform (difference of the acquired TDR

signals) using IConnect “Acquisition” tool.

4. Use S-parameter tool of IConnect to compute differential-to-common conversion (Sdc11) of the PUT.

The resulting waveform will be displayed in the frequency domain viewer.


Impedance balance measurements are shown in Figure 2.6.


Figure 2.6. Impedance balance loss measurements for TX-05. Cursor 1 reads –20.4dB at 798MHz, and cursor


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Observable Results:

The TX Impedance Balance shall be above the minimum limits specified in reference [1] for Gen2i

products. For convenience, the values are reproduced below.


TX-05a 150-300 MHz 30dB

TX-05b 300-600 MHz 20dB

TX-05c 600-1200 MHz 10dB

TX-05d 1200-2400 MHz 10dB

TX-05e 2400-3000 MHz 4dB

TX-05f 3000-5000 MHz 4dB (N/A for test Gen2m)

Possible Problems: 1. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The

correct acquisition window settings are shown in Figure 2.2


D can be used.



200kHz to 100kHz.

Test TX-06 - Gen-1 (1.5Gb/s) Differential Mode Return Loss


limits.

References:

[1] SATA Standard, 7.2.1, Table 21 – Transmitter Specifications [2] Ibid, 7.2.2.2.3 – TX Differential Mode Return Loss (Gen2i)

[3] Ibid, 7.4.10 – Return Loss and Impedance Balance [4] SATA unified test document, 1.4 [5] SATA ECN_21/22 – TX Differential Mode Return Loss (Gen1i)



Discussion:




this test.



This test requirement is only applicable to products running at 1.5Gb/s. For products which support 3Gb/s

or 6Gb/s , this test is not required.




Test Setup:

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1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each









odd mode (source steps are of the opposite polarity). The step signals should arrive at the PUT at the

same time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane



from TX-01 test can be reused (the rise time is filtered to 40ps (10-90%) rise time).


Test Procedure:










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Figure 2.7 Differential return loss measurements for TX-06.

Observable Results:

RLDD11,TX measured per the values in table below (for products running at 1.5Gb/s)


TX-06a 75-150MHz 14 dB

TX-06b 150-300 MHz 8dB

TX-06c 300-600 MHz 6 dB

TX-06d 600-1200 MHz 6 dB

TX-06e 1200-2400 MHz 3 dB (N/A for test Gen1m)

TX-06f 2400-3000 MHz 1 dB (N/A for test Gen1m or

Gen2m)

Possible Problems: 1. Inclusion of the first incident step in the measurement will results in erroneous S-parameters. The window

needs to be adjusted according the Figure 2.2.

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2. When the transmitter does not support “disconnect” operation the test setup described in the Appendix D can

be used.

3. Some PUTs showed significant oscillations at the termination level of the TDR response due to interactions

with Tx pattern, they can be reduced by changing the internal clock of the TDR from 200kHz to 100kHz.

Test TX-07 - Gen3 (6Gb/s) Differential Mode Return Loss


limits.

References:

[1] SATA Standard, 7.2.1, Table 29 – Transmitter Specifications [2] Ibid, 7.2.2.2.6 – TX Differential Mode Return Loss (Gen3)



Discussion:




this test.



This test requirement is only applicable to products that support a maximum operating speed of 6 Gb/s. For products that support a maximum operating speed of 1.5 Gb/s or 3 Gb/s, this test is not required.

















from TX-01 test can be reused (the waveforms were filtered to 40ps (10-90%) rise time).


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Test Procedure:

5 This procedure should be applied to the worst case port (in a multi-port system/host) as determined


6 Acquire the differential open reference using IConnect “Acquisition” tool.







The TX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for Gen3

products running at 6Gb/s.

Parameters Units Limit Electrical Specification

The TX Differential Mode

Return Loss shall be above

the minimum limits

specified in reference [1]

for Gen2i products

running at 3Gb/s. For

convenience, the values

are reproduced below.

dB Min at 300MHz

14

Slope of TX Differential Mode Return Loss

dB/dec Nom -13

TX Differential Mode Return Loss Max Frequency

GHz Max 3

Tektronix, Inc.


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Test TX-08 – Gen3 (6Gb/s) Impedance Balance

Purpose: To verify that the Impedance Balance of the PUT’s transmitter is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 29 – Transmitter Specifications [2] Ibid, 7.2.2.2.5 – TX Impedance Balance (Gen2i) [3] Ibid, 7.4.13 – Return Loss and Impedance Balance [4] SATA unified test document, 1.4



Discussion:


specification includes conformance limits for the TX Impedance Balance. Reference [2] provides the definition of



.Testing of this requirement must be completed during transmission of the Mid Frequency Test Pattern




pair of the transmitter and receiver is connected to one sampling module The TDR single ended signal

amplitude should be less than 139mV peak-to-peak. This can be achieved by introducing 6dB






measurements are done for the pairs within the modules. The deskew has to be performed in even

mode: both sources are positive, and the step signals should arrive at the PUT and the same time. The

instrument’s setup can be saved to a file.






Test Procedure:










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The TX Impedance Balance shall be above the minimum limits specified in reference [1] for Gen2i

products. For convenience, the values are reproduced below.


TX-08a 150-300 MHz 30dB

TX-08b 300-600 MHz 30dB

TX-08c 600-1200 MHz 20dB

TX-08d 1.2-2.4 GHz 10dB

TX-08e 2.4-3 GHz 10dB

TX-08f 3-5 GHz 4dB

TX-08g 5 – 6.5 GHz 4dB

Possible Problems: 1. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The



D can be used.



200kHz to 100kHz.

PHY RECIEVE CHANNEL REQUIREMENTS (RX: 1-6)

Overview:

This group of tests verifies the Phy Receiver Requirements, as defined in Section 2.15 of

the SATA Interoperability Unified Test Document, v1.4 (which references the SATA Standard,

v3.0).

Test RX-01 - Pair Differential Impedance

Purpose: To verify that the Pair Differential Impedance of the PUT’s receiver is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 31 – Receiver Specifications [2] Ibid, 7.2.2.3.1 [3] Ibid, 7.4.26 [4] SATA unified test document, 1.4


See Appendix C for measurement accuracy specifications.


Discussion:

Reference [1] specifies the Transmitted Signal conformance limits for SATA devices. This specification

includes conformance limits for the RX Pair Differential Impedance. Reference [2] provides the definition of this

term for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.

This test requirement is only applicable to products that support a maximum operating speed of 1.5 Gb/s. For products that support a maximum operating speed of 3.0 Gb/s or 6.0Gb/s this test is not required.

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Testing of this requirement must be completed during a PHYRDY Interface Power State (see section 8.1.

of SATA Revision 2.6). The amplitude of a TDR pulse or excitation applied to a receiver shall not exceed

300mVpp (-6.48dBm 50 ohms) single ended.


pair of the transmitter and receiver to one sampling module.







menu of DSA8200. Set math to a difference for TDR signals for each module, and filter this waveform

to 40ps (10-90%) rise time.

4. Power up the product under test (PUT) and complete a full OOB sequence.

Test Procedure:




3. Connect the PUT and acquire TDRdd.

4. Filter open reference and TDRdd waveforms to 135ps (10-90%) rise time.

5. Use Z-line tool of IConnect to compute impedance profile. Set Zo equal to 100 Ohm and press on

“Compute.” The resulting waveform will be displayed in the time domain viewer.

6. Enable IConnect’s cursors by right-clicking the computed Z-waveforms and selecting “Cursor

Readout” option. Using the cursors measure the impedance value at a point 2 ns past the bottom of the

last major capacitive excursion (i.e. dip) that is known to be inside the ASIC device (Figure 4.1).


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Figure 4.1 Pair differential impedance measurements for receiver (RX-01). Min impedance is 80.9 Ohm at

1.14ns.

Observable Results:

Verify that both the minimum [RX-01a] and maximum [RX-01b] results for the pair differential impedance

measured between 85 ohms and 115 ohms (for products running at 1.5Gb/s).

NOTE: The verification of this result may not be required. If a product which supports 1.5Gb/s product

passes RX-06, then it is not required that this test be verified. This result must be verified for a 1.5Gb/s product if it

fails RX-06



2. First incident step needs to be windowed out; otherwise the measurement will not be accurate. The


Test RX-02 - Single-Ended Impedance (Obsolete)

Purpose: To verify that the Single-Ended Impedance of the PUT’s receiver is within the conformance limits.

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References:



See Appendix C for measurement accuracy specifications.


Discussion:


includes conformance limits for the RX Single-Ended Impedance. Reference [2] provides the definition of this term

for the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.

This test requirement is only applicable to products that support a maximum operating speed of 1.5 Gb/s. For products that support a maximum operating speed of 3.0 Gb/s or 6.0Gb/s this test is not required.












menu of DSA8200. Filter the TDR waveforms to 40ps (10-90%) rise time. The instrument’s setup can

be saved to a file.


Test Procedure:




3. Connect the PUT and acquire TDR waveforms for each channel using IConnect “Acquisition” tool.

4. Filter open reference and TDR waveforms to 135ps (10-90%) rise time.

5. Use Z-line tool of IConnect to compute impedance profile for each line of the PUT. Set Zo equal to 50

Ohm and press on “Compute.” The resulting waveform will be displayed in the time domain viewer.

6. Using cursors measure the minimum impedance value for each line (Figure 4.2).


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Figure 4.2. Single-ended impedance measurements using Z-line tool of IConnect (RX-02). Minimum

impedance for positive line is 49 Ohm, while for the negative line the value is 42 Ohm.

Observable Results:

• The RX Single-Ended Impedance shall be at least 40 Ohms for 1.5Gb/s devices (for products running at

1.5Gb/s)

• Both the minimum [RX-02a] and the maximum [RX-02b] results shall be captured



2. First incident step needs to be windowed out, otherwise the measurement will not be accurate. The


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Test RX-03 – Gen2 (3Gb/s) Differential Mode Return Loss

Purpose: To verify that the Differential Mode Return Loss of the PUT’s receiver is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 31 – Receiver Specifications [2] Ibid, 7.2.2.3.3 & 7.2.2.2.6 [3] Ibid, 7.4.13 [4] SATA unified test document, 1.4


Last Template Modification: April 10 2006 (Version 1.0)

Discussion:


includes conformance limits for the RX Differential Mode Return Loss. Reference [2] provides the definition of this


This test requirement is only applicable to products that support a maximum operating speed of 3.0Gb/s. For products that support a maximum operating speed of 1.5 Gb/s or 6.0Gb/s this test is not required.










time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane



from RX-01 test can be reused (the response is filtered to 40ps (10-90%) rise time.


Test Procedure:





4. Use S-parameter tool of IConnect to compute differential return loss (Sdd11) of the receiver. The





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Figure 4.3. Differential return loss measurements for RX-03. Cursor 1 reads -9.1dB at 2.34GHz, and cursor 2

reads -8.97dB and 4.1GHz.

Observable Results:

The RX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for



RX-03a 150-300 MHz 18 dB

RX-03b 300-600 MHz 14dB

RX-03c 600-1200 MHz 10 dB

RX-03d 1200-2400 MHz 8 dB

RX-03e 2400-3000 MHz 3 dB

RX-03f 3000-5000 MHz 1 dB

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Test RX-04 – Gen2 (3Gb/s) Common Mode Return Loss

Purpose: To verify that the Common Mode Return Loss of the PUT’s receiver is within the conformance limits.

References:




Discussion:


includes conformance limits for the RX Common Mode Return Loss. Reference [2] provides the definition of this









pair of the transmitter and receiver is connected to one sampling module.







menu of DSA8200. Set math to the summation of signal sources and filter response to 40ps (10-90%)

rise time.


Test Procedure:




3. Connect the PUT and acquire TDR waveform in even mode using IConnect “Acquisition” tool.

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4. Use S-parameter tool of IConnect to compute common mode S-parameters of the PUT (Scc11). The





Figure 4.4. Common mode return loss measurements for RX-04. Cursor 1 reads –4.45dB at 1.01GHz, and

cursor 2 reads -5.49dB at 3.07GHz.

Observable Results:

The RX Common Mode Return Loss shall be above the minimum limits specified in reference [1] for



RX-04a 150-300 MHz 5dB

RX-04b 300-600 MHz 5dB

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RX-04c 600-1200 MHz 2dB

RX-04d 1200-2400 MHz 1dB

RX-04e 2400-3000 MHz 1dB

RX-04f 3000-5000 MHz 1dB



Test RX-05 – Gen2 (3Gb/s) Impedance Balance

Purpose: To verify that the Impedance Balance of the PUT’s receiver is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 31 – Receiver Specifications [2] Ibid, 7.2.2.3.5 [3] Ibid, 7.4.13 [4] SATA unified test document, 2.15.5



Discussion:


includes conformance limits for the RX Impedance Balance. Reference [2] provides the definition of this term for

the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.









measurements are done for the pairs within the modules. The deskew is to be performed in even mode:

both sources are positive, and the step signals should arrive at the PUT and the same time. The

instrument’s setup needs to be saved to a file.






.

Test Procedure:

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Figure 4.5. Impedance balance loss measurements for RX-05. Cursor 1 reads –19.4dB at 4.07GHz, and cursor


Observable Results:

The RX Impedance Balance shall be above the minimum limits specified in reference [1] for products

running at 3Gb/s. For convenience, the values are reproduced below.

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Test Name Frequency Range Lower Rloss Limit (Gen2i)

RX-05a 150-300 MHz 30 dB

RX-05b 300-600 MHz 30 dB

RX-05c 600-1200 MHz 20 dB

RX-05d 1200-2400 MHz 10 dB

RX-05e 2400-3000 MHz 4 dB

RX-05f 3000-5000 MHz 4 dB (N/A for test Gen2m)



Test RX-06 – Gen1 (1.5Gb/s) Differential Mode Return Loss


References:




Discussion:

















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from RX-01 test can be reused (the response is filtered to 40ps (10-90%) rise time).


Test Procedure:










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Figure 4.6. (requires a true Gen-1 screen shot) Differential return loss measurements for RX-03. Cursor 1

reads -9.1dB at 2.34GHz, and cursor 2 reads -8.97dB and 4.1GHz.

Observable Results:

The RX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for

products running at 1.5Gb/s. For convenience, the values are reproduced below.

Test Name Frequency Range Lower Rloss

Limit

RX-06a 75-150 MHz 18 dB

RX-06b 150-300 MHz 14dB

RX-06c 300-600 MHz 10 dB

RX-06d 600-1200 MHz 8 dB

RX-06e 1200-2400 MHz 3 dB

RX-06f 2400-3000 MHz 1 dB



Test RX-07 – Gen3 (6Gb/s) Differential Mode Return Loss


References:

[1] SATA Standard, 7.2.1, Table 31 – Receiver Specifications [2] Ibid, 7.2.2.3.3 & 7.2.2.2.6 [3] Ibid, 7.4.13 [4] SATA unified test document, 1.4



Discussion:










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time. Both, acquisition and TDR deskew are to be performed at the SMA reference plane



from RX-01 test can be reused (the response is filtered to 40ps (10-90%) rise time.


Test Procedure:










The RX Differential Mode Return Loss shall be above the minimum limits specified in reference [1] for Gen3

products running at 6Gb/s.

Parameters Units Limit Electrical Specification

The RX Differential Mode

Return Loss shall be above

the minimum limits

specified in reference [1]

for Gen2i products

running at 3Gb/s. For

convenience, the values

are reproduced below.

dB Min at 300MHz

18

Slope of RX Differential Mode Return Loss

dB/dec Nom -13

RX Differential Mode Return Loss Max Frequency

GHz Max 6

Tektronix, Inc.


Test RX-08 – Gen3 (6Gb/s) Impedance Balance

Purpose: To verify that the Impedance Balance of the PUT’s receiver is within the conformance limits.

References:

[1] SATA Standard, 7.2.1, Table 31 – Receiver Specifications [2] Ibid, 7.2.2.3.5 [3] Ibid, 7.4.13 [4] SATA unified test document, 1.4.5



Discussion:


includes conformance limits for the RX Impedance Balance. Reference [2] provides the definition of this term for

the purposes of SATA testing. Reference [3] defines the measurement requirements for this test.





Test Setup:

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1. Matched length SMA cables have to be connected to the DSA/CSA8200 sampling oscilloscope; each




measurements are done for the pairs within the modules. The deskew is to be performed in even mode:

both sources are positive, and the step signals should arrive at the PUT and the same time. The

instrument’s setup needs to be saved to a file.






.

Test Procedure:











Observable Results:

The RX Impedance Balance shall be above the minimum limits specified in reference [1] for products

running at 3Gb/s. For convenience, the values are reproduced below.

Test Name Frequency Range Lower Rloss Limit (Gen2i)

RX-08a 150-300 MHz 30 dB

RX-08b 300-600 MHz 30 dB

RX-08c 600-1200 MHz 20 dB

RX-08d 1.2-2.4 GHz 10 dB

RX-08e 2.4-3 GHz 10 dB

RX-08f 3-5 GHz 4 dB

RX-08g 5-6.5Ghz 4 dB



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Appendix A – Resource Requirements

The resource requirements include two separate sets of equipment. The equipment required for TX and RX tests is

shown in section A.2, and the equipment required for OOB tests is shown in section A.3.

A.1 Equipment for PHY and TSG tests

1. Real-time Digital Oscilloscope

TDS6154C, TDS612C, or TDS6804B (gen1 only!)

2. Test Fixture

Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP

Or equivalent

3. Cables

179-4944-00 or equivalent

4. SATA host system for Drive initialization

Any system capable of controlling Gen1 and Gen2 devices, and capable of running Ulink

DriveMaster or Intel BISTFIS utility to set BIST pattern transmission in device.

5. Software

BISTFIS Utility or Ulink DriveMaster

Tektronix TDSJIT3v2

Tektronix TDSRT-Eye (RTeye version 2.0.3 or later, SST version 1.1.2 or later)

A.2 Equipment for TX and RX tests

1. Equivalent-time Sampling Oscilloscope

DSA/CSA8200 with 2 ea TDR sampling head (models 80E04, 80E08, and 80E10)

2. Test Fixture

Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP (< 36dB of NEXT required

in fixtures in addition to satisfying the required Serial ATA lab load requirements)

Or equivalent

4. Cables and other accessories

4 ea. Matched SMA cables 179-4944-00 or equivalent

2 ea 6dB SMA attenuators required for Tx tests, 6dB matched power splitters can be used as well.

5. Software

1. IConnect software (80SICON), Tektronix, Inc. or equivalent



DriveMaster or Intel BISTFIS utility or equivalent system to ensure device has properly

negotiated a full Com-Init / Reset cycle (required before any testing can be conducted on

an active device ).

A.3 Equipment for OOB tests

1. Real-time Digital Oscilloscope

TDS6154C, TDS612C, or TDS6804B (gen1 only!)

2. Signal Generator

AWG710B, AWG710, AWG610, or AWG615

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3. Test Fixture

Crescent Heart Software Fixture TF-SATA-NE/XP, TF-SATA-FE/XP

Or equivalent

4. Cables

179-4944-00 or equivalent



DriveMaster or Intel BISTFIS utility to set BIST pattern transmission in device.

6. Software

BISTFIS Utility or Ulink DriveMaster

Tektronix TDSJIT3v2

Tektronix TDSRT-Eye (RTeye version 2.0.3 or later, SST version 1.1.2 or later)

Tektronix, Inc.


Appendix B – TDR Alignment and Acquisition Setup

Introduction This deskew procedure utilizes an independent acquisition source and assumes availability of two TDR sampling

modules (80E04, 80E08, or 80E10). It can also be used with one TDR (80E04, 80E08, or 80E10), and one dual

sampling module (80E03 or 80E09). It aligns both samplers and TDR steps allowing measuring mixed mode S-

parameters. The procedure starts with the alignment of the samplers and concludes with alignment of the acquisition

channels.

Match samplers to the ends of the cables The purpose of this step is to set the samplers on each channel so that an input into the open end of each cable

arrives at the sample gate at precisely the same time. This step compensates for cable and sampler differences. First

stage is alignment of the channels 1-3 using the channel 4 as an independent TDR source, and then aligning

acquisition of the channel 4 with respect to already aligned channel 3 using channel one as another independent

source.2 The deskew procedure is to be performed in rho mode.

1. Connect SMA cables to the sampling modules of the oscilloscope. For the best results, it is desired that the

SMA cables used in the measurements have approximately the same quality and length (matched within 20ps).

2. Connect channel 1 and channel 4 with SMA barrel, activate TDR step on channel 4 and acquisition on channel

1 (see Figure 2).

Figure 2 C1 is connected to C4 with SMA barrel. The TDR step is generated on C4 and acquired

using C1.

3. Adjust the horizontal position and scale to get the rising edge on screen with good resolution (20ps/div). Record

length should have the maximum number of 4000 points.

4. Save channel one (C1) waveform as a reference trace. Channel 2 and 3 will be aligned with respect to it.

5. Connect channel two (C2) to the channel four (C4) using SMA barrel, and display C2 on the screen.

6. Turn on the delay measurement to measure the time difference between the rising edge on the reference trace

and the rising edge of C2 as shown in Figure 3.

2 When only one TDR and one sampling modules are available another TDR channel can be used as an independent

TDR source.

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Figure 3 Delay measurements between the reference (R1) acquired from the channel one and the

channel two (C2). It has to be the minimum for the best deskew value.

7. Adjust the channel deskew value in the Vertical menu of the Setups dialog until a delay value within 1ps is

achieved as show

8. Repeat steps 5-7 for the C3.

9. Now, when the acquisition of C1 through C3 is aligned, the same approach can be used to align C4. For this

purpose generate a new reference by using the step of C1 and acquiring it on C3. C3 has to be connected to C1

with the SMA barrel.

10. Repeat steps 5-7 for the C4 using acquired reference from C3. Now, all four acquisition channels have been deskewed within 1ps.

Match the TDR pulses to the ends of the cables The purpose of this step is to adjust the TDR pulses so they arrive at the ends of the cables at precisely the same

time. The deskew has to be performed separately for odd and even TDR steps when 80E04 modules are used3. This

section describes only odd mode TDR step deskew. The deskew procedure has to be performed in rho mode.

1. Disconnect the SMA barrel and turn on TDR pulses of the appropriate polarity for each channel (C1 and C2).

Use the differential TDR preset selection to activate odd mode.

2. Adjust the horizontal position and scale so that the pulses as they arrive at the ends of the cables are visible on

screen with good resolution. (Use Average mode and vectored display, a set time scale to 20ps/div).

3. Turn on the delay measurement to measure the time difference between the two pulse edges.

4. Adjust the Step Deskew in TDR menu to minimize the time difference between the C1 and C2 pulses. You

might want to activate Fine button to reduce the increment of deskew as shown in Figure 4.

3 Odd mode (differential) is generated when TDR steps set to opposite polarity, and even mode (common) is

generated when both steps are of the same polarity.

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Figure 4 Differential TDR step deskew. The channels C1 and C2 are aligned within ~300fs.

5. Repeat steps 1-4 for C3 and C4, and save the instrument setup.

6. Repeat steps 1-5 in even mode if desired.

The instrument should now be set up to accurately make differential or common mode TDR measurements.

Correct Acquisition Window Settings for S-parameter Calculations with IConnect The acquisition of S-parameters with TDR/T instrument requires that the PUT’s reflections settle to their steady DC

level. The approximate rule of thumb for the acquisition window width is four or five times time delay of the PUT.

This is shown in the Figure B.2.1.

Figure B.2.1. Correct acquisition window settings used in IConnect software to compute S-parameters. First

incident step is windowed out, and all reflections settled to a steady DC level.

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Appendix C - TDNA Measurement System Accuracy

Table C.1 summarizes characteristics of the TDNA system used for RX/TX and SI test. The system is based on a

standard 80E04 module that allows to perform both return and insertion loss measurements from time domain data.

Table C.1 TDR System Characteristics with a standard 80E04 module

Characteristics Value

Input Impedance 50 ±0.5Ω

TDR Step Amplitude 250 mV

TDR System Reflected Rise Time (10% to 90%) ≤35 ps

TDR System Incident Rise Time (10% to 90%) ≤28 ps (typical)

TDR Step Maximum Repetition Rate 200 kHz DC Vertical Range Accuracy within 2°C of Compensated Temperature

±[ 2 mV + 0.007 (Offset) + 0.02 (Vertical Value-Offset)]

RMS Noise (typical/maximum) 600 µV/≤1.2 mV

Bandwidth 20GHz

Dynamic Range 50-60dB

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Appendix D - Measurements of the Active SATA Transmitter

Measurement setup

The BIST-L method of the host transmitter testing requires a transmitter to transmit a

specific pattern. This pattern can be initiated using a host controller which can be a hard drive

emulator or AWG. The problem with this approach is that many hosts do support “disconnect”

operation; this means that as soon as the drive is disconnected from the host, the host’s

transmitter stops transmitting the data. Thus TX testing of such hosts requires a constant

connection with the host controller. This can be accomplished by using power splitters and

connecting both, the TDR instrument and the host controller, to the measured host in the same

measurement setup.

The diagram of such measurement is shown in Figure D.1. The measurement setup

consists of a set of matched length SMA cables connected between the host under test and power

splitters that are attached to the sampling module using SMA male-to-male adaptors. To control

the host longer SMA sables are connected between the other ports of the splitter and the receiver

ports of the host controller. Note that the power splitters can be also connected directly to the

sampling heads before the SMA cables, however, in this the longer cables to the BIST initiator

might be required in order to set the time window propely. The transmitter port of the host

controller is connected to the receiver of the host thus providing the initiation of the required

pattern. If the regular 6dB matched power splitter is used, the resulting differential TDR voltage

amplitude will be ~125mV, which is sufficient to make measurements and not to loose much of

the dynamic range at the same time.

Figure D1. Measurement setup that can be used to perform TDR measurement of the

actively transmitting host (HUT).

SATA

Host Under Test

Ch1 Ch2

Rx Tx

Rx

Tx SATA

BIST

Initiator

t1

t2

t0

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Note: BIST initiator may be required to operate outside of its nominal operating conditions due to typical losses

associated with 3dB power splitters and interconnect cable length.

It is important to select the right cable length to provide sufficient TDR acquisition

window. The general principal of the acquisition window setup is illustrated in the Figure D2.

The cable length between the host under test and the host controller (t0 and t2) should provide

enough time for the host response to settle to a steady DC level and for the host controller not to

show up the TDR acquisition window. This is effectively an accurate and direct time domain

gating of the host under test response, which represents a unique TDR instrument capability

because Inverse Fast Fourier Transformation (IFFT) response from the frequency domain

instrument will include the effects of the host controller.

Figure D2. Time domain measurement window: t0 –time at 6dB splitter, t1-reference plane

for SATA measurements, t2- time position of the host controller.

Validation Results

Figure D3 shows the original time domain impedance profile for the SATA host acquired

when BIST initiated MFTP pattern was applied. Two measurements were performed: one with

the splitter and one without. The obtained TDR impedance profile shows that termination

impedance of the reduced TDR amplitude has higher value which is an indicator of the

dependency of the transmitter’s impedance on the applied TDR step voltage. A possible reason

of this difference is that the original TDR voltage was too high putting the transmitter into a

nonlinear region of operation.

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Figure D3. The original time domain impedance profile for the SATA host acquired when

BIST initiated MFTP pattern was applied. The transmitter’s termination impedance has

different values.

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Figure D4. Impedance profile of the same HUD measured from TDR with different step

signal amplitudes. The difference between 6dB and 14dB impedance is small indicating

that an accurate measurement of the active transmitter has to be done with an amplitude

that allows the transmitter operate in the linear region.

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Figure D5. Differential return loss obtained with TDNA of different amplitudes of the step

voltages. The comparison of the results for 0dB and 6dB attenuation levels shows the effect

of the termination impedance change at low frequencies, whereas 14dB attenuation shows

that the data repeats a general trend but have an excessive noise due to very small TDR

step amplitude (~20mV).

Conclusion

The presented results demonstrate that TDR measurements can be successfully performed on

actively transmitting host that can be controlled from the host controller at the same time. Special

care should be taken when selecting the right TDR signal levels: the signal should be small

enough to keep the transmitter operating in a linear region, and large enough to provide a

sufficient dynamic range for S-parameter acquisition. The attenuation level of 6dB seems to

provide a reasonable solution for the active SATA transmitter measurements.

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Appendix E Verification of the mated Test Fixture and setup

Purpose: To provide a methodology for the quick verification of the calibration and test fixtures prior performing

Rx/Tx test measurements

References:

[1] SATA Standard, 7.2.2,5 Lab Load Details



Discussion:

Reference [1] specifies the lab load requirements for SATA Test fixture. Assuming the fixture meets these

requirements, the following method described in this appendix is used to quickly check the performance of the test

fixtures used for Rx/Tx tests. The measurement is performed the same way as it is done for Rx/Tx tests for Gen II

PUTs with the PUT replaced by the same test fixture with the opposite gender having its SMA connectors

terminated with 50 Ohm terminations.

The Crescent Heart test fixture is used in the measurements.





measurements are done for the pairs within the modules. The deskew is to be performed in odd and

even modes. The step signals should arrive at the PUT and the same time.

3. It is recommended to save the test setups to the instrument after each, even and odd deskew operations.

Test Procedure:

1. Apply the same procedure that was used for Rx/Tx01-05 tests.

Figure E.1 Crescent Heart fixtures configured for the verification tests.

Measurement Results:

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The following figures illustrate the results of the verification tests. Time domain tests are informative only.

Red line in the frequency domain test results shows required test compliance limits defined for Rx/Tx tests.

Figure E.2 Rx-01 Test results for Crescent Heart Mated Pair.


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Figure E.7 Tx-01 Test results for Crescent Heart Mated Pair.

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Tektronix, Inc.


Appendix F - Test Setup to use with TekExpress Automation Software

TekExpress test automation software allows a complete, “hands off”, automation of RxTx tests according to

Tektronix SATA RxTx tests MOI. TekExpress requires the use of RF Switch to provide proper control of the

acquisition channels and the UUT. The UUT is controlled by the Signal Source, which is the Arbitrary Waveform

Generator (AWG) by Tektronix. The modules have to be connected to the test fixtures according to a diagram

shown in Figure F.1. Make sure that all equipment required by TekExpress is available and follow the instructions

provided in the TekExpress user manual.

Figure F.1. SATA RxTx test setup used in TekExpress automation. AWG controls the UUT state by

communicating with Rx part of the UUT. The pattern is verified when the sampling scope is triggered from

the negative Tx channel (C-3 connection of Ch4). The block diagram does not show 6dB attenuators used in

the Tx tests; the attenuators are connected to the sampling heads of Ch3 and Ch4.

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