rev 5/02 luna technologies 2003. rev 3/03 luna technologies, providers of optical vector analysis,...
TRANSCRIPT
Rev 5/02
Luna Technologies Luna Technologies 20032003
Rev 3/03
Luna Technologies, providers of Optical Luna Technologies, providers of Optical Vector Analysis, allowing you to do Vector Analysis, allowing you to do things never before available in opticsthings never before available in optics
XMT RX
Source
H()
Rev 3/03
About LunaAbout Luna• Founded - Summer 2000
• Focused on measurement instrumentation for fiber-optic components and subsystems
• World headquarters in
Blacksburg, VA
• Sales offices in Atlanta, Los Angeles, Canada, China, and Tokyo
• Completed “B” round of funding led by Columbia Capital - March 2003
Rev 3/03
Before the Luna OVA…nothing couldBefore the Luna OVA…nothing could• Use a measured linear transfer function to determine all
characteristics…future-proof
• Measure and display all-parameters simultaneously at a 4 hertz update rate
• Align optical devices to optimize all device parameters in seconds
• Cost-effectively manufacture tunable devices
• Measure devices with large dispersion
• Peer inside the device to determine the source of degraded specifications
Rev 3/03
Luna Technologies Products & ServicesLuna Technologies Products & Services
Optical Vector Analyzer (OVA) • All parameter test solution• Industry leading combination of speed and accuracy• CT - Component Test (30m)• ST - System Test (80m)• LP – Loss and PMD Analyzer
OFDR • Peer into the heart of your subsystems with 20 micron accuracy• Measure up to 200 ns of delay and 80 m of DUT length• 80 dB sensitivity
Optical Testing Services • Outsource your measurement needs to the experts at Luna, it’s . . . • Fast• Easy• Economical
Software Analysis Tool Set• Desktop Analysis Software• Coming Soon … Filter Characterization and Eye Diagram Analysis Software
Redefining the Economics of Optical TestRedefining the Economics of Optical Test
Rev 3/03
Luna’s Optical Vector Analyzers…Luna’s Optical Vector Analyzers…
• Test with one sweep across C and L bands:– IL, RL, GD, CD, PDL, DGD, Optical Phase, Time Domain
• Combine the power of an all-parameter analyzer with the functionality of an OTDR
• Decrease testing cycles by a factor of 20
• Reduce capital equipment cost
• Pay back period in months
The best choice for measurement and characterization of components and sub modules.
Rev 3/03
Fiber Optic Test Fiber Optic Test Product of the YearProduct of the Year
“Luna Technologies’ OVA is clearly the most innovative product in the optical test arena…scoring top points for speed of testing, ease of testing, price-to-performance ratio, resolution and accuracy, and scalability…it enables end-users to achieve lower development time and offers cost savings”
Award Recipient: Luna Technologies
Technology Award, 2002Technology Award, 2002
Rev 3/03
Luna’s Optical Vector Analyzers…Luna’s Optical Vector Analyzers…
“We would not have made it through these tough times without the OVA.”
OFS Fitel
“…the best thing to happen to optical measurements since I’ve been in the business.”
Lucent Bell Labs
“It would not be feasible to make our device without the speed of the OVA”
Accumux Technologies
Rev 3/03
H(t)
DUT
Bits go in Bits come out
DUT affects both the amplitude and phase of the transmitted data.
Single mode system example:Single mode system example:
Rev 3/03
Optical Vector AnalysisOptical Vector Analysis
HA B
C D
DUT is completely characterized by four independent complex functions. From H(), calculate IL, PDL, GD, CD, PMD, etc.
Rev 3/03
The Result is…The Result is…
– Breakthrough measurement speeds– Dramatically reduced costs– Rapidly determine the source of degraded
specifications– Completely characterize a device under
test – Maximized yields by tracking every stage
of the development process– Bin components to match design
performance
Rev 3/03
OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all
parameters in a single scan
• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available
• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy
• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan
Rev 3/03
Measure all parameters…Measure all parameters…
In less than 0.25 secondsIn less than 0.25 seconds
Rev 3/03
OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all
parameters in a single scan
• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available
• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy
• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan
Rev 3/03
Model data transmission with easeModel data transmission with ease
Measured H() Data
Simulated 10Gb/sNRZ Signal Spectrum
Rev 3/03
Tangible future benefits…2Tangible future benefits…2ndnd Order PMD Order PMD
100
80
60
40
20
0
-20
seco
nd O
rder
PM
D (
ps*p
s)
1548.31548.21548.11548.01547.91547.8
wavelength (nm)
-40
-30
-20
-10
0
Omega_Parallel Omega_Perpendicular
Rev 3/03
OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all
parameters in a single scan
• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available
• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy
• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan
Rev 3/03
Measurement Example - FBGMeasurement Example - FBG
Rev 3/03
OVA Product HighlightsOVA Product Highlights• All Parameter Analysis - Obtain all
parameters in a single scan
• Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available
• Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy
• Breakthrough Measurement Speeds - View all parameters in “Real Time” @ > 4 Hz update rate for 2.5 nm scan
Rev 3/03
OVA Product HighlightsOVA Product Highlights
• Time Domain Filtering - “Look inside” devices with femtosecond resolution
• Desktop Analysis Software - Analyze stored data (No retesting!) at later time and location
• Test Long Devices - Test components up to 80 meters long
• Minimal Setup time - Full calibration takes ~ 1 minute for C + L bands