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Remote Sensing in Severe Radiation Environments Ralph Levy*, Kevin P. Hand**, Robert W. Carlson** Winthrop Wadsworth***, Jens Peter Dybwad*** Daniel Berisford**, Didier Keymeulen**, Jason E. Feldman** Quant Engineering, ** NASA JPL, *** D&P Instruments Presented at: 2011 Sensors Tech Forum, Boston, MA

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  • Remote Sensing in Severe Radiation Environments

    Ralph Levy*, Kevin P. Hand**, Robert W. Carlson**Winthrop Wadsworth***, Jens Peter Dybwad***

    Daniel Berisford**, Didier Keymeulen**, Jason E. Feldman**

    •Quant Engineering, ** NASA JPL, *** D&P Ins truments

    •Presented at: 2011 Sensors Tech Forum, Boston, M A

  • Overview• Based on a spectrometer for the delayed NASA Jupiter Europa

    Orbiter mission

    • Why go to Jupiter - possibilities and problems

    • FTIR Spectral Instrumentation

    • Analysis and Removal of Radiation Effects

    • Other Applications

    • Work funded by: NASA JPL contract #1396649Edgewood Chemical and Biological Center DAAD13-03-C-0035 Quant Engineering internal funding

  • Moons of Jupiter with Liquid Water

  • Moons of Jupiter with Liquid Water

  • Measurements and Problems

    WAVELENGTH, µm

    0 1 2 3 4 5 6 7 8 9 10 11 12

    RA

    DIA

    NC

    E, 1

    09 p

    hoto

    ns s

    -1 c

    m-2

    ste

    r-1 (

    cm-1

    )-1

    1

    10

    100

    1000

    31%

    23%

    15%

    10% (µ0 > 0.2)

    120 K

    110 K

    100 K

    130 K

    θ0 = 67.5

    θ0 = 0

    • What we want to measure What happens when we try

  • Radiation Environment at Europa

    CHARGE, fC

    1 10

    DIF

    FE

    RE

    NT

    IAL

    HIT

    RA

    TE

    , s-1

    fC-1

    0.1

    1

    10

    100

    1000

    EUROPA G1ENHiLatInSb, DETECTOR NO.14

    AVERAGE CHARGE

  • D&P Instruments TurboFT• Very rugged, only one moving (rotary) part• Data acquisition triggering• Spectral resolution is a function of the rotor

    thickness and rotor material index of refraction• 4 quadrants for design purposes

  • FTIR Spectrometer• Multiplexing (Felgett) advantage, light at all wavelengths is collected

    simultaneously.

    • Higher light-gathering power than dispersive spectrometers (Jacquinot advantage). TurboFT (D&P Instruments) is approximately 50 × more sensitive in light gathering than the Galileo Near Infrared Mapping Spectrometer (NIMS).

    • Built-in Radiation tolerance – Noise is spread and apodization

    • AC-coupled to data acquisition

    • Signal Processing can greatly increase performance in high radiation environment

  • Data Analysis for the TurboFT Spectrometer

    • Peculiarities of the TurboFT – 4 quadrants

    • Compute spectra by FFT

    • Co-Add spectra for each quadrant

    • Combine for a single spectrum

  • Data Rates and Resolution

    • Acquire multiple scans– Between 10 and 360 scans per second – Multi-pixel versions

    • Good spectral resolution 8 cm-1 (4096 interferogram data points), tighter if desired.

    • At slow rotation speeds (10 scans/sec) the single-pixel data rate is approximately 1 MB/sec.

  • Integration Times and Data Redundancy

    • Integration times estimated at approximately 60 seconds per physical location at Europa

    • With 4 rotational positions, there are 150 (60*10/4) samples of each interferogram data point

    • Time interval between successive interferogram points is approximately 8 us

  • Requirements for Signal-to-Noise are dependent on analysis

    • Single wavelength analysis– Often what is taught at school– Deservedly bad reputation

    • Integrated peaks– A modest improvement

    • Spectral Methods– If there is structure in the target spectrum– Demonstrated SNR < 1 with high accuracy

    • This talk is not about Spectral Processing Methods but about separable signal and noise in the measurement – a prelude to Spectral Processing

  • Statement of the Problem

    • Each Interferogram is a sampling of the same signal so there are redundant samples

    • Each sample contains signal and ambient noise measured together

    • Because the data rate is fast compared to the radiation noise frequency near Jupiter, the “signal” mean can be recovered

  • Indexed Statistics

    • Simple idea – Powerful in practice: Throw out what is inconsistent to find

    what you are looking for

    • Start with the median value of the distribution and compute mean value and standard deviation, throw out samples that are outside 2 sigma limits

    • Repeat by re-sampling remaining data until convergence (usually

  • Signals and NoiseRange of Application and Limitations

    • Signals must be separable:– Standard deviation of “signal” must be small

    compared to magnitude of noise

    • Examples:– Signal with Big noise– Signal with White noise– Signal with Small noise– Signal with Europa noise

  • Signal, Noise and MeasurementBig Noise

    Normalized Histogram of Signal, Noise and Measureme ntSignal Mean at 10.0 - Idx Calculated Mean = 10.01 4

    0

    0.05

    0.1

    0.15

    0.2

    0.25

    0.3

    0.35

    0 5 10 15 20 25 30

    Signal Intensity

    Rel

    ativ

    e F

    requ

    ency

    of O

    ccur

    renc

    e Signal

    Noise

    Measurement Average = 15.09

    Signal, Noise and Measurement Data

    0

    5

    10

    15

    20

    25

    30

    0 100 200 300 400 500 600

    Sample Number

    Sam

    ple

    Val

    ue

  • Signal, Noise and MeasurementWhite Noise

    Normalized Histogram of Signal, Noise and Measureme ntSignal Mean at 10.0 - Idx Calculated Mean = 10.04 3

    0

    0.05

    0.1

    0.15

    0.2

    0.25

    0.3

    0.35

    0 5 10 15 20 25 30

    Signal Intensity

    Rel

    ativ

    e F

    requ

    ency

    of O

    ccur

    renc

    e

    Signal

    Noise

    Measurement Average = 15.62

    Signal, Noise and Measurement Data

    0

    5

    10

    15

    20

    25

    30

    35

    40

    45

    0 100 200 300 400 500 600

    Sample Number

    Sam

    ple

    Val

    ue

  • Signal, Noise and MeasurementSmall Noise

    Normalized Histogram of Signal, Noise and Measureme ntSignal Mean at 10.0 - Idx Calculated Mean = 10.14 5

    0

    0.05

    0.1

    0.15

    0.2

    0.25

    0.3

    0.35

    0 5 10 15 20 25 30

    Signal Intensity

    Rel

    ativ

    e F

    requ

    ency

    of O

    ccur

    renc

    e

    Signal

    Noise

    Measurement Average = 11.06

    Signal, Noise and Measurement Data

    -5

    0

    5

    10

    15

    20

    0 100 200 300 400 500 600

    Sample Number

    Sam

    ple

    Val

    ue

  • Signal, Noise and MeasurementEuropa Noise (synthetic)

    Signal, Noise and Measurement Data

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    0 100 200 300 400 500 600

    Sample Number

    Sam

    ple

    Val

    ue

    Normalized Histogram of Signal, Noise and Measureme nt Signal Mean at 0.50 - Idx Calculated Mean = 0.497

    0

    0.1

    0.2

    0.3

    0.4

    0.5

    0.6

    0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

    Signal Intensity

    Rel

    ativ

    e F

    requ

    ency

    of

    Occ

    urre

    nce

    Signal

    Noise

    Measurement - Mean = 0.79

  • Interferogram Jitter and Registration

    -2.5

    -2.0

    -1.5

    -1.0

    -0.5

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    1950 1970 1990 2010 2030 2050 2070 2090

    Interferogram Sequence Point

    Signa

    l Inten

    sity / Volt

    -1

    0

    1

    0 500 1000 1500 2000 2500 3000 3500 4000

    Inteferogram Data Point Sequence Number

  • Radiation Effects – 14 Interferograms

    -1

    0

    1

    2

    3

    4

    5

    6

    7

    8

    0 500 1000 1500 2000 2500 3000 3500 4000

    Inteferogram Data Point Sequence Number

    Vol

    tage

    -0.5

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    3.0

    3.5

    1900 1920 1940 1960 1980 2000 2020 2040 2060 2080 2100

    Inteferogram Data Point Sequence Number

    Vol

    tage

    -1

    0

    1

    0 500 1000 1500 2000 2500 3000 3500 4000

    Inteferogram Data Point Sequence Number

  • 2 Sigma Limits

    Registered

    -2.5

    -2.0

    -1.5

    -1.0

    -0.5

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    1950 1970 1990 2010 2030 2050 2070 2090

    Interferogram Sequence Point

    Sig

    nal I

    nten

    sity

    / V

    olt

    Unregistered

    -2.5

    -2.0

    -1.5

    -1.0

    -0.5

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    1950 1970 1990 2010 2030 2050 2070 2090

    Interferogram Sequence Point

    Sig

    nal I

    nten

    sity

    / V

    olt

  • Application to Radiation in FTIR Data

    0.0000

    0.0002

    0.0004

    0.0006

    0.0008

    0.0010

    0.0012

    0.0014

    0.0016

    0.0018

    0.0020

    4 6 8 10 12 14 16 18 20

    Wavelength - um

    Sig

    nal I

    nten

    sity

    With Radiation

    Without Radiation

    Repaired

  • Another Example

    0.0004

    0.0005

    0.0006

    0.0007

    0.0008

    0.0009

    0.0010

    0.0011

    0.0012

    6.2 6.4 6.6 6.8 7.0 7.2 7.4 7.6 7.8 8.0

    Wavelength - um

    Sig

    nal I

    nten

    sity

    Radiation

    New

    Fixed

    Removed fromIntegral

    Integral from Wavelength = 6.5702 to 6.8196 um above the black trapezoid is: 0.0000129 for the original spectrum and 0.0000125 for the spectrum with Radiation that had been Fixed - 3.2% error in the feature bump

  • An Inverse Application to Curve Fitting of Noisy Data

    • Fluorescence Background Removal in RamanSpectroscopy – where this numerical technique was originally developed

    – Compute fluorescence signal, e.g., as Gaussian (3 variables)

    – Compute Error and throw out big points with large error (Raman signal)

    – Optimize fit of Gaussian to reduced data set

    Removal of Raman Background Fluorescence

    -1.0

    0.0

    1.0

    2.0

    3.0

    4.0

    5.0

    6.0

    0 1 2 3 4 5 6 7 8

    Wavelength (arbitrary units)

    Sig

    nal I

    nten

    sity

    Measured Signal

    Computed FluorescenceBackground

    Computed Raman Signal

  • Take-Aways

    • FTIR has inherent tolerance for Radiation

    • Instrument design can influence operation

    • Data analysis can pull much information out of some types of noise

  • JPL Jovian References• http://opfm.jpl.nasa.gov/ • http://opfm.jpl.nasa.gov/europajupitersystemmissionejsm/ejsmpresentations• Boldt, J., et al., 2008. Assesment of Radiation Effects on Science and

    Engineering Detectors for the JEO Mission Study. Jupiter Europa Orbiter Mission Study 2008: Final Report. JPL D-48256

    • Carlson, R. W., 2010. Radiation Noise Effects at Jupiter: Comparison of In-situ and Laboratory Measurements RTD Final Report. Jet Propulsion Laboratory, Pasadena.

    • Carlson, R. W., et al., 2009. Europa's Surface Composition. In: EUROPA (R. T. Pappalardo, et al., Eds.). Univ. Ariz. Press, Tucson, 283-327.

    • Fieseler, P. D., et al., 2002. The radiation effects on Galileo spacecraft systems at Jupiter. IEEE Transactions on Nuclear Science. 49, 2739-2758.

    • Hand, K. P., et al., 2009. Astrobiology and the Potential for Life on Europa. In: EUROPA (R. T. Pappalardo, et al., Eds.). Univ. Ariz. Press, Tucson, 589-630.

  • TurboFT References• Wadsworth, W., Dybwad, J. P., 1997. Ultra high speed chemical imaging spectrometer.

    ElectroOptical Technology for Remote Chemical Detection and Identification, Vol. 3082. Soc. Photog. Instrum. Eng., pp. 148-154.

    • Wadsworth, W., Dybwad, J. P., 1998. A very fast imaging FT spectrometer for on line process monitoring and control. Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring, Vol. 3537. Soc. Photog. Instrum. Eng., pp. 54-61

    • Wadsworth, W. and Dybwad, J.P., 2001a, Airborne Testing of Small, Fast, Rugged Fourier Transform Spectrometer for Geologic Survey Use, Proceedings of Fifth International Airborne Remote Sensing Conference, San Francisco, CA, 17-20 September, 2001.

    • Wadsworth, W., Dybwad, J. P., 2001b. Field testing of a small, fast, rugged Fourier transform spectrometer in the air and on the ground. ISSSR 2001, Quebec City, Canada.

    • Wadsworth, W., Dybwad, J. P., 2001c. Rugged high speed rotary imaging Fourier transform spectrometer for industrial use. Vol. 4577. Soc. Photog. Instrum. Eng.

    • Winthrop Wadsworth, "8x8 element mosaic imaging FT-IR for passive standoff detection“, 7th 2006 Standoff Detection Conference in Williamsburg, VA, 23-27 October 2006, Proc. SPIE 6302, 630202 (2006)

    • "8X8 Element Mosaic Imaging FT-IR for Passive Standoff Detection“, SPIE Optics & Photonics Conference in San Diego, 13-17 August, 2006

    • Hewson, R., et al, Hyperspectral Thermal Infrared Line Profiling for Mapping Surface Mineralogy, Proceedings of Fifth International Airborne Remote Sensing Conference, San Francisco, CA, 17-20 September, 2001.

    • http://www.dpinstruments.com/publications.php