reflecting at 30.4 and antireflecting at 58.4 nm

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Reflecting at 30.4 and Antireflecting at 58.4 nm David D. Allred and R. Steven Turley Department of Physics and Astronomy, Brigham Young University, Provo, UT [email protected] ; [email protected]

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Reflecting at 30.4 and Antireflecting at 58.4 nm. David D. Allred and R. Steven Turley Department of Physics and Astronomy, Brigham Young University, Provo, UT [email protected] ; [email protected]. IMAGE Mission http://image.gsfc.nasa.gov/. Launched Mar 25 00. Had 4 instruments - PowerPoint PPT Presentation

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Page 1: Reflecting at 30.4 and Antireflecting at 58.4 nm

Reflecting at 30.4 and Antireflecting at 58.4 nm

David D. Allred and R. Steven Turley

Department of Physics and Astronomy, Brigham Young University, Provo, UT

[email protected]; [email protected]

Page 2: Reflecting at 30.4 and Antireflecting at 58.4 nm
Page 3: Reflecting at 30.4 and Antireflecting at 58.4 nm

IMAGE Mission http://image.gsfc.nasa.gov/

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Launched Mar 25 00• Had 4 instruments

• The Extreme Ultraviolet Imager was designed to study the distribution of cold plasma in Earth's plasmasphere by imaging the distribution of He+ ions through their emission at 30.4 nm.

• B. R. Sandel, A. L. Broadfoot, J. Chen, C. C. Curtis, R. A. King, T. C. Stone, R. H. Hill, J. Chen, O. H. W. Sigmund, R. Raffanti, David D. Allred, R. Steven Turley,  D. L. Gallagher, “The Extreme Ultraviolet Imager Investigation for the IMAGE Mission,” Space Science Reviews 91, 197-242 (2000).

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EUV Pictures

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EUV Movie of May 24, 2000 bright aurora and plasmasphere tail

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3 Mirrors flew

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