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127 REFERENCES [1] S. Ramesh, B. Ramamoorthy,” Measurement of surface finish using an optical diffraction technique” Manufacturing Engineering Section, Department of Mechanical Engineering, Indian Institute of Technology, Madras 600036, India Received 30 May 1995; accepted 5 October 1995. [2] Irem Y. Tumer, R.S.Srinivasan, Kristin L. Wood, “Characteristic Measures for the Representation of Manufactured Surface Quality ”, ASME design Engineering Technical Conference and Design for Manufacturing Conference, Irvine, California, August (18-22) 1996. [3] S.Livens, P.Scheunders, G.Van de Wouwer, D.Van Dyck,“Wavelets for Texture Analysis”, University of Antwerp, Belgium, 30 th June 1997. [4] M.Malfait and D.Roose, “Wavelet based image denoising using a Markov Random Field a priori model”, IEEE Transactions on Image Processing, vol. 6,no. 4, pp. 549–565, 1997. [5] Paul Layzell, “Reducing Hardware Evolution’s Dependency on FPGAs”, proceedings of the Seventh International Conference on Microelectronics for Neural, Fuzzy and Bio-Inspired Systems(Micro Neuro'99),IEEE 1999,pp.171-178, 1999. [6] J.D.Lohn and S. P. Colombano, “A circuit representation technique for automated circuit design”, IEEE Transactions on Evolutionary Computation, 3(3):205.219, September 1999. [7] Qinghu Chen, Shunian Yang, Zhu Li, “Surface roughness evaluation by using wavelets analysis”, Research Centre of Measurement Technology and Scientific Instruments, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China, 22 March 1999.

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Page 1: REFERENCES - shodhganga.inflibnet.ac.inshodhganga.inflibnet.ac.in/bitstream/10603/6020/17/17_references.p… · [28] Feng xiang Qiao, ˝Introduction to Wavelet, A Tutorial ˛,Workshop

127

REFERENCES

[1] S. Ramesh, B. Ramamoorthy,” Measurement of surface finish using an

optical diffraction technique” Manufacturing Engineering Section,

Department of Mechanical Engineering, Indian Institute of Technology,

Madras 600036, India Received 30 May 1995; accepted 5 October 1995.

[2] Irem Y. Tumer, R.S.Srinivasan, Kristin L. Wood, “Characteristic

Measures for the Representation of Manufactured Surface Quality ”,

ASME design Engineering Technical Conference and Design for

Manufacturing Conference, Irvine, California, August (18-22) 1996.

[3] S.Livens, P.Scheunders, G.Van de Wouwer, D.Van Dyck,“Wavelets for

Texture Analysis”, University of Antwerp, Belgium, 30th June 1997.

[4] M.Malfait and D.Roose, “Wavelet based image denoising using a Markov

Random Field a priori model”, IEEE Transactions on Image Processing,

vol. 6,no. 4, pp. 549–565, 1997.

[5] Paul Layzell, “Reducing Hardware Evolution’s Dependency on

FPGAs”, proceedings of the Seventh International Conference on

Microelectronics for Neural, Fuzzy and Bio-Inspired Systems(Micro

Neuro'99),IEEE 1999,pp.171-178, 1999.

[6] J.D.Lohn and S. P. Colombano, “A circuit representation technique for

automated circuit design”, IEEE Transactions on Evolutionary

Computation, 3(3):205.219, September 1999.

[7] Qinghu Chen, Shunian Yang, Zhu Li, “Surface roughness evaluation by

using wavelets analysis”, Research Centre of Measurement Technology

and Scientific Instruments, Huazhong University of Science and

Technology, Wuhan, Hubei, 430074, China, 22 March 1999.

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[8] Bruno Josso , David R. Burton, Michael J. Lalor,“Wavelet strategy for

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Adaptive Weight Algorithm for Salt and Pepper Noise Removal”, IEEE

Transactions, 2011.

[109] H. S. Bhadauria, Dr.M.L.Dewal,“Performance Evaluation of Curvelet and

Wavelet based Denoising Methods on Brain Computed Tomography

Images”, proceedings of ICETECT, in IEEE Transactions, 2011.

[110] K. Suganya, Dr.V.Nagarajan, “Efficient Run-time Task Allocation in

Reconfigurable Multiprocessor System-On-Chip with Network-On-Chip”,

International Conference on Computer, Communication and Electrical

Technology – ICCCET 2011, 18th & 19th March, 2011.

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LIST OF PUBLICATIONS

International Journals:

[J1] P.Sivakumar, S.Ravi, “Image Enhancement using evolved reconfigurable

filter cores” International Journal of Computer Science and Network

Security, Vol.12, No.2, pp 123-127, February 2012.

[J2] P.Sivakumar, S.Ravi, “Performance of wavelet, Contourlet and 2D PCA

Transforms for image Denoising” CiiT International Journal of Digital

Image Processing,Vol.4,No.7,pp 386-391,April 2012.

[J3] P.Sivakumar, S.Ravi, “Vector Quantization Based Image Compression”

International Journal of Innovative Technology and Exploring

Engineering, Vol.1, No.1, pp 89-94, June 2012.

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142

CURRICULUM VITAE

Mr. SIVAKUMAR.P was born in 1983 at Vellore, Tamil Nadu, India. He

obtained his DCT (Diploma in Computer Technology) in 2002 from Sri

Venkateswara Polytechnic College, Vellore, B.E (Electronics and

Communication Engineering) in 2005 from Priyadarshini Engineering College,

Vaniyambadi and M.Tech (Applied Electronics) in 2007 from the Dr.MGR

Educational and research institute University, Chennai. He has 7 years of

teaching experience and currently working as Assistant Professor,

ECE department, Kingston Engineering College, Katpadi. His area of interest

includes Digital Signal Processing and Digital Image Processing. He is a

member of IAENG, IACSIT, CSTA and Life member of ISTE.