pmma data sheet from microchem
DESCRIPTION
PMMA descriptionTRANSCRIPT
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PMMA (polymethyl methacrylate) is a versatile polymeric material that is well su
for many imaging and non-imaging microelectronic applications. PMMA is m
commonly used as a high resolution positive resist for direct write e-beam as wel
x-ray and deep UV microlithographic processes. PMMA is also used as a protec
coating for wafer thinning, as a bonding adhesive and as a sacrificial layer.
Standard PMMA products cover a wide range of film thicknesses and are formula
with 495,000 & 950,000 molecular weight (MW) resins in either chlorobenzene
the safer solvent anisole. Custom MW products ranging from 50,000 - 2.2 million
available upon request. In addition, we offer copolymer (MMA (8.5) MAA) produ
formulated in the safer solvent ethyl lactate. All MCC PMMA and copolymer res
are available in package sizes from 500ml to 20 liters.
NANOPMMA and Copolymer
MCCPRODUCT ATTRIBUTES
Submicron linewidth control
Sub 0.1m imaging
E-beam, X-ray & deep UV imaging
Broad range of molecular weights & dilutions
Excellent adhesion to most substrates
Compatible with multi-layer processes
APPLICATIONS
Multi-layer T-gate processing
Direct write e-beam lithography
Protective coatings for wafer thinning
Adhesive for X-ray LIGA processing
Sacrificial layers
100nm gate profile imaged in 495K PMMA with 8.5 MAA Copolymer on top.
T-gate resulting from PMMA/Copolymer bilayer resist stack.
courtesy M/A Com
courtesy M/A Com
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PROCESSING GUIDELINES
Substrate Preparation
Thesubstrate should be clean and dry. Solvent,O2 plasma, and O3
cleans are commonly used and recommended.
Coat
MicroChemPMMAresists produce low defect coatings overa broad
range of filmthicknesses. Thefilmthickness vs.spin-speed curves
displayed in Fig. 1 through 8 provide the information required to
select the appropriate PMMA dilution and spin speed needed to
achieve the desired film thickness.
The recommended coating conditions are:
(1) Dispense: STATIC 5 - 8ml for a 150mm wafer
(2) Spread: DYNAMIC 500 rpm for 5 sec OR
STATIC 0 rpm for 10 sec
(3) Spin: Ramp to final spin speed at a high acceleration
rate and hold for a total of 45 seconds.
Pre Bake
PMMA
Hot plate: 180o
C for 60 - 90 sec ORConvection Oven: 170oC for 30 min
Copolymer
Hot plate: 150oC for 60 - 90 sec OR
Convection Oven: 140oC for 30 min
*Vacuum oven bake can also be used
Spin Coat
Bottom Layer
PMMA Resist
Prebake
PMMA
Prebake
Copolymer
Expose and
Develop
Resist Stack
Spin Coat
Top Layer
Copolymer Resist
Remove Resist
Edge Bead
Gate Etch and
Deposition
Strip/Remove
Resist Stack
Typical process flow for bi-layer T-gate proces
1. 2.
4.3.
.6.5
8.7.
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Expose
PMMA can be exposed with variousparts of the electromagnetic
spectrum.
e- beam:Do se - 50 - 500 C /cm 2 depending on radiation
source/equipment & developer used.
Energy 20-50kV; higher kV for higher resolution, e.g. 50kV for
0.1mm images.
DUV(deep UV):Low sensitivity, requiring doses >500mJ/cm2
at 248nm.
X-ray: Sensitivity of PMMA is low, ~1-2 J/cm2at 8.3. The
sensitivity increases at longer x-ray wavelengths. Features of
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10000
9000
8000
7000
6000
5000
4000
3000
2000
1000
0
500 1000 1500 2000 2500 3000 3500 4000 4500
FilmT
hickness()
Spin Speed (rpm)
C4
C2
C6
495PMMA C Resists
Solids: 2% - 6% in Chlorobenzene
Figure 1
23000
21000
19000
17000
15000
13000
11000
90007000
5000
500 1000 1500 2000 2500 3000 3500 4000 4500
FilmT
hickness()
Spin Speed (rpm)
C8
C9
495PMMA C Resists
Solids: 8% - 9% in Chlorobenzene
Figure 2
1000
2000
3000
4000
5000
6000
7000
0
500 1000 1500 2000 2500 3000 3500 4000
FilmT
hickness()
Spin Speed (rpm)
A6
A4
A2
495PMMA A Resists
Solids: 2% - 6% in Anisole
Figure 3
5000
10000
15000
20000
25000
0
500 1000 1500 2000 2500 3000 3500 4000
FilmT
hickness()
Spin Speed (rpm)
A11
A8
495PMMA A Resists
Solids: 8% - 11% in Anisole
Figure 4
0
2000
4000
6000
8000
10000
12000
FilmT
hickness,
()
500 1000 1500 2000 2500 3000 3500
Spin Speed (rpm)
EL 11
EL 9
EL 6
4000 4500
Copolymer Resists
Solids: 6% - 11% in Ethyl Lactate
SPIN SPEED CURVES FOR PMMA AND COPOLYMER RESISTS
Thespin speed versusfilm thickness curvesdisplayed in figures1-11 provideapproximate information required to select the appropriate PMM
copolymer resist and spin conditions needed to obtain the desired filmthickness.Actualresults will varyand are equipment, environment,proces
application specific. Additional resist dilutions to obtain other film thicknesses are available upon request.
Figure 9
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55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
500 1000 1500 2000 2500 3000 3500 4000 4500
FilmT
hickness()
Spin Speed (rpm)
C9
C10
950PMMA C Resists
Solids: 9% - 10% in Chlorobenzene
Figure 5
0
5000
10000
15000
20000
25000
500 1000 1500 2000 2500 3000 3500 4000 4500
Spin Speed (rpm)
C7
C4
C2
FilmT
hickness()
950PMMA C Resists
Solids: 2% - 7% in Chlorobenzene
Figure 6
4000
6000
8000
10000
12000
0
2000
500 1000 1500 2000 2500 3000 3500 4000
FilmT
hickness()
Spin Speed (rpm)
A7
A4
A2
950PMMA A Resists
Solids: 2% - 7% in Anisole
Figure 8
55000
50000
45000
40000
35000
30000
25000
20000
15000
10000
500 1000 1500 2000 2500 3000 3500 4000 4
FilmT
hickness()
Spin Speed (rpm)
A9
A11
950PMMA A Resists
Solids: 9% - 11% in Anisole
Figure 7
1.45
1.5
1.55
1.6
1.65
1.7
RefractiveIndex
0 300 500 700 900
Wavelength (nm)
Cauchy Coeffiecients
A B C
495 PMMA 1.491 3.427 e-03 1.819 e-04950 PMMA 1.488 2.898 e-03 1.579 e-04
1.45
1.5
1.55
1.6
1.65
1.7
RefractiveIndex
0 300 500 700 900
Wavelength (nm)
Cauchy Coeffiecients
A B C
8.5 mEL 1.478 7.204 e-04 -3.478 e-0
Optical Properties
Copolymer Resists
Figure 10 Figure 11
Optical Properties
495 and 950 PMMA Resists
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Bi-Layer Process
2. Coat and bake copolymer
4. Expose resist stack, center scan dose,then side scan dose
1. Coat and bake high MW PMMA
PMMA
GaAs
Copolymer
PMMA
GaAs
3. Coat and bake low MW PMMA
CopolymerPMMA
PMMA
CopolymerPMMA
PMMA
GaAs
e-beam
GaAs
>>
5.Develop tri-layer stack
6.Deposition
7. Strip resist stack
Tri-Layer Process
PMMA resists for T-gate and other imaging processes
PMMA is a high resolution positive tone resist for e-beam, deep UV
(200-250nm) and X-ray lithographic processes.AlthoughPMMAmay
be used in a single layer resist process, it is most commonly used in
multi-layer processes such as in the fabrication of mushroom or
T-gates. Imagesare formed through the photo scission of the
polymer backbone and subsequent developmentprocess, which
removes the exposed, lower molecular weight resist. Multi-layer,
shaped resist profiles are realized and influenced through the careful
choice of PMMAmolecular weight, film thickness and other process
set points.
Ina typical bi-layer process, a combination of bottom and top layer
resists are selected such that a large difference in dissolution rates
of the layers at the developer step exists, leading to the desired
resist sidewall profile. Thiscontrast may be further influenced with a
varietyof process strategies. Generally,dissolution rate increases as
molecular weight decreases. However, soft bake conditions, which
affect residual solvent leveland subsequent development rates will
influence the bi-layer resist profile as will the exposure conditions.
Please refer to our web site, www.microchem.com for applications
notes concerning non-imaging PMMA processes such as wafer
thinning, bonding and sacrificial layers.
2. Coat and bake copolymer
3. Expose resist stack, center scan dose,then side scan dose
5.Deposition
6. Strip resist stack
1. Coat and bake PMMA
PMMA
GaAs
Copolymer
PMMA
GaAs
PMMA
e-beam
GaAs
4.Develop PMMA and Copolymer
>>
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NOTES
PMGI and LOR for lift-off processing
SU-8 resists for MEMS and ultra thick resist processing
Remover PG resist stripper
EBR PG edge bead remover
Acryl Strip resist stripper for PMMA
OTHER RESIST AND ANCILLORY PRODUCTS FROM MICROCHEM
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HANDLING NANO PMMA
& COPOLYMER SERIES RESISTS (in Anisole or Chlorobenz
Use precautions in handling flammablePMMA solutions. Avoidcontact w
skin, and clothing. Use with adequate ventilation.Avoidbreathing fume
chemical-resistant eye protection, chemical gloves (PVA for chloro
solutions) and protectiveclothing when handling NANOPMMA& Copolym
Resist products. NANOPMMA& Copolymer Series Resists cause irritation
of contact with eyes, skin, and mucous membranes. Incase of eye contawith water for 15 minutes and call a physician immediately. Review the
MSDS (Material Safety Data Sheet) before using.
MATERIAL AND EQUIPMENT COMPATIBILITY
NANOPMMA& Copolymer Resists are compatible with glass, ceramic
polyethylene, high-density polyethylene, polytetrafluoroethylene, stainless s
equivalent materials.
Chlorobenzene is a powerful solvent and will attack var ious elastom
as BUNAN,EPDM,HYPALON, and NEOPRENE. It will also attack PVC,Cpolyester. VITON A is recommended for both O-rings and tubing.
PROCESSING ENVIRONMENT
For optimum results, use NANO PMMA& Copolymer Series Resi
controlled environment. 20 - 25o 1oC (68 - 77oF) is suggested.
STORAGE
Store upright in original containers in a dry area 50 - 80oF (10 - 27oC). Don
refrigerate. Keepaway from sources of ignition, light, heat, oxidants, acids,
reducers. Shelf life is 13 months from date of manufacture.
DISPOSAL
Each locality, state, and county has unique regulations regarding the
of organic solventssuch as NANOPMMASeries Resists. It is the respon
the customer to dispose of NANOPMMA Series Resists in compliance
applicable codes and regulations. See MSDS for additional information.
The information regarding these products is based on our testing to date, which we believebe reliable, but accuracy or completeness is not guaranteed. We make no guarantee or warrexpressed or implied, regarding the information, use, handling, storage, or possession of thproducts, or the application of any process described herein or the results desired, since theand handling of these products are beyond our control.
MicroChem Corp. copyright 2001.
All rights reserved.
LOR is a trademark of MicroChem Corp.
1254 CHESTNUT STREET
NEWTON, MA 02464
PHONE: 617.965.5511
FAX : 617.965.5818
EMAIL: [email protected]
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