physics 736 experimental methods in nuclear-, particle...
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Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Physics 736
Experimental Methods in Nuclear-, Particle-, and Astrophysics
Lecture 12
Karsten [email protected]
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
course websitehttp://neutrino.physics.wisc.edu/teaching/PHYS736/
Course Schedule and Reading
todayʼs homework comes in 2 parts:
first part = reading + slides, due on Monday, March 15, 2010second part = some exercises, due next Wednesday, March 17, 2010
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistics & Error AnalysisTopics
• introduction to statistics and error analysis• probability distributions• treatment of experimental data• measurement process and errors• maximum likelihood• parameter estimation• method of least squares • Bayesian and frequentist approach• hypothesis testing and significance• confidence intervals and limits
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Statistical Distributions
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistical Distributions
which distributions are continuous?
which are discrete?
binomial
Poisson
Gaussian
chisquare distribution
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistical Distributions
ννννν
binomial
Poisson
Gaussian
chisquare distribution
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistical Distributions
P (r) =N !
r!(N ! r)!pr(1 ! p)N!r
P (r) =µre!µ
r!
P (x) =1
!!
(2")e!
(x!µ)2
2!2A
B
C
P (u)du =(u/2)(u/2)!1e!u/2
2!(!/2)duD
what are distributions A-D?
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistical Distributions
Gaussian
binomial
Poisson
chisquare distribution
P (r) =N !
r!(N ! r)!pr(1 ! p)N!r
P (r) =µre!µ
r!
P (x) =1
!!
(2")e!
(x!µ)2
2!2A
B
C
P (u)du =(u/2)(u/2)!1e!u/2
2!(!/2)duD
what are distributions A-D?
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Statistical Distributions
p ! 0.05
p ! 0.05
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Probability and StatisticsMeasurement is a random process described by a
probability distribution
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Probability and StatisticsMeasurement is a random process described by a
probability distribution
σ=instrumental precision
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Probability and StatisticsWhat about errors?
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
1
Figure 2: A historical perspective of values of a few particle properties tabulated in this Review as a function of date ofpublication of the Review. A full error bar indicates the quoted error; a thick-lined portion indicates the same but withoutthe “scale factor.”
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Sampling and Parameter Estimation
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Sampling and Parameter Estimation
some terminology
sample • data • set of N measurements
population• observable space • underlying parent distribution
estimate• best value
variance of estimate• error on best value
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Sampling and Parameter Estimation
best value minimizes variance between estimate and true value
• method of estimation– 1) determine best estimate– 2) determine uncertainty on best estimate
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Examples
mean and error from series of measurements
mental Dat.
(4.s2)
;ense that.51). TheEquationat unlikernent be-s it quire
(4.53)
(4.s4)
r fromen oc-lantityof the'moremeth-imum
valuelevia-tY oi.
f.55)
cor-
,56)
t in
rl5 Examples of Applications 97
1,5 Examples of Applications
15.1 Mean and Error from a Series of Messurements
f,remple 4.1 Consider the simple experiment proposed in Sect. 4.3.2 to measure theLngth of an object. The following results are from such a measurement:
17.62l7.61t7.61
17.6217.6217.615
| 7.6t 511.625t7.61
17.62l7.6217.@5
17.6117.6217.61
Uhat is the best estimate for the length of this object?
Since the errors in the measurement are instrumental, the measurements are Gaus-rian distributed. From (4.49), the best estimate for the mean value is then
I = 17.61533
rhile (4.52) gives the standard deviation
d: 5.855 x l0-3 .
This can now be used to calculate the standard error of the mean (4.50),
o(r) = A/V15:0.0015 .The best value for the length of the object is thus
x = 17.616x.0.002 .
Note that the uncertainty on the mean is given by the standard error of the mean andnot the standard deviation!
f5.2 Combining Data with Different Errors
Enmple 4.2 It is necessary to use the lifetime of the muon in a calculation. However,in searching through the literature, 7 values are found from different experiments:
2.19Et0.(X)1 rrs2.197t0.d)i ps2.t948t0.(X)10 us
2.203 t 0.004 ps2.198t0.(X)2 ps
2.202+0.003 ps2.1!X5t0.0020 us
What is the best value to use?One way to solve this problem is to take the measurement with the smallest error;
however, there is no reason for ignoring the results of the other measurements. Indeed,cven though the other experiments are less precise, they still contain valid informationon the lifetime of the muon. To take into account all available information we musttake the weighted mean. This then yields then mean value
t = 2.1%96
with an error
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Examples
combining data with different errors
mental Dat.
(4.s2)
;ense that.51). TheEquationat unlikernent be-s it quire
(4.53)
(4.s4)
r fromen oc-lantityof the'moremeth-imum
valuelevia-tY oi.
f.55)
cor-
,56)
t in
rl5 Examples of Applications 97
1,5 Examples of Applications
15.1 Mean and Error from a Series of Messurements
f,remple 4.1 Consider the simple experiment proposed in Sect. 4.3.2 to measure theLngth of an object. The following results are from such a measurement:
17.62l7.61t7.61
17.6217.6217.615
| 7.6t 511.625t7.61
17.62l7.6217.@5
17.6117.6217.61
Uhat is the best estimate for the length of this object?
Since the errors in the measurement are instrumental, the measurements are Gaus-rian distributed. From (4.49), the best estimate for the mean value is then
I = 17.61533
rhile (4.52) gives the standard deviation
d: 5.855 x l0-3 .
This can now be used to calculate the standard error of the mean (4.50),
o(r) = A/V15:0.0015 .The best value for the length of the object is thus
x = 17.616x.0.002 .
Note that the uncertainty on the mean is given by the standard error of the mean andnot the standard deviation!
f5.2 Combining Data with Different Errors
Enmple 4.2 It is necessary to use the lifetime of the muon in a calculation. However,in searching through the literature, 7 values are found from different experiments:
2.19Et0.(X)1 rrs2.197t0.d)i ps2.t948t0.(X)10 us
2.203 t 0.004 ps2.198t0.(X)2 ps
2.202+0.003 ps2.1!X5t0.0020 us
What is the best value to use?One way to solve this problem is to take the measurement with the smallest error;
however, there is no reason for ignoring the results of the other measurements. Indeed,cven though the other experiments are less precise, they still contain valid informationon the lifetime of the muon. To take into account all available information we musttake the weighted mean. This then yields then mean value
t = 2.1%96
with an error
muon lifetime measurements
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Examples
count rates and errors
98
o(r) = 0.00061.
Note that this value isThe best value for the
*.{tr
4. Stat ist ics and the Trca
smaller than the error on anv of the inclifetime is thus
t = 2.1970+ 0.0006 ps .
4.5.3 Determination of Count Rales and Their Errors
Example 4.3 Consider the following series of measuremenrs ofrom a detector viewing a 22Na source,
2201 2145 )r) ' ,
What is the decay rate and its uncertainty?
Since radioactive decay is described by a Poisson distributicfor this distribution to find
fr=i=2205.6 and
o(ir) =
The count rate is thus
Count Rate = (2206x.21) counts/min.
It is interesting to see what would happen if instead of cotriods we had counted the total 5 minutes without stopping.served a total of 11028 counts. This constitutes a sample of 4for 5 minutes is thus 11 208 and the error on this, o = l.counts per minute, we divide by 5 (see the next section) toidentical to what was found before. Note that the error takcncount rate in 5 minutes. A common error to be avoided is tominute and then take the square root of this number.
4.5.4 Null Experiments. Setting Confidence Limis \l 'her
Many experiments in physics test the validity of certain theosearching for the presence of specific reactions or decal's Isuch measurements, an observation is made for a cenain anif one or more events are observed. the theoretical lau isevents are observed. the converse cannot bc said to bc truc
23m21ffi
lE=---- ' - =215
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Examples
error propagation (e.g. polarization measurements)
! =R ! L
R + L
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Mean, Median, Mode
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Method of Least SquaresQuality of Fit
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
For ±1σ,
1/3 of data should be outside fit
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Accuracy and Precision
a) precise but inaccurate datab) accurate but imprecise data
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
2-4 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
2-5 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
2-6 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
Figure 1: Experimental model-independent residual rate of the single-hit scintillationevents, measured by DAMA/LIBRA,1,2,3,4,5,6 in the (2 – 4), (2 – 5) and (2 – 6)keV energy intervals as a function of the time. The zero of the time scale is January1st of the first year of data taking of the former DAMA/NaI experiment [15]. Theexperimental points present the errors as vertical bars and the associated time binwidth as horizontal bars. The superimposed curves are the cosinusoidal functionsbehaviors A cos!(t ! t0) with a period T = 2!
" = 1 yr, with a phase t0 = 152.5 day(June 2nd) and with modulation amplitudes, A, equal to the central values obtainedby best fit over the whole data including also the exposure previously collected bythe former DAMA/NaI experiment: cumulative exposure is 1.17 ton " yr (see alsoref. [15] and refs. therein). The dashed vertical lines correspond to the maximumexpected for the DM signal (June 2nd), while the dotted vertical lines correspond tothe minimum. See text.
5
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Data with Error Bars
2-4 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
2-5 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
2-6 keV
Time (day)
Res
idua
ls (c
pd/k
g/ke
V)
DAMA/LIBRA ! 250 kg (0.87 ton"yr)
Figure 1: Experimental model-independent residual rate of the single-hit scintillationevents, measured by DAMA/LIBRA,1,2,3,4,5,6 in the (2 – 4), (2 – 5) and (2 – 6)keV energy intervals as a function of the time. The zero of the time scale is January1st of the first year of data taking of the former DAMA/NaI experiment [15]. Theexperimental points present the errors as vertical bars and the associated time binwidth as horizontal bars. The superimposed curves are the cosinusoidal functionsbehaviors A cos!(t ! t0) with a period T = 2!
" = 1 yr, with a phase t0 = 152.5 day(June 2nd) and with modulation amplitudes, A, equal to the central values obtainedby best fit over the whole data including also the exposure previously collected bythe former DAMA/NaI experiment: cumulative exposure is 1.17 ton " yr (see alsoref. [15] and refs. therein). The dashed vertical lines correspond to the maximumexpected for the DM signal (June 2nd), while the dotted vertical lines correspond tothe minimum. See text.
5
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009
Probability and StatisticsMeasurement is a random process described by a
probability distribution
how confident are we in our measurement?
best estimate
standard deviation
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Probability and Statistics
Gaussian distribution
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
One-parameter Confidence Level
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Multiparameter Confidence Levels
hold some parameters fixed, vary only subset
allow all parameters to vary
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
rate orflux or# of events
x confidenceinterval (CL=68.3%)
confidenceinterval (CL=99%)
Confidence Intervals: Measurements and Limits
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Issue of Coverage
• Correct coverage
• Confidence intervals overcover (i.e. are too conservative)
• Reduced power to reject wrong hypotheses
• Confidence intervals undercover
• Measurement pretends to be more accurate than it actually is
Proper coverage can be tested by Monte Carlo simulations
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Flip-Flopping
• Flip-flopping between measurements and upper limits with different confidence levels spoils the coverage of the stated confidence intervals
• Easy to show with a toy Monte Carlo
„We will state a measurement with a 1σ error (i.e. CL=68.3%) if the measurement result is above mσ, and an 99% CL upper limit otherwise.“
The flip-flopping attitude (example):
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Classical Confidence Intervals
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Bayesian Interval
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Example
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
Feldman & Cousins Approach
• Provides confidence intervals that change smoothly from upper limits to measurements
• „User“ just needs to decide for a confidence level
• Flip-flopping problem is solved
• Uses Neyman‘s construction and a Likelihood Ratio to decide what values are included into confidence intervals
Karsten Heeger, Univ. of Wisconsin Physics 736, Spring 2010
• (Frequentist) Definition of the confidence interval for the measurement of a quantity x:• If the experiment were repeated and in each attempt a
confidence interval is calculated, then a fraction α of the confidence intervals will contain the true value of x (called µ). A fraction 1-α of the confidence intervals will not contain µ .
• Note: Experiments must not be identical
Karsten Heeger, Univ. of Wisconsin NUSS, July 13, 2009