opportunities and challenges for better than worstcase design todd austin (presenter) valeria...

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Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan [email protected]

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Page 1: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Opportunities and Challengesfor Better Than Worst Case DesignOpportunities and Challengesfor Better Than Worst Case Design

Todd Austin (presenter)

Valeria Bertacco

David Blaauw

Trevor Mudge

University of Michigan

[email protected]

Page 2: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Design-TimeVerification

andOptimization

Traditional Worst-Case DesignTraditional Worst-Case Design

L H

Time-to-Market

L H

Performance

Page 3: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Run-TimeVerification

TypicalCase

Optimization

Better Than Worst-Case DesignBetter Than Worst-Case Design

L H

Time-to-Market

L H

Performance

L H

Performance

L H

Time-to-Market

Online

Checker

Hardware

Page 4: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Addressing Challengesin the Nanometer RegimeAddressing Challengesin the Nanometer Regime

Design complexity Billions and billions of transistors lead to

untenable designs…

Soft errors upsets in logic and memory Cosmic rays, alpha particles, neutrons, etc…

Uncertainty in design parameters Process and temperature variation, supply

noise…

Power/performance demands Bounding performance, area, and battery life

Page 5: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Example BTWC Design:DIVA CheckerExample BTWC Design:DIVA Checker

All core function is validated by checker Simple checker detects and corrects faulty results, restarts core

Checker relaxes burden of correctness on core processor Tolerates design errors, electrical faults, defects, and failures Core has burden of accurate prediction, as checker is 15x slower

Core does heavy lifting, removes hazards that slow checker

speculativeinstructions

in-orderwith PC, inst,inputs, addr

IF ID REN REG

EX/MEM

SCHEDULER CHK CT

Performance Correctness

Core CheckerOnline

Checker

Hardware

Page 6: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Another BTWC Design:Razor LogicAnother BTWC Design:Razor Logic

Mai

n FF

Sha

dow

Latc

h

Mai

n FF

clk clk

clk_del

5

49 MEM39

9

Double-sampling metastability tolerant latches detect timing errors Second sample is correct-by-design

Microarchitectural support restores state Timing errors treated like branch mispredictions

Online

Checker

Hardware

Page 7: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

recover

IFRa

zor F

F ID

Razo

r FF EX

Razo

r FF MEM

(read-only)WB

(reg/mem)

error bubble

recover recover

Razo

r FF

Stab

ilizer

FF

PC

recover

flushID

bubbleerror bubble

flushID

error bubble

flushIDFlushControl

flushID

error

Cycle: 0

inst1inst2inst3inst4inst5

123456

inst6

Distributed Pipeline Recovery

inst2inst7inst8

789

inst3inst4

Builds on existing branch prediction framework

Multiple cycle penalty for timing failure

Scalable design as all communication is local

Page 8: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Opportunities for CADOpportunities for CAD

Key observation:

Infrequent faults in the core design are tolerable.Infrequent faults in the core design are tolerable.

Opportunities: Focus only on the critical components, no need to verify

ad infinitum Optimize performance/power for the most common

scenarios (typical-case optimization)

Page 9: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Razor Opportunity:Typical-Case Energy ReductionRazor Opportunity:Typical-Case Energy Reduction

Eref

VoltageControl

Function

.

.

.Pipeline

reset

Vdd

Ediff = Eref - Esample

-

EsampleVoltageRegulator

Ediff

errorsignals

Energy reduction can be realized with a simple proportional control functionControl algorithm implemented in software

Page 10: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Energy/Performance CharacteristicsEnergy/Performance Characteristics

Decreasing Supply Voltage

Energy

Energy of ProcessorOperations, Eproc

Energy ofPipeline

Recovery,Erecovery

Total Energy,Etotal = Eproc + Erecovery

Optimal Etotal

PipelineThroughput

IPC

Energy of Processorw/o Razor Support

50%

1%

Page 11: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Razor Opportunity:Typical-Case Optimized AdderRazor Opportunity:Typical-Case Optimized Adder

Kogge-Stone Adder

G0

P0

G1

P1

G2

P2

G3

P3

G4

P4

G5

P5

G6

P6

G7

P7

G8

P8

G9

P9

G10

P10

G11

P11

G12

P12

G13

P13

G14

P14

G15

P15 Cin

Page 12: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Carry Propagations for Random DataCarry Propagations for Random Data

08162432

4048

56

016

32

48

64

0

0.01

pro

bab

ility

Bit Position Carry Distance

Pro

babi

lity

Page 13: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Carry Propagations for Typical DataCarry Propagations for Typical Data

08162432

4048

56

016

32

48

64

0

0.16

pro

bab

ility

Carry DistanceBit Position

Pro

babi

lity

Page 14: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Typical Case Optimized AdderTypical Case Optimized Adder

G0

P0

G1

P1

G2

P2

G3

P3

G4

P4

G5

P5

G6

P6

G7

P7

G8

P8

G9

P9

G10

P10

G11

P11

G12

P12

G13

P13

G14

P14

G15

P15 Cin

ripple carry circuit

carry-lookahead circuit

Page 15: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Benefits of Typical Case OptimizationBenefits of Typical Case Optimization

Adder

Topology

Latency (in gate delays)

Worst-Case Typical-Case Random

Kogge-Stone 8 5.08 7.09

TCO Adder 128 3.03 3.69

Typical-case performance much better than worst case Especially for typical-case optimized design

Page 16: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Core CAD Requirement:Observability of Circuit-Level CharacteristicsCore CAD Requirement:Observability of Circuit-Level Characteristics

App

ArchConfig

ArchitecturalSimulator

ArchitecturalSimulator

CircuitSimulatorCircuit

Simulator

Output

ArchMetrics

ModuleCircuitModels

TechModels

CircuitMetrics

Inputs,Voltage,

Constraints

Delay,Power,Switching

IF ID EX MEM WBSpeedand

Scope

Fidelityand

Observability

Circuit-Aware Architectural Simulator efficiently melds circuit simulation with architectural simulation

Page 17: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

Additional CAD OpportunitiesAdditional CAD Opportunities

For synthesis: Typical-case library characterization (e.g., pdf of delay) Synthesize design for target performance, power, etc… TCO-style optimizations possible for macro-modules

For verification: Full formal verification for checker components Profile-directed simulation-based verification for core

For testing: Checker component can facilitate software-based

manufacturing test of core components

Page 18: Opportunities and Challenges for Better Than WorstCase Design Todd Austin (presenter) Valeria Bertacco David Blaauw Trevor Mudge University of Michigan

ConclusionsConclusions

Better than worst-case design abandons traditional worst-case design constraints

Couples complex designs with checkers

Enables CAD opportunities for typical-case optimization

Requires tool support for observability, synthesis and verification

For more information:

http://www.eecs.umich.edu/razor

First tutorial at DATE, Munich, March 2005