n5394a dvi application compliance testing methods of

Agilent N5394A DVI Electrical Performance Validation and Compliance Software

Compliance Testing Methods of Implementation

Agilent Technologies

Notices© Agilent Technologies, Inc. 2004

No part of this manual may be reproduced in any form or by any means (including electronic storage and retrieval or transla-tion into a foreign language) without prior agreement and written consent from Agi-lent Technologies, Inc. as governed by United States and international copyright laws.

Manual Part Number

N5394-97001

Edition

Second edition, October 2004

Printed in USA

Agilent Technologies, Inc.1900 Garden of the Gods Road Colorado Springs, CO 80907 USA

Warranty

The material contained in this docu-ment is provided “as is,” and is sub-ject to being changed, without notice, in future editions. Further, to the max-imum extent permitted by applicable law, Agilent disclaims all warran-ties, either express or implied, with regard to this manual and any infor-mation contained herein, including but not limited to the implied warran-ties of merchantability and fitness for a particular purpose. Agilent shall not be liable for errors or for incidental or consequential damages in connection with the furnishing, use, or perfor-mance of this document or of any information contained herein. Should Agilent and the user have a separate written agreement with warranty terms covering the material in this document that conflict with these terms, the warranty terms in the sep-arate agreement shall control.

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The hardware and/or software described in this document are furnished under a license and may be used or copied only in accordance with the terms of such license.

Restricted Rights Legend

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Safety Notices

CAUTION

A CAUTION notice denotes a haz-ard. It calls attention to an operat-ing procedure, practice, or the like that, if not correctly performed or adhered to, could result in damage to the product or loss of important data. Do not proceed beyond a CAUTION notice until the indicated conditions are fully understood and met.

WARNING

A WARNING notice denotes a hazard. It calls attention to an operating procedure, practice, or the like that, if not correctly per-formed or adhered to, could result in personal injury or death. Do not proceed beyond a WARNING notice until the indicated condi-tions are fully understood and met.

DVI Automated Testing—At A Glance

DVI Compliance Testi

The Agilent N5394A DVI Electrical Performance Validation and Compliance Software helps you verify DVI transmitter device under test (DUT) compliance to specifications with the Agilent 54854A/54855A Infiniium 20GS/s digital storage oscilloscope. The DVI Electrical Performance Validation and Compliance Software:

• Lets you select individual or multiple tests to run.

• Lets you identify the device being tested and its configuration.

• Shows you how to make oscilloscope connections to the device under test.

• Automatically checks for proper oscilloscope configuration.

• Automatically sets up the oscilloscope for each test.

• Provides detailed information for each test that has been run and lets you specify the thresholds at which marginal or critical warnings appear.

• Creates a printable HTML report of the tests that have been run.

NOTE The tests performed by the DVI Electrical Performance Validation and Compliance Software are intended to provide a quick check of the electrical health of the DUT. This testing is not a replacement for an exhaustive test validation plan.
Compliance testing measurements are described in Section 4.7, Electrical Measurement Procedures, in the DVI Specification Revision 1.0. For more information, see the DDWG (Digital Display Working Group) web site at www.ddwg.org.
Required Equipment and Software

In order to run the DVI automated tests, you need the following equipment and software:

• 54854A/54855A Infiniium 4/6 GHz, 20GS/s Digital Storage Oscilloscope. Option 001 (1M/ch memory upgrade) is recommended; this will greatly reduce Data Eye Pattern and Jitter test times.

• N5394A DVI Electrical Performance Validation and Compliance Software.

• Probes and/or test fixtures. For more information on the specific probes and test fixtures required, refer to the chapters that describe tests.

• Keyboard, qty = 1, (provided with the Agilent 54854A/54855A oscilloscope).

• Mouse, qty = 1, (provided with the Agilent 54854A/54855A oscilloscope).

• Precision 3.5 mm BNC to SMA male adapter, Agilent p/n 54855-67604, qty = 2 (provided with the Agilent 54854A/54855A oscilloscope).

• 50-ohm Coax Cable with SMA Male Connectors – 24-inch or less RG-316/U or similar, qty = 2, matched length.

ng Methods of Implementation 3

http://www.ddwg.org

In This Book

4

This manual describes the tests that are performed by the DVI Electrical Performance Validation and Compliance Software in more detail; it contains information from (and refers to) the DVI Specification Revision 1.0, and it describes how the tests are performed.

• Chapter 1, “Installing the DVI Electrical Performance Validation and Compliance Software” shows how to install and license the automated test application software (if it was purchased separately).

• Chapter 2, “Preparing to Take Measurements” shows how to start the DVI Electrical Performance Validation and Compliance Software and gives a brief overview of how it is used.

• Chapter 3, “Transmitter Data Eye Pattern Tests” contains more information on the data eye pattern tests.

• Chapter 4, “Transmitter Jitter Tests” contains more information on the clock jitter test.

• Chapter 5, “Transmitter Transition Time Tests” contains more information on the risetime/falltime tests.

• Chapter 6, “Transmitter Inter-Pair Skew Tests” contains more information on the inter-pair skew tests.

• Chapter 7, “Cable Assembly Tests” contains more information on testing cable assemblies.

• Appendix A, “Calibrating the 54854A/54855A Digital Storage Oscilloscope” describes how to calibrate the oscilloscope in preparation for running the DVI automated tests.

• Appendix B, “INF_SMA_Deskew.set Setup File Details” describes a setup used when performing channel de-skew calibration.

• Appendix C, “InfiniiMax Probing” describes the 1132A/1134A probe amplifier and probe head recommendations for DVI testing.

See Also

• The DVI Electrical Performance Validation and Compliance Software’s online help, which describes:

• Creating or opening a test project.

• Selecting tests.

• Configuring selected tests.

• Connecting the oscilloscope to the DUT.

• Running tests.

• Viewing test results.

• Viewing/printing the HTML test report.

• Saving test projects.

DVI Compliance Testing Methods of Implementation

Contents


DVI Automated Testing—At A Glance 3

Required Equipment and Software 3

In This Book 4

See Also 4

1 Installing the DVI Electrical Performance Validation and Compliance Software

Installing the Software 7

Installing the License Key 7

2 Preparing to Take Measurements

Acquiring Test Fixtures 10

Soldering Damping Resistors into Test Fixtures 13

Calibrating the Oscilloscope 14

Starting the DVI Electrical Performance Validation and Compliance Software 15

Online Help Topics 16

3 Transmitter Data Eye Pattern Tests

Probing for Data Eye Pattern Tests 18

D0/D1/D2 - Eye Pattern Test Method of Implementation 20

Test Definition Notes from the Specification 20Test Procedure 20PASS Condition 22Measurement Algorithm 22Test References 22

4 Transmitter Jitter Tests

Probing for Jitter Tests 24

Clock - Jitter Test Method of Implementation 26



5 Transmitter Transition Time Tests

6

Probing for Transition Time Tests 30

Transition Time Test Method of Implementation 32


6 Transmitter Inter-Pair Skew Tests

Probing for InterPairSkew Tests 36

D0/D1, D0/D2, D1/D2 - Skew Test Method of Implementation 38


7 Cable Assembly Tests

Probing for Cable Assembly Eye Pattern Tests 42



A Calibrating the 54854A/54855A Digital Storage Oscilloscope

Required Equipment for Calibration 47

Internal Calibration 48

Cable and Probe Calibration 54

Channel-to-Channel De-skew 63

B INF_SMA_Deskew.set Setup File Details

C InfiniiMax Probing

Index


N5394A DVI Electrical Performance Validation and Compliance SoftwareCompliance Testing Methods of Implementation

1Installing the DVI Electrical Performance Validation and Compliance Software

Installing the Software 7

Installing the License Key 7

If you purchased the N5394A DVI Electrical Performance Validation and Compliance Software separately, you need to install the software and license key.

Installing the Software
1 Make sure you have version A.03.50 or higher of the Infiniium oscilloscope software by choosing Help>About Infiniium... from the main menu.
2 Insert the DVI Electrical Performance Validation and Compliance Software CD, and follow the instructions.

Be sure to accept the installation of the .NET Framework software; it is required in order to run the DVI Electrical Performance Validation and Compliance Software.

Installing the License Key

1 Request a license code from Agilent by following the instructions on the Entitlement Certificate.

You will need the oscillocope’s “Option ID Number”, which you can find in the Help>About Infiniium... dialog.

2 After you receive your license code from Agilent, choose Utilities>Install Option License....

3 In the Install Option License dialog, enter your license code and click Install License.

4 Click OK in the dialog that tells you to restart the Infiniium oscilloscope application software to complete the license installation.

7Agilent Technologies

8

1 Installing the DVI Electrical Performance Validation and Compliance Software

5 Click Close to close the Install Option License dialog.

6 Choose File>Exit.

7 Restart the Infiniium oscilloscope application software to complete the license installation.



2Preparing to Take Measurements

Acquiring Test Fixtures 10

Calibrating the Oscilloscope 14

Starting the DVI Electrical Performance Validation and Compliance Software 15

Before running the DVI automated tests, you need to acquire the appropriate test fixtures, and you should calibrate the oscilloscope. After the oscilloscope has been calibrated, you are ready to start the DVI Electrical Performance Validation and Compliance Software and perform measurements.



Acquiring Test Fixtures

10

DVI test fixtures can be acquired from a distributor of Silicon Image parts or from the DDWG (Digital Display Working Group) (see the web site at www.ddwg.org).

Currently available test fixtures, called “TPA2” fixtures in this document, include a CRU (Clock Recovery Unit) board and TPA2-P (plug) and TPA2-R (receptacle) adapter boards.

Figure 1 TPA2-P (Plug) Adapter Board

Figure 2 TPA2-R (Receptacle) Adapter Board (Top and Bottom Views)


http://www.ddwg.org

Preparing to Take Measurements 2


Figure 3 CRU (Clock Recovery Unit) Board (for TPA2 Fixtures)

NOTE The CRU board must be configured according to the clock frequency in use.


12


Earlier DVI plug and receptacle test fixtures from Silicon Image, called “TPA” fixtures in this document, had the CRU (Clock Recovery Unit) built-in.

Figure 4 TPA-P (Plug) Test Point Access Board

Figure 5 TPA-R (Receptacle) Test Point Access Board



Soldering Damping Resistors into Test Fixtures


To get the best probed signal fidelity, the E2678A differential socket probe head for the 1132A/1134A InfiniiMax probe amplifier is recommended. This probing solution requires damping resistors to be soldered into test fixture boards at the data channel and raw clock test points. The proper damping resistors (and instructions for soldering them into a device under test) are included with the E2678A differential socket probe head.

Figure 6 Damping Resistors Soldered into TPA2-P and CRU Boards



Calibrating the Oscilloscope

14

If you haven’t already calibrated the oscilloscope, see Appendix A, “Calibrating the 54854A/54855A Digital Storage Oscilloscope”.

NOTE If the ambient temperature changes more than 5 degrees Celsius from the calibration temperature, internal calibration should be performed again. The delta between the calibration temperature and the present operating temperature is shown in the Utilities>Calibration menu.

NOTE If you switch cables between channels or other oscilloscopes, it is necessary to perform cable and probe calibration again. Agilent recommends that, once calibration is performed, you label the cables with the channel they were calibrated for.



Starting the DVI Electrical Performance Validation and Compliance Software


1 From the Infiniium oscilloscope’s main menu, choose Analyze>Automated Test Apps>DVI.

Figure 7 The DVI Electrical Performance Validation and Compliance Software

NOTE If DVI does not appear in the Automated Test Apps menu, the DVI Electrical Performance Validation and Compliance Software has not been installed (see Chapter 1, “Installing the DVI Electrical Performance Validation and Compliance Software”).

Figure 7 shows the DVI Electrical Performance Validation and Compliance Software main window. The task flow pane, and the tabs in the main pane, show the steps you take in running the automated tests:


16


Select Tests Lets you select the tests you want to run. The tests are organized hierarchically so you can select all tests in a group. After tests are run, status indicators show which tests have passed, failed, or not been run, and there are indicators for the test groups.

Configure Lets you enter information about the device being tested and configure test parameters (like memory depth). This information appears in the HTML report.

Connect Shows you how to connect the oscilloscope to the device under test for the tests to be run.

Run Tests Starts the automated tests. If the connections to the device under test need to be changed while multiple tests are running, the tests pause, show you how to change the connection, and wait for you to confirm that the connections have been changed before continuing.

Results Contains more detailed information about the tests that have been run. You can change the thresholds at which marginal or critical warnings appear.

HTML Report Shows a compliance test report that can be printed. You can choose between a verbose and compact report.

Online Help Topics

For information on using the DVI Electrical Performance Validation and Compliance Software, see its online help (which you can access by choosing Help>Contents... from the application’s main menu).

The DVI Electrical Performance Validation and Compliance Software’s online help describes:

• Creating or opening a test project.

• Selecting tests.

• Configuring selected tests.

• Connecting the oscilloscope to the DUT.

• Running tests.

• Viewing test results.

• To show reference images and flash mask hits.

• To change margin thresholds.

• Viewing/printing the HTML test report.

• Saving test projects.


Agilent Technologies 17


3Transmitter Data Eye Pattern Tests

Probing for Data Eye Pattern Tests 18


This section provides the Methods of Implementation (MOIs) for data eye pattern tests using an Agilent 54854A/54855A Infiniium oscilloscope, 1132A/1134A probes, and the DVI Electrical Performance Validation and Compliance Software.

NOTE Agilent 54854A/54855A Option 001 (1M/ch memory upgrade) is recommended; this will greatly reduce Data Eye Pattern test times.

18 DVI Compliance Testing Methods of Implementation


Probing for Data Eye Pattern Tests

When performing data eye pattern tests, the DVI Electrical Performance Validation and Compliance Software will prompt you to make the proper connections (also shown in Figure 8 or Figure 9).

Figure 8 Probing for Data Eye Pattern Tests (TPA2 Fixture)

Figure 9 Probing for Data Eye Pattern Tests (TPA Fixture)

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier

E2678A DifferentialSocket Probe Head

Ch4

DV

I Con

nect

orTPA2-P Adapter Board CRU Board

SMA to SMACables

+

-

+

-

SMA to BNCCable

Raw Clock

D0/D1/D2Test Point

RecoveredClock

+ -

54854A/54855A OscilloscopeDamping Resistors

DVISource(DUT)

Ch2 Ch3

1132A/1134AProbe Amplifier


Ch4

DV

I Con

nect

or

TPA-P Test Access Board

SMA to BNCCable

D0/D1/D2Test Point

RecoveredClock

+

-

54854A/54855A Oscilloscope

Damping Resistors

Transmitter Data Eye Pattern Tests 3

DVI Compliance Testing Methods of Implementation 19

You can use any of the oscilloscope channels for the recovered clock and data test point. You identify the channels used for each signal in the Configuration tab of the DVI Electrical Performance Validation and Compliance Software. (The channels shown in Figure 8 and Figure 9 are just for example.)

For more information on the 1132A/1134A probe amplifiers and differential probe heads, see Appendix C, “InfiniiMax Probing,” starting on page 71.



D0/D1/D2 - Eye Pattern Test Method of Implementation

Data eye pattern measurements are made as a differential measurements using the recovered clock signal as the oscilloscope trigger source. The transmitter drives the pseudo-random data test pattern and the test ensures that the eye diagram limits given by the DVI spec are not exceeded.

Test Definition Notes from the Specification

See section 4.7.6, Transmitter Eye, in the DVI Specification Revision 1.0.

Test Procedure

1 Attach a DVI monitor to the DVI source (DUT).

2 Select a resolution for test, and display the pseudo random pattern in full screen mode.

3 Unplug the monitor, and connect the TPA2 plug adapter board directly to the output of the DVI source.

4 Confirm the frequency output of the DVI source by measuring RC+ and RC- on the TPA2 plug board with the oscilloscope.

5 Set the CRU board to operate at the correct frequency.

6 Allow the CRU board to warm up for 5 minutes.

7 Attach the SMA to SMA cables from RC+ and RC- on the TPA2 plug board to the respective SMA connectors on the CRU board.

8 Start the automated testing application as described in “Starting the DVI Electrical Performance Validation and Compliance Software" on page 15.

9 In the DVI Test application, click the Select Tests tab.

10 Navigate to the Data Eye Pattern group, and check the appropriate Eye Pattern test (D0, D1, or D2).

Transmitter Data Eye Pattern Tests 3


11 Follow the DVI Test application’s task flow to set up configuration options, make oscilloscope connections, run the test, and view the test results.

Figure 10 Selecting Data Eye Pattern Tests

Table 1 Data Eye Pattern Test Configuration Options

Configuration Option Description

Device Description Lets you enter information about the device under test, including the device ID and any comments that you wish to include.

Test Fixture Identifies the revision of your test fixture. Agilent recommends test fixture TPA2. The recovered clock from TPA will have 2.5 times the frequency of the raw clock. TPA2 however will have the same frequency for both clocks.

Recovered Clock Identifies the oscilloscope channel probing the recovered clock.

D0/D1/D2 Identifies the oscilloscope channels probing data channel links D0, D1, and D2.

Test Freq[Screen Resolution]

Identifies the frequency of the DVI interface you are testing. You can select one of the frequencies from the drop-down list, or you can enter a frequency in the range from 25 to 165 MHz.

Mask Type Choose “Normalized Eye Pattern Mask at TP2”.

# Unit Interval Available in Debug Mode, this option specifies the number of UI (Unit Intervals) to measure in the data eye pattern test.The DVI revision 1.0 specification recommends 100,000 acquisitions to achieve 99% confidence within 1% error of the mean value. For full compliance, a measurement of 1,000,000 acquisitions must be made.Note that increasing the number of UI has a negative impact on the run time of the data eye pattern tests.Value used in Compliance Mode: 100,000.



PASS Condition

Zero mask failures.

Measurement Algorithm

1 Trigger on the recovered clock; the data lane is being viewed in color grade form.

2 Repeat step 1 until the # Unit Intervals has been reached.

3 The test passes if none of the waveform sample points falls into the mask failure region.

Test References

Section 4.3, Transmitter Electrical Specifications, in the DVI Specification Revision 1.0.

Manual Mask Adjustment

Specifies whether the manual mask adjustment is needed prior to the mask test.

Composite Eye Available in Debug Mode, this option specifies whether all data bits in a pixel need to be overlapped in the eye diagram.Value used in Compliance Mode: Off.

Worst Eye Location Available in Debug Mode, this option specifies the location of the worst eye in respect to the rising edge of the recovered clock. This parameter will be ignored if Composite Eye is turned ON. Choose auto to let the application automatically find the worst eye. The worst eye is defined as the bit having the smallest pulse width. Select only 1-4 for the TPA test fixture.Value used in Compliance Mode: Auto.

Table 1 Data Eye Pattern Test Configuration Options (continued)




4Transmitter Jitter Tests

Probing for Jitter Tests 24

Clock - Jitter Test Method of Implementation 26

This section provides the Methods of Implementation (MOIs) for jitter tests using an Agilent 54854A/54855A Infiniium oscilloscope, probes, and the DVI Electrical Performance Validation and Compliance Software.

NOTE Agilent 54854A/54855A Option 001 (1M/ch memory upgrade) is recommended; this will greatly reduce Jitter test times.



Probing for Jitter Tests

When performing the clock jitter test, the DVI Electrical Performance Validation and Compliance Software will prompt you to make the proper connections (also shown in Figure 11 or Figure 12).

Figure 11 Probing for Jitter Tests (TPA2 Fixture)

Figure 12 Probing for Jitter Tests (TPA Fixture)

DVISource(DUT)

Ch2 Ch3



Ch4

DV

I Con

nect

orTPA2-P Adapter Board CRU Board

SMA to SMACables

+

-

+

-

SMA to BNCCable

Raw Clock Test Point

RecoveredClock

+

-


Damping Resistors

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

DV

I Con

nect

or


SMA to BNCCable

Raw ClockTest Point

RecoveredClock

+-


Transmitter Jitter Tests 4


You can use any of the oscilloscope channels for the recovered clock and raw clock test point. You identify the channels used for each signal in the Configuration tab of the DVI Electrical Performance Validation and Compliance Software. (The channels shown in Figure 11 and Figure 12 are just for example.)



Clock - Jitter Test Method of Implementation

The jitter measurement in the raw clock is performed as a differential measurement of the rising edge of the clock signal (clk+ minus clk-). The clock signal from the clock recovery unit must be used as a trigger source.


See section 4.7.7, Jitter Measurement, in the DVI Specification Revision 1.0.

Test Procedure



3 Navigate to the Jitter group, and check the “Clock - Jitter” test.


Figure 13 Selecting Jitter Tests

Table 2 Clock Jitter Test Configuration Options



Test Fixture Identifies the revision of your test fixture. Agilent recommends test fixture TPA2.


Transmitter Jitter Tests 4


PASS Condition

≤ 0.25 Tbit

The bit time Tbit is one tenth of the pixel time. The bit time is also referred to as one Unit Interval, or UI, in the jitter and eye diagram specification.


1 Trigger on the recovered clock; the raw clock signal is being viewed in color grade form.

2 Repeat step 1 until "Number of edges" has been acquired.

3 Jitter is the width the of signal at 50% crossing. (Measure using histogram.)

Test References

Section 4.6, Jitter Specifications, in the DVI Specification Revision 1.0.

Raw Clock Identifies the oscilloscope channel probing the raw clock.



Number of edges (Jitter) Specifies the number of differential clock signal acquisitions to use when performing the jitter measurement.

Table 2 Clock Jitter Test Configuration Options (continued)




5Transmitter Transition Time Tests

Probing for Transition Time Tests 30

Transition Time Test Method of Implementation 32



Probing for Transition Time Tests

When performing transition time tests, the DVI Electrical Performance Validation and Compliance Software will prompt you to make the proper connections (also shown in the figures that follow).

Figure 14 Probing Data Channels for Transition Time Tests (TPA2 Fixture)

Figure 15 Probing Raw Clock for Transition Time Tests (TPA2 Fixture)

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

DV

I Con

nect

orTPA2-P Adapter Board

D0/D1/D2Test Point

+ -


DVISource(DUT)

Ch2 Ch3



Ch4

DV

I Con

nect

or

TPA2-P Adapter Board CRU Board

SMA to SMACables

+

-

+

-

Raw Clock Test Point+

-


Damping Resistors

Transmitter Transition Time Tests 5


You can use any of the oscilloscope channels for the data and raw clock test points. You identify the channels used for each signal in the Configuration tab of the DVI Electrical Performance Validation and Compliance Software. (The channels shown in the preceding figures are just for example.)

Figure 16 Probing Data Channels for Transition Time Tests (TPA Fixture)

Figure 17 Probing Raw Clock for Transition Time Tests (TPA Fixture)

DVISource(DUT)

Ch2 Ch3



Ch4

DV

I Con

nect

or


D0/D1/D2Test Point

+

-


Damping Resistors

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

DV

I Con

nect

or


Raw ClockTest Point

+-




Transition Time Test Method of Implementation

Risetime/falltime is a differential measurement across the outputs of a differential pair.

The transition is defined as the time interval between the normalized 20% and 80% amplitude levels.


See section 4.7.4, Transmitter Rise/Fall Time, in the DVI Specification Revision 1.0.

Test Procedure



3 Navigate to the Transition Time group and the Clock or Data group, and check the appropriate risetime/falltime test.


Figure 18 Selecting Transition Time Tests

Table 3 Transition Time Test Configuration Options



Transmitter Transition Time Tests 5


PASS Condition

75 ps ≤ Risetime/Falltime ≤ 0.4 Tbit

The bit time Tbit is one tenth of the pixel time. The bit time is also referred to as one Unit Interval, or UI, in the jitter and eye diagram specification.


The oscilloscope is set up to look for a waveform with 7 bits of 0 followed by 7 bits of 1 inside the pseudo-random pattern (using advanced comm triggering). When this waveform is found, it is used to determine Vtop (100%) and Vbase (0%) for the rise/fall time measurements.

All subsequent risetime/falltime measurements are performed using simple edge triggering only.

Test References



Raw Clock Identifies the oscilloscope channel probing the raw clock.




Number of edges (Transition Time)

Specifies the number of acquisitions to use when performing the rise/fall time measurements.

Table 3 Transition Time Test Configuration Options (continued)




6Transmitter Inter-Pair Skew Tests

Probing for InterPairSkew Tests 36

D0/D1, D0/D2, D1/D2 - Skew Test Method of Implementation 38



Probing for InterPairSkew Tests

When performing inter-pair skew tests, the DVI Electrical Performance Validation and Compliance Software will prompt you to make the proper connections (also shown in Figure 19 or Figure 20).

NOTE Be sure to match the polarity of the differential probe to the polarity of the probed signals; otherwise, the tests will not run correctly.

Figure 19 Probing for Inter-Pair Skew Tests (TPA2 Fixture)

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

DV

I Con

nect

or

TPA2-P Adapter Board

DataChannel

Test Points+ -


+

-



Transmitter Inter-Pair Skew Tests 6


You can use any of the oscilloscope channels for the data test points. You identify the channels used for each signal in the Configuration tab of the DVI Electrical Performance Validation and Compliance Software. (The channels shown in Figure 19 and Figure 20 are just for example.)

Figure 20 Probing for Inter-Pair Skew Tests (TPA Fixture)

DVISource(DUT)

Ch2 Ch3



Ch4

DV

I Con

nect

or


DataChannel

Test Points +

-


Damping Resistors

+

-



D0/D1, D0/D2, D1/D2 - Skew Test Method of Implementation

The transmitter skew is the time difference between the two differential signals measured at the normalized 50% crossover point. The trigger source can be either one of the differential signals.

Channel-to-channel de-skew must be performed on the two oscilloscope channels used for this measurement (see “Channel-to-Channel De-skew" on page 63).


See section 4.7.5, Transmitter Skew Measurement, in the DVI Specification Revision 1.0.

Test Procedure



3 Navigate to the InterPairSkew group, and check the appropriate skew test.


Figure 21 Selecting InterPairSkew Tests

Transmitter Inter-Pair Skew Tests 6


PASS Condition

≤ 0.20 Tpixel

The pixel time Tpixel is the time period of the raw clock.


1 Trigger on the rising edge of the lowest data lane number. (D0/D1 use D0, etc.).

2 Measure the time from the first signal's rising edge to the second signal’s rising edge at 50% crossing.

3 Repeat step 2 for the "Number of edges", record the worst value.

4 Repeat steps 1 through 3 for the falling edge.

5 Report the worst rising skew, falling skew, and the worst among both.

Test References


Table 4 InterPairSkew Test Configuration Options







Number of edges (InterPairSkew)

Specifies the number of acquisitions to use when performing the inter-pair skew measurements.



7Cable Assembly Tests

Probing for Cable Assembly Eye Pattern Tests 42


This section provides the Methods of Implementation (MOIs) for data eye pattern tests using an Agilent 54854A/54855A Infiniium oscilloscope, 1132A/1134A probes, and the DVI Electrical Performance Validation and Compliance Software.



Probing for Cable Assembly Eye Pattern Tests

When performing cable assembly eye pattern tests, the DVI Electrical Performance Validation and Compliance Software will prompt you to make the proper connections (also shown in Figure 22 or Figure 23).

Figure 22 Probing for Cable Assembly Eye Pattern Tests (TPA2 Fixture)

Figure 23 Probing for Cable Assembly Eye Pattern Tests (TPA Fixture)

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

DV

I Rec

epta

cle

TPA2-R Adapter Board CRU Board

SMA to SMACables

+

-

+

-

SMA to BNCCable

Raw Clock

D0/D1/D2Test Point

RecoveredClock

+ -


DVI Cable Assembly

DV

I Receptacle

DV

I Plug

DV

I Plug

DVISource(DUT)

Ch2 Ch31132A/1134A

Probe Amplifier


Ch4

TPA-R Test Access Board

SMA to BNCCable

D0/D1/D2Test Point

RecoveredClock

+-


DV

I Rec

epta

cle

DVI Cable Assembly

DV

I Receptacle

DV

I Plug

DV

I Plug

Cable Assembly Tests 7


You can use any of the oscilloscope channels for the recovered clock and data test point. You identify the channels used for each signal in the Configuration tab of the DVI Electrical Performance Validation and Compliance Software. (The channels shown in Figure 22 and Figure 23 are just for example.)



D0/D1/D2 - Eye Pattern Test Method of Implementation

Data eye pattern measurements are made as differential measurements using the recovered clock signal as the oscilloscope trigger source.


See section 4.7.6, Transmitter Eye, in the DVI Specification Revision 1.0.

Test Procedure

1 Attach a DVI monitor to the DVI source (DUT).

2 Select a resolution for test, and display the pseudo random pattern in full screen mode.

3 Unplug the monitor, and connect the TPA2 plug adapter board directly to the output of the DVI source.

4 Confirm the frequency output of the DVI source by measuring RC+ or RC- on the TPA2 plug board with the oscilloscope.

5 Set the CRU board to operate at the correct frequency.

6 Allow the CRU board to warm up for 5 minutes.

7 Attach the SMA to SMA cables from RC+ and RC- on the TPA2 plug board to the respective SMA connectors on the CRU board.



10 Navigate to the Data Eye Pattern group, and check the appropriate Eye Pattern test (D0, D1, or D2).

Figure 24 Selecting Data Eye Pattern Tests

Cable Assembly Tests 7



PASS Condition

Zero mask failures.

Table 5 Cable Assembly Test Configuration Options



Test Fixture Identifies the revision of your test fixture. Agilent recommends test fixture TPA2. The recovered clock from TPA will have 2.5 times the frequency of the raw clock. TPA2 however will have the same frequency for both clocks.





Mask Type Choose either “Cable Test Low-amplitude Eye Mask” or “Cable Test High-amplitude Eye Mask”.

# Unit Interval Available in Debug Mode, this option specifies the number of UI (Unit Intervals) to measure in the data eye pattern test.The DVI revision 1.0 specification recommends 100,000 acquisitions to achieve 99% confidence within 1% error of the mean value. For full compliance, a measurement of 1,000,000 acquisitions must be made.Note that increasing the number of UI has a negative impact on the run time of the data eye pattern tests.Value used in Compliance Mode: 100,000.

Manual Mask Adjustment

Specifies whether the manual mask adjustment is needed prior to the mask test.

Composite Eye Available in Debug Mode, this option specifies whether all data bits in a pixel need to be overlapped in the eye diagram.Value used in Compliance Mode: Off.

Worst Eye Location Available in Debug Mode, this option specifies the location of the worst eye in respect to the rising edge of the recovered clock. This parameter will be ignored if Composite Eye is turned ON. Choose auto to let the application automatically find the worst eye. The worst eye is defined as the bit having the smallest pulse width. Select only 1-4 for the TPA test fixture.Value used in Compliance Mode: Auto.




1 Trigger on the recovered clock; the data lane is being viewed in color grade form.

2 Repeat step 1 until the # Unit Intervals has been reached.

3 The test passes if none of the waveform sample points falls into the mask failure region.

Test References

Section 4.5, Cable Assembly Specifications, in the DVI Specification Revision 1.0.


ACalibrating the 54854A/54855A Digital Storage Oscilloscope

Required Equipment for Calibration 47

Internal Calibration 48

Cable and Probe Calibration 54

Channel-to-Channel De-skew 63

This appendix describes the Agilent 54854A/54855A digital storage oscilloscope calibration procedures.

Required Equipment for Calibration

To calibrate the 54854A/54855A oscilloscope in preparation for running the DVI automated tests, you need the following equipment:

• Keyboard, qty = 1, (provided with the Agilent 54854A/54855A oscilloscope).

• Mouse, qty = 1, (provided with the Agilent 54854A/54855A oscilloscope).

• Precision 3.5 mm BNC to SMA male adapter, Agilent p/n 54855-67604, qty = 2 (provided with the Agilent 54854A/54855A oscilloscope).

• Calibration cable (provided with the Agilent 54854A/54855A oscilloscope).

• BNC shorting cap (provided with the Agilent 54854A/54855A oscilloscope).

Figure 25 below shows a drawing of the above connector items.

Figure 25 Accessories Provided with the Agilent 54854A/54855A Oscilloscope


48


• 50-ohm Coax Cable with SMA Male Connectors – 24-inch or less RG316/U or similar, qty = 2, matched length.

• SMA T-adapter.

• BNC to SMA male adapter, qty = 1.

Figure 26 below shows an example of the above mentioned cables and connectors needed.

Figure 26 Additional Cables and Adapters

Internal Calibration

This will perform an internal diagnostic and calibration cycle for the oscilloscope. For the Agilent oscilloscope, this is referred to as Calibration. This Calibration will take about 20 minutes. Perform the following steps:

1 Set up the oscilloscope with the following steps:

a Connect the keyboard, mouse, and power cord to the rear of the oscilloscope.

b If SigTest is being used on the oscilloscope, then connect a second monitor to the VGA connector located near the LAN port, on the rear of the oscilloscope.

c Plug in the power cord.

d Turn on the oscilloscope by pressing the power button located on the lower left of the front panel.

e Allow the oscilloscope to warm up at least 30 minutes prior to starting the calibration procedure in step 3 below.


Calibrating the 54854A/54855A Digital Storage Oscilloscope A


2 Locate and prepare the accessories that will be required for the internal calibration:

a Locate the BNC shorting cap.

b Locate the calibration cable.

c Locate the two Agilent precision SMA/BNC adapters.

d Attach one SMA adapter to one end of the calibration cable - hand tighten snugly.

e Attach the other SMA adapter to the other end of the calibration cable - hand tighten snugly.

3 Referring to Figure 27 below, perform the following steps:

a Click on the Utilities>Calibration menu to open the Calibration window.

4 Referring to Figure 28 below, perform the following steps to start the calibration:

a Uncheck the Cal Memory Protect checkbox.

b Click the Start button to begin the calibration.

Figure 27 Accessing the Calibration Menu.

Click here to open thecalibration window.


50


5 Follow the on-screen instructions:

a You will be prompted to disconnect everything from all the inputs, click the OK button.

b Then, you will be prompted to connect BNC shorting cap to a specified input. Install the BNC shorting cap by pressing it on the specified input BNC, and turning right. Click the OK button after moving the BNC cap to each specified channel.

c Then you will be prompted to connect the calibration cable with SMA adapters between the Aux Out and a specified input, as shown in the example in Figure 29 below. Install the SMA adapter by pressing it on input BNC, and hand tightening the outer ring turning right. Click the OK button after connecting the cable as prompted.

Figure 28 Oscilloscope Calibration Menu.

Uncheck this first

Then click here to start




d Early during the calibration of channel 1, you will be prompted to perform a Time Scale Calibration, as shown in Figure 30 below.

e Click on the Default button to continue the calibration, using the Factory default calibration factors.

f When the calibration procedure is complete, you will be prompted with a Calibration Complete message window. Click the OK button to close this window.

Figure 29 Calibration Cable Connection Example.

Calibration CablePrecision SMA Adapteron Channel 1 Input

Precision SMA Adapteron Aux Out


52



a Confirm that the Vertical and Trigger Calibration Status for all Channels passed.

b Click the Close button to close the calibration window.

c The internal calibration is completed.

d Read NOTE below.

Figure 30 Time Scale Calibration Menu.

Click Default




Figure 31 Calibration Status Screen.

Verify Calibration Passed Close this menu

Delta CalibrationTemperature

NOTE These steps do not need to be performed every time a test is run. However, if the ambient temperature changes more than 5 degrees Celsius from the calibration temperature, this calibration should be performed again. The delta between the calibration temperature and the present operating temperature is shown in the Utilities>Calibration menu.



Cable and Probe Calibration

54

Perform a 50-ohm direct-coupled input calibration for the SMA interface of channel 1 and channel 3. This calibration compensates for gain, offset, and skew errors in cables and probes. Perform the following steps.

1 Referring to the Figure 32 below, perform the following steps:

a Locate and connect one of the Agilent precision SMA adapters to the Channel 1 oscilloscope input.

b Locate and connect the other Agilent precision SMA adapter to the Channel 3 oscilloscope input.

c Locate and connect one end of one of the RG-316 cables to the SMA adapter on Channel 1.

d Locate and connect one end of the other RG-316 cable to the SMA adapter on Channel 3.

e Locate and connect the non-Agilent SMA/BNC adapter to the Aux Out BNC on the oscilloscope.

f Connect the other end of the cable attached to Channel 1 to the SMA adapter on the Aux Out.

Figure 32 Vertical Input Calibration Connections (Cable on Channel 3 not shown).

Channel 1

Channel 3Aux Out





a Click on the Setup>Channel 1 menu to open the Channel Setup window.

b Click the Probes button in the Channel Setup window, to open the Probe Setup window.

Figure 33 Channel Setup Window.

Click Setup Channel 1

Click here for ProbeSetup Menu


56



a Click the Configure Probing System button, and then click on User Defined Probes.

Figure 34 Probe Setup Window.

Click here Then click here





a Click on the Calibrate Probe button to open the Probe Calibration window.


a Select the Calibrated Atten/Offset Radio Button

b Click the Start Atten/Offset Calibration Button to open the Calibration window.

Figure 35 User Defined Probe Window.

Click Here


58


6 Referring to Figure 37 shown below, perform the following steps:

a Ignore the instructions shown in the dialog box.

b Click the OK button on the Calibration window.

c The calibration should complete in about 10 seconds.

Figure 36 Probe Calibration Window.

Figure 37 Calibration Window.

Select Calibrated Atten/Offset

Then Click Here

Click OK





a Click OK to close the Probe Calibration Done window.


a Select the Calibrated Skew Radio button in the Probe Calibration window

b Click the Start Skew Calibration button

9 Referring to Figure 40 shown below, perform the following steps:

a Ignore the instructions shown in the dialog box.

b Click the OK button on the Calibration window.

c The calibration should complete in about 10 seconds.

Figure 38 Probe Calibration Done Window.

Figure 39 Probe Calibration Window.

Click to close this window

Select Calibrated Skew

Then Click Here


60



a Click OK to close the Probe Calibration Done window.



Click OK

Click to close this window





a Click the Close button to close this window.


Click Close


62



a Click on the Channel 3 tab.

13 Referring to Figure 32 on page 54, perform the following steps:

a Disconnect the RG-316 cable connected to the SMA adapter on the Aux Out.

b Connect the other end of the RG-316 cable connected to the SMA adapter on Channel 3, to the SMA adapter on the Aux Out.

14 Repeat steps 3 through 11 of this section to calibrate the cable on Channel 3.

15 Click the Close button on the Probe Setup window (Figure 43) to close this window.

16 Click the Close button on the Channel Setup window (Figure 33 on page 55) to close this window.

17 The Cable and Probe calibration is complete.

18 Read the NOTE below.


Click on Channel 3 Tab



Channel-to-Channel De-skew

NOTE Each cable is now calibrated for the oscilloscope channel it is connected to. Do not switch cables between channels or other oscilloscopes, or it will be necessary to calibrate them again. It is recommended that the cables be labeled with the channel they were calibrated for.


This procedure ensures that the timing skew errors between channel 1 and channel 3 are minimized. Perform the following steps:


a Do not disconnect the RG-316 cables from either the Channel 1 or Channel 3 SMA adapters.

b If not already installed, install the non-Agilent SMA adapter on the oscilloscope Aux Out.

c Disconnect any cable connected to the SMA adapter on the Aux Out.

d Locate and connect the middle branch of the SMA Tee to the SMA adapter on the Aux Out BNC.

e Connect the far end of the cable from the Channel 1 SMA adapter, to one branch of the SMA Tee on the Aux Out.

f Connect the far end of the cable from the Channel 3 SMA adapter, to the other branch of the SMA Tee on the Aux Out.


64



a Select the File>Load>Setup menu to open the Load Setup window.

b Navigate to the directory location that contains the INF_SMA_Deskew.set setup file. If the setup file is not available, it can be created by following the instructions in Appendix B, “INF_SMA_Deskew.set Setup File Details”.

c Select the INF_SMA_Deskew.set setup file by clicking on it.

d Click the Load button to configure the oscilloscope from this setup file.

Figure 44 De-skew Connection.

SMA Tee onAux Out

Channel 1 Channel 3




The oscilloscope display should look similar to Figure 46 below. A falling edge of the square wave is shown in a 200 ps/div horizontal scale. The upper portion of the screen shows channel 1 (yellow trace) and channel 3 (purple trace) superimposed on one another. The lower portion of the screen is the differential signal (green trace) of channel 1 minus channel 3. The top two traces provide for visual inspection of relative time skew between the two channels. The bottom trace provides for visual presentation of unwanted differential mode signal resulted from relative channel skew (and to a much lesser extent from other inevitable channel mismatch parameters like gain and non-linearity). Figure 46 is an example of exaggerated skew between channel 1 and channel 3, measured to be about 50 ps with the cursor.

Figure 45 Load De-skew Setup.

3. Then click hereto load setup file.

1. Click File Load Setup

2. Then find and selectINF_SMA_Deskew.set


66


Figure 47 below shows the desired effect of no skew between the cables. Note that the channel 1 (yellow trace), channel 3 (purple trace) traces overlap, and the differential signal (green trace) is flat. If this is not the case, then perform the following steps to reduce the skew between channels 1 and 3.

Figure 46 Channel Skew.

Skew between Channel 1and Channel 3

Differential signal notflat, indicating mismatchin skew.




3 Referring to Figure 48, perform the following steps to de-skew the channels:

a Click on the Setup>Channel 1 menu to open the Channel Setup window.

b Move the Channel Setup window to the left so you can see the traces.

c Adjust the Skew by clicking on the < or > arrows, to achieve the flattest response on the differential signal (green trace).

d Click the Close button on the Channel Setup window to close it.

e The de-skew operation is complete.

f Disconnect the cables from the Tee on the Aux Out BNC. Leave the cables connected to the Channel 1 and Channel 3 inputs.

g Read the NOTE below.

Figure 47 Skew Minimized.

Channel 1 and 3traces overlap,indicating no skewerror.

Flat differentialsignal, indicating noskew error.


68


Figure 48 De-skewing Procedure.

Click Setup Channel 1 to openthe Channel Setup window.

Then click Close when done.

Then adjust the Skew left or right tomaximize flatness of green trace.

NOTE Each cable is now calibrated for the oscilloscope channel it is connected to. Do not switch cables between channels or other oscilloscopes, or it will be necessary to calibrate them again. It is recommended that the cables be labeled with the channel they were calibrated for.



BINF_SMA_Deskew.set Setup File Details

If the INF_SMA_Deskew.set file is not available, you can create it by following these instructions.

1 Start from a default setup by pressing the Default Setup key on the front panel. Then configure the following settings:

Acquisition Averaging on number of averages 16 Interpolation on

Channel 1 Scale 100.0 mV/ Offset –350mV Coupling DC Impedance 50 Ohms

Channel 3 Turn Channel On; Scale 100.0 mV/ Offset –350m V Coupling DC Impedance 50 Ohms

Time base Scale 200 ps/sec

Trigger Trigger level –173mV Slope falling

Function 2 Turn on and configure for channel 1 subtract channel 3, Vertical scale 50 mV/ Offset 100.000 mV


70

B INF_SMA_Deskew.set Setup File Details



CInfiniiMax Probing

Agilent recommends either the E2678A differential socket probe head.

Figure 49 1134A InfiniiMax Probe Amplifier

Figure 50 Recommended Probe Head for the DVI Testing

Table 6 Probe Head Characteristics

Probe Head Model Number

Differential Measurement(BW, input C, input R)

Single-Ended Measurement(BW, input C, input R)

Differential socket E2678A 7 GHz, 0.34 pF, 50 kOhm 7 GHz, 0.56 pF, 25 kOhm


72

C InfiniiMax Probing


Index

Numerics

50-ohm coax cable with SMA male connectors, 3, 48

B

BNC shorting cap, 47BNC to SMA male adapter, 3, 47, 48

C

cable and probe calibration, 54calibrating the oscilloscope, 47calibration cable, 47channel de-skew, 63configure, 16connect, 16

D

de-skew, channel-to-channel, 63DVI automated testing—at a glance, 3

H

HTML report, 16

I

in this book, 4INF_SMA_Deskew.set setup file, 69internal calibration, 48

J

jitter tests, 23

K

keyboard, 3, 47

L

license key, installing, 7

M

mouse, 47

DVI Compliance Testing Methods of Imp

N

N5394A DVI electrical performance validation and compliance software, 3

P

precision 3.5 mm BNC to SMA male adapter, 3, 47

probe and cable calibration, 54probing the link for data eye pattern tests, 18,

42probing the link for inter-pair skew tests, 36probing the link for jitter tests, 24probing the link for transition time tests, 30

R

report, 16required equipment and software, 3required equipment for calibration, 47results, 16run tests, 16running clock jitter test, 26running data eye pattern tests, 20, 44

S

select tests, 16SMA T-adapter, 48starting the DVI automated test application, 15

T

transition time tests, 29

lementation
73

Index

74
DVI Complia nce Testing Methods of Implementation

Agilent Technologies, Inc. 2004

Printed in USA 10/04Second edition, October 2004

*N5394-97001*N5394-97001

www.agilent.com

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