monitoring organic thin film growth and its water...

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Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry A. Sarkar 1 , A. Kjerstad 1 , T. Hofmann 1 , B. Laderian 1 ,T. Viitala 3 , T. E.Tiwald 2 , J. A. Woollam 2 , and M. Schubert 1 * *[email protected] http://ellipsometry.unl.edu 1 Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, U.S.A. 2 J.A.Woollam Co., Lincoln, NE,USA 3 KSV Instruments Ltd., Helsinki, Finland Special acknowledgement: Mark Solinski Proctor & Gamble, Cincinnati, USA Simultaneous measurement of organic thin fim using Quartz Crystal Microbalance (QCM) and Our message Studying water rich organic thin films How does the water content evolve Ellipsometer is sensitive only to polymer mass l t Water Synperonic (polymer) Spectroscopic Ellipsometry (SE). Synperonic in aqueous phase deposited on octadecane thiol coated gold surface is used as a model system. QCM is measures total mass including water entrapped in the thin organic film whereas SE excludes water in the measurement. The combination of the two instruments allows one to determine the porosity and thereby find the water content. Methods to investigate this phenomena are: • Optical • Mechanical • Combination of optical and •mechanical methods during organic thin film formation in an aqueous environment? Porosity holds the key! Substrate polymer water Quartz Crystal Microbalance is sensitive to total mass (polymer + water) Comparison provides the porosity (f v ) , fraction of polymer in the film Schematic diagram of film on QCM wafer (polymer) SAM Au electrode Quartz (piezoelectric) Description of System Studied Instrumentation Synperonic Liquid cell Quartz Crystal QCM-SE liquid cell Specially designed cell allows for simultaneous measurement of mass uptake by SE and QCM. •QCM and SE readings taken from sample surface. •A self-assembled monolayer (SAM) composed of octadecanethiol was first assembled on to the gold surface. This was done to make the surface hydrophobic. •Synperonic, a well studied polymer, was introduced to form a thin organic film on the SAM. Molecular structure of Synperonic PE/F68 Combined stage for QCM and SE Liquid cell Quartz Crystal Microbalance unit Measurement of Film Thickness and Determining the Porosity QCM and SE Determination of Porosity, f v film on the SAM. 0.9 1.0 6 8 film thickness by QCM, d QCM -5 0 Hz) QCM N Determines d QCM 18 21 24 0.5 0.6 0.7 0.8 porosity, f v SE time (min) 0 2 4 6 film thickness by SE,d SE d SE , d QCM (nm) film thickness by QCM, d QCM void fraction, f v -45 -40 -35 Δf/N (H 3 5 7 9 11 90 93 549.9 nm degrees) SE 135 899.62 nm The formula for porosity (f v ) relates the thickness determined from SE (d SE ) & QCM (d QCM ) and densities of water and polymer respectively. Monitoring the evolution of f v gives an idea of whether the film: 1 forms and swells by imbibing water 5 th Workshop Ellipsometry, Zweibrücken, March 2-4, 2009 Top panel (QCM): Frequency shift normalized by harmonic number. The graphs do not overlap indicating formation of a viscoelastic film. Bottom panel (SE): Δ at selected wavelengths from in-situ scanning ellipsometry (SE) measurements. The graph above displays the variation of thickness of synperonic film over time as calculated from QCM (d QCM ) and SE data (d SE ). Also shown is the evolution of porosity (f v ) over time. In this case, the film entraps water as it is formed. Determines d SE SE time (min) 10 20 30 87 Δ (d 391.96 nm Time (minutes) 132 1. forms and swells by imbibing water . 2.forms from an initial water rich state to a final denser state by releasing water.

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Page 1: Monitoring Organic Thin Film Growth and its Water …ellipsometry.unl.edu/publications/postergallery/pdf...Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz

Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry

A. Sarkar1 , A. Kjerstad1, T. Hofmann1, B. Laderian1,T. Viitala3, T. E.Tiwald2, J. A. Woollam2, and M. Schubert1*

*[email protected] http://ellipsometry.unl.edu

1Department of Electrical Engineering and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, U.S.A.2J.A.Woollam Co., Lincoln, NE,USA 3 KSV Instruments Ltd., Helsinki, Finland

Special acknowledgement: Mark Solinski Proctor & Gamble, Cincinnati, USA

• Simultaneous measurement of organic thin fimusing Quartz Crystal Microbalance (QCM) and

Our message Studying water rich organic thin films

How does the water content evolveEllipsometer is sensitive only to polymer mass

ltWater Synperonic

(polymer)Spectroscopic Ellipsometry (SE).

• Synperonic in aqueous phase deposited onoctadecane thiol coated gold surface is used as amodel system.

• QCM is measures total mass including waterentrapped in the thin organic film whereas SEexcludes water in the measurement. Thecombination of the two instruments allows one todetermine the porosity and thereby find the watercontent.

Methods to investigate this phenomena are:• Optical • Mechanical• Combination of optical and •mechanical methods

during organic thin film formation in an aqueous environment?

Porosity holds the key!

Substrate

y p ypolymerwater

Quartz Crystal Microbalance is sensitiveto total mass (polymer + water)

Comparison provides the porosity (fv) ,fraction of polymer in the film

Schematic diagram of film on QCM wafer

(polymer)

SAM

Auelectrode

Quartz (piezoelectric)

Description of System Studied

Instrumentation Synperonic

Liquid cellQuartz Crystal

g Q

QCM-SE liquid cell• Specially designed cell allows for simultaneous measurement of mass uptake by SE and QCM.•QCM and SE readings taken from sample surface.

•A self-assembled monolayer (SAM) composed of octadecanethiol was first assembled on to the gold surface. This was done to make the surface hydrophobic.

•Synperonic, a well studied polymer, was introduced to form a thin organic film on the SAM.

Molecular structure of Synperonic PE/F68

Combined stage for QCM and SE

Liquid cellQuartz Crystal Microbalance unit

Measurement of Film Thickness and Determining the Porosity

QCM and SE Determination of Porosity, fv

film on the SAM.

0.9

1.0

6

8

film thickness by QCM, dQCM

-50

Hz)

QCM

N

Determines dQCM

18 21 240.5

0.6

0.7

0.8

poro

sity

, fv

SE time (min)

0

2

4

6

film thickness by SE,dSE

dSE

, d

QC

M (n

m)

film thickness by QCM, dQCM

void fraction, fv-45

-40

-35

Δf/N

(H

3579

11

90

93 549.9 nm

degr

ees)

SE 135

899.62 nm

The formula for porosity (fv) relates the thicknessdetermined from SE (dSE) & QCM (dQCM) and

densities of water and polymer respectively. Monitoring the evolution of fv gives an idea of whether the film:

1 forms and swells by imbibing water

5th Workshop Ellipsometry, Zweibrücken, March 2-4, 2009

Top panel (QCM): Frequency shift normalized by harmonic number. The graphs do not overlap indicating formation of a viscoelastic film.

Bottom panel (SE): Δ at selected wavelengths from in-situ scanning ellipsometry (SE) measurements.

The graph above displays the variation of thickness of synperonic film over time as calculated from QCM (dQCM) and SE data (dSE). Also shown is the evolution of porosity (fv) over time. In this case, the film entraps water as it is formed.

Determines dSE

SE time (min)

10 20 3087

Δ (d

391.96 nm

Time (minutes)

1321.forms and swells by imbibing water.2.forms from an initial water rich state to a final

denser state by releasing water.