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Photon Production Laboratory Ltd. MIRRORCLE-CV4 for material science and imaging

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Page 1: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Photon Production Laboratory Ltd.

MIRRORCLE-CV4for material science and imaging

Page 2: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

MIRRORCLE-CV4

1.1m0.65m

1.6m

Specification

• 4 MeV storage ring 35x35cm2

Total weight including MIC: 1.25 tRequired Power : 50 KVAno synchrotron RF cavity

• Injector beam current: 150mArepetition rate: 1kpps

• Average beam power: 120W

• accumulated beam current: about 4A without target

• generate x-rays by target via Bremsstrahlung

•guaranteed photon density for X-rays of 10 keV through 4MeV is 108

photons/[s,mrad2,0.1%BW]

• Brilliance is 1012

Storage ring

Microtron

Klystron

X-ray port

Page 3: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

X-ray generation scheme

Page 4: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Brilliance of CV4

Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV > 6.7nA=4E+12 photons/s/mrad^2/mm^2 at 5k Hz inj. This is equivalent to the X-ray tube of 50kV,20 KW

32.04 mR/pixel6.7nA by PD

Page 5: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Flux

Flux[2π/γ2]

MIRRORCLE

Spring-8

Page 6: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Mirrorcle is advance by the following;

SynchrotronSynchrotronInjectorInjector

X線X線

High energy X-ray

NDT of heavy material construction

X-ray energy is tunable by monochrometer

Orbit radius=8cmstored beam current=4A> High power radiation source

1-10 μm wide target

highly coherent

Magnified imaging

very high energy resolution is attained

4. Polychromatic X-ray

2. Small emission point

3. Cone beam

1. High current

A

B

C imaging of large object

Page 7: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

We have a technologyWe have a technology to designto design beam linesbeam lines

2m

Dispersive typeXAFS is possible

Page 8: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Wide range of spectrum can betaken simultaneously

• High energy resolution is achieved by short beam line• Dispersive type XAFS is possible• No mechanism which interfere the measurement• High speed measurement

Page 9: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Energy resolution depend on the source size

Photon Factory

MIRRORCLE 93005000

10100

Energy resolutionE/ΔE

Emitter size[μm]

source-detectordistance [m]

2525

MIRRORCLE 510010 3

XANES

EXAFS吸収係数

光エネルギー

XAFS spectrum

BLSEE θτθ cot)(/ 22 Δ+Δ+Δ=Δ

Δθ:capture angleΔτ:Brag diffraction (~10-5)ΔS:source sizeL : source-detector distanceθB:Bragg angle

Page 10: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Dispersive XAFS on 10μm thick Mo

3.5

3.0

2.5

2.0

1.5

mR

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

200 250 300 350 400 450 500 550

Mo10um

Sampleなし

0.2

0.205

0.21

0.215

0.22

0.225

0.23

0.235

0.24

0.245

0.25

19950 20050 20150 20250 20350 20450 20550

Photon Energy [eV]

mμt

This spectrum can be taken in30min without focusing elements by CV4

Dire

ctio

nof

disp

ersi

on

Page 11: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Laue experiment

sample SiO2(111)

Fine space resolution TOPOGRAPH isenabled

Page 12: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Imaging is advanced by MIRRORCLE

•The small focus point is the advantage for Magnified imaging and x-ray microscope•Significant phase contrast appears

Page 13: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Configuration of magnified imagingImaging plate

L

sample 2L=750 (2 times)

10L=3750(10 timesImaging Plate: ST-VI(standard)

Reader:FCR-XG1(FUJIFILM Co.)

150μm/pixel Dynamic range12bit

100 times magnification and 1 μm size emitter appreciate 1.5μm space resolution

Page 14: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Fine space resolution is obtained without loosing intensity

Test chartX-ray contact image

Pb1mmPoint

Pt100μmPoint

Cu25μmPoint

W10μmPoint

W10μmLine

W2.5μmLine

12times m

agnified

imagin

g

SOURCE:MIRRORCLE-6XDetector:Imaging Plate(FUJIFILM, XG-1 150μm/pixel)S-O distance 400mm

20 16 12.5 10 8 [LPM]

Page 15: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Phase contrast appears by small target

25μmφ

50μmφ

Target size

100μmφ

25 32 40 50 [μm]

High resolution

2mm thickPlastic

plate

10mm

10mm

10mm

High contrast

11timesmagnified

Page 16: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Air

PlasticPlate

Edge is more enhanced in larger magnification

(3.3mm)

(2.0mm)

Page 17: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

10mm

0.5mmthick plate x11

A B

10mm

A B

10mm

A B

x11

Shape dependence of edge effect

10mmφRod

Air bubble in water x11

A

B

5mmφpipe

Plane sample 凸shape

凹shape 凹凸shape sample

target:Cu25μmφRod target:W10μmφWire

target:W10μmφWiretarget:W10μmφWire

X-ray

X-ray

X-ray

X-ray

Page 18: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Magnified phase contrast image

12 times magnified image by MIRRORCLE

Page 19: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

5 times magnified.

Magnified imaging of Chest phantom

rib vessels

10 times magnified

Page 20: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Very hard X-ray from MIRRORCLE is advantage for

NDT of heavy constructions

Page 21: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Polychromatic beam is usefulto distinguish material, density and volumeto distinguish material, density and volume

Page 22: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

High energy polychromatic X-ray is usefulX-ray spectrum is selected by the thickness and material of targets

We are able to see different kind of materials and complex materials

Cocoons

Optical switch

Page 23: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

50mm

・inspection of concrete

15cm thick

X1

X3 projection

25μm target source-object distance

1.3m 50sec imaging time

Expanded

60cm thick concrete

45cm thick concrete

Page 24: MIRRORCLE-CV4 for material science and imaginggaps.ing2.uniroma1.it/Uploaded file for Maui/for prof Tang 2.pdf · Brilliance of CV4 Photodiode efficiency: photons/nA =2.67E+3 at 17.4keV

Advanced features of MIRRORCOE beam lines

1. MIRRORCLE is different from synchrotron light source and X-ray tube

2. Small emitter point is advantage for magnified imaging and significant phase contrast, and for reducing scattering background

3. Very hard X-ray is useful for precise non-destructive testing.

4. Small emitter point is advantage for very high energy resolution by the very short monochrometer beam line.

5. Widely spread beam is advantage for the DEXAFS.6. MIRRORCLE is the machine provide a very thin fan

beam. Small angle scattering and CT will be combined.