march 5 - 8, 2017 mesa, arizona archive session 8 · 2017-03-30 · bits 2017 contact frequency -...
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Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Archive – Session 8
March 5 - 8, 2017
Hilton Phoenix / Mesa Hotel
Mesa, Arizona
© 2017 BiTS Workshop – Image: tonda / iStock
BiTS 2017
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Copyright Notice
The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2017 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2017 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2017 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop’s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop. All rights reserved.
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
BiTS Workshop 2017 Schedule
Session
Session Chair
Solutions Day Wednesday March 8 - 10:30 am
Contact Frequency
" Small Form Factor Cantilever Concepts for High Performance Analog / RF Applications"
Gerhard Gschwendtberger – Cohu
"MRC (MEMS Rubber Contact) Socket Bump Particle Structure & Performance Analysis"
BoHyun Kim, Dave Oh, Justin Yun - TSE Co., Ltd
"Flat Probe Technology For High Frequency Test" Jason Mroczkowski, Nadia Steckler - Xcerra
8 Hongjun Yao
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Small Form Factor
Cantilever Concepts for
High Performance Analog/
RF Applications Gerhard Gschwendtberger
Cohu
BiTS Workshop
March 5 - 8, 2017
Conference Ready
mm/dd/2014
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Content
• Contactor requirements
• New multi-beam cantilever concepts
• RF/Analog & power Kelvin example
• RF/Analog contactor features
• Prototype qualification & specification
• High volume production results
• Summary & outlook
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 5
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contactor Requirements
Today’s contactors have to fulfill more complex
requirements in various disciplines.
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 6
mechanical
thermal electrical
The handling system has significant influence on
some of the performance parameters
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Thermal Challenges
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 7
Set temperature
Ambient temperature
DUT
Board
Contactor
Plunge to board / high
performance contactors
provide best signal
integrity by small contact
elements.
Thermal accuracy during
test requires large contact
surface for thermal
conditioning
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Temperature Accuracy During Test
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 8
Temperature
Time
Start of test
DUT temperature at hot
DUT temperature at cold
Temperature
drift at hot
Temperature
drift at cold
Contactors influence the thermal accuracy of the DUT
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Cantilever Concept Considerations
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 9
Multi-beam compared to single-beam concepts
Force Force
Multi-beam structures allow a smaller formfactor
and provide large surface for thermal conditioning
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Multi-Beam Contact Spring
Architecture
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 10
High Power
Cantilever
High Performance
RF/Analog Cantilever
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
RF/Analog Cantilever Concept
Elastomer free multi-beam cantilever
Scrub against package pad/lead
Static connection to load board
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 11
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contactor Housing Concept
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 12
DUT
Board
Contact Socket Section
The contact socket design
contains air channel
features which enable an
airstream through the
multi-beam structure of
the contact spring
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contactor Housing Thermal
Features
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 13
annular
air flow
channel
Air flow
from
handling
system
Air outlet
on the pins
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Thermal Drift Measurements
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 14
Time in sec
Te
mp
era
ture
in °
C
Temperature drift on Cohu handling system with
150°C set temperature: 1.65°C over 20 sec test-time
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contactor Specification
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 15
Electrical:
Insertion Loss S21 -1 dB @ 22 GHz Cres typ. 30mOhm
Return Loss S11 -20 dB @ 12 GHz CCC 1.2A DC
Crosstalk S41 -20 dB @ 22 GHz
Self Inductance 0.43nH
Mechanical:
Compressed Contact
Height: 1.7 mm Min. Pitch 0.3 mm
Lifetime: 1 M+ Scrub 0.06 mm
Contact Force: 0.4 N
Deflection: 0.3 mm
Thermal:
Temperature Range: -55 °C to 155 °C
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Contact Resistance Qualification
CRes test results on Cohu’s strip test handler
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 16
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
High Volume Production Results
Setup: Ismeca Turret System NY20, SOT1232
Lifespan: 1M to 1.5M
Cleaning cycles: 500k to 1M insertions
Yield: 99.5% - 99.8%
End of life reason: Wear on contact spring tips
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 17
New contact spring Contact spring after 1M
Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1
March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org
Summary
Multi-beam cantilever concepts are suitable to enable
small form factor plunge-to-board (PTB) contactor
solutions in combination with best temperature accuracy
behavior.
No elastomers are needed to generate contact force.
Lifespan, yield and cleaning performance have been
proven in high volume production environment.
Multi-beam concepts can be applied to various
applications from high power Kelvin to RF/Analog
solutions.
Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 18