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Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1 March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org Archive Session 8 March 5 - 8, 2017 Hilton Phoenix / Mesa Hotel Mesa, Arizona © 2017 BiTS Workshop Image: tonda / iStock

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Page 1: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Archive – Session 8

March 5 - 8, 2017

Hilton Phoenix / Mesa Hotel

Mesa, Arizona

© 2017 BiTS Workshop – Image: tonda / iStock

Page 2: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

BiTS 2017

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Copyright Notice

The presentation(s)/poster(s) in this publication comprise the Proceedings of the 2017 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2017 BiTS Workshop. This version of the presentation or poster may differ from the version that was distributed in hardcopy & softcopy form at the 2017 BiTS Workshop. The inclusion of the presentations/posters in this publication does not constitute an endorsement by BiTS Workshop or the workshop’s sponsors. There is NO copyright protection claimed on the presentation/poster content by BiTS Workshop. However, each presentation/poster is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies. The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop. All rights reserved.

Page 3: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

BiTS Workshop 2017 Schedule

Session

Session Chair

Solutions Day Wednesday March 8 - 10:30 am

Contact Frequency

" Small Form Factor Cantilever Concepts for High Performance Analog / RF Applications"

Gerhard Gschwendtberger – Cohu

"MRC (MEMS Rubber Contact) Socket Bump Particle Structure & Performance Analysis"

BoHyun Kim, Dave Oh, Justin Yun - TSE Co., Ltd

"Flat Probe Technology For High Frequency Test" Jason Mroczkowski, Nadia Steckler - Xcerra

8 Hongjun Yao

Page 4: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Small Form Factor

Cantilever Concepts for

High Performance Analog/

RF Applications Gerhard Gschwendtberger

Cohu

BiTS Workshop

March 5 - 8, 2017

Conference Ready

mm/dd/2014

Page 5: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Content

• Contactor requirements

• New multi-beam cantilever concepts

• RF/Analog & power Kelvin example

• RF/Analog contactor features

• Prototype qualification & specification

• High volume production results

• Summary & outlook

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 5

Page 6: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Contactor Requirements

Today’s contactors have to fulfill more complex

requirements in various disciplines.

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 6

mechanical

thermal electrical

The handling system has significant influence on

some of the performance parameters

Page 7: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Thermal Challenges

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 7

Set temperature

Ambient temperature

DUT

Board

Contactor

Plunge to board / high

performance contactors

provide best signal

integrity by small contact

elements.

Thermal accuracy during

test requires large contact

surface for thermal

conditioning

Page 8: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Temperature Accuracy During Test

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 8

Temperature

Time

Start of test

DUT temperature at hot

DUT temperature at cold

Temperature

drift at hot

Temperature

drift at cold

Contactors influence the thermal accuracy of the DUT

Page 9: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Cantilever Concept Considerations

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 9

Multi-beam compared to single-beam concepts

Force Force

Multi-beam structures allow a smaller formfactor

and provide large surface for thermal conditioning

Page 10: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Multi-Beam Contact Spring

Architecture

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 10

High Power

Cantilever

High Performance

RF/Analog Cantilever

Page 11: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

RF/Analog Cantilever Concept

Elastomer free multi-beam cantilever

Scrub against package pad/lead

Static connection to load board

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 11

Page 12: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Contactor Housing Concept

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 12

DUT

Board

Contact Socket Section

The contact socket design

contains air channel

features which enable an

airstream through the

multi-beam structure of

the contact spring

Page 13: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Contactor Housing Thermal

Features

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 13

annular

air flow

channel

Air flow

from

handling

system

Air outlet

on the pins

Page 14: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Thermal Drift Measurements

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 14

Time in sec

Te

mp

era

ture

in °

C

Temperature drift on Cohu handling system with

150°C set temperature: 1.65°C over 20 sec test-time

Page 15: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Contactor Specification

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 15

Electrical:

Insertion Loss S21 -1 dB @ 22 GHz Cres typ. 30mOhm

Return Loss S11 -20 dB @ 12 GHz CCC 1.2A DC

Crosstalk S41 -20 dB @ 22 GHz

Self Inductance 0.43nH

Mechanical:

Compressed Contact

Height: 1.7 mm Min. Pitch 0.3 mm

Lifetime: 1 M+ Scrub 0.06 mm

Contact Force: 0.4 N

Deflection: 0.3 mm

Thermal:

Temperature Range: -55 °C to 155 °C

Page 16: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Contact Resistance Qualification

CRes test results on Cohu’s strip test handler

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 16

Page 17: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

High Volume Production Results

Setup: Ismeca Turret System NY20, SOT1232

Lifespan: 1M to 1.5M

Cleaning cycles: 500k to 1M insertions

Yield: 99.5% - 99.8%

End of life reason: Wear on contact spring tips

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 17

New contact spring Contact spring after 1M

Page 18: March 5 - 8, 2017 Mesa, Arizona Archive Session 8 · 2017-03-30 · BiTS 2017 Contact Frequency - Contact Technology - 2 of 2 Session 8 Presentation 1 Burn-in & Test Strategies Workshop

Contact Frequency - Contact Technology - 2 of 2 BiTS 2017 Session 8 Presentation 1

March 5-8, 2017 Burn-in & Test Strategies Workshop www.bitsworkshop.org

Summary

Multi-beam cantilever concepts are suitable to enable

small form factor plunge-to-board (PTB) contactor

solutions in combination with best temperature accuracy

behavior.

No elastomers are needed to generate contact force.

Lifespan, yield and cleaning performance have been

proven in high volume production environment.

Multi-beam concepts can be applied to various

applications from high power Kelvin to RF/Analog

solutions.

Small Form Factor Cantilever Concepts for High Performance Analog/RF Applications 18