life prediction for cigs solar modules · life prediction for cigs solar modules d.j. coyle, ......
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1DJ Coyle
GE Global Research 16-February 2011
Life Prediction for CIGS Solar Modules D.J. Coyle, H.A. Blaydes, R.S. Northey, J.E. Pickett, K.R. Nagarkar,
R.A. Zhao, and J.O. Gardner
GE Global Research
Niskayuna, NY, 12309
DOE PV Module Reliability WorkshopDenver, CO
February 16-17, 2011
One can use accelerated testing data to predict real-world module failures only if the degradation mechanisms are known and their dependence on environmental factors measured. The moisture-induced degradation rate of flexible CIGS solar cells has been measured as a function of temperature and humidity and fit to a kinetic rate expression. This expression is coupled to a model of moisture diffusion into a package and typical meteorological input data to create a cumulative damage model to predict lifetime of packaged cells versus outdoor exposure and package construction. Estimated acceleration factors for damp heat (85C/85%RH) vs. Miami range from 15X to 50X, depending on the package, since diffusion through the package is accelerated differently than the cell degradation kinetics. The degradation rates are strongly dependent on the transparent conductive oxide used for the window layer and the electrically-conductive adhesive used for the contacts. The dependence of degradation on encapsulant materials is fundamentally different than is often assumed in the literature.
2DJ Coyle
GE Global Research 16-February 2011
Prototype Flexible CIGS Module
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GE Global Research 16-February 2011
Top Sheet• Transparent•UV Stable, UV block• Electrical insulation•Mechanical (cut, hail)•Moisture barrier
Flexible Thin-Film PV Package
CdSCIGS
TCO
MolybdenumFlexible Substrate(Stainless Steel)
Transparent Moisture BarrierTransparent Polymer Film
Moisture BarrierPolymer Film
Encapsulant
Encapsulant
Edge Seal
Encapsulant• Low Tg compliant “glue”• Transparent• Adhesion
Backsheet• Electrical insulation•Mechanical (cut)•Moisture barrier
PV Cell
Edge Seal• Barrier• Adhesion
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GE Global Research 16-February 2011
2 µm
ZnO/ITOCdS
Cu(InGa)Se2
Mo
Cu(InGa)Se2 Device Environmental Stability
(W. Shafarman & L. Stolt, Handbook of Photovoltaic Science and Engineering, Ed. A. Luque & S. Hegedus, Wiley, 2003)
Increased Series Resistance Rs
Decreased Shunt Resistance Rsh
Increased Recombination1. Quasi-neutral region2. Depletion region
Moisture-induced degradation
Increased Series Resistance Rs
i-ZnO Buffer Layer
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GE Global Research 16-February 2011
Test Cells:1. Global Solar Test Cells (ITO)2. AZO
~ 36 x 46 mm exposedStainless steel foilMo coatingECA – Tabs/ribbons
Efficiency ~ 12 – 13.5%Voc ~ 600 - 610 mVJsc ~ 33-36 mA/cm2
FF ~ 60 - 62%A ~ 16.5 cm2
GSE test celltabbed and encapsulated
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GE Global Research 16-February 2011
1. Cell construction• ITO vs AZO window layer• Type of ECA for interconnect• Other
2. Exposure• Accelerated testing (ovens with various temp, RH)• Real-world exposure (Miami, Phoenix, …)
3. Package• Barrier properties of topsheet and backsheet• Encapsulant• Edge seals• other
Factors for prediction of lifetime (moisture degradation):
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GE Global Research 16-February 2011
Life Model – Moisture Sensitivity1. CIGS Degradation Kinetics - Measure
• Degradation rate vs. Temp, humidity• ITO vs AZO• ECA - Interconnect degradation can play a role
2. Moisture Diffusion into Package - Model• Meteorological data – TMY3 from NSRDB
‐ Hourly irradiance, air temp, ground temp, humidity, wind speed• Heat transfer model of module
‐ Radiation, free & forced convection• Diffusion through barrier film, Saturation of encapsulant, no edge effects
3. Coupled Model - Predict• Cumulative degradation and average life vs. location and package design• Tradeoffs between CIGS sensitivity and package design/cost• Interpretation of accelerated tests results
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GE Global Research 16-February 2011
Degradation Data - Examples
y = -0.0077xR² = 0.6866
-35
-30
-25
-20
-15
-10
-5
0
5
0 500 1000 1500 2000 2500
% C
hang
e Ef
f
Time (hrs)
% Change Eff - 85C/50% - ECA1
y = -0.027xR² = 0.9017
-80
-70
-60
-50
-40
-30
-20
-10
00 500 1000 1500
% C
hang
e Ef
f
Time (hrs)
% Change Eff - 95/50% - ECA1
• High temperature, humidity faster• Driven by FF loss due to Roc and some shunting
-80
-70
-60
-50
-40
-30
-20
-10
00 500 1000 1500
% C
hang
e Ef
f
Time (hrs)
% Change Eff - 85C/75% - ECA1
y=-0.0213xR2=0.86
-80
-70
-60
-50
-40
-30
-20
-10
00 200 400 600 800
% C
hang
e Ef
f
Time (hrs)
% Change Eff - 95C/75% - ECA1
y = -0.0523xR2 = 0.86
9DJ Coyle
GE Global Research 16-February 2011
Scaling with partial pressure water
Negative activation energy!Need to scale with % saturation (RH)
RHSC
SC
b
b
a
a ==Interfacial equilibrium (Henry’s Law)
0
20
40
60
80
100
120
0 10 20 30 40 50 60 70
RD
(%/1
000h
rs)
PH2O (KPa)
22oC 85oC
75oC65oC
55oC35oC
ITO ECA0
αpRTEkR a
D
−= exp0
Ea = -50 kcal/mole
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GE Global Research 16-February 2011
0
10
20
30
40
50
60
70
80
0% 20% 40% 60% 80% 100%
RH
RD (%
/100
0hrs
)
22oC
85oC75oC
65oC
55oC
95oC
CIGS Degradation Kinetics (Global Solar test cells)
(Klinger, D. J., “Humidity acceleration factor for plastic packaged electronic devices”, Quality and Reliability Engineering International. Vol. 7, 965-3711, 1991).
• For every Temp & RH, fit data to linear degradation rate (1st 20% of degradation)• Fit rate of degradation vs Temp, RH to kinetic model
+−
=
−
εcell
cellRTE
oDeg RHRHekR
a
1
deg,
Dashed Curve - ECA0
• Strong RH dependence at high RH• ECA affects temperature dependence
11DJ Coyle
GE Global Research 16-February 2011
CIGS Degradation - AZO vs ITO
• AZO ~ 25X ITO• Comparable to published data
0
1
10
100
1000
10000
0% 20% 40% 60% 80% 100%
RD
(%/1
000h
rs)
RH
22oC
85oC75oC 65oC
55oC
95oC
AZO 85oC
AZO 22oC
Olsen 2008
Britt 2006Westin 2006
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GE Global Research 16-February 2011
Arrhenius Plot
-3
-1
1
3
5
7
0.0027 0.0028 0.0029 0.0030 0.0031 0.0032 0.0033 0.0034
Ln(R
D)+
Ln(R
H/(1
-RH
+ε))
1/T (1/K)
AZO
ITO ECA0
ITO ECA1
Olsen 2008
Britt2006
Westin2006
• ECA0 very low activation energy
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GE Global Research 16-February 2011
Package Diffusion Model
−−=
c
E
E ttRHSC e /
1
If initially dry:
maxWVTRSLt EE
c =
(Kempe, M.D., “Modeling of rates of moisture ingress into photovoltaic modules,” Solar Energy Materials & Solar Cells, Vol 90 (2006) pp. 2720–2738).
Mass Balance, Interfacial Equilibrium,Fickian Diffusion, Dbarrier<<Dencapsulant
RH
cellRH
( )0=xCB
( )BB LxC =
EC
RH
cellRH
( )0=xCB
( )BB LxC =
EC
encapsulantbarrier cell
Integrate moisture ingress with hourly weather data (TMY3)
c
EEE
tCRHS
tC −
=∂∂
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GE Global Research 16-February 2011
1
10
100
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR (g/m2/day)
Life
yrs
(20%
deg
rade
)
San FransiscoMiami
Golden CO
Phoenix
Life vs. Barrier: ITO-ECA0
Need ~ 4x10-5 g/m2/day package ~ 20 yr life
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GE Global Research 16-February 2011
1
10
100
1000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Life
yrs
(20%
deg
rade
)San Fransisco
Miami
Golden CO
PhoenixECA1 - solid linesECA0 - dashed lines
Life vs. Barrier: ITO-ECA1
Need ~ 8x10-3 g/m2/day package ~ 20 yr life
ECA0
ECA1
16DJ Coyle
GE Global Research 16-February 2011
Life vs Barrier – ITO vs AZO
0
1
10
100
1000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Life
yrs
(20%
deg
rade
) San Fransisco
Miami
Golden CO
PhoenixITO/ECA1AZO
ITO Life 5-25x AZO Life
AZO
ITO
17DJ Coyle
GE Global Research 16-February 2011
AcceleratedTesting• Nonlinear relationship• No simple scaling• Depends on details of
kinetics and package
,
0
1
10
100
1000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Life
yrs
(20%
deg
rade
)
Miami, FL
AZO
ITO/ECA0
ITO/ECA1
,
0
1
10
100
1000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Life
yrs
(20%
deg
rade
)
Miami, FL
AZO
ITO/ECA0
ITO/ECA1
1
10
100
1000
10000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Hou
rs 8
5o C 8
5% R
H to
10%
Deg
rade
Damp Heat
AZO
ITO/ECA0
ITO/ECA1
1
10
100
1000
10000
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
WVTR at 25oC (g/m2/day)
Hou
rs 8
5o C 8
5% R
H to
10%
Deg
rade
Damp Heat
AZO
ITO/ECA0
ITO/ECA1
~10,000 hrs~4,000 hrs~2,500 hrs
18DJ Coyle
GE Global Research 16-February 2011
FL, AZ Testing
Results as expected after 3 months
• ITO/ECA1 no measureable degradation
• ITO/ECA0 ~ 5% down as expected
Calc Pmax
changeMeasured
Pmax change
Phoenix ECA1 -0.1% -1% +-2%
Miami ECA1 -0.5% -1% +-2%Miami ECA0 -4.1% -5% +-2%
19DJ Coyle
GE Global Research 16-February 2011
Encapsulant Effect
• Low solubility encapsulants become saturated faster => BAD!!
maxWVTRSLt EE
c =
−−=
c
E
E ttRHSC e /
1
1
10
100
1.E-04 1.E-02 1.E+00 1.E+02
Life
Mia
mi -
Yrs
20%
deg
rada
tion
Diffusion Half-Time @25oC (yrs)
1
10
100
1.E-05 1.E-04 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01
Life
Mia
mi -
Yrs
20%
deg
rada
tion
WVTR @25oC (g/m2day)
Urethane 2mm
Urethane 0.5mm
Silicone 2mm
Silicone 0.5mm
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GE Global Research 16-February 2011
-4
-3
-2
-1
0.0027 0.0029 0.0031 0.0033
Solu
bilit
y (g
/cm
3 )
1/T (1/oK)
Silicone
Urethane
EVA
Polyolefin
10
10
10
10
100
1,000
10,000
1.E-03 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03
WVTR at 85oC (g/m2/day)
Hou
rs L
ife 8
5o C 8
5% R
H (2
0% d
egra
de)
TPU -6x14mil_2x14mil
Silicone_2x19mil
GSE cellsECA1
ACLAR
PC 5,7mil
PET 5,7mil
3M
2mil7.8mil
Polyolefin
Barrier Film
Aclar®Urethane
Encapsulant Experimental Plan (85oC, 85%RH)
All encapsulants the same
Thick, high SEencapsulants better
Thickness (mm)
Solubility @85C g/cm3
t1/2 Hrs @85C
Urethane 0.355 3.0E-02 89Urethane 1.065 3.0E-02 268Silicone 0.480 3.1E-03 12Polyolefin 0.400 3.6E-03 12
WVTR @85C g/m2day
Aclar® 0.307 2.0
Material
Encapsulant
Barrier
10x
21DJ Coyle
GE Global Research 16-February 2011
Encapsulant Confirmation Experiment
• EVA outlier – unusually fast degradation
• Urethane (TPU), silicone, polyolefin same, latter two even with Aclar®, as expected
• Barrier (Aclar®) makes no difference for silicone & polyolefin, as expected
• Barrier (Aclar®) improves TPU life, especially thicker, as expected
-80.
-70.
-60.
-50.
-40.
-30.
-20.
-10.
0.
0 200 400 600 800 1000
Pmax
Cha
nge
(%)
Time (hrs)
TPU/Aclar®
3xTPU/Aclar®
Silicone/Aclar®
1x,3xTPU/PC
PO/Aclar® PO/PCEVA/PC
22DJ Coyle
GE Global Research 16-February 2011
Comparison of Experiment & Model
Saturation
Degradation
-30
-25
-20
-15
-10
-5
0
0 200 400 600 800 1000
% C
hang
e Pm
ax
Time (Hours @85oC/85%RH)
0
10
20
30
40
50
60
70
80
90
100
0 200 400 600 800 1000
% E
ncap
sula
nt S
atur
atio
n (1
00C
E/S)
Time (Hours @85oC/85%RH)
PC
3xTPU/Aclar®
TPU/Aclar®
PC
3xTPU/Aclar®
TPU/Aclar®
23DJ Coyle
GE Global Research 16-February 2011
Conclusions1. Life model and accelerated test scaling developed
– Relative humidity and % saturation of encapsulant are key
2. Moisture sensitivity of CIGS almost independent of encapsulant type
3. Module lifetime longer for thick encapsulants with high water solubility
4. AZO vs ITO CIGS degradation kinetics quantified ~25X
5. ECA can also be a strong factor in degradation
6. Diffusion-controlled: Life ~ (tc/RD)1/2 ~ (diffusion-time*degrade-time)1/2
7. Significant moisture barriers required for 20 yr life – even for ITO
8. Acceleration factor for damp heat smaller than assumed, highly nonlinear!
9. Methodology can predict life for any moisture-sensitive module (once kinetic constants are measured)
24DJ Coyle
GE Global Research 16-February 2011
Acknowledgements
Mike Kempe NRELJeff Britt Global Solar EnergySteve Hegedus IEC
This work was supported by:U.S. Department of Energy Award DE-FC36-07GO17045
GE Global ResearchGE Energy