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Recent trends in the Particle Size Analysing Techniques
Suk-Ho KangDepartment of Chemical Engineering,
Yeungnam University, Gyongsan 632, Korea?IH
10 , 4-
ABSTRACT
Recent advances and developments in the particle-sizing technologies were briefly reviewedin accordance with three operating principles including particle size and shape descriptions.Significant trends of the particle size analysing equipments recently developed show thatcompact electronic circuitry and rapid data-processing system were mainly adopted in theinstrument designs. Some newly developed techniques characterizing the paniculate systemwere also introduced.
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Fig. 1-a. Various descriptions of a mean particlesize for a given sample powder
> 10 15 JJ
FA?TiCLE SIZE. * n44-^
°J 4 .71Fig. 1-b. Difference between various particle size
descriptions.
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Quantimet3"-^- o]^ Si 4.
photoscan,35' Spectrophotometer4. o]-!- } (Table 2)t
Table 2. Manufacturers of Particle Image Analyser
Name
TGZ 3Quant imetClassimatTAS-SystemMikro-VideomatEpiquantMagi scanMOPOmniconImagelyzer
Manufac turer
ZeissI manco
Leitz
Carl ZeissVEB Carl ZeissJoyce Loebl LtdKontronBausch & LombHamatsu
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Fig. 2. Principle of the Coulter Counter
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Si 4.
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HWAHAK KONGHAK Vol. 20, No. 1, February 1982
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Table 3. Vbrious forces acting on a particle in the measuring system
hydramdyamic particle diam- 7-il tj-t 4^ data£] A} B.]
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ShimadzuCt! -£.-), Satonus(-^-cj! ) -f-o] 4. o] -f--cr digiial rccuing o] 7\-^-e\-SL. microprocessor
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^ 'l;-'.'1', "^ ^ ^s^^&$$ .r- x., *x
C-=.-:ICLE si:;
Fig. 3-a Actual separation of the f ine and thecoarse fraction out of the feed throughthe cut size, xt.
9 n ,- ! »J
Fig. 3-b. Separation curve showing the gradeefficiency, ^(x), and a separation func-tion, A'25/75
-v-v. __ _/"
^^•' // '• ' - ,//// f / / 'Jf' i • ! I
_
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Fig. 3-c. Various grade efficiencies can be obtainedwith different PSA instruments for thesamples; 1,2,3 and 4
HWAHAK KONGHAK Vol. 20, No. 1, February 1982
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Table 4 Commercial Ins t ruments classified a f t e rmajor working principles
principle ; name of intsrument ref
scattering
diffraction
extinction
Optical particle counter |(7J)Tjpton particle analyserCoulter NanosizerRoyco Particle AnalyserLaser InterferomelersLaser Doppler
Anemometers
Talbot-Disa
(73)(74, 75)(76)(77, 78)(79-83)
(84)C1LAS granulometer 1(85,86)Malvern Analyser 1(87.88)Microtrac (89-93)
HIAC-counter ,(94)
4-1-4.
il^ o jc- j
-g-o} $14.
s)H 21 JL,
^ja. laser ^-
C.].. 98,99,1001 ^
odispersed)^.5-7\ J£_ (m0n.
SiA^Cpolydispersed)
44-
optical particle counter
-f-
4. a. °1 «l
*>4. Coulter Nanosizcr7 ' '75 '-Si 4
(fluctuation)-S: 4^ *H °J 4s)sit!: Einsticn ^ o] -3-10I>A.5.-f ^
i*}^ ^-^1 61 4. Royco T}| 7] Si 4-. 5
(chopped) ^-
*, 2J-L J Hi-l\fe LASER
ETTlMCTON »COLLECTION
3p«cR^-\K}€SS)—Ir\! CELL B / \/ \
SCATTER M!RRORE/ CALIBRfiTtOH/ FIBRE
RETURNMIRROR
Laser doppler anemometer^
Si (optical sieve) eV^^-tll °J4£1 3.7] ^-f-r--! imaginary fringepattern 4 n]5L^A5.'«l ^^44-
Fraunhofcr s] S-t f a r - f i e l d il^102'-^ o|
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mask-disc35)7r
71-1- 4^ 0Ji>'lmatrix T 44.68,103.
Ta-
4-1--5.71-
... /.L;.!pcrl.cle 5=nple I
Fig. 4. Schematic diagram of the Royco submicron Fig 5 Far-field diffraction analysis of the 2-dim-particle analyser ensional model particles
HWAHAK KONGHAK Vol. 20, No. 1. February 1982 m
10
xtinction
coefficient, K)-|- -S-*H
*)— — (5)
6. ^
7] -^o,
Table 5. physical principles employed to sense andsize particles
1. Image replication2. .Electrical resistance change
3. Light scattering4. Radiation attenuation,
light, ultrasonic, ^-ray, x-ray5. Classification;
sieve, elutriation, hydrocyclone, sedimentation6. Fluid flow,
permeametry, nozzles, rheology7. Hot v. ire anemometry
8. Electrostatic ion capture
(sieve)-fe-
Til 31^1-fc- 7j-f
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. 106,107)
)_£_.£. Schonert s\
Orr
$1544:
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]-3- 7]
Coulter Courier-1: <£D3^1; Small-fir11" =.
\151-1: -§~§- ]: hydrodynamic chr-
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Sprt£& ~ J^i >.