g. kaupp, m. r. naimi-jamal powerpoint presentation, ecm22 budapest, august 26-31, 2004
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G. Kaupp, M. R. Naimi-Jamal Powerpoint Presentation, ECM22 Budapest, August 26-31, 2004. G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004. G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004. Al-Berkovich. - PowerPoint PPT PresentationTRANSCRIPT
G. Kaupp, M. R. Naimi-Jamal
Powerpoint Presentation, ECM22
Budapest, August 26-31, 2004
0-FN 0-FN
constant FN
constant FL
nanoindentation ramp nanoscratching constant load nanoscratching(indent, hold FN , and scratch)
0-FL
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Nanoindentation and Nanoscratching
Mechanical properties of crystals and solids
Indentation hardness (with respect to projected contact area) Young`s elastic modulus Elasticity/plasticity Nanoindentation coefficient [µN/nm3/2] Work of the nanoindentation Phase transitions (pressure induced) Long-range effects Face anisotropies ____________________________________________________ Abrasion/pileup Scratch coefficient [1/µN1/2] (instead of “friction coefficient”) Scratch work Scratch resistance Phase transitions (pressure induced) Angle and face dependence Anisotropic molecular migrations Relation to crystal structure and chemical reactivity
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Al-Berkovich
loading: FN = k h3/2 k [µN/nm3/2] = indentation coefficient
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Al, Conosphere (R=1µm)y = 0,1812x + 109,72
0
2000
4000
6000
8000
10000
12000
0 20000 40000 60000
(norm. displ.)1,5 (nm)1.5
no
rmal
fo
rce
(µN
)
0
2000
4000
6000
8000
10000
12000
0 1000000 2000000
(norm. displ.)2 (nm)2
no
rmal
fo
rce
(µN
)
The relation of normal force and normal displacement FN = k·h3/2 (k [µN/nm3/2] = indentation coefficient)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
0
1000
2000
3000
4000
5000
6000
0 1000 2000 3000
(norm. displ.)1.5 (nm1.5)
no
rmal
fo
rce (
µN
)
Quartz (10-10)
0
500
1000
1500
2000
2500
3000
0 250 500 750 1000(norm. displ.)1.5 (nm1.5)
no
rmal
fo
rce
(µN
)
SrTiO3 (110)
cubic SrTiO3(Pm-3m); tetragonal (I4/mcm) ?trigonal -quartzmonoclinic coesite (>2.2 GPa)tetragonal stishovite (>8.2 GPa)
Crystalline SiO2 and SrTiO3
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
k1 = 0.058 µN/nm3/2
Cube corner:
k2 = 0.0188 µN/nm3/2
WN tot tg = 11.27 µNµm (100 µN)
Anthracene, coefficients and work of indentation
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Isotropic and anisotropic indentation responce
Far-reaching phenomena with crystals
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Cube corner nanoindentation of α-quartz (P3221) up to 5000 µN; Berkovich nanoindentation of strontium titanate (Pm-3m) up to 3000 µN load.
Compd. Face hmax
(nm) H
(Gpa) Er
(Gpa) k1
(µNnm-3/2) k2
(µNnm-3/2) Wp/We WNtot tgα
(µNµm) SiO2 (10-10) 201 15.3 109.0 1.956 1.590 1.07 420.8 SiO2 (01-10) 191 16.2 119.7 2.145 1.728 1.09 378.3 SiO2 (01-11) 179 17.4 133.6 2.730 1.844 1.26 379.1 SiO2 (10-11) 193 16.5 105.0 2.256 1.668 1.17 404.7 SiO2 (1-100) 193 16.6 109.4 2.303 1.656 1.05 395.6
SrTiO3 (100) 102 11.7 236 2.754 3.536 1.53 329.7 SrTiO3 (110) 103 12.0 254 2.462 3.390 2.04 331.1 SrTiO3 (111) 102 11.1 246 2.317 3.096 2.08 355.7
Face anisotropy in nanoindentations
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Appearances of nanoscratches by AFM
ramp experiment constant normal force
Z range 50 nm
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
y = 0,1926x - 44,289
0
50
100
150
200
250
0 300 600 900 1200 1500
normal force (μN)
late
ral f
orce
(μN)
y = 0,0046x + 0,022
0
50
100
150
200
250
0 10000 20000 30000 40000 50000
normal force1.5 (μN1.5)
late
ral f
orce
(μN)
y = 0,0001x + 21,791
0
50
100
150
200
250
0 500000 1000000 1500000 2000000
normal force2 (μN2)
late
ral f
orce
(μN)
(a) (b) (c)normal force (µN) (normal force)1.5 (µN1.5) (normal force)2 (µN2)
FL = K·FN3/2 (K = scratch coefficient [N-1/2])
Linear plot through the origin only with exponent 1.5 (not 1 or 2)
The relation of lateral force and (fixed) normal force
Fused quartz and cube corner indentation tip, edge in front
The value for the lateral force gives the scratch work [µNµm] for 1 µm scratch length
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
exponent 1.5 (not 1 or 2)the steep line in (b) corresponds to phase transformed SrTiO3
0
100
200
300
0 20000 40000 60000
(normal force)1.5 (µN1.5 )
late
ral
forc
e (
µN
)
y1 = 0,0047x1 + 3,8443
y2 = 0,0071x 2 - 61,218
0
100
200
300
0 500 1000 1500
normal force (µN)
late
ral
forc
e (
µN
)
(a) (b)
y = 0,0048x + 13,571
0
40
80
120
160
200
0 10000 20000 30000 40000
late
ral
forc
e (
µN
)
(c)
y = 0,0001x + 33,419
0
40
80
120
160
200
0 250000 500000 750000 1000000
(normal force)2 (µN 2)
late
ral
forc
e (
µN
)
(d)invalid
(normal force)1.5 (µN1.5)acceptable
The relation of lateral force and (fixed) normal forceSrTiO3 (100), 0°, cube corner edge in front
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
SrTiO3 (100) SrTiO3 (110) SrTiO3 (111)
Spec. scratch work (3 µm, 60 s, FN = 1190 µN ) Angle µNµm 0° 246.6 45° 270.1 90° 240.4
Spec. scratch work (3 µm, 60 s, FN = 1190 µN ) Angle µNµm 0° 244.3 45° 253.0 90° 206.8
Spec. scratch work (3 µm, 60 s, FN = 1190 µN ) Angle µNµm 0° 326.2 45° 239.5 90° 241.9
Angular and facial dependence of specific scratch work on strontium titanate at different normal loads (WSc, spec = FL
.1 [µNµm])
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Angular dependence of specific scratch work on (1-100) of -quartz and crystal packing
(1-100), scratch work per µm scratch length (FN=1482 µN):
Angle µNµm
90° 206 45° 223 0° 225
spec.WSc = FL.1 [µNµm] = work for 1 µm scratch length of the indented tip
c-direction: alternation of 0.5405nm Si-Si rows; the other directions are less distant and the skew (10-11) cleavage plane is cutting in c-direction
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
NH
NH
O S
Molecular migrations under (110) of thiohydantoin
(P21/c)
(a) 0° (b) 90° (c) 180° (d) 270°
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
cleavage planes between steep (66°) monolayers
Geometric model for the understanding of the marked anisotropies upon scratching over skew cleavage planes in four orthogonal directions
Reason for the orientational specifity on (110) of thiohydantoin
In all directions: FL = K.FN3/2 is valid
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Nanoscratching of anthracene on (110)
(110) on top
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
ramp nanoscratching at 0-150 µN on (001)
(001) on topanthracene
Nanoscratching on the layers
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
Tetraphenylethene (P21) on (10-1)
Poor vertical (010) cleavage planes between monolayers of bulky molecules
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
OH
OH
O
O
Cube corner scratches on ninhydrin (110) along the polar axis
edge in front
side in front
Nanoscratching along the polar axis of ninhydrin
180°
180°
180°
(P21)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004
(image rotated by 10° around x and y)
Thiourea, anisotropic nanoscratching on (100)
ab
c
(100)
ramp nanoscratching at 0-150 µN
b) along [001] (c)
a) along [010] (b)
S
NH2 NH2
(Pbnm)
G. Kaupp, M. R. Naimi-Jamal, ECM22, Budapest, August 26-31, 2004