Focus on the details to capture the bigger picture

Epsilon 1

Small spot analysis

H1

1.008

Na11

22.990

K19

39.098

Rb37

85.47

Fr87

(223)

Li3

6.941

He2

4.003

Ne10

20.180

Ar18

39.948

Kr36

83.80

Xe54

131.29

Cs55

132.905

Ra88

226.02

Ba56

137.33

Be4

9.012

Mg12

24.31

Ca20

40.08

Sr38

87.62

Sc21

44.96

Y39

88.906

Ti22

47.88

Zr40

91.22

V23

50.94

Nb41

92.91

Cr24

52.00

Mo42

95.94

Mn25

54.94

Tc43

(98)

Fe26

55.85

Ru44

101.1

Co27

58.93

Rh45

102.95

Ni28

58.69

Pd46

106.4

Cu29

63.55

Ag47

107.87

Zn30

65.39

Cd48

112.41

I53

126.90

Te52

127.60

Ga31

69.72

Ge32

72.61

As33

74.92

Se34

78.96

Br35

79.904

Al13

26.98

Si14

28.09

P15

30.974

S16

32.066

Cl17

35.453

B5

10.81

C6

12.011

N7

14.007

O8

15.999

F9

18.998

In49

114.82

Sn50

118.71

Sb51

121.75

Rn86

(222)

At85

(210)

Po84

(209)

Bi83

208.98

Pb82

207.21

Tl81

204.38

Hg80

200.59

Au79

196.97

Pt78

195.08

Ir77

192.2

Os76

190.2

Re75

186.2

W74

183.85

Ta73

180.95

Hf72

178.49

La57

138.91

Ce58

140.12

Pr59

140.91

Nd60

144.24

Pm61

(145)

Sm62

150.36

Eu63

151.97

Gd64

157.25

Tb65

158.93

Dy66

162.50

Ho67

164.93

Er68

167.26

Tm69

168.96

Yb70

173.04

Lu71

174.97

Ac89

(227)

Th90

232.04

Pa91

231.04

U92

238.03

Lr103

(260)

No102

(259)

Md101

(258)

Fm100

(257)

Es99

(252)

Cf98

(251)

Bk97

(247)

Cm96

(247)

Am95

(243)

Pu94

(244)

Np93

237.05

L

A

L

A

Possible to analyze with Epsilon 1

Not possible to analyze with Epsilon 1

Z

Z

Looking for the details in a sample?

The Epsilon 1 X-ray fluorescence spectrometer is an ideal

analytical solution for flexible and precise analysis of small

objects or small inclusions in rocks, electronic appliances,

toys, jewelry or finished products. The small footprint and

self-contained design make the Epsilon 1 an ideal solution

for analysis, to be placed close to the sample location, like

quarries, exploration sites, or even at crime sites for forensic

investigation.

Regularly and irregularly-shaped samples can be placed

directly in the spectrometer without the need of any sample

preparation. The combination of the color camera, the small

measurement spot size and the straightforward positioning

procedure is optimized for analyzing every detail in the

sample. The performance of the spectrometer meets the

standard test methods required by different directives and

regulations in various industry markets, like RoHS-2 for

electronics and CPSIA for many consumer goods.

Following standard test methods like ASTM F2617,

specifications like ASTM F963 or methods for screening

electronics per IEC 62123, an analysis report can be generated

automatically after each measurement to save valuable time.

Spot-on results are provided for a wide range of applications.

This is made possible by Omnian, PANalyticals’ market-leading

standardless analysis software package, also used on the more

advanced XRF instruments.

PANalytical has a strong reputation for safe and high-end

X-ray instrumentation. The high-quality X-ray shielding in the

instrument guarantees the safety of your employees.

Epsilon 1 is built using PANalytical’s market-leading

technology with superior quality, worldwide service and

application support.

Epsilon 1 spectrometer

The total solution consists of• Self-contained Epsilon 1 XRF instrument

• Flexible user software

• Factory pre-calibrated for Omnian standardless analysis

• Validation sample to check the out-of-the-box accuracy of

the instrument

Key features

Color camera< 1 mm2 spot size on sample Analysis reportAccurate manual positioning

It's all in the detailsFlexible and spot-on elemental analysis

Ready for any sample

Enter sample name and push ‘measure’ button.

Epsilon 1 can handle a large variety of sample types, from weighing a few grams to larger bulk samples: solids, pressed

powders, loose powders, liquids, fused beads, slurries, granules, films and coatings. Also large and irregularly shaped objects

with maximum dimensions of 15 x 12 x 10 cm (W x D x H) can be analyzed.

Place your sample for positioning

1 2

No sample preparation

Simple to operate

Convenient results viewing

Applications

• RoHS-2 (ASTM F2617-15)

• Toys (ASTM F963-16)

• Jewelry

• Heterogeneous rocks

• Polymer inclusions

• Product inspection

• Forensics

Advantages of XRF• Unmatched analytical precision and accuracy

compared to other analytical techniques

• Quick quantification method

• Simple, fast and safe sample preparation

• Non-destructive analysis

• Wide analytical concentration range (ppm – %) reducing

the necessity for dilution and associated errors

1

2

34

6

9

8

5

Built for detailsThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer and analysis

software. Powered by the latest advances in excitation and detection technology, the Epsilon 1 is a star performer in the low-

cost benchtop instrument class. A well-designed optical path, a wide range of excitation capabilities ranging from 10 to 50 kV

for light and heavier elements and a highly sensitive SDD detector system contribute to Epsilon 1’s uniqueness.

Self-contained system

Built-in computer running Microsoft Windows 7 with a

powerful CPU and 120 GB hard drive ensures flexibility to

store and handle thousands of results.

Repeatability for years

A low-drift X-ray tube and a handy drift correction routine

give compliant results for years without the need for time-

consuming re-calibration.

Maximum sensitivity

The thin-window Ag anode X-ray tube, designed and

manufactured by PANalytical, ensures high quality and

sensitivity. The 15 W and 50 kV X-ray tube and generator are

ideal for exciting heavier elements like cadmium, mercury,

lead, bromine and chromium.

Spillage protection

In order to shield the delicate heart of the system from

spillage, a protection foil and plastic disc are in place. In case

of spillage, the disc can be removed and the foil can be easily

replaced by the operator.

Economical footprint

Compact design with a built-in computer and touchscreen

reduces the requirement of valuable lab space

to less than 0.15 m2.

Easy operation

High-resolution (1024 x 768), 10.4” LCD touchscreen

for easy walk-up and operation

1

2

3

4

5

6

7

10

Built for details

Safety guaranteed Epsilon 1 complies with the latest Machinery

Directive, CSA, IEC, EMC, Vollschutz norms and

standards for protection and radiation safety to

guarantee a safe instrument for the operator.

Easy communication

USB and network connections for use of standard

computer peripherals enable extended use,

application development and seated operator.

Small analyzing spot

Small pieces or small inclusions in samples can

easily be analyzed with a collimated X-ray beam.

The spot size on the sample is typically

0.8 x 1.2 mm.

Sample positioningWith the help of the color camera and crosshair

in the picture, the user can manually position the

sample on the analyzing spot of the instrument.

Analysis report

After each analysis, the picture from the camera is

stored on the built-in computer.

When an analysis report is

generated, the picture is

automatically included.

7

8

9

10

Robust and flexible quantification for ROHS-2, WEEE and ELVXRF is a well-established technique for screening and

quantification of toxic metals and compounds regulated

by global directives, like RoHS-2/WEEE/ELV. The Epsilon 1 is

specifically designed to analyze a wide range of samples in

accordance to these regulations. With a dedicated calibration

the Epsilon 1 complies with the ASTM F2617-15 test method,

as proven with reference materials.

Dedicated calibration

A set of reference materials was used to set up calibrations

for chromium, bromine, cadmium, mercury and lead in

polyethylene, in compliance with the ASTM F2617-15 test

method. For each standard, two hot-pressed discs of 2 mm

each were used. The measurement time was 10 minutes

per sample. The calibration graph for lead in polyethylene

demonstrates a high degree of accuracy for the method.

Complying with ASTM F2617-15

Measurement precision is an important requirement of

ASTM F2617. To test the precision of the method, reference

standard ERM-EC681k was measured twenty times

consecutively. The certified and average concentrations,

maximum achieved difference between successive

measurements and the difference allowed by ASTM F2617-

15, are presented for chromium, bromine, cadmium, mercury

and lead in the table. This precision is illustrated graphically

for lead (Pb). The orange lines show the maximum difference

allowed by ASTM F2617-15.

Calibration graph for lead (Pb) in polyethylene.

� � � � � � � � � �� �� �� �� �� �� �� �� �� �� ��

Pb concentration difference (mg/kg)5

4

3

2

1

0

-1

-2

-3

-4

-5

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

100 200 300 400 500 600

Concentration Pb (mg/kg)

Co

rr. i

nte

nsi

ty

700 800 900 1000 1100

RMS = 4.6Cor = 0.9999

Robust and flexible quantification for ROHS-2, WEEE and ELVFlexible RoHS-2 screening

For characterization and analysis of unidentified sample

types, or in situations where certified standards that match

specific sample characteristics are not available, PANalytical’s

Omnian package is the solution of choice.

Without using any dedicated calibrations, Omnian was

used to quantify the restricted elements of the RoHS-2

directive in the reference standard ERM-EC681k. Also other

elements present in the sample are reported by Omnian. The

measurement time was 10 minutes and repeated five times to

show the repeatability of the method.

Element Certified conc.

(mg/kg)

Average conc.

(mg/kg)

Largest diff.

(mg/kg)

Max permitted

diff. by ASTM F2617-15(mg/kg)

LLD(mg/kg,

300s)

Cr 100 ± 5 100 12.4 14 2

Br 770 ± 40 782 6.7 8.7 0.5

Cd 137 ± 4 140 14.3 16 6

Hg 23.7 ± 0.8 22.5 2.1 10 1

Pb 98 ± 6 98 3.1 3.8 1

Element Certified Concentration

(mg/kg)

Measured concentration

(mg/kg)

Cr 100 ± 5 104 ± 1 Br 770 ± 40 851 ± 2Cd 137 ± 4 144 ± 7Pb 98 ± 6 94 ± 2Hg 23.7 ± 0.8 20.3 ± 0.5As 29.1 ± 1.8 15 ± 1Sb 99 ± 6 97 ± 15

� � � � � � � � � �� �� �� �� �� �� �� �� �� �� ��

Pb concentration difference (mg/kg)5

4

3

2

1

0

-1

-2

-3

-4

-5

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

100 200 300 400 500 600

Concentration Pb (mg/kg)

Co

rr. i

nte

nsi

ty

700 800 900 1000 1100

RMS = 4.6Cor = 0.9999

Other available software options

Stratos Thickness and composition analysis software for multi-

layer samples

Enhanced Data Security Protect your data and track any changes

FingerprintQuick Pass-Fail analysis and cluster representation

Flexible and fast screening PANalytical’s Omnian standardless analysis package is the solution for quantification and fast screening of small objects or

small inclusions in rocks, electronic appliances, toys and jewelry, or failure analysis and troubleshooting of finished products.

The following data show results of a plastic toy, rock and ring with gem stone, obtained using Epsilon 1 and Omnian. The

measurement time was only 2 minutes per analysis and repeated five times to show the repeatability of the method.

Children’s toys

Chromium ore

Ring with gemstone

Element Concentration (mg/kg)

ASTM F963

limits after leaching (mg/kg)

Ti (wt%) 0.15 ± 0.01 -Cl 99 ± 12 -Cr < 6 60As < 3 25Se < 3 500Cd < 25 75Sb < 30 60Ba < 20 1000Hg < 4 60Pb < 4 90

Major compounds Concentration (wt %)

Cr2O3 0.3 ± 0.1

SiO2 41.1 ± 0.2

MgO 49.3 ± 0.3

Fe2O3 5.7 ± 0.1

Al2O3 < 0.5

Element Concentration (wt %)

Au 58.9 ± 0.4 (14K)

Ni 14.0 ± 0.3

Cu 18.6 ± 0.2

Zn 7.1 ± 0.1

Rh 1.0 ± 0.2

Element Concentration (wt %)

ZrO2 82.4 ± 0.1

Y2O3 15.2 ± 0.1

HfO2 2.2 ± 0.1

Major compounds Concentration (wt %)

Cr2O3 64.7 ± 0.5

SiO2 2.3 ± 0.1

MgO 11.5 ± 0.6

Fe2O3 14.3 ± 0.1

Al2O3 5.1 ± 0.2

Element Concentration (mg/kg)

ASTM F963

limits after leaching (mg/kg)

Ti (wt%) 1.17 ± 0.09 -Cl 412 ± 40 -Cr < 6 60As < 3 25Se < 3 500Cd < 25 75Sb < 30 60Ba < 20 1000Hg < 4 60Pb < 4 90

Although diligent care has been used to ensure that the information herein is accurate, nothing contained herein can be construed to imply any representation or warranty as to the accuracy, currency or completeness

of this information. The content hereof is subject to change without further notice. Please contact us for the latest version of this document or further information. © PANalytical B.V. 2014. 9498 707 60011 PN11105

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info@panalytical.com

www.panalytical.com

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validation• Analysis services and customized

calibration materials• Multi-laboratory standardization

About PANalyticalPANalytical’s mission is to enable people to get valuable insight into their materials and processes. Our customers can be found in virtually every industry segment, from building materials to pharmaceuticals and from metals and mining to nanomaterials. The combination of our software and instrumentation, based on X-ray diffraction (XRD), X-ray scattering, X-ray fluorescence (XRF) and near-infrared (NIR) spectroscopy as well as pulsed fast thermal neutron activation (PFTNA), provides our customers with highly reliable and robust elemental and structural information on their materials and is applied in scientific research and industrial process and quality control.

PANalytical employs over 1,000 people worldwide. The company’s headquarters are in Almelo, the Netherlands. Fully equipped application laboratories are established in Japan, China, the US, Brazil, and the Netherlands. Supply and competence centers are located on two sites in the Netherlands: Almelo (X-ray instruments) and Eindhoven (X-ray tubes), in Nottingham, UK (XRF applications and standards), in Quebec, Canada (fusion sample preparation) and in Boulder CO, US (near-infrared instruments). A dedicated research activity is located on the campus of the University of Sussex in Brighton (UK).

PANalytical is active in all but a few countries of the world with a worldwide sales and service network that ensures unrivalled levels of customer support.

PANalytical is active in all but a few countries of the world. This worldwide sales and service network ensures unrivalled levels of customer support. The company is certified in accordance with ISO 9001 and ISO 14001.

Visit www.panalytical.com for more information about our activities.

PANalytical is part of Spectris plc, the productivity-enhancing instrumentation and controls company. Since 1 January 2017 PANalytical has merged its activities with Malvern Instruments, a UK-based provider of materials and biophysical characterization technology and also an operating company within the Materials Analysis segment of Spectris.

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