omnian panalytical day 2009 final
TRANSCRIPT
-
8/2/2019 Omnian PANalytical Day 2009 Final
1/32
Omnian
The benchmark
Standardless analysis
-
8/2/2019 Omnian PANalytical Day 2009 Final
2/32
2Omnian - The benchmark
Content
Analytical strategies Introduction standardless analysis Omnian advantages Omnian features
-
8/2/2019 Omnian PANalytical Day 2009 Final
3/32
3Omnian - The benchmark
Analytical strategies
Highest precision
Highest accuracy
Highest measurement efficiency
Full traceability
Full flexibility
Good accuracy without in-type standards Good comparative data/trend analysis
/ Ideal screening tool
Conventional calibration or Standardless analysis?
PK?
-
8/2/2019 Omnian PANalytical Day 2009 Final
4/32
4Omnian - The benchmark
Introduction Standardless analysis
Complete composition of most types of unknownmaterials can be quantified with a single calibrationprogram Calibration set up with a selected range of reference
materials to calibrate the instrument response
Covers all common elements that can be measured by XRF:by default O-U O-UXRF
Makes use of (a form of) Fundamental Parameter (FP)
calculations to correct for all sample-matrix specificproperties
Handles most types of samples, including solids, pressedpowders, fused beads, loose powders and liquids
,
-
8/2/2019 Omnian PANalytical Day 2009 Final
5/32
5Omnian - The benchmark
Introduction Standardless analysis
How is a quantitative result obtained?
Two steps: 1.
Determine which elements are present in the
sample
2.
Calculate the concentration of each element that is
present. This gives the total sample composition
NOTE: A conventional analysis only has to deal withstep 2, because the elements of interest are alreadyknown.
-
8/2/2019 Omnian PANalytical Day 2009 Final
6/32
6Omnian - The benchmark
Omnian advantages
The right result every time Easy to use Problem solving power foryour analytical challenges
-
8/2/2019 Omnian PANalytical Day 2009 Final
7/32
7Omnian - The benchmark
The right result every time The basis of a good result is toobtain accurate net intensities
Having advanced algorithms forthe determination of background,peak search & match and line-
overlaps
Using a scan-based measurementprogram, for a comprehensivepicture of the sample
but can be combined with peakmeasurements for higher precision andlower detection limits for key elements
-
8/2/2019 Omnian PANalytical Day 2009 Final
8/32
8Omnian - The benchmark
The right result every time By using scans a comprehensive picture of thesample is given:
Allowing both qualitative and quantitative
analysis
Quick visual screening or full quantification
Providing an accurate background profile
Superior to the estimations obtained from fixedbackground positions
Providing a view of all peaks and backgrounds across theperiodic table
Reduces the chance of incorrect element identification
-
8/2/2019 Omnian PANalytical Day 2009 Final
9/32
-
8/2/2019 Omnian PANalytical Day 2009 Final
10/32
10Omnian - The benchmark
Easy to use Handles almost all sample types with one calibrationprogram
Solids, pressed powders, fused beads, loose powders andliquids
-
8/2/2019 Omnian PANalytical Day 2009 Final
11/32
11Omnian - The benchmark
Easy to use
Scaleable from routine to advanced usage
Easy operation procedure for daily routine usage Advanced functions for experienced users to fine tune analytical
parameters
Results can be viewed inthe SuperQ results viewerSuperQ
Easy comparison of data Print or transfer to LIMS
system LIMS
-
8/2/2019 Omnian PANalytical Day 2009 Final
12/32
12Omnian - The benchmark
Easy to use daily operation process 1.
Place your sample on the
Axios
changer
1.
Simply assign the Omnian
application to the chosensample location Omnian
2.
Fill in sample preparation
details if applicable
1.
Measure!
-
8/2/2019 Omnian PANalytical Day 2009 Final
13/32
13Omnian - The benchmark
Easy to use daily operation process After measurement completionthe result is displayed
automatically
For further results evaluation,
the SuperQ results viewer is used uperQ
For comparison of different
analyses For applying statistics For editing of results
-
8/2/2019 Omnian PANalytical Day 2009 Final
14/32
-
8/2/2019 Omnian PANalytical Day 2009 Final
15/32
15Omnian - The benchmark
Problem solving power R&D analysis tool
For analyses of all types of samples For detailed investigation of results
Failure analysis
To identify steps in a process where things might gowrong, e.g by analyzing:
A particular bolt or screw A powder that was found in an instrument; itmight come from components wear
-
8/2/2019 Omnian PANalytical Day 2009 Final
16/32
16Omnian - The benchmark
Problem solving power Comparative analysis For comparison of different samples
To distinguish samples on matrix differences (e.g. stainless vs.low-alloy steel or PE vs. PVC polymer) PE PVC
Helps to monitor and steer your process by comparingsamples from different batches
-
8/2/2019 Omnian PANalytical Day 2009 Final
17/32
17Omnian - The benchmark
Omnian features Advanced technology Boosting the accuracy with ASC
FastScan
analysis
Easy data retrieval
-
8/2/2019 Omnian PANalytical Day 2009 Final
18/32
18Omnian - The benchmark
Advanced technology Finite thickness characteristics High-energy lines will have a larger
penetration
depth in the sample than low
energy lines
The penetration depth in light matrices is
larger than in heavy matrices
FP corrects in case the sample is not infinite
thick for all measured energies
Steel
Irradiated and detected
(Penetration depth)
Not irradiated and detected
OilOmnians advanced FP algorithms dealwith:
-
8/2/2019 Omnian PANalytical Day 2009 Final
19/32
19Omnian - The benchmark
Irradiated and detected
Not irradiated and detected
Advanced technology Fluorescence Volume Geometry (FVG)
The irradiated area of a light-matrixsample is not only determined by thepenetration depth
It is also determined by the geometry ofthe optical path
FP corrects for the FVG effect
It takes into account the real geometry ofthe irradiated area, which is far morecomplex than the wedge-shape as drawnin the picture
Omnians advanced FP algorithmsdeal with:
-
8/2/2019 Omnian PANalytical Day 2009 Final
20/32
20Omnian - The benchmark
Example FVG and Finite Thickness effect
Polymer CRM: BCR681k
2 mm
FT
(16 mm)Cd-Ka (
)
FVG/ FT
Cd-Ka in thick PE sample
0
20
40
60
80
100
120
140
160
With FVG and FT No FVG, with FT No FVG, No FT
Concentration(ppm)
Certified
Measured
BCR 681k Certified 1 disc
1 disc, no
FTElement Conc. (ppm) Conc. (ppm) Conc. (ppm)
S 630 589 581
Cl 800 927 914
Cr 100 102 98
As 29.1 38 18Br 770 809 300
Cd 137 148 19
Sb (La) 99 77 75
Hg 23.7 20 10
Pb 98 108 36
FVG
-
8/2/2019 Omnian PANalytical Day 2009 Final
21/32
21Omnian - The benchmark
Example FVG and Finite Thickness effect The scans show the bigdifferences in intensity
between the 1 and 8
disc measurements
This all needs to be
corrected for! 1 8
-
8/2/2019 Omnian PANalytical Day 2009 Final
22/32
22Omnian - The benchmark
Advanced technology
FP calculates the Dark Matrix compounds from the measuredCompton-scattered tube intensity
This Compton intensity is reversely proportional to the density of thesample
A heavy
matrix (e.g. Copper) will have low Compton scatter whereas a light
matrix (e.g. B4
C) will have a high Compton scatter:B4
C
-
8/2/2019 Omnian PANalytical Day 2009 Final
23/32
23Omnian - The benchmark
Example Calculation of Dark Matrix compound
Example: B in glass
This clearly indicates that using the
Compton intensity gives a far moreaccurate result
Example: LOI in Limestone
There is not much difference between
calculating LOI as balance or from theCompton line, but: this comparisongives a clear indication of thecorrectness of the results!
,NBS 1411, glass
Certified
(wt%
Measured
(wt%
Measured
(wt%B2O3 10.94 Compton 10.1 Balance 20.2
F ~0.5 0 0
Na2O 10.14 11.1 10.3
MgO 0.33 0.32 0.29
Al2O3 5.68 6.04 5.43
SiO2 58.04 57.9 51.6
K2O 2.97 2.7 2.33
CaO 2.18 2.2 1.89
Fe2O3 0.05 0.059 0.049
ZnO 3.85 4.04 3.36
SrO 0.09 0.092 0.076
BaO 5 5.33 4.35
TiO2 0.02 0 0
GBW07215a, Limestone fused beadCertified
(wt%)
Measured
(wt%)
Measured
(wt%
Na2O 0.072 0.072
MgO 2.29 2.266 2.262
Al2O3 0.77 0.812 0.811
SiO2 1.8 1.951 1.947SO3 0.755 0.716 0.714
K2O 0.168 0.134 0.133
CaO 51.2 51.31 51.041
Fe2O3 0.446 0.571 0.562
SrO 0.041 0.039
L.O.I.: Compton 40.549 Balance42.42
-
8/2/2019 Omnian PANalytical Day 2009 Final
24/32
-
8/2/2019 Omnian PANalytical Day 2009 Final
25/32
25Omnian - The benchmark
Example Using ASC
Use ASC for calibration lines ofAl, Si and Ca All results clearly improve!
ASCAlSi a
Use of ASC increases theaccuracy Especially for Si
Rawmix pressed pellet
ASC Default
Certified
(wt%
Measured
(wt%
Measured
(wt%Na2O 0.202 0.206 0.205
MgO 1.504 1.267 1.252
Al2O3 3.194 3.358 2.591
SiO2 12.726 13.331 10.547
P2O5 0.118 0.082 0.077
SO3 0.631 0.595 0.56K2O 0.608 0.529 0.494
CaO 44.06 44.778 39.85
TiO2 0.314 0.307 0.278
MnO 0.054 0.043 0.038
Fe2O3 2.035 2.063 1.673
SrO 0.074 0.07 0.063
CO2 34.48 33.159 42.177
CKD 238 Al alloy
ASC Default
Certified
(wt%
Measured
(wt%
Measured
(wt%)Mg 0.32 0.296 0.301
Si 11.78 12.083 13.949
Ti 0.16 0.163 0.14
Cr 0.004 0.004
Mn 0.145 0.138 0.133
Fe 0.56 0.584 0.579Ni 0.03 0.021 0.025
Cu 0.37 0.395 0.474
Zn 0.32 0.236 0.307
Ga 0.008 0.008
Zr 0.001 0.001
Pb 0.007 0.007
Al (bal) 86.064 84.071
-
8/2/2019 Omnian PANalytical Day 2009 Final
26/32
26Omnian - The benchmark
FastScan analysis
FastScan
analysis is a unique feature of Omnian
coupled with
an Axios
spectrometer OmnianAxios
For a quick determination of all majors and minors
For samples that are likely to be damaged by X-rays
X
With a measurement time of about 1 minute the scan program
covers the complete periodic table 1
Combining FastScan
with selected peak
measurements, the accuracy for critical or low-
concentration elements canbe
increased
-
8/2/2019 Omnian PANalytical Day 2009 Final
27/32
27Omnian - The benchmark
Easy data retrieval Omnian is built into the proven SuperQ
analysis software platformOmnian
SuperQ Results fully integrate into SuperQ
results viewers
SuperQ
Easy comparison of data
Print or transfer to files or LIMSLIMS Default measurement program can be easily extended with
extra scans or peak measurements
-
8/2/2019 Omnian PANalytical Day 2009 Final
28/32
28Omnian - The benchmark
Omnian the benchmark With Omnian: Omnian You get the right results every time with an easy to use package
with problem solving power for your analytical challenges!
-
8/2/2019 Omnian PANalytical Day 2009 Final
29/32
Omnian
Application examples
-
8/2/2019 Omnian PANalytical Day 2009 Final
30/32
30Omnian - The benchmark
Application example Aluminum alloys
Default calibration is used
CKD 236 Al alloy CKD 240 Al alloy CKD 242 Al alloy CKD 245 Al alloyDefault Default Default Default
Certified
(wt%)
Measured
(wt%)
Certified
(wt%)
Measured
(wt%
Certified
(wt%)
Measured
(wt%)
Certified
(wt%)
Measured
(wt%
Mg 0.21 0.212 0.66 0.669 7.50 7.533 4.39 4.491
Si 7.46 7.849 10.13 11.468 0.33 0.376 1.80 1.932
Ti 0.025 0.027 0.07 0.058 0.10 0.087
Mn 0.095 0.088 0.27 0.27 0.01 0.005 0.52 0.498
Fe 0.23 0.227 0.45 0.452 0.05 0.051 0.74 0.727
Ni 0.36 0.361 0.91 1.069 0.209
Cu0.21 0.237 0.7 0.831 0.005 0.008 0.19 0.225
Zn 0.05 0.041 0.06 0.059 0.01 0.019 0.14 0.198
Ga 0.007 0.006 0.006 0.008
Zr 0.001 0.002 0.001 0.023
Al (bal) 90.945 85.1 92.001 91.588
-
8/2/2019 Omnian PANalytical Day 2009 Final
31/32
31Omnian - The benchmark
Application example failure analysis
Metal drillings
Pressed in boric acid
Default calibration is used
The results are obtained by
normalizing to 100 %00%
Certified Measured
Element (%) (%)
Si 0.42 0.889
P 0.016 0.01
S 0.016 0.058
V 0.029
Cr 15.2 16.008
Mn 0.78 0.789
Fe 74.701
Co 0.04 0.034
Ni 6.26 7.003
Cu 0.175As 0.023
-
8/2/2019 Omnian PANalytical Day 2009 Final
32/32