epc2024 – enhancement mode power transistor...j = 25 c unless otherwise stated) parameter test...
TRANSCRIPT
eGaN® FET DATASHEET EPC2024
EPC – THE LEADER IN GaN TECHNOLOGY | WWW.EPC-CO.COM | COPYRIGHT 2019 | | 1
EFFICIENT POWER CONVERSIONG
D
SHAL
Maximum Ratings
PARAMETER VALUE UNIT
VDS
Drain-to-Source Voltage (Continuous) 40V
Drain-to-Source Voltage (up to 10,000 5 ms pulses at 150°C) 48
ID
Continuous (TA = 25°C, RθJA = 6°C/W) 90A
Pulsed (25°C, TPULSE = 300 µs) 560
VGS
Gate-to-Source Voltage 6V
Gate-to-Source Voltage -4
TJ Operating Temperature -40 to 150°C
TSTG Storage Temperature -40 to 150
Thermal Characteristics
PARAMETER TYP UNIT
RθJC Thermal Resistance, Junction-to-Case 0.4
°C/W RθJB Thermal Resistance, Junction-to-Board 1.1
RθJA Thermal Resistance, Junction-to-Ambient (Note 1) 42Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board.See https://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf for details.
All measurements were done with substrate connected to source.
Static Characteristics (TJ = 25°C unless otherwise stated)
PARAMETER TEST CONDITIONS MIN TYP MAX UNITBVDSS Drain-to-Source Voltage VGS = 0 V, ID = 1.1mA 40 V
IDSS Drain-Source Leakage VGS = 0 V, VDS = 32 V 0.1 0.9 mA
IGSSGate-to-Source Forward Leakage VGS = 5 V 1 9 mA
Gate-to-Source Reverse Leakage VGS = -4 V 0.1 0.9 mA
VGS(TH) Gate Threshold Voltage VDS = VGS, ID = 19 mA 0.8 1.4 2.5 V
RDS(on) Drain-Source On Resistance VGS = 5 V, ID = 37 A 1.2 1.5 mΩ
VSD Source-Drain Forward Voltage IS = 0.5 A, VGS = 0 V 1.8 V
EPC2024 – Enhancement Mode Power Transistor
VDS , 40 VRDS(on) , 1.5 mΩID , 90 A
EPC2024 eGaN® FETs are supplied only inpassivated die form with solder bumps. Die Size: 6.05 mm x 2.3 mm
Applications: • High Frequency DC-DC Conversion
• Motor Drive
• Industrial Automation
• Synchronous Rectification
• Inrush Protection
• Point-of-Load (POL) Converters
Gallium Nitride’s exceptionally high electron mobility and low temperature coefficient allows very low RDS(on), while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that can handle tasks where very high switching frequency, and low on-time are beneficial as well as those where on-state losses dominate.
eGaN® FET DATASHEET
EPC – THE LEADER IN GaN TECHNOLOGY | WWW.EPC-CO.COM | COPYRIGHT 2019 | | 2
EPC2024
Dynamic Characteristics (TJ = 25°C unless otherwise stated)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
CISS Input Capacitance
VDS = 20 V, VGS = 0 V
1920 2300
pF
COSS Output Capacitance 1620 2430
CRSS Reverse Transfer Capacitance 29
COSS(ER) Effective Output Capacitance, Energy Related (Note 2)VDS = 0 to 20 V, VGS = 0 V
2050
COSS(TR) Effective Output Capacitance, Time Related (Note 3) 2240
RG Gate Resistance 0.3 Ω
QG Total Gate Charge VDS = 20 V, VGS = 5 V, ID = 37 A 18 24
nC
QGS Gate-to-Source Charge
VDS = 20 V, ID = 37 A
5.1
QGD Gate-to-Drain Charge 2.4
QG(TH) Gate Charge at Threshold 3.8
QOSS Output Charge VDS = 20 V, VGS = 0 V 45 68
QRR Source-Drain Recovery Charge 0All measurements were done with substrate connected to source.Note 2: COSS(ER) is a fixed capacitance that gives the same stored energy as COSS while VDS is rising from 0 to 50% BVDSS. Note 3: COSS(TR) is a fixed capacitance that gives the same charging time as COSS while VDS is rising from 0 to 50% BVDSS.
500
400
300
200
100
00 0.5 1.0 1.5 2.0 2.5 3.0
I D – D
rain
Curre
nt (A
)
VDS – Drain-to-Source Voltage (V)
VGS = 5 VVGS = 4 VVGS = 3 VVGS = 2 V
Figure 1: Typical Output Characteristics at 25°C
4
3
2
1
02.5 3.0 3.5 4.0 4.5 5.0
R DS(o
n) –
Dra
in-to
-Sou
rce R
esist
ance
(mΩ)
VGS – Gate-to-Source Voltage (V)
ID = 35 AID = 70 AID = 140 AID = 210 A
Figure 3: RDS(on) vs. VGS for Various Drain Currents
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
25°C125°C
VDS = 3 V
I D – D
rain
Curre
nt (A
)
VGS – Gate-to-Source Voltage (V)
Figure 2: Transfer Characteristics
500
400
300
200
100
0
25°C125°C
ID = 37 A
R DS(o
n) –
Dra
in-to
-Sou
rce R
esist
ance
(mΩ)
VGS – Gate-to-Source Voltage (V)
Figure 4: RDS(on) vs. VGS for Various Temperatures
4
3
2
1
02.5 3.0 3.5 4.0 4.5 5.0
eGaN® FET DATASHEET
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EPC2024
All measurements were done with substrate shortened to source.
1000
100
10
Figure 5b: Capacitance (Log Scale)
Capa
citan
ce (p
F)
VDS – Drain-to-Source Voltage (V)
COSS = CGD + CSDCISS = CGD + CGSCRSS = CGD
0 10 20 30 40
500
400
300
200
100
0
I SD –
Sour
ce-to
-Dra
in Cu
rrent
(A)
VSD – Source-to-Drain Voltage (V)
Figure 7: Reverse Drain-Source Characteristics
25°C125°C
0.5 0 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
1.4
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.60 25 50 75 100 125 150
Norm
alize
d Th
resh
old
Volta
ge
TJ – Junction Temperature (ºC)
ID = 19 mA
Figure 9: Normalized Threshold Voltage vs. Temperature
3500
3000
2500
2000
1500
1000
500
00 10 20 30 40
Capa
citan
ce (p
F)
VDS – Drain-to-Source Voltage (V)
COSS = CGD + CSDCISS = CGD + CGSCRSS = CGD
Figure 5a: Capacitance (Linear Scale)
5
4
3
2
1
00 5 10 15 20
V GS –
Gat
e-to
-Sou
rce V
olta
ge (V
)
QG – Gate Charge (nC)
ID = 37 AVDS = 20 V
Figure 6: Gate Charge
2.0
1.8
1.6
1.4
1.2
1.0
0.80 25 50 75 100 125 150
Norm
alize
d On
-Sta
te R
esist
ance
– R
DS(o
n)
TJ – Junction Temperature (ºC)
ID = 37 A
VGS = 5 V
Figure 8: Normalized On-State Resistance vs. Temperature
eGaN® FET DATASHEET
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EPC2024
Figure 11: Transient Thermal Response Curves
Duty Factors:0.5
0.10.050.020.01
Single Pulse
1
0.1
0.01
0.001
0.000110-5 10-4 10-3 10-2 10-1 1 10
Transient Thermal Response Curves (Junction-to-Board)
tp, Rectangular Pulse Duration, seconds
Z θJB
, Nor
mal
ized T
herm
al Im
peda
nce
Notes:Duty Factor: D = t1/t2Peak TJ = PDM x ZθJB x RθJB + TB
PDM
t1t2
Duty Factors:
Notes:Duty Factor: D = t1/t2Peak TJ = PDM x ZθJC x RθJC + TB
PDM
t1t2
0.5
0.10.2
0.050.020.01
Single Pulse
1
0.1
0.01
0.001
0.000110-6 10-5 10-4 10-3 10-2 10-1 1
Transient Thermal Response Curves (Junction-to-Case)
tp, Rectangular Pulse Duration, seconds
Z θJC
, Nor
mal
ized T
herm
al Im
peda
nce
80
60
40
20
00 1 2 3 4 5 6
I G – G
ate C
urre
nt (m
A)
VGS – Gate-to-Source Voltage (V)
Figure 10: Gate Leakage Current
25°C125°C
eGaN® FET DATASHEET
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EPC2024
2024
YYYY
ZZZZ Die orientation dot
Gate Pad bump is under this corner
Part Number
Laser Marking
Part #Marking Line 1
Lot_Date CodeMarking Line 2
Lot_Date CodeMarking Line 3
EPC2024 2024 YYYY ZZZZ
DIE MARKINGS
2024YYYYZZZZ
TAPE AND REEL CONFIGURATION4 mm pitch, 12 mm wide tape on 7” reel
7” reel
a
d e f g
c
b
Note 1: MSL 1 (moisture sensitivity level 1) classied according to IPC/JEDEC industry standard.Note 2: Pocket position is relative to the sprocket hole measured as true position of the pocket, not the pocket hole.
Dieorientationdot
Gatesolder bar isunder thiscorner
Die is placed into pocketsolder bar side down(face side down)
Loaded Tape Feed Direction
Dimension (mm) target min max a 12.00 11.70 12.30 b 1.75 1.65 1.85
c (note 2) 5.50 5.45 5.55 d 4.00 3.90 4.10 e 4.00 3.90 4.10
f (note 2) 2.00 1.95 2.05 g 1.5 1.5 1.6
EPC2024 (note 1)
Figure 12: Safe Operating Area
0.1
1
10
100
1000
0.1 1 10 100
VDS – Drain Voltage (V)
Limited by RDS(on)
I D –
Drai
n Cu
rrent
(A)
Pulse Width 100 ms 10 ms 1 ms 100 µs
eGaN® FET DATASHEET
EPC – THE LEADER IN GaN TECHNOLOGY | WWW.EPC-CO.COM | COPYRIGHT 2019 | | 6
EPC2024
RECOMMENDEDLAND PATTERN (units in µm)
RECOMMENDEDSTENCIL DRAWING (units in µm)
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29
6050
180
700
X30
2300
400
2030
X30
X28
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30
6050
400X34
2300
1330
2050
720
200X35
R601 3 5 7 9 11 13 15 17 19 21 23 25 27 29
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30
Information subject to change without notice.
Revised August, 2019
Recommended stencil should be 4 mil (100 µm) thick, must be laser cut, openings per drawing.
Intended for use with SAC305 Type 3 solder, reference 88.5% metals content.
Additional assembly resources available at https://epc-co.com/epc/DesignSupport/ AssemblyBasics.aspx
Efficient Power Conversion Corporation (EPC) reserves the right to make changes without further notice to any products herein to improve reliability, function or design. EPC does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others.
eGaN® is a registered trademark of Efficient Power Conversion Corporation.EPC Patent Listing: epc-co.com/epc/AboutEPC/Patents.aspx
Land pattern is solder mask definedSolder mask opening is 180 µmIt is recommended to have on-Cu trace PCB vias
Pad 1 is Gate;Pads 2, 5, 6, 9,10,13,14, 17, 18, 21, 22, 25, 26, 29 are Source;Pads 3, 4, 7, 8, 11, 12, 15, 16, 19, 20, 23, 24, 27, 28 are Drain;
Pad 30 is Substrate.*
*Substrate pin should be connected to Source
DIE OUTLINESolder Bump View
(685
)
Seating plane
(785
)
100 ±
20
2 4 6 8 10 12 14 16 18 20 22 24 26 28 30
1 3 5 7 9 11 13 15 17 19 21 23 25 27 29
A
f
d X30
B
gX4e
c
X30
X28
Pad 1 is Gate;Pads 2 ,5, 6, 9, 10, 13, 14, 17, 18, 21, 22, 25, 26, 29 are Source;Pads 3, 4, 7, 8, 11, 12, 15, 16, 19, 20, 23, 24, 27, 28 are Drain;
Pad 30 is Substrate.*
*Substrate pin should be connected to Source
DIM
Micrometers
MIN Nominal MAX
A 6020 6050 6080B 2270 2300 2330c 2047 2050 2053d 717 720 723e 210 225 240f 195 200 205g 400 400 400
Side View