design of a ‘single event effect’ mitigation technique for reconfigurable architectures
DESCRIPTION
Design of a ‘Single Event Effect’ Mitigation Technique for Reconfigurable Architectures. SAJID BALOCH. Prof. Dr. T. Arslan 1,2 Dr.Adrian Stoica 3. Supervisory Team. ACRONYMES. SEU (Single Event Effect) SET (Single Event Transient) SEB (Single Event Burnout) - PowerPoint PPT PresentationTRANSCRIPT
Baloch 1 MAPLD 2005/1024-L
Design of a ‘Single Event Effect’ Mitigation Technique for
Reconfigurable Architectures
TH
E
UNI VERSI TY
OF
E D I N B U
RG
H
SAJID BALOCH
Prof. Dr. T. Arslan1,2 Dr.Adrian Stoica3Supervisory Team
Baloch 2 MAPLD 2005/1024-L
ACRONYMES
– SEU (Single Event Effect)– SET (Single Event Transient)– SEB (Single Event Burnout)– SEL (Single Event Latch-up)– Cfg (Configuration)– EDAC (Error Detection and Correction)– SoC (System on Chip)– FPGA (Field Programmable Gate Array)– DEU (Double Event Upset)– TEU (Triple Event Upset )– MEU (Multiple Event Upsets)
Baloch 3 MAPLD 2005/1024-L
RECONFIGURABLE ARCHITECTURES
ME
MO
RY
ME
MO
RY
ReconfigurableArray
IP
DSP
IP
Re-Configurable SoC Architecture
a) FPGAs
- SRAM
- Anti Fuse
- EPROM
b) Reconfigurable SoC
- General purpose
- Domain Specific
Baloch 4 MAPLD 2005/1024-L
RADIATION EFFECTS RE-CONFIGURABLE ARCHITECTURES
– PERMANANT FAULTS (due to SEL, SEB etc)
– TEMPORARY FAULTS (due to SEU etc)
Baloch 5 MAPLD 2005/1024-L
SEU MITIGATION TECHNIQUES
a) HARDWARE REDUNDANCY
- Dual Modular Redundancy (DMR)
- Triple Modular Redundancy (TMR)
- EDAC Codes
- Process Technology
b) TIME REDUNDANCY
c) COMBINATION (Hardware & Time)
Baloch 6 MAPLD 2005/1024-L
• TRANSIENT FAULTS (Data Memory etc)
• PERMANANT FAULTS (Cfg. Memory)
Radiation Hardening SEU EFFECTS
Baloch 7 MAPLD 2005/1024-L
SEU EFECTS Synchronous Circuits
D-F
lip F
lop
D-F
lip F
lop
CombinationalLogic Circuits
Data_in Data_out
Clock
Baloch 8 MAPLD 2005/1024-L
SEU EFECTS Configuration Memory
M
M
D-F
lip F
lop
M
M M M MLUT
SEU (BITFLIP)
Baloch 9 MAPLD 2005/1024-L
CLUSTER
CLUSTER
CLUSTER
CLUSTER
CLUSTER
CLUSTER
SEU EFECTS ROUTING OF A SIGNAL
Baloch 10 MAPLD 2005/1024-L
Proposed SEU/SET MitigationTechnique
based on:• Temporal Data Sampling• Weighted Voting
Salient Features of The Proposed Technique:Auto Correction Mechanism for• 100% SEU Recovery• 100% Double Fault Recovery• Voter Faults Recovery
Baloch 11 MAPLD 2005/1024-L
Temporal Sampling
Q
QSET
CLR
S
R
Q
QSET
CLR
S
R
Q
QSET
CLR
S
R
Q
QSET
CLR
S
R
Q
QSET
CLR
S
R
Q
QSET
CLR
S
R
Data
CLk-A
CLk-B
CLk-C
L1 L2
L6L5
L4L3
1
3
5 6
4
2
Primary Section
Secondary Section
Baloch 12 MAPLD 2005/1024-L
TEMPORAL SAMPLING Clock Scheme
• 3 derivates of Main Clock
• Each Clock is Phase shifted
• 25% duty Cycle
CLk-A
CLk-B
CLk-C
CLOCK
Computation Cycle
2 Clock Cycles
Baloch 13 MAPLD 2005/1024-L
Minimized TermX4.X3.X0 + X5.X3.X0 + X5.X4.X0 + X4.X3.X1 + X5.X3.X1 + X5.X4.X1 + X4.X3.X2 + X5.X3.X2 + X5.X4.X2 + X5.X4.X3 +
X3.X2.X1.X0 + X4.X2.X1.X0 + X5.X2.X1.X0
Weighted Voter Circuit
Baloch 14 MAPLD 2005/1024-L
SEU in Secondary Section
Node BeforeSEU
AfterSEU
Voting Weights‘1’ ‘0’
Total Votes ‘1’ ‘0’
1 1 1 2 -
8 1
3 1 1 2 -
5 1 1 2 -
2 1 0 - 1
4 1 1 1 -
6 1 1 1 -
Case Example
Baloch 15 MAPLD 2005/1024-L
Multiple Bit Upset
Node BeforeSEU
AfterSEU
Voting Weights‘1’ ‘0’
Total Votes ‘1’ ‘0’
1 1 1 2 -
5 4
3 1 0 - 2
5 1 0 - 2
2 1 0 1 -
4 1 1 1 -
6 1 1 1 -
Case Example
Baloch 16 MAPLD 2005/1024-L
Hardware Implementation of Proposed Scheme with
Auto-Correction Mechanism
Baloch 17 MAPLD 2005/1024-L
Single Event Transition FaultData / Clock
Baloch 18 MAPLD 2005/1024-L
SEU/SET Simulator•SEU’s can be injected at instance•SEU of any duration can be injected•Multiple upsets can be injected
Baloch 19 MAPLD 2005/1024-L
Performance AnalysisFault Coverage
Mitigation Scheme %age Fault Tolerance
SET SEU DEU TEU
Proposed Scheme 100% 100% 100% 50%
F. Lima etal Scheme 63% 100% - -
D. Mavis etal Scheme 100% 100% 32% 18%
Baloch 20 MAPLD 2005/1024-L
Performance AnalysisArea Overhead
0
50
100
150
200
250
300
350
400
450
Proposed Technique Mavis etal Technique
Are
a (
u s
qu
are
mete
r)
Results are based on:
0.13µm CMOS technology