cis testing technology
DESCRIPTION
CIS Testing Technology. 思衛科技 Jemmy Mobil Phone:0917866007 E-mail:[email protected]. Basic Introduction CIS Function CIS Test Item CIS Test System Production Issue. Contents. -What is CIS -CIS Application -CIS Market. Basic Introduction. Digital camera. Digital camera. CCD. - PowerPoint PPT PresentationTRANSCRIPT
思 衛 科 技Jetek Technology Corp.
CIS Testing Technology
思衛科技 JemmyMobil Phone:0917866007E-mail:[email protected]
思 衛 科 技Jetek Technology Corp.
Contents• Basic Introduction
• CIS Function
• CIS Test Item
• CIS Test System
• Production Issue
思 衛 科 技Jetek Technology Corp.
Basic Introduction
-What is CIS
-CIS Application
-CIS Market
思 衛 科 技Jetek Technology Corp.
What is CISCIS(CMOS Image Sensor)
Digital camera
CCDCCD
Digital camera
CCDCIS
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Note PC
PDA
Mobile Phone
Digital Camera
Video Camera
Fingerprint/Pupil
User AuthenticationCopy
MachineFacsimile/Scanner
Security Camera
In-vehicle Camera
Wristwatch Camera
CCD / CMOS Image Sensor
CIS Application
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CIS Market
思 衛 科 技Jetek Technology Corp.
CIS Market
思 衛 科 技Jetek Technology Corp.
CIS Function
-System Block
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System Block
CMOS Image Sensor
CDSADCAGC
DSP
TimingGenerator
VideoEncoder
Interface
Memory
DVP(Digital Video Port)
MIPI(Mobile Industry
Processor Interface)
NTSC/PAL
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Image Sensor Structure
思 衛 科 技Jetek Technology Corp.
Passive Sensor: Advantage: Simple circuit(one transistor) Large sensor area Disadvantage: Loading is higher Random noise is big
Active Sensor: Advantage: Electron convert voltage directly in each pixel Reduce radon noise Disadvantage: Small sensor area Amplifier character is different in each pixel Fixed pattern noise
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Digital Control Logic
•Timing generator• I2C Interface
Exposure control Frame Rate control Gain control Image size control Multi port output --------
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CDSCDS(Correlated Double Sampling)
Delay T
Vin Vout
+
_
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About Multi Port Output :
Clk limit solution for big area sensor
思 衛 科 技Jetek Technology Corp.
EnCoderMonochrome:
Color:
1 Hsync
1 Hsync
Chroma
Burst
Sync
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DVP Waveform Diagram
FEN: VSyncLEN: HSync
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MIPI Waveform Diagram
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Output Image:
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Output Signal(Internal ADC) :
Respons
e
Pixels
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CIS Test Item
• DC/Function Test• ADC Test• Image Test(Dark,Standard Light,Saturation,Color)• Image Processor Library
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DC Test• Continuity
• Leakage
• Power Consumption
• I2C Write/Read
• DSP Pattern
Function Test
CIS Test Item
ADC Test• Offset
• Gain
• INL / DNL
• THD
• S / N
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Dark Test
• Dark Mean/Std.
• Dark Row/Column Variation
• Dark uniformity
DSNU(Dark Signal non-uniformity)
• Dark Defect Pixel
• Dark Cluster
• Dark Current
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Dark Current
(Dark_level1-dark_level2)/(0.255-0.02) Dark_level1 : Exposure:255ms Dark_level2 : Exposure:20ms
Exposure Time(ms)20 255
Respons
e
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Defect Test
• Defect Pixel Test
• Adjacent Defect Pixel Test
Wound Pixel
Dead Pixel
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Adjacent Defect(Cluster)
Region Define
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Cluster Test Algorithm
• Build Convolution Filter
• Build Bed Pixel Map
• Cluster Judge Method
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Cluster Judge Method :
CMOS Imager
ΣXi
N Frames 1/N
Mean X
Bad Pixel Map
ConvolutionFilter
Count Judge
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Build Bed Pixel Map :
R
Mean
G
Mean
R
Mean
G
Mean
G
Mean
B
Mean
G
Mean
B
Mean
R
Mean
G
Mean
R
Mean
G
Mean
0 0 0 0
0 1 1 1
0 1 0 1
R
Value
G
Value
R
Value
G
Value
G
Value
B
Value
G
Value
B
Value
R
Value
G
Value
R
Value
G
Value
_
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0 0 0 0 0
0 1 1 1 0
0 1 0 1 0
0 0 0 0 0
0 0 0 0 0
1 16 2
64 256 128
8 32 4
416 460 352
274 211 273
16 3 16
Judge Method 1:
For 3 * 3:
You can judge the relation of bed pixels by value Ex: 274
*
1 1
1
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0 0 0 0 0
0 1 1 1 0
0 1 0 1 0
0 0 0 0 0
0 0 0 0 0
1 1 1
1 9 1
1 1 1
11 13 11
11 5 11
1 2 1
Judge Method 2:
For 3 * 3:
If the value >10 , There are 3 bad pixels in the 3*3 area(don’t care relation of bad pixels)
*
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Standard Light Test• Mean Level ( Light, R, G, B )• Std. ( Overall, R, G, B )• S/N ( Overall, R, G, B ) -FPN(Fixed Pattern Noise) -Random Noise• Row/Column Variation (R, G, B )• Uniformity (R, G, B ) PRNU(Photon Response non-uniformity) • Defect Pixel (Overall):Defect judge by R, G, B independently• Cluster
Ps1: G1, G2 maybe need to be separated
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Saturation Test
• Saturation Mean Level (Overall, R, G, B )
• Dynamic range (R, G, B)
20 * log( V_sat / V_noise)
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Color Frame Test
• R (G, B)Mean Value in R(G, B) Light
• R (G, B)Std. in R(G, B) Light
• Prime Response in R(G, B) Light
• Cross Response in R(G, B) Light
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Prime Response in R Light
(Light R Mean – Dark R Mean) / (Light Overall Mean – Dark Overall Mean)
Cross Response in R Light
((Light G(B) Mean – Dark G(B) Mean) / (Light R Mean – Dark R Mean)
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Micro Lens
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Color Filter
On-chip Micro Lens
PhotoShielding Film
Sensor Die
Micro-Lens
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Normalize Micro Lens Shift
By low pass filter:
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Solution1 for Micro Lens ShiftBy HW(Pupil Lens)
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1 1 1 1 1 1 1
1 1 1 1 1 1 1
1 1 1 1 1 1 1
1 1 1 10 1 1 1
1 1 1 1 1 1 1
1 1 1 1 1 1 1
1 1 1 1 1 1 1
1/9 1/9 1/9
1/9 1/9 1/9
1/9 1/9 1/9
1 1 1 1 1
1 2 2 2 1
1 2 2 2 1
1 2 2 2 1
1 1 1 1 1
×
Image Uniformize
1 1 1 1 1
1 2 2 2 1
1 2 2 2 1
1 2 2 2 1
1 1 1 1 1
1 1 1 1 1
1 1 1 1 1
1 1 10 1 1
1 1 1 1 1
1 1 1 1 1
1 1 1 1 1
1 0.5 0.5 0.5 1
1 0.5 5 0.5 1
1 0.5 0.5 0.5 1
1 1 1 1 1
÷
÷
Solution2 for Micro Lens ShiftBy SW
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CIS Test System
• System Structure• IP Module• Illuminator(Light Source)• Main System• Analog Module(option)• Debug Tool
思 衛 科 技Jetek Technology Corp.
DUT
Main System
Control Signal Sync
LightSource
IP Module(Frame Grabber
included)
Analog Module
Data Bus
Sync
Sync
AnalogWaveform
Data
Control & Result
Prober / Handler
System Structure
思 衛 科 技Jetek Technology Corp.
Docking method:
Light source connect with testhead directly
思 衛 科 技Jetek Technology Corp.
AC Power
illuminator
Testhead
Cable system
Top View
Prober
PIB (Prober Interface Board)
Docking with Prober (Cable system)
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Docking with Handler (Cable system)
Cable system
Handler
Testhead
illuminator
Side View
DIB (Device Interface Board
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IP Module
DUT
32 pinsmax.
Test Head
IP D
ata
I/F
DigitalImage
TimingControl& Setup
Digital Pins
DC Pins
LF/HF/VHF Pins
5pins:
FrameGrabberBoard
IP Controller
IP Cabinet
DC Test Functions
Digital Test Functions
Analog Test Functions
Time Measurement
MasterClocks
UIPTC
Tester Cabinet
Light SourceController
CRT &Keyboard
CRT &Keyboard
IP Module
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Illuminator
Light Source Structure
AGC
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Lamp AGC
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•Multi Sites (CP: Depend on Illuminator Area Size
FT: Depend on Illuminator multi sites Design)
•Area: Area Sensor >25*25 mm Line Sensor > 100*100 mm
•LUX: W > 1000 LUX
•Uniformity: < 3%
Illuminator Specification
For Blue Light
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•R/G/B/W Light (option)
•Pattern Turret (option)
•Shutter Turret
•F-number
•Calibration Table
•External / Internal Type
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Light Source Uniformity Measure Method :
(Lx max - Lx min) ((Lx max + Lx min)/2) *100 Uniformity (+/- %) = / 2
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F-Number=Focal Length / Iris Diameter
Light Source F-number :
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Select Illuminator:
Uniformity Halogen > LED
Spectrum Halogen > LED
Intensity Halogen > LED
Lamp Life Time Halogen < LED
Cost Halogen > LED
Color Temperature Halogen = LED
思 衛 科 技Jetek Technology Corp.
思 衛 科 技Jetek Technology Corp.
Compare External type Illuminator and Internal type Illuminator
•External type Illuminator(Cable Mount) Advantage: Mount handler/prober Easily Disadvantage: -Long cable effect test speed limitation -Need special handler/prober design
•Internal type Illuminator(Direct Mount) Advantage: -Signal performance is better -Use Standard handler/prober
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Main System / Analog Module
Waveform
Source
Waveform
Digitizer
Digital
DC
AWGSequencer
Waveform
DigitizerSequencer
DC DCData Memory
Test Vector
GeneratorPin
Electronics
Sequencer
Capture Memory
Digital
Capture Memory
Waveform
Source Memory
AWG
Digitizer
Syn
chro
-Pip
e
Time Measurement
Unit
TIAData
MemoryTime Interval
Analyzer
DigitalMaster
Sequencer
DualMasterClocks
Time Measure
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•DPS
•Digital I/O (Image data out not included) pin count : > 64 pins data rate : > 30MHz pattern depth : >2M
•Image Data Differential Transfer
•System Noise Floor : < -90dB
•Prober/Handler Control
•Illuminator (Light source) Control
Main System Specification
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Analog Module
• Digitizersample rate: > 40MHzresolution: >12Bits
• AWGsample rate: >40MHzresolution >12Bits
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Debug Tool
IP Image Viewer• Display Image• View Pixel Value and Color• Change Display Scale of image • Displaying Line Profile• Histogram
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思 衛 科 技Jetek Technology Corp.
• Socket
• Light Source
• Multi Sites
Production Issue
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Socket
Tester Load Board
Socket PCB
DUT
Socket
Pogo PinSocket Cover
Sensor Glass
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Light Source
• Adjust the light source focus
• Calibration Light Source
Light Source Correction(Use same type light Source)
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• Support a small hole light source
• Let’s the hole imagine put on the center of frame
• Adjust the light source focus
• Convert iris
Adjust Light Source Focus
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If the Slope is Sharp,The focus adjustment is good.
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Use different Light Source
Spectrum is the most important concern - light Source: Halogen or LED
- Color Temperature (Color Temperature ,Blue Response )
- Filter
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F-number is the other concern
思 衛 科 技Jetek Technology Corp.
Multi SitesFor wafer: Assign needle location