cic3d + qif symposium – oct. 3-5, 2017 - action engineering · –manual gage device cic3d + qif...
TRANSCRIPT
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Capturing Measurement Resources in the QIF Format
Edward Morse, Prashanth JaganmohanCenter for Precision Metrology
Department of Mechanical Engineering
UNC Charlotte, USA
CIC3D + QIF Symposium – Oct. 3-5, 2017
Topical outline
• The "Quality Process"
• The Quality Information Framework (QIF)
• QIF Resources Development
• Populating a QIF document with resources
• Conclusions & Looking Forward
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CIC3D + QIF Symposium – Oct. 3-5, 2017
The Quality Process
• Geometry Assurance ↔ Data Assurance
• Completeness
• Correctness
• Trust & Traceability
• Interoperability
CIC3D + QIF Symposium – Oct. 3-5, 2017
Quality workflow
Product Definition
Measurement Planning
Measurement Execution
Results, Analysis,& Reports
MBD
PLANS
RESULTS
RESOURCES
RULES
STATISTICS
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CIC3D + QIF Symposium – Oct. 3-5, 2017
How do we model these data?
• What is QIF?
• Feature‐Based Ontology of Manufacturing Quality Metadata
• XML Technology: Simple Implementation and Built‐In Code Validation
• Data semantically linked to Model for pure MBE implementation
CIC3D + QIF Symposium – Oct. 3-5, 2017
QIF Application Areas
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QIF Statistics
QIF Resources
QIF Rules
DMIS
QIF Results
CAD and PMI data
QIF MBD
Bill of Characteristics (“what”) and Measurement Plan (“how”) data
Measurement Resource information
Measurement templates, macros, and best practices
ISO/DMIS 5.3 is fully linked to QIF
Measurement result data
Statistical process control using QIF
QIF Plans
QIF Library
ISO 22093Industrial automation systems and integration ̶ Physical device control ̶ Dimensional Measuring Interface Standard (DMIS)
ISO 22093Industrial automation systems and integration ̶ Physical device control ̶ Dimensional Measuring Interface Standard (DMIS)
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CIC3D + QIF Symposium – Oct. 3-5, 2017
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2
34
5
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QIF Statistics
QIF Resources
QIF Rules
DMIS
QIF Results
CAD and PMI data
QIF MBD
Bill of Characteristics (“what”) and Measurement Plan (“how”) data
Measurement Resource information
Measurement templates, macros, and best practices
ISO/DMIS 5.3 is fully linked to QIF
Measurement result data
Statistical process control using QIF
QIF Plans
QIF Library
QIF Application Areas
CIC3D + QIF Symposium – Oct. 3-5, 2017
QIF Resources
• The role of the QIF Resources schema is to provide a model that supports all of the information about measuring equipment that would be needed by a measurement planner.
• Examples related to a CMM include: measuring volume, accuracy statement (possible including details of the testing method), probing access directions (where appropriate), and calibration status.
• This information is necessary both for measuring equipment selection, and in detailed measurement planning once the equipment has been identified.
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CIC3D + QIF Symposium – Oct. 3-5, 2017
Evolution of QIF Resources
Version 2.0
• Cartesian CMM
• Caliper
• Gage (comparator type)
Version 2.1
• Hierarchy of instruments
• CMMs (many types)– Also, explicit CMM component
descriptions
• Sensors– CMM sensors & others
• Hand Gages– Manual gage device
CIC3D + QIF Symposium – Oct. 3-5, 2017
Upper hierarchy
Measurement Device Type
Universal Device Type
CMM Type
Cartesian CMM Type
Light Pen CMM Type
Parallel Link CMM
Type
Articulated Arm CMM
Type
Theodolite Type
Universal Length Measuring
Machine Type
Computed Tomography
Type
… additional Types
Universal Device Type hierarchy in
QIF Measurement Resources
Hierarchy
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CIC3D + QIF Symposium – Oct. 3-5, 2017
Overview of Inheritancefor Measurement Resources
CIC3D + QIF Symposium – Oct. 3-5, 2017
• Light-Pen CMM
• Multiple Carriage CMM
• Parallel Link CMM
• Comparator
• Equator
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CIC3D + QIF Symposium – Oct. 3-5, 2017
• Micrometer
• Sine Bar
• Microscope
• Profile Projector
• Theodolite
• Universal Length Measuring
Machine
CIC3D + QIF Symposium – Oct. 3-5, 2017
• Tool with Capacitive Sensor
• Tool with Confocal Chromatic Sensor
• Tool with DVRT Sensor
• Tool with Draw Wire Sensor
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CIC3D + QIF Symposium – Oct. 3-5, 2017
• Tool with Magneto Inductive Sensor
• Tool with Structured Light Sensor
• Tool with Tactile Probe Sensor
• Tool with Ultrasonic Sensor
CIC3D + QIF Symposium – Oct. 3-5, 2017
Current state
• We have an extensive structure that supports recording and organizing metrology resources.
• Question: How do we populate this structure?
• Proposed solutions:1. provide assistance to someone who will enter the
data as they move through the metrology lab (or shop floor)
2. automate the extraction of resource data from an existing database
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CIC3D + QIF Symposium – Oct. 3-5, 2017
Objectives for the first solution
• Develop an app that enables cataloging of the measurement resources of an enterprise in the QIF format
• Use the results from this process to update the QIF standards: specifically, filling in gaps and reducing ambiguity for the measurement resources schema definition.
CIC3D + QIF Symposium – Oct. 3-5, 2017
Proposed features of the app
• Catalog
– Ability to add, edit, and update information on any available device within the defined hierarchy
– Ability to add multiple similar devices at once, when they share similar attributes with the exception of unique identifiers (such as serial number)
– Provide database query capabilities, including simple search functions, report generation, etc.
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CIC3D + QIF Symposium – Oct. 3-5, 2017
Proposed features of the app
• Version
– Ability to log in with employee credentials to authenticate changes
– Display of most recent version along with log of changes made throughout the resources section
– Cloud storage and syncing to ensure that the most recent version is available to all devices that use the app within the enterprise.
CIC3D + QIF Symposium – Oct. 3-5, 2017
Additional possible features
• MBD support:
– Ability to open model files and visualize the product definition along with Product Manufacturing Information (PMI) within the app environment
– Ability to generate Model Based Data in QIF format for export or use in other sections of the app.
• e.g. enter permanent fixture data that accompanies another measurement resource.
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CIC3D + QIF Symposium – Oct. 3-5, 2017
The application in use …
CIC3D + QIF Symposium – Oct. 3-5, 2017
Output in an xml file
(QIF Document)
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CIC3D + QIF Symposium – Oct. 3-5, 2017
Conclusions / Future Directions• Systematic modeling of quality data allows greater
automation, optimization, and traceability throughout the quality enterprise.
• There are remaining opportunities for better understanding of how metrology resources can be characterized and what rules are needed for both the selection and application of metrology equipment.
• I encourage the use of these data models by my colleagues to share our models, resources, rules, and results with industry and with each other.
CIC3D + QIF Symposium – Oct. 3-5, 2017
Thank you
• Acknowledgements
– UNC Charlotte's Center for Precision Metrology
– NIST (Agreement #70NANB14H254)
– CIC3D's organizers, sponsors, and attendees