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Carrier-envelope phase stabilization of modelocked lasers Tara M. Fortier, David J. Jones, Jun Ye and Steven T. Cundiff JILA, University of Colorado and National Institute of Standards and Technology, Boulder, CO 80309-0440 [email protected] Summary. We present advances in carrier-envelope phase stabilization of modelocked lasers within the scope of both optical frequency metrology and ultrafast science. By drawing on the techniques of single-frequency laser stabilization and on improvements of ultrafast lasers, phase stabilization of Ti:sapphire (Ti:S) lasers has led to great advances in both the fields of optical frequency metrol- ogy and ultrafast phenomena [JDR + 00]. In the former, it has resulted in the realization of an all optical atomic clock [DUB + 01, YMH01] and in the latter it has allowed for waveform synthesis of ultrashort (2 cycle) pulses [PGW + 01]. In this paper, we report on both development of the technology of and experimental results for modelocked laser stabilization. Phase coherence measurements to characterize various noise sources that lead to contamina- tion of the carrier-envelope phase are discussed. Using this highly phase sta- ble laser, we discuss a lock-in based technique to measure phase fluctuations and extra-cavity changes in the carrier-envelope phase due to propagation through a dispersive material. We also present an octave spanning Ti:S laser, which allows for carrier-envelope phase stabilization without the use of exter- nal broadening in fiber. 1 Background The spectrum of a modelocked laser is a frequency comb characterized by two radio frequencies (rf). One of these frequencies is the laser repetition rate, f rep , which determines the comb spacing. The second is the offset frequency, f 0 , which determines the absolute position of the comb. As a result the frequency of the n th comb line, ν n , is represented by: ν n = nf rep + f o (1)

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Page 1: Carrier-envelope phase stabilization of modelocked lasersCarrier-envelope phase stabilization of modelocked lasers 3 harmonic comparison (Fig. 1) [JDR+00]. The comb-offset frequency

Carrier-envelope phase stabilization ofmodelocked lasers

Tara M. Fortier, David J. Jones, Jun Ye and Steven T. Cundiff

JILA, University of Colorado and National Institute of Standards and Technology,Boulder, CO 80309-0440 [email protected]

Summary. We present advances in carrier-envelope phase stabilization ofmodelocked lasers within the scope of both optical frequency metrology andultrafast science.

By drawing on the techniques of single-frequency laser stabilization andon improvements of ultrafast lasers, phase stabilization of Ti:sapphire (Ti:S)lasers has led to great advances in both the fields of optical frequency metrol-ogy and ultrafast phenomena [JDR+00]. In the former, it has resulted inthe realization of an all optical atomic clock [DUB+01, YMH01] and in thelatter it has allowed for waveform synthesis of ultrashort (∼ 2 cycle) pulses[PGW+01]. In this paper, we report on both development of the technology ofand experimental results for modelocked laser stabilization. Phase coherencemeasurements to characterize various noise sources that lead to contamina-tion of the carrier-envelope phase are discussed. Using this highly phase sta-ble laser, we discuss a lock-in based technique to measure phase fluctuationsand extra-cavity changes in the carrier-envelope phase due to propagationthrough a dispersive material. We also present an octave spanning Ti:S laser,which allows for carrier-envelope phase stabilization without the use of exter-nal broadening in fiber.

1 Background

The spectrum of a modelocked laser is a frequency comb characterized by tworadio frequencies (rf). One of these frequencies is the laser repetition rate, frep,which determines the comb spacing. The second is the offset frequency, f0,which determines the absolute position of the comb. As a result the frequencyof the nth comb line, νn, is represented by:

νn = nfrep + fo (1)

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2 Fortier T.M. et al.

Here, n is a large integer multiplying frep up into the optical regime. Stabi-lization of both frep and f0 results in an absolute optical comb with approx-imately 106 coherent lines spanning the visible to near IR. This provides aconvenient secondary reference to which other oscillators, single frequency orpulsed, may be synchronized. Additionally, phase stabilization of the comblocks the evolution of the carrier-envelope (CE) phase of the pulse electricfield, φCE [JDR+00, Cun02]. φCE is defined as the phase difference betweenthe peak of the carrier wave relative to the pulse envelope, and it’s evolutionis related to the offset frequency via

f0 =12π

dφCE

dt. (2)

The major advance in the Ti:S stabilization scheme is measurement of f0 in-dependent of a secondary optical standard. The measurement scheme uses theTi:sapph laser spectrum for self-comparison by referencing harmonics at thespectral extremes, |N(nfrep + f0)−M(mfrep + f0)| [TSD+99]. Here, the twoharmonic numbers, N and M , are chosen such that spectral overlap is ob-tained, i.e., Nn = Mm. Interference between the two harmonics then directlyyields the rf beat signal (N −M)f0. A drawback of this measurement scheme,however, is that it requires a large bandwidth. For the simplest scheme, whereN = 1 and M = 2, the required bandwidth is an optical octave, which hasnot typically been available from a Ti:S laser alone. Microstructure (MS) fibertechnology provides a simple solution as it enables continuum generation usingthe pulse energy available directly from the laser output [RWS00].

Fig. 1. Experimental apparatus of a carrier-envelope phase-stabilized fs Ti:S laser.The box in the lower left shows the ν–to–2ν interferometer used to measure f0. AnAOM is included in the ∼530 nm arm of the interferometer to shift the frequencyof one arm relative to the other such that f0 may be set to zero.

Using the generated continuum the laser offset frequency is measured us-ing a ν–to–2ν interferometer, which performs the necessary N = 1, M = 2

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Carrier-envelope phase stabilization of modelocked lasers 3

harmonic comparison (Fig. 1) [JDR+00]. The comb-offset frequency is mea-sured as an rf signal that results from the optical heterodyne beat betweenthe green portion (∼530 nm) and the doubled near IR portion (∼1060 nm) ofthe spectrum. Once the signal is measured, it is filtered, amplified and used ina feedback loop for comparison against a known reference. Negative feedbackto stabilize f0 is actuated by either tilting the laser end mirror after an intra-cavity prism sequence, or via amplitude modulation of the laser pump power(Fig. 1). For details about the feedback electronics and mechanisms and therepetition rate lock see Ref. [CYH01].

The stability of the two characteristic frequencies is important in deter-mining the quality of the optical comb. In metrology, the width of the comblines presents a primary limit on precision. Given Eqn. 1, the dominant contri-bution to the optical linewidth results from fluctuations in frep. For ultrafastapplications, however, it is small fluctuations in f0 relative to frep that areimportant because they cause an accumulated phase error in φCE .

2 Carrier-envelope phase coherence

As mentioned above, the evolution of the CE phase is directly related tothe laser offset frequency via Eqn. 2, yielding φCE(t) = 2πf0t + φ0. Iff0 is stabilized to a frequency derived from the laser repetition rate, thevalue of f0 fixes the pulse-to-pulse phase shift in the carrier-envelope phase,∆φCE = 2π f0/frep. The constant offset, φ0, often termed the “absolutephase,” determines the initial phase shift (at t = 0) between the carrier andthe pulse envelope, making it an important parameter in field sensitive experi-ments. As a matter of course, fluctuations of f0 are manifested as phase noise,∆φ(t), on φ0. Therefore, for ultrafast experiments relying on the stability ofthe CE phase [Die00, PGW+01], knowledge of φCE ’s stability is paramount asthe dephasing of φ0 determines the duration of a phase sensitive measurement.In this section, we present coherence time measurements of a stabilized Ti:Slaser. These measurements, aside from determining the time scale over whichthe light pulses remain coherent, also give the quality of the servo system andaid in identifying the contributions due to the different noise sources withinthe stabilization loop.

Given the direct relationship between φCE and f0, knowledge of the sta-bility of the offset frequency directly yields that of the carrier-envelope phase.The stability of the offset frequency is determined from its lineshape. Thenoise analysis is straight forward since the spectrum of sidebands at frequen-cies relative to the carrier, ν, yield the power spectral density (PSD), Sφ(ν),of the phase noise [YCF+02],

∆φrms|τobs=

√2

∫ −1/(2πτobs)

−∞Sφ(ν) dν. (3)

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4 Fortier T.M. et al.

Integration of the noise spectrum yields the total accumulated phase error onφCE , ∆φrms, due to frequency noise on f0. Specifically, integration of Sφ(ν)up to an observation time, τobs, over which ∆φRMS accumulates ∼1 radian isgenerally taken to define the coherence time, τcoh.

Fig. 2. Experimental setup showing how the coherence of φCE is measured. Oneinterferometer is used to stabilize the laser while the second ν–to–2ν interferometerdetermines the phase coherence. The noise of the second interferometer is minimizedby making the ν–to–2ν comparison as common mode as possible by using prismsfor spectral dispersion.

We determine the carrier-envelope phase coherence time of a stabilizedKerr-lens modelocked Ti:S laser capable of producing 10 fs pulses. The laseruses prisms for intra-cavity dispersion compensation [FMG84]. The laser base-plate is temperature controlled and the laser is itself encased in a pressuresealed box. Negative feedback is obtained with a bandwidth of ∼ 18 kHz viatilting the laser end mirror using a piezo-electric actuator (PZT). To performan out-of-loop measurement of the offset frequency phase noise, we utilizetwo ν–to–2ν interferometers (Fig. 2) [FJY+02]. One interferometer stabilizesthe laser, while the second determines the carrier-envelope phase noise from aphase sensitive measurment of f0. The phase noise PSD is obtained by mixingf0 down to base band where the noise sidebands are measured using a signalanalyzer (see Fig. 2).

Figure 3 presents the results of the coherence measurement. A measure-ment of the unstabilized offset frequency and that of f0 used for locking areincluded, comparison of the two indicates the noise suppression. The latterprovides an in–loop phase noise measurement that is used only to determinethe effectiveness of the stabilization circuitry. The difference between the out–of–loop and in–loop spectra yields the extra-cavity phase noise present within

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Carrier-envelope phase stabilization of modelocked lasers 5

Fig. 3. (left axis)Phase power spectral density, Sφ(ν), for the in-loop, solid line, andout-of-loop spectra, dashed line, of the comb offset frequency . (right axis)Integrationof Sφ(ν) yields the accumulated phase error as a function of observation time (topaxis).

the stabilization loop (e.g., feedback electronics, the ν–to–2ν interferometer,microstructure fiber, etc.) and the differential noise between the two loops.This noise is written onto the output of the laser, as the servo system usesthe laser to compensate for extra-cavity noise. Integration of the phase noisePSD out–of–loop (in–loop), in Fig. 3 results in an accumulated phase error of0.109 rad (0.08 rad) over the interval 102 kHz down to 488 mHz (resolutionlimited). Given that the out-of loop accumulated phase error is less than 1rad, the lower frequency integration bound determines the coherence time,τcoh = 1/(2π 244µHz) = 652 s.

Comparison between the unlocked and the in-loop phase noise PSD den-sities indicates a servo bandwidth ∼ 20 kHz. The in-loop PSD shows thatadditional phase noise results from the action of the servo loop at frequencieshigher than 20 kHz, and that there is insufficient gain in the acoustic range(∼100 Hz - 5 kHz). This frequency range is also responsible for the majorityof the out–of–loop phase noise contribution. From Fig. 3, given that the out–of–loop accumulated phase error is less than 1 rad, the lower frequency inte-gration bound determines the coherence time, τcoh = 1/(2π 244µHz) = 652 s.This indicates that phase coherence is maintained for > 65 billion pulses.

A major source of out–of–loop noise in the ν–to–2ν stabilization is the MSfiber, where amplitude noise on the laser output is converted to phase noise viathe fiber nonlinear index of refraction [FYCW02]. This is detrimental whenthe direct output of the laser is to be used in an experiment, however it doesnot affect an experiment that uses the output of the microstructure fiber.A shortcoming of the dual interferometer method is that MS fiber is usedin both interferometers, which because of common mode power fluctuationsmay result in a net cancellation of fiber generated noise in the out-of-loopmeasurement. To estimate the contribution of fiber noise, we measure the

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6 Fortier T.M. et al.

Fig. 4. (left axis) Phase noise spectrum for the unlocked laser, locked using an AOMin the pump beam and locked using the fast PZT. (right axis) Accumulated phasejitter obtained by integrating the spectra for the two locked cases.

laser amplitude fluctuations and use them in conjunction with the amplitude-to-phase conversion factor for MS fiber [FYCW02]. This measurement is alsoused to compare the induced fiber noise by the PZT stabilization schemedescribed above to that obtained via modulation of the laser pump power[PHA+01]. Stabilization using the latter method is actuated by placing anAOM in the path of the pump beam for the Ti:S.

One drawback of modulating the pump power as a means for feedbackto the Ti:S oscillator is the possibility of inducing fluctuations on the out-put power [HSK+02]. Figure 4 shows the amplitude noise PSD as well as thecalculated accumulated fiber phase noise of the PZT versus AOM stabilizedsystems. A spectrum of the amplitude noise for the unstabilized laser is shownfor comparison. As can be seen in Fig. 4, the PZT system contributes littleadditional amplitude noise during stabilization, whereas the opposite is truefor the AOM stabilized laser. Integration of the AOM and PZT stabilizednoise spectra from 8 Hz to 3.2 kHz yields the percent rms fractional laserpower fluctuation, (∆P/P0)rms, to be 0.00473 and 8.34 × 10−5, respectively.For a coupled laser power of 50 mW at 100MHz and an amplitude-to-phaseconversion coefficient for MS fiber of 3784 rad/nJ [FYCW02], the amplitudenoise would result in 8.78 rad of phase jitter for the AOM stabilized system.To connect back to the coherence measurement, the additional fiber noise con-tributed by the PZT stabilized system to the accumulated out-of-loop phasenoise presented in Fig. 3 is determined to be 0.155 rad rms. This measuredfiber noise then brings the total accumulated phase noise (fiber generatednoise + out-of-loop phase noise (Fig. 3) to 0.264 rad.

3 Phase sensitive detection of φCE

In an ideal case, the phase of the f0 signal includes the overall “absolute”phase φ0. Since a phase-locked loop establishes a fixed phase, it seems that

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Carrier-envelope phase stabilization of modelocked lasers 7

φCE is fully determined by the reference signal to which f0 is locked, or that aphase sensitive measurement of the f0 signal gives full knowledge of φCE . Onelimiting case is f0 = 0 in which case φCE does not evolve pulse–to–pulse andthus is just given by φ0. However, any ν–to–2ν interferometer is non-ideal andintroduces an arbitrary phase shift that prevent this direct connection frombeing correct. This is illustrated in Fig. 5. The phase shifts in the ν–to–2νinterferometer arise from differences in the path length of the two arms anddispersion in any optical elements. (In principle an explicit interferometer isnot needed if a chirp free pulse is used, however there is still unavoidabledispersion in the second harmonic crystal.)

Fig. 5. Schematic showing relationship between pulse train and interferometer out-put. a) Pulse train showing pulse-to-pulse change in ∆φCE = π/4. b) Output ofν–to–2ν interferometer, solid line is the output of an ideal interferometer where zerosignal is coincident with the pulse that has φCE = 0. However, an actual signal froman interferometer has an arbitrary phase shift relative to the ideal signal.

Nevertheless it is still useful to make phase sensitive measurement of the f0

signals in our dual interferometer setup [FJYC02]. With a dual-phase lock-in,it is possible to directly measure the phase difference between the referencechannel and signal channel. As shown in Fig. 6, we phase lock f0 to a ref-erence frequency fref using one of the ν–to–2ν interferometers. As before,the acousto-optic modulator (AOM) in one arm facilitates locking f0 at lowfrequencies as it offsets the beat note to higher frequencies. To be able to usea standard lock-in, we choose fref ∼ 100 kHz. This signal is also provided tothe reference channel of the lock-in. The output of the measurement ν–to–2νinterferometer is presented to the signal input of the lock-in. We then recordthe phase output of the lockin. We emphasize that this phase is a relativephase between the two channels, not φCE , and that φCE is evolving becausef0 �= 0.

This measurement allows a direct visualization of the phase fluctuations.Figure 7 shows a 400 sec time record of the lock-in phase for an integrationtime of 100 ms. The standard deviation of the phase fluctuation is 3.8 degrms (0.066 rad), with a maximum deviation of 20.8 deg (0.363 rad), whichclearly shows that phase coherence is maintained. This result is related to

Page 8: Carrier-envelope phase stabilization of modelocked lasersCarrier-envelope phase stabilization of modelocked lasers 3 harmonic comparison (Fig. 1) [JDR+00]. The comb-offset frequency

8 Fortier T.M. et al.

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Fig. 6. Diagram of experiment used to monitor the relative φCE using a lock-inamplifier.

the jitter measurement in section 2 by a Fourier transform where lower limiton the observation time is determined by the lock-in integration time. Thismeasurement is more appropriate for measuring long time scale phase dynam-ics, where as the phase noise spectrum is better for characterizing short timescales.

Fig. 7. Time record of the lock-in phase (lower trace, left axis) and amplitude (uppertrace, right axis). The inset shows an enlargement to show that the amplitude andphase fluctuations are uncorrelated.

This technique also promises to be very useful in searching for phase de-pendent processes. The extraordinary sensitivity of the phase sensitive detec-tion performed by a lock-in allows very small signals to be retrieved. This isenabled by using a lock interferometer to establish a phase stable reference.

Page 9: Carrier-envelope phase stabilization of modelocked lasersCarrier-envelope phase stabilization of modelocked lasers 3 harmonic comparison (Fig. 1) [JDR+00]. The comb-offset frequency

Carrier-envelope phase stabilization of modelocked lasers 9

4 Extra-cavity adjustment of φCE

Using the same apparatus as in the previous section, we can demonstrate thatthe ν–to–2ν interferometer is able to track shifts in φCE and the capabilityof adjusting φCE outside the laser cavity by simple propagation through adispersive optical element. Specifically, we insert a 70 µm thick fused silicaplate before the measurement interferometer. The plate is rotated to achieve avariable path length. The difference between group and phase velocities causesa shift in φCE . Because of the arbitrary phase shifts in the interferometers,we measure the change in the phase due to a change in the angle of the plate.We set the phase to be zero for normal incidence. The results are shown inFig. 8. The curved line shows calculations based on the known dispersion offused silica, which yields very good agreement with the experiment.

Fig. 8. Measured shift in φCE as a function of plate angle, θ, (circles). Line showschange φCE calculated from the Selemeier coefficients for fused silica

These results demonstrate that it is possible to impose a fixed shift in φCE

and that it agrees well with the expected values. This capability will be usefulas progress is made in experiments that are directly sensitive to φCE as it willallow systematic studies to be made. It also provides a means for correctingφCE using a feedback loop.

5 An octave spanning Ti:sapphire laser

Aside from the problems posed by fiber induced phase fluctuations, stabi-lization of Ti:S laser using MS fiber presents challenges to short pulse ex-periments because of fiber dispersion. Additionally, complexities in the fiberalignment often lead to loss of fiber coupling and degradation in the f0 signalover time. This hinders optical frequency metrology since long term averag-ing is necessary to increase the measurement precision. Thus, a laser thatdirectly generates an octave is preferable. In this section we present an oc-tave spanning, conventional geometry Ti:S laser using intra-cavity prisms and

Page 10: Carrier-envelope phase stabilization of modelocked lasersCarrier-envelope phase stabilization of modelocked lasers 3 harmonic comparison (Fig. 1) [JDR+00]. The comb-offset frequency

10 Fortier T.M. et al.

negatively chirped mirrors. This has the advantage over a previously demon-strated octave spanning laser [EMK+01] in that the laser does not requireprecise intra-cavity dispersion compensation, nor does it require the use ofan auxiliary space and time focus. We support the definition of octave span-ning by demonstrating stabilization of the carrier-envelope phase using thebandwidth from the laser alone.

The octave spanning laser presented here is an x-folded cavity that utilizesCaF2 prisms and commercially available negative chirped mirrors [FJT] forintra-cavity dispersion compensation (Fig. 9). The generation of intra-cavitycontinuum is obtained via optimization of self-phase modulation (SPM) inthe laser crystal. The latter is obtained by strong misalignment of the curvedmirrors away from the optimal cw position, which results in the productionof a highly asymmetric and highly focused cw beam. When pumped with 5.5W of 532 nm light the spectrum spans from 580 nm to 1200 nm ( 40 dB downfrom the 800 nm portion of the spectrum) with an average power of 400 mW(100 mW, cw) at a ∼ 88 MHz repetition rate [FJT].

Fig. 9. (a) Experimental schematic of the Ti:S laser and the ν–to–2ν interferometerused for measurement of the laser offset frequency. The inset shows the rf spectrum off0 at a 100 kHz resolution bandwidth. (b) Phase noise power spectral density (PSD)of the stabilized f0 versus frequency (left and bottom axes) and the integrated phaseerror as a function of observation time (right and top axes).

To demonstrate that the spectrum is indeed octave spanning, we measuref0 using the laser output directly, i.e., without external broadening. This isdone with a ν–to–2ν interferometer that uses prisms for spectral dispersion(not for compression) as shown in Fig. 9. The beat signal is detected usinga fast photomultiplier tube (PMT) and yields a maximum signal–to–noiseratio of 30 dB at 100 kHz resolution bandwidth. This signal is then usedto stabilize the laser using the PZT scheme described in section 2. Figure9 presents the stabilization results. The phase noise PSD presented is anin-loop measurement of the offset frequency, which, as explained previously,may not reflect the total noise on the laser output. However, the use of theoctave spanning laser eliminates MS fiber noise. Interferometer noise is also

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Carrier-envelope phase stabilization of modelocked lasers 11

minimized by making the ν–to–2ν comparison as common mode as possible.As a result, the main contribution to the out-of-loop phase noise should stemfrom the feedback circuitry.

Fig. 10. The laser beam profile is displayed for selected wavelengths. A 10/90knife edge fit was used to determine the spot sizes in the sagittal (filled squares) andtangential (empty squares) planes, displayed at the right of the figure. The solid anddashed lines are the respective fits to the expected 1/λ diffraction limit divergence.(Some of the diffraction rings observed for the larger beam modes may result fromaperturing of the laser mirrors.)

An interesting aspect of the generated continuum is the laser beam spatialprofile as a function of wavelength [CKIH96]. Because of the extreme breadthof the spectrum, light generated in the spectral wings is not resonant in thecavity and thus is not forced to obey the cavity transverse spatial mode con-ditions. This results in the production non-Gaussian modes (Fig. 10), whichcause poor mode-matching between the ν and 2ν portions of the spectrum.The change in spot size of the beam as a function of wavelength, observed inFig. 6, is the result of a sudden decrease in waist size for light in the wings ofthe spectrum, as shown in Fig. 11a. The beam waist is obtained from an M2

measurement of the light at the output coupler. Because the beam param-eters are derived using Gaussian beam propagation theory, they are simplymeant to indicate a trend versus wavelength. The value of M2 is obtainedby comparing the ratio of measured divergence (Fig. 11b) with the divergencecalculated for a TEM00 beam using the respective measured waists in Fig. 11a.This value indicates the strength of the non-ideal Gaussian mode propagation(higher order or non-Gaussian modes.)

6 Summary

This chapter has described a small contribution to remarkable advances thathave been possible over the last few years by combining ultrafast lasers withfrequency domain techniques for stablizing CW lasers. Further advances areopening new possibilities for controlling the electric field at optical frequencies.

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12 Fortier T.M. et al.

Fig. 11. (a) Measured beam waists and (b) measured beam divergence at the laseroutput coupler of the laser in the sagittal (filled squares) and tangential planes(empty squares) versus wavelength. Also show in (a), the output coupler trans-mission (right axis) is included to indicate the bandwidth of the resonant versusnonresonant modes. In (b) the solid and dotted lines are the calculated TEM00

beam divergences from the measured waist sizes [shown in (a)] in the sagittal andtangential planes, respectively.

Acknowledgments. The authors would like to acknowledge the contribu-tions of J. Hall, and R. Windeler to this work. Funding is provided by NIST,NSF, DARPA and ONR.

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