analogfront-end electronics in beam instrumentation

2005 by A. Boscolo

Analog front-end electronics in beam instrumentation

Basic instrumentation structure

Silicon state of art

Sampling state of art

Instrumentation trend

Comments and example on BPM

Future Beam Position Instrumentation

Conclusions

2005 by A. Boscolo

Basic measurement and control process

Coded targetdescription

Measurement process

Control process

Inputtransducers

sensorsFront_end CODEC Symbolic

processorCoded

information

Output transducersactuators

Driver SymbolicprocessorDECODEC

Physical domain

event Symbols

domain

abstract

2005 by A. Boscolo

Generalized informationcapture process

[information carrier]

[E][D][C][C][C][A] [B]

Input transducer Processing Output transducer

2005 by A. Boscolo

Generalized information capture process

example

[L][V][V][V][R][P] [ε]


Elasticdevice

Piezoresistivedevice τs

G+1

( )iu VfV = Magnetoelectricdevice

R/Vconverter

2005 by A. Boscolo

Generalizedinstrumentation architecture

SensorsPhysic

processor(analog)

CODEC(A/D)

Symbolic processor(numeric)

Coded information(measure)

[A] [B] [B] [code] [code] [code]

[information carrier]

2005 by A. Boscolo

Classification criteria

SystemAmplitudeTime

Full digitaldiscretediscrete

Sampledcontinuousdiscrete

Full analogcontinuouscontinuous

2005 by A. Boscolo

Classification criteria

Full analog (Time Continuous) is one must in:

Impedance converterCommon mode rejectionHigh speed comparatorAnti aliasing filterGHz oscillator

2005 by A. Boscolo

Generalizedinstrumentation architecture

Instrument

is an information based device capable to capture and to refine information from the physical word

2005 by A. Boscolo

Generalized instrumentation architecture

sensors cabling protection TCprocessing

TDprocessing coding Symbolic

processing

Rawinformation

Refinedinformation

measureevent

Physical word

Abstract word

The best choice is a synergic mix of the three different approach: analogic, sampled and numeric

2005 by A. Boscolo








Conclusions

2005 by A. Boscolo

Silicon State of artthe MOS

Cross-sectional transmission electron micrograph of 50 nm gate length mosfet

2005 by A. Boscolo

Silicon State of art

This year we are celebrating the40th anniversary of Moore's Law

2005 by A. Boscolo

Silicon State of artNTRS and ITRS National and Internationals

Roadmap for Semiconductors

2005 by A. Boscolo

Silicon State of artMosfets scaling limit

Open problems

Gate insulatorsGate electrodesShallow junctionsJunction contacts

Some solutions

Copper + low εr

SOI silicon on insulatorStrained siliconHigh εr gate insulator

2005 by A. Boscolo

Silicon State of art Driven force

Embedded applications navigator, automotive, medical, consumer

Personal communication one chip systemsHome automation and Digital home

New processorsHigh speed serial bus (10Gb/s) IEEE 802.11,IEEE 1394

2005 by A. Boscolo

Silicon State of art

Current availability

65nm CMOS technologyTHz transistors100Gsp/s electric sampling rate oscilloscope

2005 by A. Boscolo








Conclusions

2005 by A. Boscolo

Sampling State of artthe optoelectronic solution

2005 by A. Boscolo

Sampling State of artthe optoelectronic solution

Time stretcher analog to digital converter

Physical implementation of the time-stretch preprocessing. Single SideBand (SSB) modulation removes the electrical bandwidth limitation imposed by dispersion. The differential Mach-Zehnder (MZ) modulation is used to remove common-mode distortion

Time-stretch Analog-to-Digital Conversion . (a) with a time-limited input signal, and (b) with a continuous-time input signal.

2005 by A. Boscolo








Conclusions

2005 by A. Boscolo

Instrumentation trends

General technological improvement

Large number of components

Availability of good analog switch

Key factors:

2005 by A. Boscolo


New class of device where all the techniques are fused together in

order to optimize the cost performance ratio

Adaptive analogelectronic

Embedded controller

Switched capacitor technique

Tuning methods

Performance evaluation

Testembedded

Measurement methods

2005 by A. Boscolo


event

Physical word

Rawinformation

measure

Abstract word

System on chip (soc)

sensors wiring protection TCprocessing

TDprocessing

coding Symbolicprocessing

Embeddedtest & tuning

Embedded controller

conditioning



Gateway

Refinedinformation

Smart sensor

2005 by A. Boscolo


Mixed Signal Array with On-Chip Controller

Low level differential high speed (>2Gsps) ADC

SSP sensor signal processor

FPAA field programmable analog array

PSoC™ programmable systems-on-chip

2005 by A. Boscolo


Low level differentialhigh speed ADC

(>2Gsps up to10 bit )

2005 by A. Boscolo


SSP sensor signal processor

2005 by A. Boscolo


FPAA field programmable analog array

Configurable Analog Blocks (CABs)Switched capacitor based

2005 by A. Boscolo


Software design environmentSimple implementation of complex functionsRapid prototype and test

FPAA platformAddresses multiple sensorsAllows tuning the data acquisition board for multiple sensorsZoom in on specific portions of the sensor curve

Signal conditioningAdaptive under real time controlAdded precisionLow latency

2005 by A. Boscolo


FPAA Feature/Benefits

On-Chip; DC references, oscillators, custom waveform generatorsTemperature stable, no driftLower cost of goods

Programmable and ReconfigurableFPAA can adapt to different sensor conditioning needsMultiple sensor conditioning circuits can be built on a single FPAA

Dynamic reconfigurabilityAdaptive and preciseAuto frequency and gain controlAuto compensationAuto calibrationCompetitive advantage

2005 by A. Boscolo


PSoC™programmable systems-on-chip

Configurable Analog Blocks (CABs)Switched capacitor based

2005 by A. Boscolo


The PSoC

consists of many Mixed-Signal Array with On-Chip Controller devices.

replaces multiple traditional MCU-based system components with one, low cost single-chip programmable component

includes configurable blocks of analog and digital logic, as well as programmable interconnect

2005 by A. Boscolo

Example

Goals:

Global Accuracy 1%Resolution 0.5 % (8 bit)

( )

elsewhere 0 ;0,0,0,for

,,1

≥>≥≥

⎪⎭

⎪⎬⎫

⎪⎩

⎪⎨⎧

⎟⎠⎞

⎜⎝⎛ −=

⎟⎠⎞

⎜⎝⎛ −−−

γβαγ

αγ

αβγβα

β

αγβ

x

exxx

f

Mapping a voltage ramp in to Weibull function

( )ViVu f=

Vu

Vi

2005 by A. Boscolo

Example

Full digital VCG

+

--

R1

R2

Rm

Rn

OP

+CMOS

No linearity

ANN2 3

4 5

6

1

1 input6 output2÷5 hidden nodes

2005 by A. Boscolo

Example

Attribute Full digital VCA ANN

Overall complexity H M L

Design complexity L M H

Standard tools availability H M L

Latency H L L

Thermal stability M M M

Added noise H M/L L

Testability H M L

Programmability H H M

Bandwidth L H M/H

Device cost M M L

Development time L M M

Ranking 60 68 66

2005 by A. Boscolo

Example

Conclusion:

The proposed solutions are overall similarAll the solution can be implemented by the same device FPAA, PSOC

The choice is aim-cost dependentThe choice is designer knowledge dependent

2005 by A. Boscolo

Analog front-end electronics in beam instrumentationBasic instrumentation structure






Conclusions

2005 by A. Boscolo

Beam Position Sensor

[E][D][C][C][C][A] [B]


2005 by A. Boscolo

Beam Position Sensor

X Position = (Va - Vb) / (Va + Vb)

Y Position = (Vc - Vd) / (Vc + Vd)

Va Vb

Vc

Vd

2005 by A. Boscolo

Beam Position Sensor Analogy

Position = (Va - Vb) / (Va + Vb)

A Basic Linear Variable Displacement TransducersLVDT - Cross Section View

2005 by A. Boscolo

Beam Position Monitoring

High dynamic range

Low beam current dependence

High resolution

Variable bandwidth

Suitable cost

Requirements Goals

Bunch-by-bunch

Multi-bunch

Turn-by turn

2005 by A. Boscolo

Beam Position Monitoring

[E][D][C][C][C][A] [B]


2005 by A. Boscolo

Beam Position measurement method

Phase normalizer schematic Time normalizer schematic

Frequency domain Time domain

2005 by A. Boscolo

Beam Position state of art

Based on:Digital Receiver (DRX)Field Programmable Gate Array (FPGA)Digital Signal Processor (DSP)General Purpose Processor (GPP)Suitable Firmware

DRXDown

converterFilter +VCA Filter +VCA ADC DSP

DRXADC DSPFilter +VCAhybrid

Bunch-by-bunchBW 250 MHz

Multi-bunch Turn-by turn BW 1KHz ÷1MHz

2005 by A. Boscolo

2005 by A. Boscolo

Beam Position metrological aspects VGA

Gain/Phase normalized to low frequency value at each Av.

2005 by A. Boscolo

Beam Position example

2005 by A. Boscolo

Beam Position example

The programmable connectivity is the key factor

2005 by A. Boscolo








Conclusions

2005 by A. Boscolo

Future Beam PositionInstrumentation

BPS Hybriddiff VGA DRX PSOC

PROC

Physical domain Abstract domain

USB

Embedded test and supervisor

Wireless distributed one (few) chip autonomous system

PSOC programmable system on chipPROC programmable receiver on chip

2005 by A. Boscolo

Future Beam PositionInstrumentation

Wireless distributed one (few) chip autonomous system

eventBPS SSP PROC

Physical domainAbstract domain

USB

Embedded test and supervisor

2005 by A. Boscolo

Conclusions

From Module to chipHW practice more easyHigh configurability by programmabilityMore knowledge requirementLow development timeGood cost performance ratioGood development tools

analogfront-end electronics in beam instrumentation

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