instrumentation list for aea - kyoto, japan · 2019-06-26 · foreign matter...
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Foreign matter analysis・nondestructive analytical equipment （non-GMP）
Instrumentation List for AEA - Kyoto, Japan
Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Visual observation
Digital microscope Confocal microscope
Internal observation
3D X-Ray microscopic CT scanner (µ-CT X ray)
Elemental analysis (Inorganics like metals, minerals)
Ingredient analysis（Organics like resins, fibers）
Scanning electron microscope/energy dispersive X-ray micro-analyzer (SEM-EDX）
）
FT-IR microscope
Laser Raman microscope
X-ray fluorescence spectrometer (micro-XRF)
Elementary analysis, Chemical bonding state analysis
Mass Spectrometry X-ray diffraction analysis
X-ray diffractometer
(XRD)
X-ray photoelectron spectroscopy (XPS)
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