ap-emc in singapore may 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - ic-emc a demonstration...

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

IC-EMC a Demonstration Freeware for Predicting

Electromagnetic Compatibility of Integrated Circuits

Alexandre BOYER, Etienne SICARDalexandre.boyer@insa-toulouse.fr

http://www.ic-emc.org

Asia-Pacific EMC-Week in Singapore, May 2008

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

Credits

European project MEDEA+ “Parachute” (2005-2007) European project PIDEA+ “EMCPack” (2006-2008) National project EPEA (2007 – 2010)

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

1. EMC of IC issues

2. What is IC-EMC

3. IBIS interface

4. Emission Prediction

5. Near Field Prediction

6. Susceptibility Prediction

7. Conclusion

Summary

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org 4

DESIGN

Architectural Design

Design EntryDesign Architect

FABRICATION

EMC compliant

EMC SimulationsCompliance ?

GO

NO GO

Design Guidelines

Tools

Training

1. EMC of IC Issues

IC-EMC

EMC validated before fabrication

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

Developed within projects like MEDEA+ “Parachute” (2005-2007),

PIDEA+ EMCPack (2006-2008), EPEA (2007-2010)

Promotes and defends the “European” vision of EMC of ICs

Trainings in industry and university

Why is it free?

Why is it non-confidential?

Standard-based tool : IBIS (IEC 62014-1), ICEM (IEC 62014-3), ICIM (IEC 62433-4),

Integrated Circuit parameters & models from ITRS roadmap

Demonstrator for industrial

2. What is IC-EMC

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

A simple tool dedicated to predict EMC of ICs

• An electric circuit schematic editor

• An interface to WinSpice analog simulator

• A set of post-processing tools

A library of EMC/IC elements

A set of EMC-related goodies

A demonstrator for predicting EMC of integrated circuits

2. What is IC-EMC

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

IC, package and PCB model

Basic symbols

2. What is IC-EMC

Main analysisSpice

Simulation

Spectrum analysis

Impedance simulation

Near-field simulation

Immunity simulation

IBIS interface

Post-processing toolsElectric circuit schematic editor

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

3. IBIS Interface

IBIS file editor

Very important for : I/O emission prediction I/O immunity prediction

Very important for : I/O emission prediction I/O immunity prediction

I/O model display

Package viewer

I/O Buffer Information Specification file editor

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

3. IBIS InterfacePackage parasitic evaluation

R, L, C extractionR, L, C extraction

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

Predict conducted mode, radiated and near-field emission

Non-confidential and based on standards (ICEM model – IEC 62433-2)

Targeted range : 1 MHz – 10 GHz

Mature handling of emission prediction in IC-EMC

Radiated emission GTEMConducted emission 1/150 Near-field emission

4. Emission PredictionTarget measurement methods (IEC 61967)

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

Core Model

Package Model

Probe Model

Test board Model

Analog Time Domain Simulation

Fourier Transform

Compare dBµV vs. Frequency

Fourier Transform

Time-domain measure

Frequency measurements

4. Emission PredictionEmission spectrum prediction

SimulationSimulationMeasurementsMeasurements

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

4. Emission Prediction

ICEM model

dBµV

MHz

Emission spectrummeasurement

simulation

Emission spectrum analysis

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

LeadPlacement

Core noiseModel (ICEM)

PackageRLC

R,L,C

Time domain SimulationWinSPICE

5. Near-field Prediction

Electrical schematic

Fourier Transform of I(t)

H[x,y,z] of I(f)

IC-EMC

Lead inductances

IC size

Pin location

IBIS

Measurements

Near field scan at a given frequency and

altitude

Scan Measurement/Simulation

Tuning

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

ICEM model

5. Near-field Prediction

16 bit microcontroller

Simulation Measurement

-8.1

-8.2

-15.2

-9.3-8.6

-16.1

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

6. Susceptibility Prediction

Only for harmonic disturbances, not for transient immunity

Predict conducted, radiated mode and near-field susceptibility

Non-confidential and based on standards (IBIS, ICIM)

Targeted range : 1 MHz – 10 GHz

Direct Power Injection Near-field ImmunityRadiated immunity in GTEM

Target measurement methods (IEC 62132)

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

6. Susceptibility Prediction

Aggressed IC Model (ICEM)

Package and IO model (IBIS)

RFI and coupling path model (Z(f))

Set RFI frequencyIC-EMC

Increase V aggressor

Time domain simulation

WinSPICE

Criterion analysis

Extract forward powerIC-EMC

Increase RFI frequency

Susceptibility threshold simulation

Susceptibility simulation flow

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

DPI on IO model

6. Susceptibility Prediction

16 bit microcontroller

Susceptibility threshold simulation

measurementsimulation

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

An environment for EMC prediction at IC level and trainings has been

developed

The tool is free and is based on standard

Conducted and radiated emission successfully predicted on several

ICs

Conducted susceptibility successfully predicted on several ICs

Positive feedback from trainees concerning the tool usage for the

illustration of EMC concepts (80 – 90 % satisfaction rate)

The demonstration tool and manual are online at www.ic-emc.org

7. Conclusion

AP-EMC in Singapore MAY 19-22, 2008 – alexandre.boyer@insa-toulouse.fr - www.ic-emc.org

Publications

• E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11 , September-November 2005, Pages 1277-1284

• S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, Dec. 2005, 0-387-26600-3

• E. Sicard, G. Peres "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits", proceedings of EMC Compo 05, Munich, Nov. 28-30, 2005

• E. Sicard, "IC-EMC, a software for analysing EMC of integrated circuits", 2005 IEEE EMC Symposium, 8-12 Aug @ Navy Pier in Chicago, Computer demonstration session.

• A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor Susceptibility to Near-Field Aggression”, proceedings of the IEEE International Symposium on EMC, Hawaii, Jul 2007.

• A. Boyer, M. Fer, L. courau, E. Sicard, “Modeling of the Susceptibility of 90 nm Input Output Buffer”, Asia Pacific EMC Week in Singapore, May 2008