ap-emc in singapore may 19-22, 2008 – [email protected] - ic-emc a demonstration...
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AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
IC-EMC a Demonstration Freeware for Predicting
Electromagnetic Compatibility of Integrated Circuits
Alexandre BOYER, Etienne [email protected]
http://www.ic-emc.org
Asia-Pacific EMC-Week in Singapore, May 2008
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
Credits
European project MEDEA+ “Parachute” (2005-2007) European project PIDEA+ “EMCPack” (2006-2008) National project EPEA (2007 – 2010)
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
1. EMC of IC issues
2. What is IC-EMC
3. IBIS interface
4. Emission Prediction
5. Near Field Prediction
6. Susceptibility Prediction
7. Conclusion
Summary
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org 4
DESIGN
Architectural Design
Design EntryDesign Architect
FABRICATION
EMC compliant
EMC SimulationsCompliance ?
GO
NO GO
Design Guidelines
Tools
Training
1. EMC of IC Issues
IC-EMC
EMC validated before fabrication
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
Developed within projects like MEDEA+ “Parachute” (2005-2007),
PIDEA+ EMCPack (2006-2008), EPEA (2007-2010)
Promotes and defends the “European” vision of EMC of ICs
Trainings in industry and university
Why is it free?
Why is it non-confidential?
Standard-based tool : IBIS (IEC 62014-1), ICEM (IEC 62014-3), ICIM (IEC 62433-4),
Integrated Circuit parameters & models from ITRS roadmap
Demonstrator for industrial
2. What is IC-EMC
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
A simple tool dedicated to predict EMC of ICs
• An electric circuit schematic editor
• An interface to WinSpice analog simulator
• A set of post-processing tools
A library of EMC/IC elements
A set of EMC-related goodies
A demonstrator for predicting EMC of integrated circuits
2. What is IC-EMC
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
IC, package and PCB model
Basic symbols
2. What is IC-EMC
Main analysisSpice
Simulation
Spectrum analysis
Impedance simulation
Near-field simulation
Immunity simulation
IBIS interface
Post-processing toolsElectric circuit schematic editor
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
3. IBIS Interface
IBIS file editor
Very important for : I/O emission prediction I/O immunity prediction
Very important for : I/O emission prediction I/O immunity prediction
I/O model display
Package viewer
I/O Buffer Information Specification file editor
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
3. IBIS InterfacePackage parasitic evaluation
R, L, C extractionR, L, C extraction
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
Predict conducted mode, radiated and near-field emission
Non-confidential and based on standards (ICEM model – IEC 62433-2)
Targeted range : 1 MHz – 10 GHz
Mature handling of emission prediction in IC-EMC
Radiated emission GTEMConducted emission 1/150 Near-field emission
4. Emission PredictionTarget measurement methods (IEC 61967)
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
Core Model
Package Model
Probe Model
Test board Model
Analog Time Domain Simulation
Fourier Transform
Compare dBµV vs. Frequency
Fourier Transform
Time-domain measure
Frequency measurements
4. Emission PredictionEmission spectrum prediction
SimulationSimulationMeasurementsMeasurements
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
4. Emission Prediction
ICEM model
dBµV
MHz
Emission spectrummeasurement
simulation
Emission spectrum analysis
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
LeadPlacement
Core noiseModel (ICEM)
PackageRLC
R,L,C
Time domain SimulationWinSPICE
5. Near-field Prediction
Electrical schematic
Fourier Transform of I(t)
H[x,y,z] of I(f)
IC-EMC
Lead inductances
IC size
Pin location
IBIS
Measurements
Near field scan at a given frequency and
altitude
Scan Measurement/Simulation
Tuning
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
ICEM model
5. Near-field Prediction
16 bit microcontroller
Simulation Measurement
-8.1
-8.2
-15.2
-9.3-8.6
-16.1
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
6. Susceptibility Prediction
Only for harmonic disturbances, not for transient immunity
Predict conducted, radiated mode and near-field susceptibility
Non-confidential and based on standards (IBIS, ICIM)
Targeted range : 1 MHz – 10 GHz
Direct Power Injection Near-field ImmunityRadiated immunity in GTEM
Target measurement methods (IEC 62132)
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
6. Susceptibility Prediction
Aggressed IC Model (ICEM)
Package and IO model (IBIS)
RFI and coupling path model (Z(f))
Set RFI frequencyIC-EMC
Increase V aggressor
Time domain simulation
WinSPICE
Criterion analysis
Extract forward powerIC-EMC
Increase RFI frequency
Susceptibility threshold simulation
Susceptibility simulation flow
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
DPI on IO model
6. Susceptibility Prediction
16 bit microcontroller
Susceptibility threshold simulation
measurementsimulation
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
An environment for EMC prediction at IC level and trainings has been
developed
The tool is free and is based on standard
Conducted and radiated emission successfully predicted on several
ICs
Conducted susceptibility successfully predicted on several ICs
Positive feedback from trainees concerning the tool usage for the
illustration of EMC concepts (80 – 90 % satisfaction rate)
The demonstration tool and manual are online at www.ic-emc.org
7. Conclusion
AP-EMC in Singapore MAY 19-22, 2008 – [email protected] - www.ic-emc.org
Publications
• E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11 , September-November 2005, Pages 1277-1284
• S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, Dec. 2005, 0-387-26600-3
• E. Sicard, G. Peres "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits", proceedings of EMC Compo 05, Munich, Nov. 28-30, 2005
• E. Sicard, "IC-EMC, a software for analysing EMC of integrated circuits", 2005 IEEE EMC Symposium, 8-12 Aug @ Navy Pier in Chicago, Computer demonstration session.
• A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor Susceptibility to Near-Field Aggression”, proceedings of the IEEE International Symposium on EMC, Hawaii, Jul 2007.
• A. Boyer, M. Fer, L. courau, E. Sicard, “Modeling of the Susceptibility of 90 nm Input Output Buffer”, Asia Pacific EMC Week in Singapore, May 2008