advanced soi gate driver ic with integrated v -monitoring

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Advanced SOI Gate Driver IC with integrated V CE -Monitoring and negative Turn-off Gate Voltage for Medium Power IGBT Modules Bastian Vogler, Reinhard Herzer, Sven Buetow, Iyead Mayya, Susanne Becker SEMIKRON Elektronik, Germany; Sigmundstrasse 200, D-90431 Nuremberg e-mail: [email protected] Abstract— A novel approach for medium power IPMs is presented combining 600V and 1200V IGBT/FWD-inverter modules based on spring contact technology with advanced silicon on insulator (SOI) gate driver ICs with fully integrated V CE -monitoring and negative turn-off gate voltage in a reliable cost effective package with excellent thermal conductivity. For the V CE -monitoring of short circuit events the HV-diode and the processing circuit are fully integrated for each switch on the TOP and BOT secondary side. Thanks to the SOI technology which blocks voltages in both directions a negative turn-off gate voltage of -5V can be used for the first time inside an IC to prevent an unmotivated turn-on of the OFF-IGBT during switching of higher currents (>100A) inside a half bridge. The presented static and dynamic measurement results demonstrate the driver and system performance. The new system approach for medium power industrial drive applications supports the market trend towards intelligent power module solutions already known from the low power consumer market. I. INTRODUCTION Intelligent Power Modules (IPM) which combine both IGBT/FWD-power bridges and fully integrated gate drivers with driving and monitoring functions replacing conventional hybrid IGBT drivers are restricted to low power applications (600V, 1200V, ≤35A) [1],[2]. To develop the medium power market for currents up to 100A or even higher the extension of the gate driver IC performance is necessary. As shown in recent papers, gate driver ICs based on a high voltage SOI- CMOS platform technology presented in Fig.1 [3],[4] can overcome the most of the disadvantages of gate drive ICs which rely on conventional junction isolation. They provide complete latch-up immunity and the operational temperature range can be considerably extended up to 200°C [5] - ideal for module integration [6]. Advanced level shifter concepts allow negative secondary side offset voltages down to -30V [7] and even the signal transmission for the 1200V class can be realized by cascaded 600V transistors [8]. In this paper new extended functions are presented. To make these systems more safety against short circuit events a V CE - monitoring is implemented for every switch. And second a negative turn-off gate voltage is used to prevent unmotivated turn-on during switching inside a half bridge and to reduce the switching losses. II. V CE -MONITORING Fig.2 shows the block circuit diagram of a gate driver IC for a three-phase inverter and a seventh switch which can be used as brake chopper or PFC for the 600V class. The seven control signals from the microcontroller (LIN1..4, HIN1..3) are processed on the low side (short pulse suppression, interlock, dead time, amplification) and transmitted by medium voltage level shifters to BOT1…4 secondary sides and by 600V high voltage level shifters to the TOP1…3 high sides. On these secondary sides the control signals are reconstructed, filtered and amplified. The IGBT gates are driven by 1.4A/-1.4A output stages (source/sink). For every BOT- and TOP-IGBT a V CE -monitoring is integrated on the secondary side to detect short circuits. The V CE -monitoring circuit integrates the HV-diode, the current limiting resistance, filter components and the comparator. Further implemented functions are the under-voltage monitoring of all operation voltage supplies on the low and high side and the current monitoring by shunt at the –DC terminal (ITRIP). Fig.3 shows the chip photography of this 600V Seven-pack gate driver IC with these implemented functions. The low side Fig.1: Schematic cross section of the foundry High Voltage (HV)-SOI technology [3],[4]

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Page 1: Advanced SOI Gate Driver IC with integrated V -Monitoring

Advanced SOI Gate Driver IC with integrated

VCE-Monitoring and negative Turn-off Gate Voltage

for Medium Power IGBT Modules

Bastian Vogler, Reinhard Herzer, Sven Buetow, Iyead Mayya, Susanne Becker

SEMIKRON Elektronik, Germany; Sigmundstrasse 200, D-90431 Nuremberg

e-mail: [email protected]

Abstract— A novel approach for medium power IPMs is

presented combining 600V and 1200V IGBT/FWD-inverter

modules based on spring contact technology with advanced

silicon on insulator (SOI) gate driver ICs with fully integrated

VCE-monitoring and negative turn-off gate voltage in a reliable

cost effective package with excellent thermal conductivity. For

the VCE-monitoring of short circuit events the HV-diode and the

processing circuit are fully integrated for each switch on the

TOP and BOT secondary side. Thanks to the SOI technology

which blocks voltages in both directions a negative turn-off gate

voltage of -5V can be used for the first time inside an IC to

prevent an unmotivated turn-on of the OFF-IGBT during

switching of higher currents (>100A) inside a half bridge. The

presented static and dynamic measurement results demonstrate

the driver and system performance. The new system approach

for medium power industrial drive applications supports the

market trend towards intelligent power module solutions

already known from the low power consumer market.

I. INTRODUCTION

Intelligent Power Modules (IPM) which combine both IGBT/FWD-power bridges and fully integrated gate drivers with driving and monitoring functions replacing conventional hybrid IGBT drivers are restricted to low power applications (600V, 1200V, ≤35A) [1],[2]. To develop the medium power market for currents up to 100A or even higher the extension of the gate driver IC performance is necessary. As shown in recent papers, gate driver ICs based on a high voltage SOI-CMOS platform technology presented in Fig.1 [3],[4] can overcome the most of the disadvantages of gate drive ICs which rely on conventional junction isolation. They provide complete latch-up immunity and the operational temperature range can be considerably extended up to 200°C [5] - ideal for

module integration [6]. Advanced level shifter concepts allow negative secondary side offset voltages down to -30V [7] and even the signal transmission for the 1200V class can be realized by cascaded 600V transistors [8].

In this paper new extended functions are presented. To make these systems more safety against short circuit events a VCE-monitoring is implemented for every switch. And second a negative turn-off gate voltage is used to prevent unmotivated turn-on during switching inside a half bridge and to reduce the switching losses.

II. VCE-MONITORING

Fig.2 shows the block circuit diagram of a gate driver IC for a three-phase inverter and a seventh switch which can be used as brake chopper or PFC for the 600V class. The seven control signals from the microcontroller (LIN1..4, HIN1..3) are processed on the low side (short pulse suppression, interlock, dead time, amplification) and transmitted by medium voltage level shifters to BOT1…4 secondary sides and by 600V high voltage level shifters to the TOP1…3 high sides. On these secondary sides the control signals are reconstructed, filtered and amplified. The IGBT gates are driven by 1.4A/-1.4A output stages (source/sink). For every BOT- and TOP-IGBT a VCE-monitoring is integrated on the secondary side to detect short circuits. The VCE-monitoring circuit integrates the HV-diode, the current limiting resistance, filter components and the comparator. Further implemented functions are the under-voltage monitoring of all operation voltage supplies on the low and high side and the current monitoring by shunt at the –DC terminal (ITRIP).

Fig.3 shows the chip photography of this 600V Seven-pack gate driver IC with these implemented functions. The low side

Fig.1: Schematic cross section of the foundry High Voltage (HV)-SOI technology [3],[4]

Page 2: Advanced SOI Gate Driver IC with integrated V -Monitoring

driver core, the four secondary side gate driver stages for the BOT-IGBTs, the three isolated high side (600V) gate driver stages for the TOP-IGBTs with their 600V DMOST level shifters and 600V diodes (oval structures) and last but not least the 600V VCE-diodes of the short circuit monitoring of each IGBT are clearly to see.

Exemplarily the Fig.4 shows the VCE-monitoring in operation

under hard short circuit conditions (L low) in a 600V, 50A

system at VDC of 500V. It is clearly to see that the ICSC

increases to 5.2 x Inom (260A) and the IGBT goes in de-

saturation. After the adjusted blanking time of app. 2.1µs the

Fig.3: Chip photography of 600V Seven-pack gate driver

IC with VCE-monitoring

Fig.4: 600V, 50A IGBT; VCE-monitoring turns off

TOP-IGBT at hard short circuit (L low) after

blanking time (VDC=500V, Tj=25°C)

Fig.5: 600V, 50A IGBT; VCE-monitoring turns off

BOT-IGBT under soft short circuit conditions

(L=200µH, exceeds monitoring threshold at 6.2V

(VDC=300V, Tj=25°C)

Fig.2: Block circuit diagram of VCE-monitoring inside the Seven-pack gate driver IC for 600V systems

TOP high side

600V VCE

-Diode

TOP

BOT BOT- secondary

. side

Driver

core

Page 3: Advanced SOI Gate Driver IC with integrated V -Monitoring

desaturation is detected and the IGBT is turned off by the secondary side. The turn-off voltage VCE,max is app. 630V. The VCE-monitoring under soft short circuit conditions (L very high) is demonstrated in Fig. 5. The ICSC increases very slowly and the monitoring threshold of ≈ 6.2V is reached after 420µs.

III. NEGATIVE TURN-OFF GATE VOLTAGE

The second new innovative feature is illustrated in Fig.6. It shows the typical operating conditions of the gate driver IC using +15V gate voltage for turn-on and -5V for turn-off. The microcontroller input signals are processed on the primary side of the gate driver IC on the same –DC potential. Medium voltage level shifters transmit the control signals to VN (e.g. -5V) to the secondary side. The gate signals for the output driver stages operate between +10…-5V for the nMOS turn-off transistor and between 0V…+15V for the pMOS turn-on transistor. (The gate driver IC has internally a high flexibility and can operate at the output also from -18V…+2V exemplarily for specific normally-on SiC-JFETs.)

Figs.7 and 8 present the switching waveforms of a BOT- and TOP-IGBT with VGE= 0V…+15V inside a 1200V, 100A half bridge of an inverter at VDC = 600V, IC = 100A. Fig. 7 shows

Fig.6: Typical operating conditions of the gate driver IC

using VGE = -5V…+15V

Fig.7: 1200V Gate driver IC with VGE= 0V…+15V: Turn-

on of BOT-IGBT with parasitic turn-on of TOP-

IGBT; an additional cross current flows over the

half bridge (VDC=600V, IC=100A, Tj=25°C,

RG=10Ω, Eon,BOT=13.46mJ)

Fig.9: Gate driver IC with VGE= -5V…+15V: Turn-on of BOT-IGBT; TOP-IGBT remains off (VDC=600V,

IC=100A, Tj=25°C, RG=10Ω, Eon,BOT=10.85mJ)

clearly, that during normal turn-on of BOT-IGBT a parasitic turn-on of TOP-IGBT happens, an additional cross current flows over the half bridge and increases the turn-on losses (13.46mJ). Further losses of 9.31mJ are generated inside the TOP-IGBT due to the cross current. It is influenced by VGE,TOP

rise up to 9V (see Fig.8; Vth of IGBT is 6.5V).

The turn-on of the OFF-IGBT (TOP) can be prevented by a negative turn-off gate voltage of -5V as shown in Fig.9. So cross currents over the bridge can be suppressed and the losses are reduced significantly from 22.77mJ to 10.85mJ. This effect becomes even more significant if the collector currents increase (>100A) and two or more IGBT per switch are in parallel.

IV. IPM-PACKAGE TECHNOLOGY

Fig.10 shows the exploded view of a Converter-Inverter-Brake (CIB)-IPM on basis of the Mini-SKiiP product family for currents up to 150A and Fig.11 its circuit diagram with implemented VCE-monitoring (DESAT) for every switch. The success of the module is based primarily on an innovative package without baseplate under the DBC substrate and with spring contacts for all main and auxiliary connections between

Fig.8: 1200V Gate driver IC with VGE= 0V…+15V:

Voltage, current and additional losses at the parasitic

turn-on of TOP-IGBT during BOT- IGBT turn-on,

(VDC=600V, IC=100A, Tj=25°C, RG=10Ω, parasitic

Eon,TOP=9.31mJ)

Page 4: Advanced SOI Gate Driver IC with integrated V -Monitoring

Fig.10: Mini-SKiiP assembly example

Fig.12: DBC layout of the 600V, 50A CIB-IPM

DBC and PCB. This leads to an easy assembly construction with high thermal and power cycling capability, as well as vibration ruggedness. The new IPMs include a conventional DBC substrate with soldered and bonded devices (Rectifier Diodes, IGBTs, FWDs, gate resistors and temperature sensor (TS)) and the gate driver IC is glued directly on the DBC (excellent thermal conductivity [6]) and is connected by thin wire bonds (see Fig.12). The DBC substrate and the mounted devices are protected with silicone gel.

V. SUMMARY

Advanced silicon on insulator (SOI)-gate-driver-ICs with fully

integrated VCE-monitoring and negative turn-off gate voltage

are presented for medium power 600V and 1200V IGBT/FWD-

inverter modules based on spring contact technology. For the

VCE-monitoring of the short circuit event the HV-diode and the

processing circuit are fully integrated for each switch on the

TOP and BOT secondary side. Thanks to the SOI technology

which blocks voltages in both directions a negative turn-off gate

voltage of -5V can be used to prevent an unmotivated turn-on of

the OFF-IGBT during switching of higher currents (>100A)

inside a half bridge. Cross currents over the bridge can be

suppressed and the turn-on losses are reduced from 22.77mJ to

10.85mJ inside a 1200V, 100A IGBT-half bridge. The new

presented functions (VCE-monitoring and negative gate turn-off

voltage) can be used alone or in combination for 600V and

1200V drives.

REFERENCES

[1] G. Majumdar, M. Iwasaki, M. Fukunaga, X. Kong “Compact IPMs in Transfer Mold Packages for Low-Power-Motor Drives”, Proceedings ISPSD 2005, p. 333-336

[2] H. Kawafuji, T. Nakano, T. Iwagami, K. Kuriaki, M. Honsberg “New 5-35A/1200V Transfer Mold IPM with heat dissipating insulation sheet”, Proc. PCIM 2005

[3] R T. Letavic, E. Arnold, et.al. “High Performance 600V Smart Power Technology Based on Thin Layer Silicon-on-Insulator”, Proc. ISPSD 1997, pp. 49-52

[4] R.T. Letavic, M. Simpson, E. Arnold, et.al. “600V Power Conversion System-on-a-Chip Based on Thin Layer Silicon–on Insulator”, Proc. ISPSD 1999, pp. 325-328

[5] S. Pawel, M. Rossberg, R. Herzer “600V SOI Gate Drive HVIC for Medium Power Applications Operating up to 200°C”, Proceedings ISPSD 2005, p. 55-58

[6] B. Vogler, M. Rossberg, R. Herzer, et.al. “600V CIB-Module with integrated SOI Gate Driver IC for Medium Power Applications”, Proc. CIPS, 2008

[7] M. Rossberg, B. Vogler R. Herzer “600V SOI Gate Driver IC with Advanced Level Shift Concept for Medium and High Power Applications”, Proc. EPE 2007

[8] B.Vogler, R.Rossberg, R.Herzer, L.Reusser “Integration of 1200V SOI gate driver ICs into a medium power IGBT module package”, Proc. ISPSD 2010, p. 97-100

Fig.11: Circuit diagram of 600V Converter-Inverter-Brake (CIB)-IPM with

VCE-monitoring

TS Converter Inverter Brake

Chopper

Driver IC