7/2/2003 Ivan Hruska,Francisca Calheiros 1

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design Test done in PSI 1-3.2.2003Test done in PSI 1-3.2.2003

verification and selection of components PSI OPTIS line 60MeV beam with flux 5E8p/cm^2/s test performed during Sunday 2.2.2003 allocated 8 hours for the test Extended setup from June 2002 by second V - meter &

pulse generator

7/2/2003 Ivan Hruska,Francisca Calheiros 2

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design List of testsList of tests

Lateral SEE test of IRFP9N60 - primary FET Basic SEE test of SUM110N05 - secondary FET (new) Basic SEE test of IR2110 & IR2213 TID/SEE test of LS373 & ALS573 TID test of 6N137 TID test of LM317 TID test of transil SMCJ15CA & SMCJ5.0CA

7/2/2003 Ivan Hruska,Francisca Calheiros 3

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design Lateral SEE test of IRFS9N60ALateral SEE test of IRFS9N60A

repeat of test from June 2002 in lateral direction

Conditions: 200VDC Result: No SEU to 40krad Test continued with double dose till

80 krad Result : No SEU but possible SEL

burn out of one resistor We have to repeat test with another

setup

7/2/2003 Ivan Hruska,Francisca Calheiros 4

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design Old setupOld setup

OK for SEU only can’t see slow edge can’t see SEL

New MOSFET setupNew MOSFET setup static design Schmitt trigger LED + counter V-meter steering

7/2/2003 Ivan Hruska,Francisca Calheiros 5

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design Basic SEE test of SUM110N06Basic SEE test of SUM110N06

new MOSFET for rectifier ( 90% efficiency of brick !!) Conditions 40VDC ( Ubr = 60V) Result : SEE in most of channels

We have replaced all MOSFETs by new pieces and tested again on 30VDC

Result : No SEE !! Real working voltage <20V!

M1 M2 M3 M4 M5 M6 M7 M8Counter 0 1 19 34 0 37 29 43

7/2/2003 Ivan Hruska,Francisca Calheiros 6

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design

Verification of functionality of high-side driver & low-side driver

Technically most difficult test 2 versions - IR2110S (600V) &

IR2213S (1200V) Conditions : 200VDC, pulses going

through low side & high side, capacitive load

2 x IR2110S didn’t work since start Result: No latch-up visible till

40krad, degradation of input observed, but can be used

Basic SEE test of IR2110S & IR2213SBasic SEE test of IR2110S & IR2213S

7/2/2003 Ivan Hruska,Francisca Calheiros 7

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design

Test setup without remote control First spot to 4 x LS373 , second

spot to 4x ALS573 2 pieces in Log0, 2 pieces in Log I After irradiation status &

functionality tested Result for LS373: OK Result for ALS573: 1SEU ! Bipolar

logic!

TID/SEE test of LS373 & ALS573TID/SEE test of LS373 & ALS573

7/2/2003 Ivan Hruska,Francisca Calheiros 8

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design TID test of optocoupler 6N137TID test of optocoupler 6N137

8 pieces measured

Visible shift of input current needed to switch output Result : Possible to use

Degradation of transfer ratio with radiation for 6N137

0

1

2

3

4

5

6

0 0.01 0.02 0.03 0.04

Input current[A]

Ou

tpu

t vo

ltag

e [V

]

0krad

24krad

48krad

7/2/2003 Ivan Hruska,Francisca Calheiros 9

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design TID test of LM317TID test of LM317

2 types tested 10 pieces in total/spot

Output voltage and input current measured Result: EMP type is OK for the design Saving the costs by ~ 35CHF/brick (20%)

Dependency of output voltage on TID level for linear regulators LM317 version MDT & EMP set to 5V

4

4.2

4.4

4.6

4.8

5

5.2

5.4

0 10 20 30 40 50 60

TID [krad]

Out

ptut

volta

ge [V

]

MDT1

MDT2

MDT3

MDT4

MDT5

EMP1

EMP2

EMP3

EMP4

EMP5

7/2/2003 Ivan Hruska,Francisca Calheiros 10

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design TID test of transil SMCJ15CA & SMCJ5CATID test of transil SMCJ15CA & SMCJ5CA

Result: No change with radiation

After 38.4Krads - 15V

0

5

10

15

20

0 5 10 15 20 25

input voltage ( v )

outp

ut v

oltag

e ( v

)

T1

T2

T3

T4

T5

T6

T7

T8

T9

T10

After 38.4Krads - 5V

0

2

4

6

8

0 5 10 15 20 25

input voltage (v)

outp

ut v

oltag

e (v

)

T1

T2

T3

T4

T5

T6

T7

T8

T9

T10

7/2/2003 Ivan Hruska,Francisca Calheiros 11

Radiation test of Radiation test of components for LV power components for LV power

supply designsupply design ConclusionConclusion

IRFS9N60 must be re-tested with new static setup New MOSFET will be tested as a spare components

worse parameters than 9N60 Re-test of SUM110N06 for sure + lateral test Selected LM317EMP as a replacement of L4913 in brick design Confirmed TID & SEE parameters of other components

To doTo do NIEL test - in preparation Re-test of MOSFETs TID test of basic chipset - statistics Brick test Preparation of production tests in radiation