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7 AD- O M 7" ARMY D CTNNCS MSARC N AND EvEl OPUN C SUWA 0- ETC P/As Lila WARTZ CRYSTAL FAIAZCATION PACILITY. I) 14AT 60RJNT0-OOI7OS f UMCLASSIFZ IDOL I cii '1111

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Page 1: 14AT I cii - DTICLogin · A stainless steel conveyor belt, in conjunction with three vacuum manipulators, transport the ... The gold sources and plating mask heads are equipped with

7 AD- O M 7" ARMY D CTNNCS MSARC N AND EvEl OPUN C SUWA 0- ETC P/As LilaWARTZ CRYSTAL FAIAZCATION PACILITY. I)14AT 60RJNT0-OOI7OS f

UMCLASSIFZ IDOL

I cii '1111

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0

V0

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UNCLASS 7FIEDSECURITY -LASSIFICA 'r:N OF THIS PAGE rWhen Det. Fnf?,ed)

REPORT DOCUMENTATION PAGE READ INSTRUCTIONSIFFORE COMPLETING FORM

1. REPORT NUMBER 2 GOVT ACCESSION NO.1 3 iP,ENTSATA OGN .F

ERADCOM HH610964CPW3/02A IAOri.,1 _ i r-4 14. TITLE (arid Subtitle) T YPE OF REPORT & PERIOD

.......... ... /_t A pr 77--

'Quartz Crystal Fabricationi Facilit , '-- tSep-. '

' -- • -; -.. .. .. - I---" . .

__GEP7-z-P-434

7. AUTHOR(e) 8 CONTRACT OR GRANT NUMBER(.)

I Project Order No.R. J.-/Ney iiH610964CPW3/01

9. PERF&"MING ORGANIZATION NAME AND ADDRESS 10 PROGRAM ELEMENT. PROJELT. TASK

Gener"aJ. Electric Company AREA4 WORK UNIT NUMBERS

Neutron Devices Dea±tment 2769754P 0 Box I1l5J733St. Peteru g, Florida 33733

11. CONTROLLING OFFICE NAME AND ADDRESS

U. S. -... 656.. 7 May W8 'GContra( °jo DE-A Cy ,4- 7 DP' 6 6 NUMBERQOF)AGES

14. MONITORINCY NAME & ADDRESS(I f dllernt from Controlling Office) 15 SECURITY .:LASS. (of this report)

U. S. Army Electronics Research and

Fort Monmouth, N. J. 07703 Development UnclassifiedDrSEL-PP-ou-, . JCommand IS, DECLASSIFICATION"DOWNGRADING,DRSEL-PP-1I-PI- i SCWEDULE

16. DISTRIBUTION STATEMENT (of this Report)

Approved for public release; distribution unlimited. \

17. DISTRIBUTION STATEMENT0( If different from Report) " I

IS. SUPPLEMENTARY NOTES

19. KEY WORDS (Continue on reverse side II neceeeary and Identify by block number)

Quartz crystal units, quartz crystal unit prgcessjng, oil-freevacuum system, cryogenic vacuum system, plating ot quartz crystalunits, sealing of quartz crystal units, gold evaporant source,nozzle beam gold evaporant source, cleaning of quartz crystalunits, vacuum manipulator, frequency control device processing.

, ABSTRACT (Contlnue an roevee side If neceesary and Identify by block number)

The report describes the design and operation of a five chamber,interconnected vacuum system, which is capable of cleaning,plating, and sealing precision quartz crystal units in ceramicflatpack enclosures continuously in a high vacuum environment.The production rate design goal was 200 units per eight hourday.

DO , 1473 EDTIONO 01OV0IS OSOLiEE UNCLASSIFIEDSECURITY CLASSIICATION OF THIS PAG. Dot&,, ateVVEn

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UNCLASS IF IEDSECURITY C-ASSFICATION OF THIS PAGErWIm Date Enoreod)

20. ABSTRACT (continued)

A unique nozzle beam gold deposition source was developed tooperate for extended periods of time without reloading. Thesource puts out a narrow beam of gold typically in the orderof 2 1/2cT'included 'rone ' angle. Maximum deposition rates arein the order of 400 at 5.5 in. "throw' distance used.

Entrance and exit air lock chambers expedite the materialthroughput, so that the processing chambers are at high vacuumfor extended periods of time. A stainless steel conveyor belt,in conjunction with three vacuum manipulators, transport theresonator components to the various work stations. Individualchambers are normally separated from each other by gate valves.The crystal resonators, mounted in flatpack frames but unplated,are loaded into transport trays in a lid-frame-lid sequency forinsertion into the system and exit as completed crystal units.

The system utilizes molybdenum disulfide coated ball bearingsat essentially all friction surfaces. The conveyors are capableof operating at 300 0C temperature and 10-8 Torr. Metal bellowsor magnetic drives are utilized tot_9 nsfer motion into thevacuum chambers.

The gold sources and plating mask heads are equipped withelevators and gate valves, so that they can be removed from thesystem for maintenance without exposing the chambers toatmosphere. --

The work stations include: ultraviolet/ozone cleaning, 300 0 Cvacuum baking, coarse and fine gold deposition stations withautomatic frequency plating controls, and a gold thermocompressionsealing station. The length of the combined vacuum envelope is24 feet.

ii UNCLASSIFIED%ECURITV CLASSIFICATION OF TMIS PAGE(W7.n Dao. Entered)

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PREFACE

This is the second report on a manufacturing methods andtechnology (MM&T) program funded by the U. S. Army ElectronicsResearch and Development Command (ERADCOM), Fort Monmouth, NewJersey, covering a period from April 1, 1977 to September 30,1979.

The work is being performed by the Neutron Devices Departmentof General Electric Company,(GEND) located at St. Petersburg,Florida, a contractor of the U. S. Department of Energy. Thisfacility is government owned.

ERADCOM requested that the described work be done by thisDepartment of Energy facility because no bids had been receivedby ERADCOM in response to its multiple source solicitation(including advertisement in the Commerce Business Daily) tohave this work performed at an industrial facility. Thegovernment would prefer to have all future projects, especiallythe eventual production of the ceramic flatpack crystal units,performed at a qualified commercial facility. In connectionwith this, an industry demonstration of the pilot line industryfacility is being planned, tentatively for sometime during1981. The date of this demonstration will be advertised inCommerce Business Daily. Those who wish to be notifieddirectly of the date should contact:

U. S. Army Electronics Technology and Devices LaboratoryATTN: DELET-MQ (Dr. John R. Vig)Fort Monmouth, NJ 07703

t ..-

~iii

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CONTENTS

Section Page

PREFACE iii

INTRODUCT ION 1

VACUUM SYSTEM ENVELOPE 1

Loading/Ultraviolet Clean Chamber 4Bake Chamber 5Plating Chamber 5Sealing Chamber 5Exit Chamber 6Envelope Support Structure 6

RESONATOR TRAY 6

TRAY TRANSPORT 9

VACUUM MANIPULATOR 11

EVAPORANT SOURCE (NOZZLE BEAM) 12

Source Tube Burnout 20Source Tube Design 20Wick Design 23Plugged Skimmer Aperture 25Skimmer Aperture Efficiency 25Reservoir Capacity 26Beam-to-Target Alignment 27Operating Life 29Throughput Rate 29

ELECTRODE MASK HEAD 30

SEALING FIXTURE 34

ELEVATORS 37

CONTROL CIRCUITRY 37

CONCLUSIONS 39

RECOMMENDAT IONS 40

ACKNOWLEDGMENTS 41

77b h

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CONTENTS

Section Page

REFERENCES 43

APPENDIX 45

DISTRIBUTION 49

ILLUSTRATIONS

Number Page

1 Quartz Crystal Fabrication Facility, Schematic 2

2 Quartz Crystal Fabrication Facility, 2Front View

3 Quartz Crystal Fabrication Facility, Front 3Oblique End View

4 Quartz Crystal Fabrication Facility, Back 4Oblique End View

5 Resonator Tray, Empty 7

6 Resonator Tray, Loaded 8

7 Tray Transport 9

8 Tray Transfer Operation 9

9 Tray Transport Showing Funnel-Shaped Guides 10

10 Vacuum Manipulator, Schematic 11

11 Vacuum Manipulator 12

12 Nozzle Beam Evaporant Source, Schematic 13

13 Nozzle Beam Evaporant Source, Isometric 15

14 Crucible, Nozzle Beam Evaporant Source 16

15 Nozzle Beam Evaporant Source, Crucible and Shield 17

16 Source Tube, Wick and Skimmers 18

vi

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ILLUSTRATIONS

Number Page

17 Gold Source, X-ray Photograph 19

18 Temperature Distribution Curve, Solid Source 21Tube, 0.9-in. Wick Insertion Depth

19 Temperature Distribution Curve, Solid Source _?

Tube, 0.8-in. Wick Insertion Depth

20 Temperature Distribution Curve, Hollow Source 22Tube

21 Temperature Distribution Curve, Reduced Tungsten 23Wick Diameter

22 X-ray Photograph, Source Showing Gold Droplet at 24

End of Bore

23 Optical Source Alignment Device 27

24 Mask Head and Elevator 31

25 Mask Head 32

26 Mask Head Close-up 33

27 Plate-to-Frequency Controls, Block Diagram 34

28 Sealing Fixture Schematic 35

29 Sealing Fixture 35

30 Sealing Fixture, Showing Sealing Furnace 35and Ramrod

31 Sealing Fixture, Sealing Furnace 36

TABLE

Number Page

1 Effect of Aperture Diameter Variation 20

vii

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INTRODUCTION

This report describes the results of Phase I of a manufacturingmethods and technology (MM&T) program aimed at establishing apilot line for producing high precision crystals. The work iscontinuing under Phases II and III. Phase I was aimed atdesigning and building an in-line ultrahigh vacuum quartzcrystal fabrication facility (QXFF) for the final steps (i.e.,cleaning, baking, plating and sealing) in the fabrication ofprecision crystals. 1 Phase II is aimed at establishing apilot line for 22-MHz high shock crystals in a small (HC-18equivalent) ceramic flatpack. Phase III is aimed atestablishing a pilot line for 5- to 10-MHz crystals in a larger(HC-6 equivalent) ceramic flatpack.

As indicated in the first report, 2 the nozzle beam goldsource was perceived as probably the most difficult engineeringtask of the Quartz Crystal Fabrication Facility project. Forthis reason, effort was concentrated on developing and testingthe nozzle beam source.

In addition, prototypes of the remaining critical components ofthe system were designed, built, and tested. The heretoforeuntested critical components were: the mask, the mask head,the elevators, and the sealing mechanism. After testing andmaking modifications, the appropriate quantity of each item wasprocured.

The vacuum system envelope and the support structure were alsodesigned and procured. Tue vacuum system was assembled andoperated.

The electric power supplies, temperature controllers, cryopumpcompressors, and mass spectrometer indicator/controller wereplaced in cabinets. The frequency plating control equipmentwas designed and built.

VACUUM SYSTEM ENVELOPE

The vacuum system, as described in the first report, was builtby Perkin-Elmer Ultek, Inc. The entire vacuum envelopecomplied with the initial specifications, as received, exceptfor one small vacuum leak. The vacuum envelope, as well as allother components of the system, are shown in the schematiccross-sectional diagram of the facility (Figure 1).Photographs of the complete envelope and facility are shown inFigures 2, 3 and 4. The total length of the assembled chambersis about 24 feet.

1

- _ _ 7 . - - - - -

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14

.1 o .1)

Q5

f.-4

441

Q 14

0

a)a

*m-4 *

2zc

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Figure 3. Quartz Crystal FaL i tn Facility, FrontOblique End Vlew,,

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Figure 4. Quartz Crystal Fabrication Facility, BackOblique End View

The system contains five individual "in-line" chambers,separated by gate valves. Each chamber is individually pumpedby cryogenic pumps; rough pumping is accomplished bycryo-sorption pumps.

LOADING/ULTRAVIOLET CLEAN CHAMBER

The first chamber is an airlock chamber; it enables the loadingof material into the bake chamber without exposing that chamberto atmosphere. It also serves as an ultraviolet/ozone cleaningchamber. This chamber contains two banks of low pressuremercury/UV tubes, m, unted over the transport. The first bankof tubes has an output ai- 1849 A and 2537 A, and is used toclean the inserted materials by the UV/ozone cleaning method. 3

4

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The second bank of tubes has an output of 2537 A only, and isused to decompose ozone. Safety practices require that ozonenot be pumped, nor flushed into the atmosphere. The UV tubeshave a special dual envelope that provides extra protectionagainst accidental mercury contamination of the system. Thechamber was designed for the throughput of one tray per hour.

BAKE CHAMBER

The second chamber is the bake chamber; it contains two banksof tantalum heaters mounted over the transport. Each bank iscapable of heating one tray of crystals up to 3000 C. Thechamber pressure is typically 5 x 10-8 after a one-hour traybaking cycle. The chamber was designed for a throughput of onetray per hour.

PLATING CHAMBER

The third chamber is the plating chamber. It contains two goldplating stations; one for coarse plating and another for fineplating. The coarse plating can be started at about 2000 Ccrystal temperature, while the fine plating is done typicallyat the upper turnover temperature for AT-cut crystals. Thecoarse plating station contains a tray temperature holdingoven. This oven is used to minimize "heat shock" on thecrystals going into the heated plating head. It also increasesthe speed of operation.

There is a need to cool the crystals between the coarse andfine plating stations. Place is provided for two trays on eachtransport between the two stations.

Experiments indicate that crystal frames at about 300 0C,placed into the fine plating head, will cool to within 50C ofthe upper turning temperature in 2 1/2 minutes. Cooling in thetray for one hour, from the initial 3000 C temperature,results in a 2 min cooling time in the fine plating head.However, the thermal shock to the crystal is greatly reduced inthe second case.

The throughput of the coarse plating station is described underthe heading "Evaporant Source."

SEALING CHAMBER

The fourth chamber is the sealing chamber; it contains apreheat furnace, a ram and furnace for thermo-compressionsealing,1 and a tray transfer manipulator.

5

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The preheat furnace is 1s2;. L, n-::<e the thermal shock tothe crystal at insertion irto Lhe sea> .g furnace and also tohelp maintain the throughput of the system.

The sealing chamber has provilsionq for gas back filling of thecrystal units, when specified. This chamber has a throughputof one tray per hour. The pressure during the sealingoperation at 300 0 C oven temperature was typically 5 x 10- 7

Torr. Residual gas data is o:ven in the Appendix (Figure I).

EXIT CHAMBER

The exit chamber is an airlock chamoer, similar in constructionto the entrance chamber. It is used to unload completedcrystal units from the system. It has provisions for rough andfine pumping, and it contains one transport.

ENVELOPE SUPPORT STRUCTURE

The support structure design is based on the principle ofunrestrained platforms in the horizontal plane. The fiveindividual chambers are attached to individual "floating"platforms. Each platform is supported by four ball coastersengaging a ground plate. The elevation of the chamber endflanges are adjusted by shimming of the stand. When thechamber end flanges are bolted together, the external forcesare thus substantially eliminated by the "floating" platforms.Thermal expansion during chamber bakeout results in a platformtranslation, so that substantially no stresses result along thechamber axis. Individual chambers may be separated at theconnecting flanges and moved forward for maintenance.

RESONATOR TRAY

The tray carrier was built as indicated in the first report(see Figures 5 and 6). Experiments with the tray indicatedthat, after a few heating cycles to 300 0 C, the corrugatedsteel ribbon, serving as the flatpack frame-to-lid spacer,failed. Molybdenum ribbon was substituted for the spring steelstock. After a few dozen operations, even the molybdenumsprings failed.

Analysis of the problem indicated that the corrugated springswere overstressed at the 300 0 C operation. Due to the lack ofspace in the tray, it was not practical to reduce the stressesin the spring design.

6

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7923-2

Figure 5. Resonator Tray, Empty

A design utilizing pivoted "fingers" was then arrived at. Inthis design, each row of fingers is loaded with two tungstenflat springs. These springs are stressed considerably belowthe yield strength of tungsten at 3000, so that no springfailure should occur. Indeed, experiments indicated that thesetrays survived at least 36 production runs without any sign ofdeterioration.

These pivoted fingers are well restricted in their motion and,unlike the corrugated springs, will not get "caught" betweenthe last lid and the stationary anvil.

7

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7923-1

Figure 6. Resonator Tray, Loaded

The initial trays contained separators for 10 crystal units,but were long enough for the addition of spacers to hold 25units. The first attempt at sealing with 20 unitssimultaneously was accomplished with 100 percent yield atRadiflo* leak detection.

The entire system is designed so that the ultraviolet tubes,heaters, and the sealing oven/ram, are capable of accommodatingtrays with 25 crystal units.

*Trademark, Iso Vac Engineering

8

.4-- - -. ---- ---- 4&- ~ --- ------- - - ---. _ _ _ _

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TRAY TRANSPORT

The tray transport was built substantially as described in thefirst report (see Figure 7). Two types of tests were conductedon the transport after installation into the chambers:

1. Temperature (300 0 C) and continuous vacuum operation,

2. Transport-to-transport tray transfer operation (seeFigure 8).

79122-5

Figure 7. Tray Transport

79102-1

Figure 8. Tray Transfer Operation

9

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Extended time period operations of the transport were made inthe bake chamber under continuous vacuum of 10- 7 to 10- 8

Torr, with the heaters operating at 300 0 C crystal temperaturefor about eight hours per day. After three to four days ofthis operation, the commercial magnetic feedthrough drive shaftstarted to run "rough". Within about ten days of operationunder the above conditions, the shaft seized up completely.These shafts were mounted in molybdenum disulfide coatedjournal bearings.

The journal bearings in the feedthrough were then replaced bymolybdenum disulfide coated ball bearings. No further problemswere observed, after over six months of operation.

Transport-to-transport transfer experiments were conducted inthe actual chambers. The transfer was effected flawlessly. Itwas noted, however, that in a few instances the crystals' traywas partially knocked off the transport by a manipulatoroperator error.

In order to eliminate this problem, dual funnel-shaped guideswere placed at the ends of the transports (see Figure 9).These guides are capable of "righting" the misaligned trays onthe transport, just by driving the trays through the guides.

79122-4

-4.

Figure 9. Tray Transport Showing Funnel-Shaped Guides

10

.........---------.-.----------. -----

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VACUUM MANIPULATOR

The three manipulators were built similar to the first model(see Figures 10 and 11), as described in the first report. 1

Operation of the manipulator/forceps in the actual transfer ofthe crystal frame from the tray to the mask and back to thetray indicated only one flaw. The forceps' jaws did not gripthe frame firmly, due to the jaws' pivoted mounting. Also,there was a tendency for the frame to slide back into theforceps, and it was cumbersome to retract the frame from thatposition.

/// Rough Vacuum Port

f{ Sealed Blla Joint

View Port 4, lm goal

Metal selows- Typical

Forcepe

Part Tray

//Transport

Figure 10. Vacuum Manipulator, Schematic

11

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7793-1

Figure 11. Vacuum Manipulator

This problem was solved by using nonpivoted (i.e., firm) jawsand frame backstops on the jaws. Unfortunately, however, thismade the forceps noncompatible with the various size flatpackresonator frames. The use of parallel motion forceps wouldsolve this incompatibility problem.

EVAPORANT SOURCE (NOZZLE BEAM)

The first nozzle beam source was fabricated at GEND early in1977 according to the design by R. P. Andres, E. Hafner andJ. R. Vig.4 A schematic diagram of the classical nozzle beamsource is shown in Figure 12. Tungsten was used for both thecrucible and source tube. It was found that after the secondheating cycle, the crucible cracked. Investigation indicatedthat since the gold adheres to the walls of the tungstencrucible, and since the gold-to-tungsten thermal expansionratio is about 3.5:1, cooling permanently deformed both thegold charge and the tungsten crucible walls. At subsequentheating, further permanent deformation was imparted to thetungsten crucible walls due to the higher thermal expansion ofthe gold. Eventually, the cylindrical walls would fail in thehoop stress cracking mode.

12

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SOURCE COLLIMATIONCHAMBER SO R ECHAMBERSK M E

( AP ERTURE - d° 0APERTURE d I1

VAPOR

nol, T1

0 /

LIQUID RESERVOIR

VACUUM

THE CLASSICAL EXPRESSIONS FOR DENSE FLOW ARE:

fo=(0. 513) no0 2kT0 " [27rdo (1)

WHERE f0 = TOTAL SOURCE FLOW (MOLECULESISEC)

n0 - SOURCE DENSITY (MOLECULES/CC)

To SOURCE TEMPERATURE (CK)

k - BOLTZMANN'S CONSTANT (ERG/ 0K)

m - MOLECULAR WEIGHT OF VAPOR (GMIMOLECULE)

do SOURCE APERTURE DIAMETER (CM)

1 ( - 0,) - CENTERLINE FLUX INTENSITY (MOLECULES/CM e SEC)

I = DISTANCE FROM SOURCE APERTURE (CM)

Figure 12. Nozzle Beam Evaporant Source, Schematic(A plot of Eq. 2 for gold is given in theAppendix, Figure II.)

13

! .k

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Other crucible materials were investigated. Graphite appeared

to be the best candidate for the following reasons:

1. Low vapor pressure up to 25000 C,

2. Liquid gold does not "wet" graphite, hence it will notrun over the side walls of the crucible, and it will notrun into gaps between bores and close fitting plugs,

3. Graphite crucibles can be temperature cycled with liquidor solid gold without cracking them,

4. It has relatively high thermal resistance, so that heatzones can be well confined,

5. High purity material is commercially available,

6. It is relatively easy to machine,

7. It has moderately high electrical resistivity, so thatpractical heating elements may be constructed ofgraphite.

A crucible and source tube were built using Poco Graphite Inc."filled pore" and purified DFP 3-2 material. An isometricdrawing of a current device is given in Figure 13. Thecrucible is shown in Figure 14 and the crucible with tripleradiation shield in Figure 15. Current sources have fiveelement radiation shields made of tungsten foil.

External heaters were used to melt the gold charge initially,and to maintain crucible temperature. Source tube temperatureswere measured by an optical pyrometer through a "window" in thecrucible wall. Later, the power input to the source tube wasincreased by increasing the source tube diameter, so thatexternal heaters are no longer required.

In the early experiments a glass slide was used for the target,permitting observation of the film build-up from the backside. The source tube was operated up to 24000C at midspan.N4o visible amount of gold was deposited on the target glass inseveral minutes at 24000C. It was soon realized that theliquid gold was pushed out of the source tube and back into thereservoir by the gold vapor pressure at elevated temperatures(P a 1 cm Hg at 20000C). A tungsten rod was placed into thesource tube bore in order to "wick" the gold up into the heatzone of the source tube, and to provide relatively large goldsurface area for vaporization. A picture of a current modelwick is given in Figure 16. An X-ray photograph of the goldsource is shown in Figure 17. This source has clocked over1,000 hours of beaming. The wick has two axial and thirty

14

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46HA922302

SOURCE TUBE POWER STRAP("-75Ai8V)

*GRAPHITE CRUCIBLE & SOURCE TUBEWITH TUNGSTEN "WICK'

04 CONCENTRIC RADIATION SHIELDS SOURCE TUBE CLAMPAND COVERS ARE NOT SHOWN - t- MOLYBDENUM"-3" O.D.

*OVERALL LENGTH 3"

*OUTPUT: 2,500 Almin AT 2" HEADER MOLYBDENUMDISTANCE FROM SOURCE APERTURE

OGOLD CONSUMPTION: <.2 gm/hr -INSULATORAT 2,500 X/min RATE AT 2"-

PLUG ( GRAPHITE

,240 CONE WICK (TUNGSTEN

SOURCE APERTURE.020" DIA APERTURE I

TRIMMING APERTURE2 1120 CONE GOLD (.030" DIA TUNGSTEN

LEVE L

SOURCE TUBE I GRAPHITE

'-.327" DIA AT 7.5"

PLUG I GRAPHITEGOLD RESERVOIR

CAPACITY"-40 gms ) = SUPPORT LEGS ( 4).040" DIA TUNGSTEN

CRUC I BLE.750" DIA x 2.25" LONGGRAPHITE

GROUND STRAP

Figure 13. Nozzle Beam Evaporant Source, Isometric

15

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7968-1

Figure 14. Crucible, Nozzle Beam Evaporant Source

radial grooves on its surface in order to reliably feed thegold over the wick surface. These grooves also increase thesurface area over that of a plain rod for increasedvaporization rate.

With the wick in the source tube, gold was finally deposited onthe target. Initially, the deposition rate was about 40 A/minat 7.5-in. source tube-to-target spacing.

16

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TRIPLE SHIELD

SOURCETUBE CLAMP

CRUCIBLE" HEADER

SKIMMER

CRUCIBLE

TERMINAL

CRUC IBLESUPPORTS

1 2 3 4 5

Figure 15. Nozzle Beam Evaporant Source, Crucible and Shield

17

~~ -

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7968-2

SKIMMER TUNGSTENROD WICK SOURCE DUAL

TUBE SKIMMER

Figure 16. Source Tube, Wick and Skimmers

18

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Figure 17. Gold Source, X-ray Photograph

Io order to increase the output of the source, empirical

parametric studies were conducted. The original source tubeaperture was a 0.020-in. diameter "knife" edge type, assuggested by Andres. 4 The aperture diameter was varied from0.010 to 0.025 in. by successively drilling and countersinkingthe aperture between runs. No skimmer aperture was used inthese experiments, since it was known that the apertureseriously affects the output intensity. The results ofvariation in aperture diameter are given in Table 1.

During this time, we were plagued with burned out source tubesand plugged skimmer apertures. For these reasons, we could notrun long experiments. It was imperative to solve theseproblems in conjunction with increasing the gold output rate.The following paragraphs will attempt to describe the problemsencountered, and the proposed solutions.

19

7-. _ _ - - -... I_

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Table 1. Effect of Aperture Diameter Variation

Aperture Source Tube Source Tube Deposition*Diameter (in.) Current (A) Temp. (oC) Rate (A/mmn)

0.010 80 2260 50

0.015 80 2260 167

0.020 80 2260 269

0.025 80 2260 plugged**skimmer

*At 7.5-in source tube-to-target distance, and 0.020-in.

source tube bore diameter.

**Output rate was probably considerably higher than 269 /min

in order to plug the aperture.

SOURCE TUBE BURNOUT

There were two distinct mechanisms observed that were causing asublimation of the graphite source tube. One was localized hotspot due to the geometry of the wick and source tube. Theother was the gold short circuiting the source tube to thewick, causing a localized hot spot.

SOURCE TUBE DESIGN

It was imperative to obtain a relatively long, low temperaturegradient heat zone at the center of the source tube in order tovaporize a sufficient amount of gold to maintain equilibriumvapor pressure of about 10-mm Hg, and to minimize hot spots, sothat the life of the source tube would be extended.

Initially, the source tube bore was terminated about 1/32 in.above the wick tip, and above the bore the section was solid upto the power clamp. There was a large discontinuity in theheat generation and heat conduction at the interface of thehollow and solid sections. A temperature distribution curvealong the source tube axis was made analytically by Andres;

5

two curves are given in Figures 18 and 19. These curves have arelatively short heat zone and a large gradient at the end ofthe bore. Both empirical and analytical studies indicated that

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the wick was conducting a very significant amount of heat outof the source tube. The locus of termination of the wick andthat of the top of the crucible, relative to the source tube,are important parameters determining the temperature profile ofthe source tube.

In order to minimize the electrical and thermal discontinuitiesof the source tube at the end of the bore, another similar borewas placed into the top section of the source tube. A smallplug was left between the top and bottom bores in order tomaintain a closed gold vapor chamber. A temperature profile ofthis hollow source tube is indicated in Figure 20. The heatzone is significantly extended on this curve, and the profileis relatively flat even beyond the termination of the vaporchamber.

SOURCE TUBE22 \

0

N 20U

F

WICK

14

0 0.3 0.6 10ogIN 9E 1.2 1.5 I1.8

I

WICK SOURCE SOURCE TUBEAPERTURE

Figure 18. Temperature DistributionCurve, Solid Source Tube,0.9-in. Wick Insertion Depth

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SOURCE TUBE

22

0

x 20U

WIC

is18C Figure 19. Temperature

Distribution Curve,

16 Solid Source Tube,0.8-in. Wick Insertion

14 -TDepth

0 0.3 0.6 1 . .

INCHES

WICK SOURCE SOURCS TUBEAPERTURE

SOURCE TUBE

22

N20-

U0L

IM rWC Figure 20. TemperatureDistribution Curve,Hollow Source Tube

0 0.3 0.6 0.9 12 1.5 i.e

WICK SOURCE SOURCE TUSEAPERIUE

22

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WICK DESIGN

In order to further extend the heat zone at the bottom of the

source tube, the tungsten wick diameter was reduced to

0.070-in. diameter, and a graphite sleeve was substituted forthe removed tungsten. The temperature profile of the slender

wick is shown in Figure 21.

SOURCE TUBE

232

ICK

17

0 0.3 0.6 19 1.2 1.6 1.3

WICK SOURCE SOUJRCE TUBEAPERTURE

Figure 21. Temperature DistributionCurve, Reduced TungstenWick Diameter

The function of the wick is to move the liquid gold from thebottom of the gold reservoir into the heat zone of the sourcetube. It is important to maintain a high thermal impedance atthe wick support in order to maintain all exposed tungstensurfaces at the heat zone temperature, so that gold vapor willnot tend to condense at the colder surfaces.

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Another problem encountered was the wick-to-source tubeelectrical short circuit. Gold was condensing at the end ofthe source tube bore, and this liquid gold was dripping ontothe tip of the wick, thereby shorting the wick to the sourcetube. The short would be generally only momentary, because thesource tube current would vaporize the gold droplet. However,repeated current surges across a relatively short section ofthe source tube would result in the source tube "burnout" dueto excessive sublimation of the graphite. An X-ray photographin Figure 22 indicates gold droplet formation at the end of thebore, in one of the early devices.

Figure 22. X-ray Photocraph, Source Showing Gold Dropletat End of Bore

The solution to the shorting problem was obtained by alteringthree parameters. First, the source tube bore diameter wasincreased to 0.116 in. from 0.090 in.; the wick diameter wasmaintained at 0.070 in.

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The increased wick-to-bore gap permits the gold droplets tofall to the bottom of the source tube. Second, as indicatedpreviously the solid top shank of the source tube was bored outto 0.116-in, diameter. This resulted in a uniform temperatureprofile at the upper region of the source tube bore, so that nogold would condense in this region. Third, the gap between thetip of the wick to the end of the source tube bore wasincreased to 0.060 in. This has the effect of increasing thetemperature at the end of the bore, and providing space forlarger droplets to form before shorting out to the wick. Smalldroplets tend to attach themselves to the graphite walls, butas they grow to about 0.030-in, diameter, they drop off. These"small" droplets, of course, will not short the source tube tothe wick, for more than a few milliseconds, because they arevaporized by the current surge. It was noted that when coolingthe crucible, occasionally gold droplets would still form atthe end of the bore; however, they did not constitute a problem.

PLUGGED SKIMMER APERTURE

In the early days of the gold source development, there was noproblem with the skimmer aperture plugging with excess gold.However, as the source output rate increased, plugged skimmerapertures became a serious problem. The original apertureplates were made of graphite; it was soon discovered that goldtends to "ball up" on the graphite aperture plate. The ballsor droplets will grow on the edge of the aperture andeventually form a liquid plug in the aperture. In order tosolve this problem, aperture plates of molybdenum were tried,as gold will coat molybdenum evenly. Sufficient length ofmolybdenum drip leg must be provided below the aperture, sothat the liquid gold will drop off before it reaches theaperture. After several days of operation, the molybdenumskimmer aperture plates disintegrated due to gold alloying withthe molybdenum. Tungsten skimmer apertures were next tried andare now being used. No damage has been observed on thetungsten skimmer plates after 1200 hours of operation.

SKIMMER APERTURE EFFICIENCY

Experimental data indicated that a 1,000-A/min beam from thesource tube, measured at the target 5.5 in. from the sourceaperture, is degraded to about 300 A/mmn by the insertion of a0.030-in, diameter knife edge planar aperture placed 0.350 in.in front of a 0.020-in, diameter source aperture. The apertureefficiency was, hence, about 30 percent.

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In order to improve the aperture efficiency, the 0.003-in.thick aperture plate was bent sharply at the aperture to form a900 included angle. The aperture efficiency was improved toabout 50 percent. The best aperture plates that have evolvedwere made of 0.003-in. "soft" tungsten sheet, with a 0.030-in.diameter aperture. These plates were suspended over thereservoir, so that the temperature on both sides wasconsiderably above the melting temperature of gold(,1400 0 C). These plates also had long pointed drip legsbelow the aperture in order to channel the gold flow away fromthe aperture region.

The output spot has a Gaussian intensity distribution. With a0.030-in. diameter skimmer aperture, at 5.5-in.target-to-source aperture spacing and a 400-A/min depositionrate, the spot diameter at the 50 percent drop-off point wasabout 3/4 in. The required spot size at the 50 percentdrop-off point is about 3/8 in., so that there is about 400percent potential gold consumption rate improvement. Anaperture diameter less than 0.025 in., however, at 400-A/mintarget deposition rate and standard conditions, will plug uprapidly. This occurs essentially due to liquid gold dropletsforming above the skimmer aperture due to the wide angle beamoutput of the source aperture and flowing into the skimmeraperture. A coarse and a fine skimmer aperture combinationwill be tried; the coarse aperture should limit the amount ofgold reaching the fine aperture plate. Hence, 0.015-in.diameter fine limiting apertures may not plug up; this apertureshould give a spot size of about 0.375-in. diameter at the 50percent drop-off point. It must be kept in mind, however, thatthe aperture efficiency deteriorates as the aperture size isreduced.

RESERVOIR CAPACITY

The reservoir has a capacity of 40 grams of gold. Empiricalmethods indicate that the gold consumption rate for a 400-9/mindeposition rate on a 0.375-in. diameter (50 percent drop-off)spot is about 0.2 g/h. This will give a 200-h beaming time forthe source. Theoretically, this beaming time should plate6,000 (20 MHz) resonators (30/h). Mechanical shutters are usedto stop the gold beam during changing of the resonators in themask. Between crystal trays, however, the source is put into astandby mode by passing 60 percent (50 A) of the beamingcurrent through the source tube. At this current, the sourceoutput rate is less than 2 A/min, and can be returned to arelatively stable beaming mode in two minutes.

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BEAM-TO-TARGET ALIGNMENT

Since the gold beam is relatively narrow, in order to obtain

optimum efficiency the beam alignment to the target must be

within about 0.03 in. The alignment is accomplished by optical

means. A 450 prism is mounted on the top of the source tubeshield; it is cooperating with a short focus telescope, asshown on Figure 23.

A

TELESCOPE

VACUUM

I I 450 PRISM

SOURCE 1IMS

S OI

SOURCE 2

Figure 23. Optical Source Alignment Device

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The crystal mask elevator is roughly adjusted so that thecenter of the mask is in the plane of the center lines of theapertures in the two source tubes. One source tube isenergized to the standby mode; the incandescent source tubeaperture is now highly visible through the skimmer aperture.The prism, on the top of the other source is adjusted by theelevators to the mask center level. The source aperture isviewed through the mask from the viewport above the prism witha short focus telescope. The source support shaft is rotatedand moved in the vertical direction until the source apertureappears centered in the mask and in the skimmer aperture, asviewed through the prism. The elevator is locked, and thesepositions are noted on the elevator's dial indicators forrepositioning. A similar procedure is used to align theopposite source.

Light projected through the skimmer aperture from theincandescent source tube can als~o be used for rough beamalignment purposes. Fine alignment is obtained from depositionrate monitor crystal data.

In the system, the source-to-mask distance is 5 1/2 in. Arelatively large source-to-crystal distance is required forfine plating to minimize the heating effect of the sourceradiation. The precise dimension was determined by the closestpositioning of the six-inch valves on the source and maskelevators. The intensity of the beam varies inverselyproportional to the square of the distance between the targetand an imaginary beam convergence point behind the sourceaperture, so that a beam intensity of 2,500 A/min can beobtained at two-inch source tube-to-target spacing and at thenormal operating source tube temperature. At 5.5-in, spacingthe intensity is about 400 A/min.

An important advantage of the nozzle beam source is itsrelatively low heat radiation characteristics at "fine"tuning. The source is substantially equivalent, in heatradiating characteristics, to a 2,O000 C tungsten source of0.030-in, diameter as seen by the target. The skimmer plate,which contains the 0.030-in, beam limiting aperture, isoperating normally at about 14000 C, so that its heatradiation output is insignificant to that of the source tuberadiation through the skimmer aperture.

Typically, when the beam shutters are closed, after a oneminute "fine" plating process, the final frequency on a 20 MHzfundamental AT-cut resonator will change less than 1 Hz in theplating mask, at the upper turning point.

The nozzle beam sources are enclosed in five concentriccylindrical radiation shields, made of 0.002-in, tungsten foil,and layers of parallel shielding on the top and bottom of the

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assembly. The whole device is enclosed in a water-cooledcopper jacket in order to minimize the heat radiation onto themask head.

OPERATING LIFE

Two nozzle beam sources were operated at 2,000 to 2,100 0Csource tube temperature for more than 1,400 hours. Microscopicand X-ray examinations of the crucibles and source tubesindicated no deterioration. It is not known what the failuremechanism of the source is. The present device is expected tooperate for several thousand hours. There is no reason tobelieve that the crucible should ever crack or sublime.

However, the source tube heat zone may vaporize eventually.The source tube diameter and wall thickness may be scaled up ifextended life is required. Also, the reservoir size may bescaled up if increased loading capacity is desired. Of course,both of the above modifications will require larger powerinputs, and increased cooling capacity.

THROUGHPUT RATE

The crystal throughput rate in the system is limited by thecoarse deposition rate; this deposition rate, in turn, islimited by the gas evolution from the sources and the heatedparts of the chamber and the pumping speed. It appears thatthe gasses can be driven out of the sources rapidly. However,the pumping speed is not sufficient at 10-7 Torr to handlethe load for several days after a new source is inserted intothe system.

There is only one 6-in, pump provided for both platingstations. It now appears that the addition of a 6-in, pump andthe separation of the two stations by a gate valve would behighly desirable. Initial outgassing of the sources, afterexposure to atmosphere, is to be accomplished in an auxiliaryvacuum system and, after attachment to the system, while stillin the elevator well, with the respective gate valve to theplating chamber still in the closed position.

If the chamber and sources have been exposed to the atmosphere,several days of envelope baking with heating tape, and goldsource outgassing is required before the pressure reaches5 x 10 7 Torr at 2004k/mmn. deposition rate. Thereafter, thepressure continues to improve with constant daily operation ofthe system. The pressure at 400 A/min. deposition rate istypically double that of the 200 A/min. rate.

The best beaming pressure obtained was 2 x 10-7 Torr, afterabout two weeks of daily operation. Residual gas analysis datais given on Figure I in the Appendix.

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It is imperative to realize that the source aperture to targotspacing in this system is 5.5 inches. At a 3.2-inch spacingthe deposition rate is increased by about 262 percent, withoutany increase of plating chamber temperature or any reduction insource life.

It may be possible to redesign the coarse plating chamber, withthe use of small format gate valves, so that the sourceelevator nipple centerline to mask spacing would be about threeinches. This will result in deposition times of under oneminute for standard 800 A thick layers, at the present Sourceoperating temperatures and pressures. A significant saving ingold usage would also result.

ELECTRODE MASK HEAD

The mask head was built according to the guidelines describedin the first report (see Figures 24, 25 and 26).

The mask holder contains two contacting pins and the seriescapacitor. The mask holder may be moved by the manipulatorinto a special tray. This tray also holds frames withcalibrated crystals, and frames with electrical shorts forsystem calibration purposes.

The contact actuator, mask holder retaining clamp, and the goldbeam shutter, are operated by an electro-pneumatic system.

The mask elevator with its mask head, is removable from theplating chamber as an integral unit, and may be bench testedbefore insertion.

Figure 27 is a block diagram of the plate-to-frequencycontrols. During actual plating-to-frequency operation, twoproblem areas have been identified and corrected:

1. Poor sensitivity,

2. Frequency shift due to contact parameter variations atrepeated contacting.

The solution to the first problem was to use ceramic insulatedcoaxial signal leads within the vacuum envelope (not shown onthe photographs); initially, only the external signal leadswere coaxial.

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78108-2

Figure 24. Mask Head and Elevator

31

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70122-1

!4

Figure 25. Mask Head

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Figure 26. Mask Head Close-up

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SWEEP . .. . .. ..

SIGNAL GENERATOR S OSCILLOSCOPE

HP3335A

POWER SPUTTER

I [ A AMPLITUDE

VECTOR PHS

XTAL VOLTMETERLEL

* FLOATING SHIELD SOLENOIDCOAXIAL FEEDTHRU

WITHIN VACUUM CHAMBER

Figure 27. Plate-to-Frequency Controls, Block Diagram

Crystal response to direct feedthrough signal ratios of 5:1were obtained repeatedly after the above change was made.Ratios of about 80:1 were later obtained by using floatingshielded coaxial feedthroughs at the vacuum envelope.

The solution to the second problem was found to be an increasedcontact pressure on the contacting Fernico* pins.

It was not conclusively proven why the contact pressure wouldchange the frequency indication by as much as 200 Hz. It wastheorized that a surface film at the Fernico-to-gold interfacehad to be "broken through," in order to maintain the circuitresistance within a tolerable range.

Frequency indication variations of no larger than 10 Hz areobtained with the increased contacting force.

SEALING FIXTURE

The heater chamber and hydraulic ram schematic is shown inFigure 28. The sealing fixture was built as described in thefirst report (see Figures 29 through 31). Metal bellows were

used to obtain the vacuum seal between the stationary and themoving components.

*Trademark, General Electric Company

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CompressionPower Feedthronghs Pressure Gages

Sealing Furnace

Return StrrokeBellows - Pressure Gage \

Pistonstationary Ramrod

AnvilHydraulic Cylinder

Guide Bushing Wa*tering Valve

Figure 28. Sealing Fixture Schematic

79189-1

Figure 29. Sealing Fixture

79189-2

Figure 30. Sealing Fixture, Showing Sealing Furnace and Ramrod

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Figure 31. Sealing Fixture, Sealing Furnace

The ram is capable of exerting a total force of 2,000 lb on thestationary anvil. The ramrod that enters the crystal tray ismade of molybdenum in order to obtain maximum resistance tobuckling, since its maximum diameter is limited to the crystalframe width (0.400 in.).

An internal copper bushing was retrofitted into the sealingoven in order to guide and laterally support the ramrod at thecrystal tray during the compression cycle.

The initially used Nichrome* heaters were coating the heatercore ceramics with a layer of metal, and shorting out coils.The Nichrome wire was replaced with tantalum wire and nofurther problems were observed.

*Trademark, Driver-Harris Co.

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The sealing oven has three heating elements enclosed in copperbars. Two of the bars are mounted on the main oven envelope;the third is mounted on the door of the oven. Even though theheater bars are well-isolated thermally from the oven envelope,the heater on the door runs much hotter than the other twoheaters. Installation of an independent current controllingdevice was required.

The multiple or stack thermocompression sealing process workswell. Data taken on 20 MHz packages with ten units sealedsimultaneously resulted in a yield of 83 percent at Radifloleak testing for all causes, including defective parts. Thisdata was taken on a sample size of 450.

One sealing run was made recently, with twenty envelopes sealedsimultaneously. All units passed Radiflo leak detection.

ELEVATORS

Elevators were utilized on the source and mask heads, so thatthey are retractable behind a gate valve for maintenancepurposes without losing plating chamber vacuum. The elevatorshaft-to-housing space is sealed with metal bellows and theelevator is driven by a manually operated lead screw. Theelevator chamber is rough-pumped prior to the insertion of thehead into the plating chamber.

CONTROL CIRCUITRY

The ERADCOM Quartz Crystal Fabrication Facility vacuum chamberis divided into five sections: entrance, clean and bake,plating, seal, and exit. The vacuum system controls are housedin cabinets separated and individualized for each section ofthe system. The cabinets are located directly across thevacuum chamber in front of each operator station (photo, Figure2). Operators have a clear view of all indicators, lights,etc. However, operators are not able to reach these cabinetsacross the vacuum system due to the clearance left forservicing the vacuum system. Therefore, all switches andcontrols that an operator would normally adjust on a regularbasis are provided as remote controls located on a small panelwithin easy reach at each of five operator stations.

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Each of the cabinets housing the facility controls contains ackimpressor for a cryogenic vacuum pump and a vacuum pressuregage. The remaining controls are individualized for eachsection providing, where needed, such functions as: valvecontrol, power to uv and incandescent lamps, power to heaters,power to the gold source evaporators, and controls for maskhead operation. Closed loop temperature regulators withthermocouple sensors are provided for heater control. Manyfunctions such as heater power, valve operation, etc. areinterlocked with cooling water flow, vacuum pressure or othersuitable protective criteria to minimize problems due tooperator error. While the facility controls presently areintended for manual operation, the possibility of futurecomputer automation has been considered and circuit layout andother features were designed to minimize the difficulty ofadding this capability.

A sixth cabinet (shown at the extreme left of Figure 2) housesequipment used in automatically plating crystals to a specifiedfrequency. This cabinet is on rollers and can be moved alongthe length of the vacuum chamber to either the rough or finecrystal plating positions. A block diagram of theplate-to-frequency controls is shown in Figure 27. A resistivePi-network is mounted within the vacuum chamber as an integralpart of the rough and the fine plating mask head assemblies.This is nominally a 25-Q2 network constructed by metallizationand film disposition on ceramic substrates. The load capacitormay be added or omitted.

The network is balanced to zero phase with a short substitutedfor the crystal. Crystals are plated until the phase is againzero, with the frequency from the generator adjusted to thedesired crystal operating frequency.

The Hewlett-Packard HP3335A signal generator provides a greatnumber of features that make setting up the system and/orchecking the crystals for proper operation quite easy. Forexample, seven preset combinations of control settings can bestored in the instrument memory and instantly recalled at anytime; a wide range of automatic or manual sweep conditions isavailable.

Automatic plating-to-frequency is accomplished simply by thefollowing steps: first, setting the signal generator to thedesired crystal frequency; second, pressing the shutter openbutton; and third, waiting for automatic closure of the shutterthat blocks gold deposition.

Emergency power of f buttons are located at the front and backof all control cabinets to provide for equipment and/orpersonnel protection.

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CONCLUSIONS

1. The basic design of a high throughput high vacuumprocessing system for precision quartz resonator units hasbeen proven with an operational device. Each work stationwas operated at the rate of 15 units per hour, although theentire system has not been operated at that rate so far.

With the use of 25 position trays, a nominal productionrate of 25 units per hour should be realized.

However, because of the complexity of this facility, anintegrated test of the entire processing system will berequired to establish operating reliability of each workstation and total system capacity.

2. A highly reliable, long-life, nozzle beam gold source wasdeveloped. The source is capable of operating for twohundred hours at deposition rates of 2,500 X/min at 2.0inches of "throw" distance, with one charge of gold. For20 MHz fundamental resonators, this typically correspondsto 2,000 + units plated, (on one side). The depositionrate is characterized by extremely high short-termstability, after the initial warmup period.

This basic design may be scaled up or down for otherspecific applications.

3. The system was operated for several months at a throughputof about one tray of 10 crystal units daily without afailure, except for the failure of the crystal unitcontacting pins. The contact pins have been redesigned,and no further problems are expected.

4. The major source of gas in the plating chamber is the goldsources, not the chamber walls, even when the walls areheated. Chamber pressure of 5 x 10-7 Torr was obtainedafter 8 hours of source operation at a 400-A/mmn depositionrate at 5.5-inch throw distance. The pressure typicallyreaches equilibrium at under 5 x 10-7 Torr in one to twoweeks of operation.

5. There was insufficient time available in this project tooptimize the efficiency of the gold utilization, i.e., toreduce the beam spot size to the crystal plate size. A400 percent improvement in the gold utilization may beachievable. This would reduce the loading downtime by afactor of 4, and would reduce the gold charge requirementby a similar factor.

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RECOMMEND ATI ONS

1. Install a valved off separately pumped cooling chamberbetween the two plating stations. This would permit thecooling of the crystal units at a pressure about twodecades lower than that of the coarse plating chamber. Thepressure in the fine plating chamber could be maintained atabout one decade below the coarse plating chamber. Anadditional pump on the fine plating chamber would berequired.

2. The QXFF is potentially capable of production rates ofabout 50 units per hour. The major limiting factor now isthe coarse plating speed. In order to achieve the aboverate, a new coarse plating chamber is required, with thesource head to mask head centerline spacing of threeinches. This can be achieved with the use of "closeformat" gate valves on the elevator tubes. The addition ofthe above cooling chamber, and the extension of some ovensis necessary to achieve the increased production rate ofthe system. It should be noted that maintenance downtimeis not considered in the "potential" production rate.

3. It may be possible to achieve significant improvements inthe nozzle beam gold source, with a relatively modestprogram. Larger beaming rates could certainly be achievedwith larger source tubes and wicks. Reducing the size ofthe beam may be achieved by multiple skimmer apertures.Improved water cooled shields should be tried, particularlywith the higher power units.

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ACKNOWLEDGMENTS

The author wishes to express his appreciation for the tirelessefforts of Dr. E. Hafner of the U. S. Army ERADCOM forproviding guidance and counsel from his initial concept throughthe construction of the Quartz Crystal Fabrication Facility.

Sincere appreciation is expressed for the invaluable consultingwork of Dr. R. P. Andres of Princeton University, Department ofChemistry, in connection with the design of the nozzle beamsource.

The author is indebted for the contributions of J. F. Howell,GEND Manufacturing Engineering Operation, for his design of theelectrical and electronics system and for his tireless"troubleshooting" services.

Sincere appreciation is expressed for the outstanding designwork, initiative, and inexhaustible patience of Wade Roberts,of the Engineering Design Definition Group.

The author also wishes to express his gratitude to SanbornHutchins, the toolmaker's toolmaker at GEND Maintenance ToolRoom, who made real parts out of nearly impossible designgeometry and materials.

Last, but not least, the author is indebted to J. Havelka, GENDCrystal Resonator Development group, for running the nozzlebeam source experiments, for assembling and operating thefacility, and for making valuable suggestions on both devices.

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R=",NqIG FA(Z 14C . r leAPJ

REFERENCES

1. Erich Hafner and John R. Vig, "Method for Processing QuartzCrystal Resonation," U.S. Pat. No. 3,914,836, October 28,1975. Also, E. Hafner and R. Ney, "High Vacuum ContinuousCycle Fabrication Facility," U.S. Patent Applied.

2. J. M. Frank and R. J. Ney , "Quartz Crystal FabricationFacility - First Semi-Annual Report, October 1976 - March1977," GEND Report GEPP-309, November 1977. (SeeAppendix.) Copies are available from the NationalTechnical Information Service, Sills Building, 5285 PortRoyal Rd., Springfield, VA 22161, Accession No. AD A053582.

3. J. R. Vig, et al, "Further Results on UV Cleaning and NiElectrobonding," Proceedings of the 29th Annual Symposiumon Frequency Control, 1975, U. S. Army Electronics Command,Fort Monmouth, New Jersey, pp 220-229, also in IEEE Trans.Parts, Hybrids and Packag., PHP-12, pp 365-370, Dec. 1976.

4. R. P. Andres, "Design of a Nozzle Beam Type Metal VaporSource," Technical Report, ECOM-4437, U. S. ArmyElectronics Command, Fort Monmouth, New Jersey, October1976. (For a similar treatment of the subject, see:Proceedings, 30th Annual Symposium on Frequency Control, U.S. Army Electronics Command, Fort Monmouth, New Jersey, pp232-236, 1976. Copies available from Electronic IndustriesAssociation, 2001 Eye Street, N.W., Washington D.C.,20006.) Also, John R. Vig, Erich Hafner, Ronald P. Andres,"Nozzle Beam Type Metal Vapor Source," U.S. Patent No.4,125,086, November 14, 1978.

5. R. P. Andres, unpublished data.

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-NC r F1limD

APPENDIX

PLOT OF EQUATION TWO FOR GOLD

45

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160

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1600 1800 2000 2200 2400 2600 0 C

Figure HI. Ideal Source Behavior - Rate of GoldDeposition

48

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ELECTRONICS TECHNOLOGY AND DEVICES LABORATORYMANDATORY CONTRACT DISTRIBUTION LIST

101 Defense Technical Information CenterATTN: DTIC-TCACameron Station (Bldg 5)

012 Alexandria, VA 22314

203 GIDEP Engineering & Support DeptTE SectionPO Box 398

001 Norco, CA 91760

205 DirectorNaval Research LaboratoryATTN: CODE 2627

001 Washing'on, DC 20375

301 Rome Air Development CenterATTN: Documents Library (TILD)

001 Griffiss AFB, NY 13441

437 Deputy for Science & Technology

Office, Asst Sec Army (R&D)001 Washington, DC 20310

438 HODA (DAMA-ARZ-D/Dr. F. D. Verderame)001 Washington, DC 20310

482 DirectorUS Army Materiel Systems Analysis ActvATTN: DRXSY-T

001 Aberdeen Proving Ground, MD 21005

563 Commander, DARCOMATTN: DRCDE5001 Eisenhower Avenue

001 Alexandria, VA 22333

564 Cdr, US Army Signals Warfare LabATTN: DELSW-OSVint Hill Farms Station

001 Warrenton, VA 22186

579 Cdr, PM Concept Analysis Centers

ATTN: DRCPM-CACArlington Hall Station

001 Arlington, VA 22212

49

W. 77

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MANDATORY CONTRACT DISTRIBUTION LIST (Continued)

602 Cdr, Night Vision & Electro-OpticsERADCOMATTN: DELNV-D

001 Fort Belvoir, VA 22060

603 Cdr, Atmospheric Sciences LabERADCOMATTN: DELAS-SY-S

001 White Sands Missile Range, NM 88002

607 Cdr, Harry Diamond LaboratoriesATTN: DELHD-CO, TD (In Turn)2800 Powder Mill Road

001 Adelphi, MD 20783

609 Cdr, ERADCOMATTN: DRDEL-CG, CS (In Turn)2800 Powder Mill Road

001 Adelphi, MD 20783

612 Cdr, ERADCOMATTN: DRDEL-CT2800 Powder Mill Road

001 Adelphi, MD 20783

680 CommanderUS Army Electronics R&D Command

000 Fort Monmouth, NJ 07703

1 DELEW-D1 DELET-DD1 DELSD-L (Tech Library)2 DELSD-L-S (STINFO)

30 DELET-MQ

681 CommanderUS Army Communications R&D Command

ATTN: USMC-LNO001 Fort Monmouth, NJ 07703

50

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ELECTRONICS TECHNOLOGY AND DEVICES LABORATORYSUPPLEMENTAL CONTRACT DISTRIBUTION LIST

(ELECTIVE)

103 Code R123, Tech LibraryDCA Defense Comm Engrg Ctr

1800 Wiehle Ave001 Reston, VA 22090

104 Defense Communications AgencyTechnical Library CenterCode 205 (P. A. Tolovi)

001 Washington, DC 20305

206 CommanderNaval Electronics Laboratory Center

ATTN: Library001 San Diego, CA 92152

207 Cdr, Naval Surface Weapons CenterWhite Oak Laboratory

ATTN; Library Code WX-21001 Silver Spring, MD 20910

314 Hq, Air Force Systems CommandATTN: DLCAAndrews Air Force Base

001 Washington, DC 20331

403 Cdr, MICOMRedstone Scientific Info CenterATTN: Chief, Document Section

001 Redstone, Arsenal, AL 35809

406 CommandantUS Army Aviation Center

ATTN: ATZQ-D-MA001 Fort Rucker, AL 36362

407 Director, Ballistic Missile DefenseAdvanced Technology CenterATTN: ATC-R, PO Box 1500

001 Huntsville, AL 35807

418 CommanderHQ, Fort HuachucaATTN: Technical Reference Div

001 Fort Huachuca, AZ 85613

5

~51

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475 Cdr, Harry Diamond LaboratoriesATTN: Library2800 Powder Mill Road

001 Adelphi, MD 20783

477 DirectorUS Army Ballistic Research LabsATTN: DRXBR-LB

001 Aberdeen Proving Ground, MD 21005

482 DirectorUS Army Materiel Systems Analysis Actv

ATTN: DRXSY-T, MP (In Turn)001 Aberdeen Proving Ground, MD 21005

507 Cdr, AVRADCOMATTN: DRSAV-EPO Box 209

001 St. Louis, MO 63166

511 Commander, Picatinny ArsenalATTN: SARPA-FR-5, -ND-A-4,

-TS-S (In Turn)001 Dover, NJ 07801

515 Project Manager, REMBASSATTN: DRCPM-RBS

001 Fort Monmouth, NJ 07703

517 CommanderUS Army Satellite Communications AgencyATTN: DRCPM-SC-3

001 Fort Monmouth, NJ 07703

518 TRI-TAC OfficeATTN: TT-SE

001 Fort Monmouth, NJ 07703

519 Cdr, US Army Avionics LabAVRADCOMATTN: DAVAA-D

001 Fort Monmouth, NJ 07703

520 Project Manager, FIREFINDERATTN: DRCPM-FF

001 Fort Monmouth, NJ 07703

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SUPPLEMENTAL CONTRACT DISTRIBUTION LIST (ELECTIVE)(Continued)

521 CommanderProject Manager, SOTASATTN: DRCPM-STA

001 Fort Monmouth, NJ 07703

531 Cdr, US Army Research OfficeATTN: DRXRO-PH (Dr. Lontz)

DRXRO-IP (In Turn)PO Box 12211

001 Research Triangle Park, NC 27709

556 HQ, TCATATechnical Information CenterATTN: Mrs. Ruth ReynoldsFort Hood, TX 76544

568 CommanderUS Army Mobility Eqp Res & Dev CmdATTN: DRDME-R

001 Fort Belvoir, VA 22060

604 ChiefOfc of Missile Electronic WarfareElectronic Warfare Lab, ERADCOM

001 White Sands Missile Range, NM 88002

606 ChiefIntel Materiel Dev & Support OfcElectronic Warfare Lab, ERADCOM

001 Fort Meade, MD 20755

608 CommanderARRADCOMDRDAR-TSB-S

001 Aberdeen Proving Ground, MD 21005

614 Cdr, ERADCOMATTN: DRDEL-LL, -SB, -AP (In Turn)2800 Powder Mill Road

001 Adelphi, MD 20783

617 Cdr, ERADCOMATTN: DRDEL-AQ2800 Powder Mill Road

001 Adelphi, MD 20783

53

-'v---- -

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619 Cdr, ERADCOMATTN: DRDEL-PA, -ILS, -ED (In Turn)2800 Powder Mill Road

001 Adelphi, MD 20783

701 MIT - Lincoln LaboratoryATTN: Library (RM A-082)PO Box 73

002 Lexington, MA 02173

703 NASA Scientific & Tech Info FacilityBaltimore/Washington Intl Airport

001 PO Box 8757, MD 21240

704 National Bureau of StandardsBldg 225, Rm A-331ATTN: Mr. Leedy

001 Washington, DC 20231

707 TACTECBatelle Memorial Institute505 King Avenue

001 Columbus, OH 43201

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Bierman, Albert Colbert, J. J.

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NORTHERN ENGINEERING LABSKANSAS CRYSTALS INC. 357 Beloit Street1203 Kansas Avenue Burlington, WI 53105Kansas City, KS Holmbeck, J.

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LINCOM CORPORATION Department of Physics1543 Olympic Blvd, 4th Floor Stillwater, OK 74074Los Angeles, CA 90015 Halliburton, Dr. L. E.

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PRINCETON UNIVERSITYDept. of Chemistry SAWYER RESEARCH CO.Princeton, NJ 08540 35400 Lakeland Blvd.

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Q-TECH CORPORATION2201 Carmelina Avenue SENTRY MANUFACTURING CO.Los Angeles CA 90024 Crystal Park

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RAYTHEON RESEARCH28 Seyon Street SPERRY RESEARCHWaltham, MA 02154 100 North Road

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ROCKWELL SCIENCE CENTER1049 Caminko Dos Rios THERMO DYNAMICS, INC.Thousand Oaks, CA 91360 P. 0. Box 2196

Staples, E. J. 5621 Foxridge DriveShawnee Mission, KS

ROCKWELL INTERNATIONAL Shipley, W. A.Collins Tele.Prod. Div.855 35th Street N.E. TRANSAT CORPORATIONCedar Rapids, IA 52406 3713 Lee Road

Frerking, Marvin Shaker Heights, OH 44120Sauerland, F.

J. M. RONAN ASSOC., INC44 Cindy Lane TYCO CRYSTAL PRODUCTSWayside, NJ 07712 3940 Montecito W.

Ronan, J. M. Phoenix, AZ 86019'Kemper, D.

SANDIA LaboratoriesP. 0. Box 5800Albuquerque, NN 87185

King, Dr. J. C.Young, T. J.

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UNITED TECHNOLOGIES RESEARCH MONITOR PRODUCTS COMPANY, INC.CENTER (UTRC) P. 0. Box 1966Silver Lane Oceanside, CA 92054E. Hartford, CT 06108 Montgomery, D. R.

Gilden, M.M-TRON INDUSTRIES, INC.

VALTEC East Highway 50, Box 63875 South Street Yankton, SD 57078Hopkinton, MA 01748 Oceanside, CA 92054

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TRACOR, INCORPORATEDWESTERN ELECTRIC MS 6-11600 Osgood Street 6500 Tracor LaneN. Anodver, MA 01845 Austin, TX 78721

Simpson, E. E. Stone, CharlesPelrine, Robert

WESTINGHOUSE ELECTRIC643 Ridgefield Ct.Glen Burnie, MD 21061

Tuznik, R.

WESTINGHOUSE R&D1310 Beulah RoadPittsburg, PA 15235

McAvoy, B. R.

KERNCO, INC.28 Harbor StreetDanvers, MA 01923

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SAUNDERS & ASSOC.6710 E. Camelback RoadScottsdale, AZ 85251

Saunders, Jack

MICROSONICS, INC.60 Winter StreetWeymouth, MA 02188

Hagen, C. E.

Mr. Benjamin Parzen70-25 Yellowstone BoulevardForest Hills, NY 11375

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AF SPACE DIVISIONP. 0. BOX 92960Woridway Postal CenterLos Angeles, CA 90005

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