068l016 063l031-rf-ce-p02v01-a-1 rpt .l.p …faenl.msi.com/ftp/ce...

Report No. 063L031-RF-CE-P02V01-A-1

Page: 1 of 60 Version:1.0

Test Report

Product Name MEGA BOOK

Model No. MS-1024, MS-1024B, S420, S420B

Transmitter Module MSI / MS-6833B

Applicant MICRO-STAR INT’L Co., LTD.

Address No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Date of Receipt July 27, 2006

Issued Date Sep. 26, 2006


The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.



Test Report Cert i f icat ion Issued Date: Sep. 26, 2006 Report No. : 063L031-RF-CE-P02V01-A-1

Product Name MEGA BOOK

Applicant MICRO-STAR INT’L Co., LTD.

Address No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer MICRO-STAR INTL Co., LTD.

Model No. MS-1024, MS-1024B, S420, S420B

Rated Voltage AC 230V/50Hz

Working Voltage AC 100-240V, 50/60Hz

Trade Name MSI

Applicable Standard

ETSI EN 301 489-17:V1.2.1 (2002-08)

ETSI EN 301 489-1:V1.5.1 (2004-11)

Test Result Complied The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Documented By :

( G e n i e C h a n g )

Tested By :

( T i m S u n g )

Approved By :

( G e o r g e C h e n ) 0914



TABLE OF CONTENTS Description Page 1. GENERAL INFORMATION..................................................................................................5 1.1. EUT Description ........................................................................................................................5 1.2. Tested System Details ................................................................................................................7 1.3. Configuration of tested System..................................................................................................8 1.4. EUT Exercise Software..............................................................................................................8 1.5. Test Facility................................................................................................................................9 2. Conducted Emission ..............................................................................................................10 2.1. Test Equipment ........................................................................................................................10 2.2. Test Setup.................................................................................................................................10 2.3. Limits .......................................................................................................................................11 2.4. Test Procedure..........................................................................................................................11 2.5. Uncertainty...............................................................................................................................11 2.6. Test Specification.....................................................................................................................11 2.7. Test Result................................................................................................................................11 3. Radiated Emission .................................................................................................................12 3.1. Test Equipment ........................................................................................................................12 3.2. Test Setup.................................................................................................................................12 3.3. Limits .......................................................................................................................................13 3.4. Test Procedure..........................................................................................................................13 3.5. Uncertainty...............................................................................................................................13 3.6. Test Specification.....................................................................................................................13 3.7. Test Result................................................................................................................................13 4. Power Harmonics, Voltage Fluctuation and Flicker...........................................................14 4.1. Test Equipment ........................................................................................................................14 4.2. Test Setup.................................................................................................................................14 4.3. Limits .......................................................................................................................................14 4.4. Test Procedure..........................................................................................................................15 4.5. Uncertainty...............................................................................................................................15 4.6. Test Specification.....................................................................................................................15 4.7. Test Result................................................................................................................................15 5. Electrostatic Discharge (ESD)...............................................................................................16 5.1. Test Equipment ........................................................................................................................16 5.2. Test Setup.................................................................................................................................16 5.3. Test Level.................................................................................................................................16 5.4. Test Procedure..........................................................................................................................17 5.5. Uncertainty...............................................................................................................................17 5.6. Test Specification.....................................................................................................................17 5.7. Test Result................................................................................................................................17 6. Radiated Susceptibility (RS) .................................................................................................18 6.1. Test Equipment ........................................................................................................................18 6.2. Test Setup.................................................................................................................................18 6.3. Test Level.................................................................................................................................18 6.4. Test Procedure..........................................................................................................................19 6.5. Uncertainty...............................................................................................................................19 6.6. Test Specification.....................................................................................................................19 6.7. Test Result................................................................................................................................19 7. Electrical Fast Transient/Burst (EFT/B)..............................................................................20 7.1. Test Equipment ........................................................................................................................20



7.2. Test Setup.................................................................................................................................20 7.3. Test Level.................................................................................................................................20 7.4. Test Procedure..........................................................................................................................21 7.5. Uncertainty...............................................................................................................................21 7.6. Test Specification.....................................................................................................................21 7.7. Test Result................................................................................................................................21 8. Surge........................................................................................................................................22 8.1. Test Equipment ........................................................................................................................22 8.2. Test Setup.................................................................................................................................22 8.3. Test Level.................................................................................................................................22 8.4. Test Procedure..........................................................................................................................23 8.5. Uncertainty...............................................................................................................................23 8.6. Test Specification.....................................................................................................................23 8.7. Test Result................................................................................................................................23 9. Conducted Susceptibility (CS) ..............................................................................................24 9.1. Test Equipment ........................................................................................................................24 9.2. Test Setup.................................................................................................................................24 9.3. Test Level.................................................................................................................................24 9.4. Test Procedure..........................................................................................................................25 9.5. Uncertainty...............................................................................................................................25 9.6. Test Specification.....................................................................................................................25 9.7. Test Result................................................................................................................................25 10. Voltage Dips and Interruption ..............................................................................................26 10.1. Test Equipment ........................................................................................................................26 10.2. Test Setup.................................................................................................................................26 10.3. Test Level.................................................................................................................................26 10.4. Test Procedure..........................................................................................................................27 10.5. Uncertainty...............................................................................................................................27 10.6. Test Specification.....................................................................................................................27 10.7. Test Result................................................................................................................................27 11. EMC Reduction Method During Compliance Testing........................................................28 12. Test Result...............................................................................................................................29 12.1. Test Data of Conducted Emission............................................................................................30 12.2. Test Data of Radiated Emission ...............................................................................................37 12.3. Test Data of Power Harmonics, Voltage Flucturation and Flicker...........................................39 12.4. Test Data of Electrostatic Discharge ........................................................................................45 12.5. Test Data of Radiated Susceptibility........................................................................................47 12.6. Test Data of Electrical Fast Transient ......................................................................................49 12.7. Test Data of Surge....................................................................................................................51 12.8. Test Data of Conducted Susceptibility.....................................................................................53 12.9. Test Data of Voltage Dips and Interruption..............................................................................55



1. GENERAL INFORMATION

1.1. EUT Description

Product Name MEGA BOOK Trade Name MSI Model No. MS-1024, MS-1024B, S420, S420B Frequency Range 2412-2472MHz Channel Number 13

DSSS: 1, 2, 5.5, 11Mbps Data Speed OFDM: 6, 9, 12, 18, 24, 36, 48, 54Mbps

Channel separation 5 MHz Type of Modulation DSSS / OFDM Channel Control Auto Antenna Type Connector Antenna Gain Refer to the table “Antenna List” Power Adapter (1) MFR: LI SHIN, M/N: LSE0202C1990

Input: AC 100-240V, 50-60Hz Output: DC 19V, 4.74A Cable Out: Shielded, 1.8m,with one ferrite core bonded. Power Cord: Shielded, 1.8m

Power Adapter (2) MFR: LITE ON, M/N: PA-1900-04 Input: AC 100-240V, 50-60Hz 1.5A Output: DC 19V, 4.74A Cable Out: Shielded, 1.8m,with one ferrite core bonded. Power Cord: Shielded, 1.8m

Antenna List of WLAN

No. Manufacturer Part No. Peak Gain

1 High-Tek 0ACMS006004N (L) 0ACMS006005N(R)

1.70dBi

Center Frequency of Each Channel:

Channel Frequency Channel Frequency Channel Frequency Channel Frequency

Channel 01: 2412 MHz Channel 02: 2417 MHz Channel 03: 2422 MHz Channel 04: 2427 MHz Channel 05: 2432 MHz Channel 06: 2437 MHz Channel 07: 2442 MHz Channel 08: 2447 MHz Channel 09: 2452 MHz Channel 10: 2457 MHz Channel 11: 2462 MHz Channel 12: 2467 MHz Channel 13: 2472 MHz



Note:

1. The EUT has four models for different market requirements. 2. This appendix report was based on Quietek report No. 063L031-RF-CE-P02V01-A. 3. The different is change CPU and add Adapter and Battery. 4. QuieTek verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined as:

EMI Mode Mode1: Normal Operation (LI SHIN)

Mode2: Normal Operation (LITE ON)

EMS Mode Mode1: Normal Operation (LI SHIN)




1.2. Tested System Details

The types for all equipment, plus descriptions of all cables used in the tested system (including inserted cards) are:

Product Manufacturer Model No. Serial No. Power Cord

1 LCD Monitor CMV CT-720D 3UC1209SSA1241 Non-Shielded, 1.8m 2 Walkman AIWA HS-TA164 N/A N/A 3 Microphone &

Earphone PCHOME N/A N/A Non-Shielded, 2m

4 Slim COMBO ASUS SCB-2408D 42DM355288 Non-Shielded, 1.8m,with one ferrite core bonded.

5 USB 2.0 HDD Topdisk ME-910 233729 Power by PC 6 USB 2.0 HDD Topdisk ME-910 235577 Power by PC 7 USB Mouse Logitech M-BE58 HCA24311611 N/A 8 Monitor SONY PVM-14M2U 2105939 Non-Shielded, 1.8m 9 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m 10 Notebook PC DELL PP01L N/A Non-Shielded, 1.8m

Signal Cable Type Signal cable Description

A D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

B 1394 Cable Shielded, 1.2m

C Audio Cable Non-Shielded, 1.2m

D Earphone & Microphone Cable Non-Shielded, 1.8m

E USB Cable Shielded, 1.8m

F USB Cable Shielded, 1.8m

G USB Mouse Cable Shielded, 1.8m

H S-VIDEO Cable Shielded, 1.2m

I TELECOM Cable Non-Shielded, 3m

J TELECOM Cable Non-Shielded, 3m

K LAN Cable Non-Shielded, 7m



1.3. Configuration of tested System

1.4. EUT Exercise Software

1 Setup the EUT and simulators as shown on 1.3.

2 Turn on the power of all equipment.

3 Notebook reads data from disk.

4 Notebook sends “H’ pattern to monitor.

5 Notebook sends “H” pattern to printer, the printer will print “H” pattern on paper.

6 Notebook reads and writes data into and from modem.

7 Notebook will read data from floppy disk and then writes the data into floppy disk, same

operation for hard disk.

8 Repeat the above procedure (4) to (7).



1.5. Test Facility

Ambient conditions in the laboratory:

Items Test Item Required (IEC 68-1) Actual

Temperature (°C) 15-35 20-35

Humidity (%RH) 30-60 50-55

Barometric pressure (mbar)

IEC 61000-4-2

860-1060 950-1000


Humidity (%RH) 10-75 50-65


IEC 61000-4-5

860-1060 950-1000



IEC 61000-4-4 IEC 61000-4-11 860-1060 950-1000

Site Description: Accreditation on NVLAP NVLAP Lab Code: 200533-0 Accreditation on DNV Statement No. : 413-99-LAB11 Accreditation on Nemko Certificate No.: ELA 165 Accreditation on TUV Rheinland Certificate NO.:10011438-1-2004 Site Name: Quietek Corporation Site Address: No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

0914



2. Conducted Emission

2.1. Test Equipment

The following test equipment are used during the conducted emission test:

Item Instrument Manufacturer Type No./Serial No Last Cal. Remark

1 Test Receiver R & S ESCS 30/825442/17 May, 2006

2 L.I.S.N. R & S ESH3-Z5/825016/6 May, 2006 EUT

3 L.I.S.N. Kyoritsu KNW-407/8-1420-3 May, 2006 Peripherals

4 Pulse Limiter R & S ESH3-Z2 N/A

5 ISN SCHAFFNER T400/19099 April, 2006

6 No.1 Shielded Room

Note: All equipment upon which need to calibrated are with calibration period of 1 year.

2.2. Test Setup

Peripheral

80cm

AMN for EUT

Shielded Room

40cm

( EUT )

≧0.8m

AMN for Peripheral

50 ohm Terminator Test Receiver



2.3. Limits

(1) Mains terminal

Limits (dBuV)

Limit for conducted emissions of equipment intended to be used in telecommunication centers only

Limit for conducted emissions Frequency

MHz

QP AV QP AV

0.15 - 0.50 79 66 66-56 56-46

0.50-5.0 73 60 56 46

5.0 - 30 73 60 60 50

Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz ~ 0.50 MHz.

2.4. Test Procedure

AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization

network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.)

Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to ETSI EN 301 489-1:V1.5.1 (2004-11) on conducted measurement.

The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.

2.5. Uncertainty

± 2.26 dB

2.6. Test Specification

According to ETSI EN 301 489-1:V1.5.1 (2004-11) EN 55022:1994+A1:1995+A2:1997

2.7. Test Result

The emission from the EUT was below the specified limits. The worst-case emissions are shown in section 12. The EUT complies the acceptance criterion and passes the test.



3. Radiated Emission

3.1. Test Equipment

The following test equipment are used during the Radiated emission test:

Test Site Equipment Manufacturer Model No./Serial No. Last Cal. Test Receiver R & S ESVS 10 / 834468/003 July, 2006

Spectrum Analyzer Advantest R3162/ 00803480 May, 2006

Pre-Amplifier Advantest BB525C/ 3307A01812 May, 2006

Site # 1

Bilog Antenna SCHAFFNER CBL6112B / 2697 Nov., 2005

Test Receiver R & S ESCS 30 / 836858 / 022 Nov., 2005

Spectrum Analyzer Advantest R3162 / 100803466 May, 2006

Pre-Amplifier Advantest BB525C/3307A01814 May, 2006

Bilog Antenna SCHAFFNER CBL6112B / 2705 Oct., 2006

Horn Antenna ETS 3115 / 0005-6160 July, 2006

Site # 2

Pre-Amplifier QTK QTK-AMP-01/ 0001 July, 2006

Test Receiver R & S ESI 26 / 838786 / 004 May, 2006

Spectrum Analyzer Advantest R3162 / 100803480 May, 2006

Bilog Antenna SCHAFFNER CBL6112B / 2697 May, 2006

Horn Antenna ETS 3115 / 0005-6160 July, 2006

Pre-Amplifier QTK QTK-AMP-01 / 0001 July, 2006

Site # 3

Pre-Amplifier QTK QTK-AMP-03 / 0003 May, 2006 Note: 1. All equipments that need to calibrate are with calibration period of 1 year.

2. Mark “X” test instruments are used to measure the final test results.

3.2. Test Setup

EUT

FRP Dome

Test Receiver

Antenna Mast Dipole or Horn Antenna Antenna height can be moved from 1m to 4m, Antenna and turntable distance 3m

TO ControllerTo Receiver

Fully Soldered Ground Plane

Non-Conducted Table

10m

1m to 4m

80cm

Load



3.3. Limits

Limits (dBuV/m)

Limit for radiated emissions from ancillary equipment intended for use in telecommunication centers

only, and measured on a stand alone basis

Limit for radiated emissions from ancillary equipment , measured on

a stand alone basis

Frequency

MHz

QP QP

30-230 40 30

230-1000 47 37

3.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters.The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to ETSI EN 301 489-1:V1.5.1 (2004-11) on radiated measurement. The additional motch filter below 1GHz was used to measure the level of harmonics radiated emission during field dtrength of harmonics measurement. The bandwidth below 1GHz setting on the field strength meter (R&S Test Receiver ESCS 30 )is 120 kHz, and 1MHz bandwidth is adpted above 1GHz. The frequency range from 30MHz to 10th harmonics is checked.

3.5. Uncertainty

± 3.8 dB


According to ETSI EN 301 489-1:V1.5.1 (2004-11) EN 55022:1994+A1:1995+A2:1997

3.7. Test Result

The emission from the EUT was below the specified limits. The worst-case emissions are shown in section 12. The EUT complies the acceptance criterion and passes the test.



4. Power Harmonics, Voltage Fluctuation and Flicker

4.1. Test Equipment

Item Instrument Manufacturer Type No/Serial No. Last Calibration

1 Power Harmonics Tester

SCHAFFNER Profline 2105-400

S/N: HK54148

June, 2006

2 Analyzer SCHAFFNER CCN 1000-1/X71887 June, 2006



4.2. Test Setup

4.3. Limits

Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n

Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

Power Analyzer Impedance Network

Power Source

EUT

Load Controller

PC

Non-Conducted



Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current

at the fundamental frequency ％

2 2

3 30．λ＊

5 10 7 7 9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A 3 3.4 2.30

5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33

13 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A

4.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.

4.5. Uncertainty

± 3.23 %


According to EN 61000-3-2:2000, EN 61000-3-3:1995+A1: 2001

4.7. Test Result

The measurement of the power harmonics, which test at the extremes of EUT’s supply range, was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



5. Electrostatic Discharge (ESD)

5.1. Test Equipment


1 ESD Simulator System SCHAFFNER NSG-438, S/N: 167 June, 2006

2 Horizontal Coupling Plane (HCP)

QuieTek HCP AL50 N/A

3 Vertical Coupling Plane (VCP)

QuieTek VCP AL50 N/A



5.2. Test Setup

5.3. Test Level

Item Environmental Phenomena Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV (Charge Voltage) ±8 Air Discharge

±4 Contact Discharge B

Metal Ground Plane

ESD Simulator

EUT Loads: Active Insulation

Horizontal Coupling Plane

Non-Conducted table 470K ohm Resistor

470K ohm Resistor

Vertical Coupling Plane

80cm



5.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

5.5. Uncertainty

± 6.003 %


According to EN 61000-4-2:1995+A1: 1998+A2: 2001

5.7. Test Result

The measurement of the electrostatic discharge was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



6. Radiated Susceptibility (RS)

6.1. Test Equipment

Item Equipment Manufacturer Model No. / Serial No. Last Cal.

1 Signal Generator R & S SMY02 / 825454/029 Oct., 2005

2 Power Amplifier A & R 100W10000M7 / A285000010

N/A

3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A

4 Bilog Antenna Chase CBL6112B / 2452 Sep., 2006

5 Power Meter R & S NRVD / 100219 Jan., 2006

6 Directional Coupler A & R DC6180 / 22735 Jan., 2006

7 No.2 EMC Fully Chamber


6.2. Test Setup

6.3. Test Level


Enclosure Port

Radio-Frequency

Electromagnetic Field

Amplitude Modulated

MHz

V/m(Un-modulated, rms)

% AM (1kHz)

80-1000

1400-2000

3

80

A

EUT

Sensor

80cm

3 m

1m

Full-Anechoic Chamber

Power Amplifier

Signal Generator

Field Meter

Computer controller

Camera system

Camera Monitor

AntennaMast

Load

Power Meter



6.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal 3. Scanning Frequency 80MHz - 1000MHz, 1400MHz - 2000MHz 4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s

6.5. Uncertainty

± 6.17 %


According to EN 61000-4-3:2002+A1: 2002

6.7. Test Result

The measurement of the radiated susceptibility was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



7. Electrical Fast Transient/Burst (EFT/B)

7.1. Test Equipment


1 Fast Transient/Burst Generator

SCHAFFNER NSG 2050 S/N: 200124-031AR

June, 2006

2 No.3 Shielded Room N/A


7.2. Test Setup

7.3. Test Level


Ports for signal lines and control lines

Fast Transients Common Mode

KV (Peak)

Tr/Th ns

Rep. Frequency kHz

+0.5

5/50

5

B

Input DC Power Ports


KV (Peak)

Tr/Th ns

Rep. Frequency kHz

+0.5

5/50

5

B

Input AC Power Ports


KV (Peak)

Tr/Th ns

Rep. Frequency kHz

+1

5/50

5

B

EUT Load Personal

Compute

Non-Conducted Table 80cm

Ground

AC Power Line to

Coupling ClampEFT/Burst Generator



7.4. Test Procedure

The EUT and load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. For Signal Ports and Telecommunication Ports:

The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min.

For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 1m.

7.5. Uncertainty

± 8.80 %


According to EN 61000-4-4:2004

7.7. Test Result

The measurement of the Electrical Fast Transient/Burst was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



8. Surge

8.1. Test Equipment


1 Surge Generator SCHAFFNER NSG 2050 S/N: 200124-031AR

June, 2006



8.2. Test Setup

8.3. Test Level


Telecommunication Ports (See 1) and 2))

Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 1 B

Telecommunication Ports in Telecom Centres (See 1) and 2))

Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 0.5 B

AC Input and AC Output Power Ports

Surges

Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) ±1 ± 2

B

AC Input and AC Output Power Ports in Telecom Centres

Surges

Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) ±0.5 ± 1

B

Notes: 1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity

test shall be required.

Surge Generator

EUT Load PC

Non-Conducted Table Non-Conducted Table



8.4. Test Procedure

The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Signal Ports and Telecommunication Ports

The disturbance signal is through a coupling and decoupling networks (CDN) device couples to the signal and Telecommunication lines of the EUT.

For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.

8.5. Uncertainty

± 7.93 %


According to EN 61000-4-5:1995+A1: 2001

8.7. Test Result

The measurement of the Surge was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



9. Conducted Susceptibility (CS)

9.1. Test Equipment


1 Signal Generator R & S SMY02 / 825454/029 May, 2006

2 Power Amplifier A & R 150A220 / 23067 Aug., 2006

3 Power Meter HP E4418A / GB37482043 May, 2006

4 Power Sensor HP ECO-E18A /US37290730 May, 2006

5 Directional Coupler A & R DC2600/23325 May, 2006

6 CDN Schwarzbeck L801 M2/M3 / 1549 June, 2006

7 50 ohm Terminator RES-NET RCX6BM June, 2006

8 6dB Attenuator BIRD RFA-30NFF-6 June, 2006

9 EM Clamp Schwarzbeck EM 101 / 22735 June, 2006

10 Shielded Room


9.2. Test Setup

9.3. Test Level


AC Input and AC Output & DC Input and DC output Power Ports & Functional Earth Ports

Radio-Frequency

Common Mode.

Amplitude Modulated

MHz

V (rms, Unmodulated)

% AM (1kHz)

Source Impedance Ω

0.15-80

3

80

150

A

Aux equipment

EUT

CDN

RF-Generator

T2Ground Reference Plane

Non-Conducted Table

CDNAux

equipment

T

PA



9.4. Test Procedure

The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10 cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports

The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT.

For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires.

All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds

5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s

9.5. Uncertainty

± 6.17 %


According to EN 61000-4-6:1996 +A1: 2001

9.7. Test Result

The measurement of the Conducted Susceptibility was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



10. Voltage Dips and Interruption

10.1. Test Equipment


1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: 200124-031AR

June, 2006



10.2. Test Setup

10.3. Test Level


AC Input and AC Output Power Ports

Voltage Dips % Reduction

ms

30

10 B

Voltage Dips % Reduction

ms

60

100 C

Voltage Interruptions % Reduction

ms

> 95 %

5000 C

Voltage Dips/ Interruptions /Variations Simulator

EUT Load

To AC Line

Controller Computer Printer

Non-Conducted Table 80cm

AC Power Line to EUT



10.4. Test Procedure

The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, with a sequence of three voltage dips with intervals of 10 seconds, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 90 0,135 0, 180 0 , 2250, 2700 ,3150 of the voltage.

10.5. Uncertainty

± 2.03 %


According to EN 61000-4-11:1994+A1: 2001

10.7. Test Result

The measurement of the Voltage Dips and Interruption was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.



11. EMC Reduction Method During Compliance Testing

No modification was made during testing.



12. Test Result

The test results in the emission and the immunity were performed according to the requirements of measurement standard and process. Quietek Corporation is assumed full responsibility for the accuracy and completeness of these measurements. The test data of the emission is listed as below. All the tests were carried out with the EUT in normal operation, which was defined as:

EMI Mode Mode1: Normal Operation (LI SHIN)


EMS Mode Mode1: Normal Operation (LI SHIN)




12.1. Test Data of Conducted Emission

Product : MEGA BOOK Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 1 Test Mode : Mode1: Normal Operation (LI SHIN)

Frequency Correct Reading Measurement Margin Limit

Factor Level Level MHz dB dBuV dBuV dB dBuV

Quasi-Peak

*0.189 0.202 51.950 52.152 -12.734 64.886 0.255 0.205 44.570 44.775 -18.225 63.000 0.568 0.217 41.410 41.627 -14.373 56.000 1.630 0.261 39.090 39.351 -16.649 56.000 3.517 0.336 40.250 40.586 -15.414 56.000 9.740 0.620 32.190 32.810 -27.190 60.000

Average *0.189 0.202 49.930 50.132 -4.754 54.886 0.255 0.205 41.320 41.525 -11.475 53.000 0.568 0.217 40.120 40.337 -5.663 46.000 1.630 0.261 38.450 38.711 -7.289 46.000 3.517 0.336 37.670 38.006 -7.994 46.000 9.740 0.620 23.450 24.070 -25.930 50.000

Note: 1. All reading levels are quasi-peak and average value. 2. " " means the worst emission level. 3. Measurement Level = Reading Level + Correct Factor



Product : MEGA BOOK Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 2 Test Mode : Mode1: Normal Operation (LI SHIN)



Quasi-Peak

0.185 0.202 52.090 52.292 -12.708 65.000 0.255 0.203 45.570 45.773 -17.227 63.000

*0.564 0.217 44.750 44.967 -11.033 56.000 3.505 0.336 41.810 42.146 -13.854 56.000 7.017 0.443 40.510 40.953 -19.047 60.000 9.709 0.523 36.130 36.653 -23.347 60.000

Average 0.185 0.202 50.080 50.282 -4.718 55.000 0.255 0.203 41.790 41.993 -11.007 53.000

*0.564 0.217 43.840 44.057 -1.943 46.000 3.505 0.336 40.060 40.396 -5.604 46.000 7.017 0.443 35.400 35.843 -14.157 50.000 9.709 0.523 30.800 31.323 -18.677 50.000




Product : MEGA BOOK Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 1 Test Mode : Mode2: Normal Operation (LITE ON)



Quasi-Peak

0.451 0.216 47.730 47.946 -9.454 57.400 *0.509 0.216 51.290 51.506 -4.494 56.000 0.697 0.229 41.290 41.519 -14.481 56.000 1.052 0.243 47.270 47.513 -8.487 56.000 1.591 0.261 40.350 40.611 -15.389 56.000 3.603 0.338 34.970 35.308 -20.692 56.000

Average 0.451 0.216 25.330 25.546 -21.854 47.400 0.509 0.216 29.890 30.106 -15.894 46.000 0.697 0.229 25.710 25.939 -20.061 46.000

*1.052 0.243 33.090 33.333 -12.667 46.000 1.591 0.261 30.160 30.421 -15.579 46.000 3.603 0.338 24.860 25.198 -20.802 46.000




Product : MEGA BOOK Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 2 Test Mode : Mode2: Normal Operation (LITE ON)



Quasi-Peak

0.380 0.215 44.310 44.525 -14.904 59.429 *0.490 0.216 47.630 47.846 -8.440 56.286 0.693 0.227 41.610 41.837 -14.163 56.000 1.056 0.234 45.850 46.084 -9.916 56.000 1.556 0.260 39.990 40.250 -15.750 56.000 2.857 0.308 38.350 38.658 -17.342 56.000

Average 0.380 0.215 20.980 21.195 -28.234 49.429 0.490 0.216 24.440 24.656 -21.630 46.286 0.693 0.227 23.060 23.287 -22.713 46.000 1.056 0.234 32.230 32.464 -13.536 46.000

*1.556 0.260 26.480 26.740 -19.260 46.000 2.857 0.308 22.960 23.268 -22.732 46.000




Product : MEGA BOOK Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)(ISN-100Mbps)



Quasi-Peak 0.591 9.768 47.370 57.138 -16.862 74.000 1.439 9.739 48.650 58.389 -15.611 74.000 2.380 9.741 48.890 58.631 -15.369 74.000

*4.005 9.763 50.770 60.533 -13.467 74.000 16.228 9.856 56.770 66.626 -17.374 84.000 18.244 9.863 57.090 66.953 -17.047 84.000

Average

0.591 9.768 41.840 51.608 -12.392 64.000 1.439 9.739 48.130 57.869 -6.131 64.000 2.380 9.741 48.260 58.001 -5.999 64.000

*4.005 9.763 48.350 58.113 -5.887 64.000 16.228 9.856 53.160 63.016 -10.984 74.000 18.244 9.863 53.460 63.323 -10.677 74.000

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " " means the worst emission level. 3. Measurement Level = Reading Level + Correct Factor



Product : MEGA BOOK Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)(ISN -10 Mbps)



Quasi-Peak 0.595 9.768 47.590 57.358 -16.642 74.000 1.127 9.735 47.490 57.225 -16.775 74.000 1.439 9.739 48.690 58.429 -15.571 74.000 2.505 9.743 50.710 60.453 -13.547 74.000

*3.822 9.760 51.850 61.610 -12.390 74.000 5.826 9.777 46.790 56.567 -17.433 74.000

Average

0.595 9.768 42.020 51.788 -12.212 64.000 1.127 9.735 47.040 56.775 -7.225 64.000 1.439 9.739 48.130 57.869 -6.131 64.000

*2.505 9.743 50.010 59.753 -4.247 64.000 3.822 9.760 49.930 59.690 -4.310 64.000 5.826 9.777 43.770 53.547 -10.453 64.000




Product : MEGA BOOK Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)(ISN-TELECOM)



Quasi-Peak *0.193 9.798 57.030 66.828 -15.943 82.771 0.701 9.759 42.370 52.129 -21.871 74.000 1.087 9.734 44.530 54.264 -19.736 74.000 2.048 9.747 45.770 55.517 -18.483 74.000 6.146 9.782 39.650 49.432 -24.568 74.000 9.334 9.804 31.490 41.294 -32.706 74.000

Average

0.193 9.798 51.210 61.008 -11.763 72.771 0.701 9.759 35.350 45.109 -18.891 64.000 1.087 9.734 41.020 50.754 -13.246 64.000

*2.048 9.747 45.560 55.307 -8.693 64.000 6.146 9.782 34.320 44.102 -19.898 64.000 9.334 9.804 24.860 34.664 -29.336 64.000




12.2. Test Data of Radiated Emission

Product : MEGA BOOK Test Item : General Radiated Emission Test Site : No.3 OATS Test Mode : Mode1: Normal Operation (LI SHIN)


Factor Level Level MHz dB dBuV dBuV/m dB dBuV/m

Horizontal 125.680 14.944 11.970 26.914 -3.086 30.000

*150.145 13.770 13.220 26.990 -3.010 30.000 200.057 12.539 13.810 26.349 -3.651 30.000 240.000 15.385 15.670 31.055 -5.945 37.000 300.087 17.463 13.500 30.963 -6.037 37.000 400.117 20.251 12.100 32.351 -4.649 37.000 480.000 21.717 10.410 32.128 -4.872 37.000 720.198 25.420 5.920 31.340 -5.660 37.000 786.685 26.230 7.760 33.990 -3.010 37.000

1000.000 29.990 2.800 32.790 -4.210 37.000 Vertical 125.680 14.944 10.050 24.994 -5.006 30.000

*150.550 13.747 13.200 26.946 -3.054 30.000 200.060 12.539 12.200 24.739 -5.261 30.000 240.000 15.385 12.010 27.395 -9.605 37.000 301.600 17.500 10.770 28.270 -8.730 37.000 424.800 20.710 7.000 27.710 -9.290 37.000 480.000 21.717 5.420 27.138 -9.862 37.000 540.850 22.832 8.140 30.973 -6.027 37.000 786.685 26.230 6.970 33.200 -3.800 37.000

1000.000 29.990 2.900 32.890 -4.110 37.000




Product : MEGA BOOK Test Item : General Radiated Emission Test Site : No.3 OATS Test Mode : Mode2: Normal Operation (LITE ON)


Factor Level Level MHz dB dBuV dBuV/m dB dBuV/m

Horizontal 125.000 14.741 6.750 21.491 -8.509 30.000 150.340 13.526 13.270 26.796 -3.204 30.000 200.450 12.263 13.800 26.063 -3.937 30.000 240.000 15.210 18.220 33.430 -3.570 37.000 294.986 17.032 11.530 28.562 -8.438 37.000 344.151 18.357 14.910 33.267 -3.733 37.000

*480.000 21.507 12.450 33.958 -3.042 37.000 540.804 22.552 10.550 33.102 -3.898 37.000 639.139 23.890 7.850 31.740 -5.260 37.000 835.800 26.337 2.260 28.597 -8.403 37.000

Vertical 45.530 13.174 12.900 26.074 -3.926 30.000

120.000 14.866 5.550 20.416 -9.584 30.000 133.628 14.495 11.650 26.145 -3.855 30.000 150.340 13.526 13.390 26.916 -3.084 30.000

*200.450 12.263 14.700 26.963 -3.037 30.000 250.814 15.979 17.810 33.789 -3.211 37.000 500.027 21.906 7.160 29.066 -7.934 37.000 540.809 22.552 4.660 27.212 -9.788 37.000 634.503 23.842 8.840 32.682 -4.318 37.000 786.630 25.640 5.390 31.031 -5.969 37.000 835.800 26.337 7.560 33.897 -3.103 37.000




12.3. Test Data of Power Harmonics, Voltage Flucturation and Flicker

Product : MEGA BOOK Test Item : Power Harmonics Classification : Class D Test Mode : Mode1: Normal Operation (LI SHIN)

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-0.9-0.6-0.30.00.30.60.9

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.



Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.77 Frequency(Hz): 50.00 I_Peak (Amps): 0.655 I_RMS (Amps): 0.321 I_Fund (Amps): 0.304 Crest Factor: 2.040 Power (Watts): 68.1 Power Factor: 0.923

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.074 0.231 0.0 0.075 0.347 0.00 Pass 4 0.000 5 0.012 0.129 0.0 0.012 0.194 0.00 Pass 6 0.000 7 0.008 0.068 0.0 0.008 0.102 0.00 Pass 8 0.000 9 0.007 0.034 0.0 0.007 0.051 0.00 Pass 10 0.000 11 0.002 0.024 0.0 0.002 0.036 0.00 Pass 12 0.000 13 0.002 0.020 0.0 0.002 0.030 0.00 Pass 14 0.000 15 0.004 0.018 0.0 0.004 0.026 0.00 Pass 16 0.000 17 0.004 0.016 0.0 0.004 0.023 0.00 Pass 18 0.000 19 0.002 0.014 0.0 0.002 0.021 0.00 Pass 20 0.000 21 0.002 0.012 0.0 0.002 0.019 0.00 Pass 22 0.000 23 0.002 0.011 0.0 0.002 0.017 0.00 Pass 24 0.000 25 0.002 0.010 0.0 0.002 0.016 0.00 Pass 26 0.000 27 0.002 0.010 0.0 0.002 0.015 0.00 Pass 28 0.000 29 0.001 0.009 0.0 0.002 0.014 0.00 Pass 30 0.000 31 0.001 0.008 0.0 0.001 0.013 0.00 Pass 32 0.000 33 0.001 0.008 0.0 0.001 0.012 0.00 Pass 34 0.000 35 0.001 0.007 0.0 0.001 0.011 0.00 Pass 36 0.000 37 0.001 0.007 0.0 0.001 0.011 0.00 Pass 38 0.000 39 0.001 0.007 0.0 0.001 0.010 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same

window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.

Others the result should be pass.



Product : MEGA BOOK Test Item : Power Harmonics Classification : Class D Test Mode : Mode2: Normal Operation (LITE ON)

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-0.6-0.4-0.20.00.20.40.6

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.0000.0250.0500.0750.1000.1250.1500.1750.2000.225

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.



Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.71 Frequency(Hz): 50.00 I_Peak (Amps): 0.384 I_RMS (Amps): 0.205 I_Fund (Amps): 0.185 Crest Factor: 1.968 Power (Watts): 42.4 Power Factor: 0.899

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.052 0.144 0.0 0.054 0.216 0.00 Pass 4 0.000 5 0.024 0.080 0.0 0.024 0.121 0.00 Pass 6 0.000 7 0.004 0.042 0.0 0.005 0.064 0.00 Pass 8 0.000 9 0.008 0.021 0.0 0.008 0.032 0.00 Pass 10 0.000 11 0.005 0.015 0.0 0.005 0.022 0.00 Pass 12 0.000 13 0.001 0.013 0.0 0.001 0.019 0.00 Pass 14 0.000 15 0.002 0.011 0.0 0.002 0.016 0.00 Pass 16 0.000 17 0.003 0.010 0.0 0.003 0.014 0.00 Pass 18 0.000 19 0.001 0.009 0.0 0.001 0.013 0.00 Pass 20 0.000 21 0.002 0.008 0.0 0.002 0.012 0.00 Pass 22 0.000 23 0.002 0.007 0.0 0.002 0.011 0.00 Pass 24 0.000 25 0.001 0.007 0.0 0.001 0.010 0.00 Pass 26 0.000 27 0.002 0.006 0.0 0.002 0.009 0.00 Pass 28 0.000 29 0.001 0.006 0.0 0.001 0.008 0.00 Pass 30 0.000 31 0.001 0.005 0.0 0.001 0.008 0.00 Pass 32 0.000 33 0.001 0.005 0.0 0.001 0.007 0.00 Pass 34 0.000 35 0.001 0.005 0.0 0.001 0.007 0.00 Pass 36 0.000 37 0.001 0.004 0.0 0.001 0.007 0.00 Pass 38 0.000 39 0.001 0.004 0.0 0.001 0.006 0.00 Pass 40 0.000

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same

window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W.

Others the result should be pass.



Product : MEGA BOOK Test Item : Voltage Fluctuations and Flicker Test Mode : Mode1: Normal Operation (LI SHIN)

Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

12:0

8:2

8

Plt and limit line

0.10.20.30.40.50.6

Plt

12:0

8:2

8

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.66 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass



Product : MEGA BOOK Test Item : Voltage Fluctuations and Flicker Test Mode : Mode2: Normal Operation (LITE ON)

Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

3:1

4:0

1

Plt and limit line

0.10.20.30.40.50.6

Plt

3:1

4:0

1

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.56 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass



12.4. Test Data of Electrostatic Discharge

Product : MEGA BOOK Test Item : Electrostatic Discharge Test Site : No.3 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)

Item Amount of Discharge

Voltage Required Criteria

Complied To Criteria (A, B, C)

Results

Air Discharge 10 10

+8kV -8kV

B B

B B

Pass Pass

Contact Discharge 25 25

+4kV -4kV

B B

B B

Pass Pass

Indirect Discharge (HCP)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Front)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Left)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Back)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Right)

50 50

+4kV -4kV

B B

A A

Pass Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.

NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.



Product : MEGA BOOK Test Item : Electrostatic Discharge Test Site : No.3 Shielded Room Test Mode : Mode2: Normal Operation (LITE ON)

Item Amount of Discharge

Voltage Required Criteria

Complied To Criteria (A, B, C)

Results

Air Discharge 10 10

+8kV -8kV

B B

B B

Pass Pass

Contact Discharge 25 25

+4kV -4kV

B B

B B

Pass Pass

Indirect Discharge (HCP)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Front)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Left)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Back)

50 50

+4kV -4kV

B B

A A

Pass Pass

Indirect Discharge (VCP Right)

50 50

+4kV -4kV

B B

A A

Pass Pass


NR: No Requirement


EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.



12.5. Test Data of Radiated Susceptibility



There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.

Product : MEGA BOOK Test Item : Radiated Susceptibility Test Site : No.2 EMC fully Chamber Test Mode : Mode1: Normal Operation (LI SHIN)

Frequency (MHz)

Position (Angle)

Polarity(H or V)

Field Strength (V/m)

Required Criteria

Complied To Criteria

(A, B, C) Results

80-1000 Front H 3 A A Pass 80-1000 Front V 3 A A Pass 80-1000 Back H 3 A A Pass 80-1000 Back V 3 A A Pass 80-1000 Left H 3 A A Pass 80-1000 Left V 3 A A Pass 80-1000 Right H 3 A A Pass 80-1000 Right V 3 A A Pass 80-1000 Top H 3 A A Pass 80-1000 Top V 3 A A Pass 80-1000 Down H 3 A A Pass 80-1000 Down V 3 A A Pass






There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.

Product : MEGA BOOK Test Item : Radiated Susceptibility Test Site : No.2 EMC fully Chamber Test Mode : Mode2: Normal Operation (LITE ON)

Frequency (MHz)

Position (Angle)

Polarity(H or V)

Field Strength (V/m)

Required Criteria

Complied To Criteria

(A, B, C) Results





12.6. Test Data of Electrical Fast Transient

Product : MEGA BOOK Test Item : Electrical Fast Transient Test Site : No.3 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)

Inject Line

Polarity Voltage

(kV)

Inject Time

(Second)

Inject Method

Required Criteria

Complied to Criteria Result

L + N + PE ± 1 60 Direct B A Pass

LAN ± 0.5 90 Clamp B A Pass

Telecom ± 0.5 90 Clamp B A Pass


Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of

Line . No false alarms or other malfunctions were observed during or after the test.



Product : MEGA BOOK Test Item : Electrical Fast Transient Test Site : No.3 Shielded Room Test Mode : Mode2: Normal Operation (LITE ON)

Inject Line

Polarity Voltage

(kV)

Inject Time

(Second)

Inject Method

Required Criteria


L + N + PE ± 1 60 Direct B B Pass

LAN ± 0.5 90 Clamp B A Pass

Telecom ± 0.5 90 Clamp B A Pass







12.7. Test Data of Surge

Product : MEGA BOOK Test Item : Surge Test Site : No. 3 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)

Inject Line

Polarity AngleVoltage

(kV)

Time Interval

(Second)

Inject Method

Required Criteria


L-N ± 0 1 60 Direct B A Pass




N-PE ± 0 2 60 Direct B A Pass




L-PE ± 0 2 60 Direct B A Pass










Product : MEGA BOOK Test Item : Surge Test Site : No. 3 Shielded Room Test Mode : Mode2: Normal Operation (LITE ON)

Inject Line

Polarity AngleVoltage

(kV)

Time Interval

(Second)

Inject Method

Required Criteria




















12.8. Test Data of Conducted Susceptibility

Product : MEGA BOOK Test Item : Conducted Susceptibility Test Site : No.2 EMC fully Chamber Test Mode : Mode1: Normal Operation (LI SHIN)

Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria Complied

To

Result

0.15~80 130(3V) CDN AC IN A A PASS

0.15~80 130(3V) Clamp LAN A A PASS

0.15~80 130(3V) Clamp Telecom A A PASS




Line . No false alarms or other malfunctions were observed during or after the test. The acceptance

criteria were met, and the EUT passed the test.



Product : MEGA BOOK Test Item : Conducted Susceptibility Test Site : No.2 EMC fully Chamber Test Mode : Mode2: Normal Operation (LITE ON)

Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria Complied

To

Result

0.15~80 130(3V) CDN AC IN A A PASS

0.15~80 130(3V) Clamp LAN A A PASS

0.15~80 130(3V) Clamp Telecom A A PASS








12.9. Test Data of Voltage Dips and Interruption

Product : MEGA BOOK Test Item : Voltage Dips and Interruption Test Site : No.3 Shielded Room Test Mode : Mode1: Normal Operation (LI SHIN)

Voltage Dips and

Interruption Reduction (%)

Angle Test Duration

(ms)

Required Performance

Criteria

Performance Criteria Complied

To

Test Result

30 0 10 B A PASS 30 45 10 B A PASS 30 90 10 B A PASS 30 135 10 B A PASS 30 180 10 B A PASS 30 225 10 B A PASS 30 270 10 B A PASS 30 315 10 B A PASS 60 0 100 C A PASS 60 45 100 C A PASS 60 90 100 C A PASS 60 135 100 C A PASS 60 180 100 C A PASS 60 225 100 C A PASS 60 270 100 C A PASS 60 315 100 C A PASS

>95 0 5000 C A PASS >95 45 5000 C A PASS >95 90 5000 C A PASS >95 135 5000 C A PASS >95 180 5000 C A PASS >95 225 5000 C A PASS >95 270 5000 C A PASS >95 315 5000 C A PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of





Product : MEGA BOOK Test Item : Voltage Dips and Interruption Test Site : No.3 Shielded Room Test Mode : Mode2: Normal Operation (LITE ON)

Voltage Dips and

Interruption Reduction (%)

Angle Test Duration

(ms)

Required Performance

Criteria

Performance Criteria Complied

To

Test Result

30 0 10 B A PASS 30 45 10 B A PASS 30 90 10 B A PASS 30 135 10 B A PASS 30 180 10 B A PASS 30 225 10 B A PASS 30 270 10 B A PASS 30 315 10 B A PASS 60 0 100 C A PASS 60 45 100 C A PASS 60 90 100 C A PASS 60 135 100 C A PASS 60 180 100 C A PASS 60 225 100 C A PASS 60 270 100 C A PASS 60 315 100 C A PASS

>95 0 5000 C A PASS >95 45 5000 C A PASS >95 90 5000 C A PASS >95 135 5000 C A PASS >95 180 5000 C A PASS >95 225 5000 C A PASS >95 270 5000 C A PASS >95 315 5000 C A PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of





Attachment 1: EUT Test Photographs

Report No.: 063L031-RF-CE-P02V01-A-1

Page : 1 of 9 Version:1.0

Attachment 1: EUT Test Setup Photographs

Front View of Conducted Test (Mode 1)

Back View of Conducted Test (Mode 1)



Front View of Conducted Test (Mode 2)

Back View of Conducted Test (Mode 2)



Front View of Radiated Test (Mode 1)

Back View of Radiated Test (Mode 1)



Front View of Radiated Test (Mode 2)

Back View of Radiated Test (Mode 2)



Power Harmonics Test Setup (Mode 1 & Mode 2)

ESD Test Setup (Mode 1 & Mode 2)



Radiated Susceptibility Test Setup (Mode 1 & Mode 2)

EFT/B Test Setup (Mode 1 & Mode 2)



EFT/B Test Setup-Clamp (Mode 1 & Mode 2)

SURGE Test Setup (Mode 1 & Mode 2)



Conducted Susceptibility Test Setup (Mode 1 & Mode 2)

Conducted Susceptibility Test Setup -Clamp (Mode 1 & Mode 2)



Voltage Dips Test Setup (Mode 1 & Mode 2)



Attachment 2: EUT Detailed Photographs



Attachment 2 : EUT Detailed Photographs (1) EUT Photo

(2) EUT Photo



(3) EUT Photo

(4) EUT Photo



(5) EUT Photo

(6) EUT Photo



(7) EUT Photo

(8) EUT Photo



(9) EUT Photo

(10) EUT Photo



(11) EUT Photo

(12) EUT Photo



(13) EUT Photo

(14) EUT Photo



(15) EUT Photo

(16) EUT Photo



(17) EUT Photo

(18) EUT Photo



(19) EUT Photo

(20) EUT Photo

Report No.


Reference: Laboratory of License

068l016 063l031-rf-ce-p02v01-a-1 rpt .l.p …faenl.msi.com/ftp/ce...

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