074l146-rfcep02v01 rpt-.l.p-notebook -ms-1634 azurewave-faenl.msi.com/ftp/ce...
TRANSCRIPT
Report No. 074L146-RFCEP02V01
Page: 1 of 50 Version:1.0
Test Report
Product Name Notebook
Model No. MS-16342
Transmitter Module Atheros / AR5BXB63 MSI / MS-6837D
Applicant MICRO-STAR INTL Co., LTD.
Address No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Date of Receipt Apr. 24, 2007
Issued Date May. 28, 2007
Report No. 074L146-RFCEP02V01
The Test Results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Report No. 074L146-RFCEP02V01
Page: 2 of 50 Version:1.0
Test Report Cert i f icat ion Issued Date: May. 28, 2007 Report No.: 074L146-RFCEP02V01
Product Name Notebook
Applicant MICRO-STAR INTL Co., LTD.
Address No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.
Manufacturer MICRO-STAR INTL Co., LTD.
Model No. MS-16342
Rated Voltage AC 230V/50Hz
Working Voltage AC 100-240V/50-60Hz
Trade Name MSI
Applicable Standard ETSI EN 301 489-17:V1.2.1 (2002-08)
ETSI EN 301489-1: V1.6.1 (2005-09)
Test Result Complied
The test results relate only to the samples tested. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.
Documented By :
( Senior Engineering Adm. Specialist /A n i t a C h o u )
Tested By :
( A s s i s t a n t E n g i n e e r /R o y H s i e h )
Approved By :
( P r e s i d e n t / G e n e C h a n g )
0914
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TABLE OF CONTENTS Description Page 1. GENERAL INFORMATION...............................................................................................5 1.1. EUT Description .....................................................................................................................5 1.2. Tested System Details .............................................................................................................7 1.3. Configuration of Test System..................................................................................................8 1.4. EUT Exercise Software...........................................................................................................8 1.5. Test Facility.............................................................................................................................9 2. Conducted Emission ...........................................................................................................10 2.1. Test Equipmen.......................................................................................................................10 2.2. Test Setup..............................................................................................................................10 2.3. Limits ....................................................................................................................................11 2.4. Test Procedure.......................................................................................................................12 2.5. Test Specification..................................................................................................................12 2.6. Uncertainty............................................................................................................................12 2.7. Test Result.............................................................................................................................12 3. Radiated Emission ..............................................................................................................13 3.1. Test Equipment .....................................................................................................................13 3.2. Test Setup..............................................................................................................................13 3.3. Limits ....................................................................................................................................14 3.4. Test Procedure.......................................................................................................................14 3.5. Test Specification..................................................................................................................14 3.6. Uncertainty............................................................................................................................14 3.7. Test Result.............................................................................................................................14 4. Power Harmonics, Voltage Fluctuation and Flicker........................................................15 4.1. Test Equipment .....................................................................................................................15 4.2. Test Setup..............................................................................................................................15 4.3. Limits ....................................................................................................................................15 4.4. Test Procedure.......................................................................................................................16 4.5. Test Specification..................................................................................................................16 4.6. Uncertainty............................................................................................................................16 4.7. Test Result.............................................................................................................................16 5. Electrostatic Discharge (ESD)............................................................................................17 5.1. Test Equipment .....................................................................................................................17 5.2. Test Setup..............................................................................................................................17 5.3. Test Level..............................................................................................................................17 5.4. Test Procedure.......................................................................................................................18 5.5. Test Specification..................................................................................................................18 5.6. Uncertainty............................................................................................................................18 5.7. Test Result.............................................................................................................................18 6. Radiated Susceptibility (RS) ..............................................................................................19 6.1. Test Equipment .....................................................................................................................19 6.2. Test Setup..............................................................................................................................19 6.3. Test Level..............................................................................................................................19 6.4. Test Procedure.......................................................................................................................20 6.5. Test Specification..................................................................................................................20 6.6. Uncertainty............................................................................................................................20 6.7. Test Result.............................................................................................................................20 7. Electrical Fast Transient/Burst (EFT/B)...........................................................................21 7.1. Test Equipment .....................................................................................................................21
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7.2. Test Setup..............................................................................................................................21 7.3. Test Level..............................................................................................................................22 7.4. Test Procedure.......................................................................................................................22 7.5. Test Specification..................................................................................................................22 7.6. Uncertainty............................................................................................................................22 7.7. Test Result.............................................................................................................................22 8. Surge.....................................................................................................................................23 8.1. Test Equipment .....................................................................................................................23 8.2. Test Setup..............................................................................................................................23 8.3. Test Level..............................................................................................................................23 8.4. Test Procedure.......................................................................................................................24 8.5. Test Specification..................................................................................................................24 8.6. Uncertainty............................................................................................................................24 8.7. Test Result.............................................................................................................................24 9. Conducted Susceptibility (CS) ...........................................................................................25 9.1. Test Equipment .....................................................................................................................25 9.2. Test Setup..............................................................................................................................25 9.3. Test Level..............................................................................................................................25 9.4. Test Procedure.......................................................................................................................26 9.5. Test Specification..................................................................................................................26 9.6. Uncertainty............................................................................................................................26 9.7. Test Result.............................................................................................................................26 10. Voltage Dips and Interruption ...........................................................................................27 10.1. Test Equipment .....................................................................................................................27 10.2. Test Setup..............................................................................................................................27 10.3. Test Level..............................................................................................................................27 10.4. Test Procedure.......................................................................................................................28 10.5. Test Specification..................................................................................................................28 10.6. Uncertainty............................................................................................................................28 10.7. Test Result.............................................................................................................................28 11. EMC Reduction Method During Compliance Testing.....................................................29 12. Test Result............................................................................................................................30 12.1. Test Data of Conducted Emission.........................................................................................31 12.2. Test Data of Radiated Emission ............................................................................................38 12.3. Test Data of Power Harmonics, Voltage Flucturation and Flicker........................................39 12.4. Test Data of Electrostatic Discharge .....................................................................................42 12.5. Test Data of Radiated Susceptibility.....................................................................................43 12.6. Test Data of Electrical Fast Transient ...................................................................................44 12.7. Test Data of Surge.................................................................................................................45 12.8. Test Data of Conducted Susceptibility..................................................................................46 12.9. Test Data of Voltage Dips and Interruption...........................................................................47 Attachment 1: EUT Test Photographs Attachment 2: EUT Detailed Photographs Reference : Laboratory of License
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1. GENERAL INFORMATION
1.1. EUT Description
Product Name Notebook
Trade Name MSI
Model No. MS-16342
Working Voltage AC 230V/50Hz
Frequency Range 802.11b/g: 2400-2483.5MHz Bluetooth: 2402-2480MHz
Channel Number 802.11b/g: 13CH Bluetooth: 79 CH
Data Rate DSSS: 1, 2, 5.5, 11Mbps OFDM: 6, 9, 12, 18, 24, 36, 48, 54Mbps Bluetooth: 2Mbps
Channel Separation 802.11b/g: 5MHz
Type of Modulation DSSS/OFDM
Channel Control Auto
Antenna Gain Refer to the table “Antenna List”
Antenna type Connector
Power Adapter LITEON, PA-1900-04 Input: AC 100-240V, 50/60Hz, 1.5A Output: DC 19V, 4.74A Cable Out: Shielded, 1.8m, with one ferrite core bonded. Power Cord: Shielded, 1.8m
Antenna List
No. Manufacturer Part No. Peak Gain 1 HIGH-TEK S79-1800260-H39 (Main)
S79-1800270-H39 (Aux) -0.87dBi for 2.4 GHz -4.27 dBi for 5.0 GHz
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DSSS Working Frequency of Each Channel:
Channel Frequency Channel Frequency Channel Frequency Channel FrequencyChannel 01: 2412 MHz Channel 02: 2417 MHz Channel 03: 2422 MHz Channel 04: 2427 MHz Channel 05: 2432 MHz Channel 06: 2437 MHz Channel 07: 2442 MHz Channel 08: 2447 MHz Channel 09: 2452 MHz Channel 10: 2457 MHz Channel 11: 2462 MHz Channel 12: 2467 MHz Channel 13: 2472 MHz
Frequency of Each Channel (Bluetooth): Channel Frequency Channel Frequency Channel Frequency Channel Frequency
Channel 00: 2402 MHz Channel 20: 2422 MHz Channel 40: 2442 MHz Channel 60: 2462 MHzChannel 01: 2403 MHz Channel 21: 2423 MHz Channel 41: 2443 MHz Channel 61: 2463 MHzChannel 02: 2404 MHz Channel 22: 2424 MHz Channel 42: 2444 MHz Channel 62: 2464 MHzChannel 03: 2405 MHz Channel 23: 2425 MHz Channel 43: 2445 MHz Channel 63: 2465 MHzChannel 04: 2406 MHz Channel 24: 2426 MHz Channel 44: 2446 MHz Channel 64: 2466 MHzChannel 05: 2407 MHz Channel 25: 2427 MHz Channel 45: 2447 MHz Channel 65: 2467 MHzChannel 06: 2408 MHz Channel 26: 2428 MHz Channel 46: 2448 MHz Channel 66: 2468 MHzChannel 07: 2409 MHz Channel 27: 2429 MHz Channel 47: 2449 MHz Channel 67: 2469 MHzChannel 08: 2410 MHz Channel 28: 2430 MHz Channel 48: 2450 MHz Channel 68: 2470 MHzChannel 09: 2411 MHz Channel 29: 2431 MHz Channel 49: 2451 MHz Channel 69: 2471 MHzChannel 10: 2412 MHz Channel 30: 2432 MHz Channel 50: 2452 MHz Channel 70: 2472 MHzChannel 11: 2413 MHz Channel 31: 2433 MHz Channel 51: 2453 MHz Channel 71: 2473 MHzChannel 12: 2414 MHz Channel 32: 2434 MHz Channel 52: 2454 MHz Channel 72: 2474 MHzChannel 13: 2415 MHz Channel 33: 2435 MHz Channel 53: 2455 MHz Channel 73: 2475 MHzChannel 14: 2416 MHz Channel 34: 2436 MHz Channel 54: 2456 MHz Channel 74: 2476 MHzChannel 15: 2417 MHz Channel 35: 2437 MHz Channel 55: 2457 MHz Channel 75: 2477 MHzChannel 16: 2418 MHz Channel 36: 2438 MHz Channel 56: 2458 MHz Channel 76: 2478 MHzChannel 17: 2419 MHz Channel 37: 2439 MHz Channel 57: 2459 MHz Channel 77: 2479 MHzChannel 18: 2420 MHz Channel 38: 2440 MHz Channel 58: 2460 MHz Channel 78: 2480 MHzChannel 19: 2421 MHz Channel 39: 2441 MHz Channel 59: 2461 MHz
Note: 1. QuieTek verified the construction and function in typical operation. All the test modes were carried out with
the EUT in normal operation, which was shown in this test report and defined as:
EMI Mode Mode1: Normal Operation (AR5BXB63+MS-6837D)
EMS Mode Mode1: Normal Operation (AR5BXB63+MS-6837D)
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1.2. Tested System Details
The types for all equipment, plus descriptions of all cables used in the tested system (including inserted cards) are:
Signal Cable Type Signal cable Description
A Audio Cable Non-Shielded, 1.6m
B USB Cable Shielded, 1.5m
C USB Cable Shielded, 1.5m
D Microphone & Earphone Cable Non-Shielded, 1.6m
E USB Cable Shielded, 1.5m
F 1394 Cable Shielded, 1.2m
G HDMI Cable Shielded, 1m
H S-VIDEO Cable Shielded, 1.6m
I COAXIAL Cable Shielded, 7.0m
J LAN Cable Non-Shielded, 7.0m
K USB Cable Shielded, 1.5m
L D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded
M TELECOM Cable Non-Shielded, 7.0m
N TELECOM Cable Non-Shielded, 7.0m
Product Manufacturer Model No. Serial No. Power Cord
1 Monitor SONY CPD-G500 2706563 Non-Shielded, 1.8m
2 Walkman AIWA HS-TA164 N/A N/A
3 Keyboard Logitech Y-SM46 867404-0121 N/A
4 USB Mouse Logitech M-UV83 HCB54904471 N/A
5 Microphone & Earphone PCHOME N/A N/A Non-Shielded, 2.0m
6 USB 2.0 HDD AACOM F12-UF N/A Power by PC
7 USB 2.0 HDD AACOM F12-UF N/A Power by PC
8 Printer EPSON StyLus C63 FAPY093574 Non-Shielded, 1.9m
9 Monitor BenQ LT-20E17 N/A Non-Shielded, 1.8m
10 TS9980 R&S N/A N/A N/A
11 Notebook PC DELL PP18L 36119001664 Non-Shielded, 0.8m
12 Exchange Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m
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1.3. Configuration of Test System
1.4. EUT Exercise Software
(1) Setup the EUT and simulators as shown on 1.3. (2) Turn on the power of all equipment. (3) Boot the PC from Hard Disk. (4) PC reads test software from disk
(5) The Notebook PC's and far Notebook PC's monitor will show the transmitting and receiving characteristics when the communication is success.
(6) Wireless LAN function was used to perform the wireless data transmission. (7) Repeat the above procedure 5 to 6.
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1.5. Test Facility
Ambient conditions in the laboratory:
Items Test Item Required (IEC 68-1) Actual
Temperature (°C) 15-35 20-35
Humidity (%RH) 30-60 50-55
Barometric pressure (mbar)
IEC 61000-4-2
860-1060 950-1000
Temperature (°C) 15-35 20-35
Humidity (%RH) 10-75 50-65
Barometric pressure (mbar)
IEC 61000-4-5
860-1060 950-1000
Temperature (°C) 15-35 20-35
Barometric pressure (mbar)
IEC 61000-4-4 IEC 61000-4-11 860-1060 950-1000
Site Description: Accredited by NVLAP NVLAP Lab Code: 200533-0 Accredited by DNV Statement No. : 413-99-LAB11 Accredited by Nemko Certificate No.: ELA 165 Accredited by TUV Rheinland Certificate No.: 10011438-1-2004 Accredited by CNLA Accredited Number: 0914 Site Name: Quietek Corporation Site Address: No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]
0914
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2. Conducted Emission
2.1. Test Equipmen
The following test equipment are used during the conducted emission test:
Item Equipment Manufacturer Model No. / Serial No. Last Cal. Remark
1 Test Receiver R & S ESCS 30 / 825442/018 Sep., 2006
2 Artificial Mains Network R & S ENV4200 / 848411/10 Feb., 2007 Peripherals
3 LISN R & S ESH3-Z5 / 825562/002 Feb., 2007 EUT
4 Pulse Limiter R & S ESH3-Z2 / 357.8810.52 Feb., 2007
5 4-wire ISN R & S ENY41 / 837032/001 Feb., 2007
6 Double 2-Wire ISN R & S ENY22 / 835354/008 Feb., 2007
7 No.1 Shielded Room
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
2.2. Test Setup
Peripheral
80cm
AMN for EUT
Shielded Room
40cm
( EUT )
≧0.8m
AMN for Peripheral
50 ohm Terminator Test Receiver
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2.3. Limits
(1) Mains terminal
Limits (dBuV)
Limit for conducted emissions of equipment intended to be used in telecommunication centers only
Limit for conducted emissions Frequency
MHz
QP AV QP AV
0.15 - 0.50 79 66 66-56 56-46
0.50-5.0 73 60 56 46
5.0 - 30 73 60 60 50
Remarks: The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz ~ 0.50 MHz.
(2) Telecommunication ports Limits (dBuV)
Limit for conducted emissions from telecommunication ports of
equipment intended for use in telecommunication centers only
Limit for conducted emissions from telecommunication ports Frequency
MHz
QP AV QP AV
0.15 – 0.50 97-87 84-74 84-74 74-64
5.0 – 30 87 74 74 64
Remarks: In the above table, the tighter limit applies at the band edges.
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2.4. Test Procedure
AC Mains: The EUT and simulators are connected to the main power through a line impedance stabilization
network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm /50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.)
Both sides of AC line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed according to ETSI EN 301489-1: V1.6.1 (2005-09) on conducted measurement. The bandwidth of the field strength meter (R & S Test Receiver ESCS 30) is set at 9kHz.
Telecommunication Port: The mains voltage shall be supplied to the EUT via the LISN when the measurement of
telecommunication port is performed. The common mode disturbances at the telecommunication port shall be connected to the ISN, which is 150ohm impedance. Both alternative cables are tested related to the LCL requested. The measurement range is from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz. The 60dB LCL ISN is used for cat. 5 cable, 50dB LCL ISN is used for cat. 3 and 80dB LCL is wed for alternative one.
2.5. Test Specification
According to ETSI EN 301489-1: V1.6.1 (2005-09) EN 55022:1998+A1: 2000 +A2: 2003
2.6. Uncertainty
± 2.26 dB
2.7. Test Result
The emission from the EUT was below the specified limits. The worst-case emissions are shown in section 12. The EUT complies the acceptance criterion and passes the test.
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3. Radiated Emission
3.1. Test Equipment
The following test equipment are used during the Radiated emission test:
Test Site Equipment Manufacturer Model No./Serial No. Last Cal. Test Receiver R & S ESVS 10 / 834468/003 July, 2006
Spectrum Analyzer Advantest R3162/ 00803480 May, 2007
Pre-Amplifier Advantest BB525C/ 3307A01812 May, 2007
Site # 1
Bilog Antenna SCHAFFNER CBL6112B / 2697 Nov., 2006
Test Receiver R & S ESCS 30 / 836858 / 022 Nov., 2006
Spectrum Analyzer Advantest R3162 / 100803466 May, 2007
Pre-Amplifier Advantest BB525C/3307A01814 May, 2007
Bilog Antenna SCHAFFNER CBL6112B / 2705 Oct., 2006
Horn Antenna ETS 3115 / 0005-6160 July, 2006
Site # 2
Pre-Amplifier QTK QTK-AMP-01/ 0001 July, 2006
Test Receiver R & S ESI 26 / 838786 / 004 May, 2007
Spectrum Analyzer Advantest R3162 / 100803480 May, 2007
Pre-Amplifier QTK QTK-AMP-03 / 0003 May, 2007
Bilog Antenna SCHAFFNER CBL6112B / 2697 May, 2007
Horn Antenna ETS 3115 / 0005-6160 July, 2006
Site # 3
Pre-Amplifier QTK QTK-AMP-01 / 0001 July, 2006
Note: 1. All equipments are calibrated every one year. 2. The test instruments marked by “X” are used to measure the final test results.
3.2. Test Setup
EUT
FRP Dome
Test Receiver
Antenna Mast Dipole or Horn Antenna Antenna height can be moved from 1m to 4m, Antenna and turntable distance 3m
TO ControllerTo Receiver
Fully Soldered Ground Plane
Non-Conducted Table
10m
1m to 4m
80cm
Load
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3.3. Limits
Limits (dBuV/m)
Limit for radiated emissions from ancillary equipment intended for use in telecommunication centers
only, and measured on a stand alone basis
Limit for radiated emissions from ancillary equipment , measured on
a stand alone basis
Frequency
MHz
QP QP
30-230 40 30
230-1000 47 37
3.4. Test Procedure
The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters.The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated according to ETSI EN 301489-1: V1.6.1 (2005-09) on radiated measurement. The additional motch filter below 1GHz was used to measure the level of harmonics radiated emission during field dtrength of harmonics measurement. The bandwidth below 1GHz setting on the field strength meter (R&S Test Receiver ESCS 30 )is 120 kHz, and 1MHz bandwidth is adpted above 1GHz. The frequency range from 30MHz to 10th harmonics is checked.
3.5. Test Specification
According to ETSI EN 301489-1: V1.6.1 (2005-09) EN 55022:1998+A1: 2002+A2: 2003
3.6. Uncertainty
± 3.8 dB
3.7. Test Result
The emission from the EUT was below the specified limits. The worst-case emissions are shown in section 12. The EUT complies the acceptance criterion and passes the test.
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4. Power Harmonics, Voltage Fluctuation and Flicker
4.1. Test Equipment
Item Instrument 4Manufacturer Type No/Serial No. Last Calibration
1 Power Harmonics Tester
SCHAFFNER Profline 2105-400
S/N: HK54148
June, 2006
2 Analyzer SCHAFFNER CCN 1000-1/X71887 June, 2006
3 No.3 Shielded Room
Note: All equipments are calibrated every one year.
4.2. Test Setup
4.3. Limits
Limits of Class A Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current
A
Harmonics Order
n
Maximum Permissible harmonic current
A
Odd harmonics Even harmonics
3 2.30 2 1.08
5 1.14 4 0.43
7 0.77 6 0.30
9 0.40 8 ≤ n ≤ 40 0.23 * 8/n
11 0.33
13 0.21
15 ≤ n ≤ 39 0.15 * 15/n
Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.
Power Analyzer Impedance Network
Power Source
EUT
Load Controller
PC
Non-Conducted
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Limits of Class C Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current Expressed as a percentage of the input current
at the fundamental frequency %
2 2 3 30.λ* 5 10 7 7 9 5
11 ≤ n ≤ 39 (odd harmonics only)
3
*λ is the circuit power factor Limits of Class D Harmonics Currents
Harmonics Order
n
Maximum Permissible harmonic current per watt
mA/W
Maximum Permissible harmonic current
A 3 3.4 2.30 5 1.9 1.14 7 1.0 0.77 9 0.5 0.40 11 0.35 0.33
13 ≤ n ≤ 39 (odd harmonics only)
3.85/n See limit of Class A
4.4. Test Procedure
The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.
4.5. Test Specification
According to EN 61000-3-2:2000+A1: 2001, EN 61000-3-3:1995+A1: 2001
4.6. Uncertainty
± 3.23 %
4.7. Test Result
The measurement of the power harmonics, which test at the extremes of EUT’s supply range, was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
Test Result: (See Test Result)
PASS FAIL Note: According to clause 7 of EN 61000-3-2: 2000, equipment with a rated power of 75W or less, no limits apply. The test result is only for reference.
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5. Electrostatic Discharge (ESD)
5.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 ESD Simulator System SCHAFFNER NSG-438 S/N: 167 June, 2006
2 Horizontal Coupling Plane (HCP)
QuieTek HCP AL50 N/A
3 Vertical Coupling Plane (VCP)
QuieTek VCP AL50 N/A
4 No.3 Shielded Room
Note: All equipments are calibrated every one year.
5.2. Test Setup
5.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Enclosure Port
Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge
±4 Contact Discharge B
Metal Ground Plane
ESD Simulator
EUT Loads: Active Insulation
Horizontal Coupling Plane
Non-Conducted table 470K ohm Resistor
470K ohm Resistor
Vertical Coupling Plane
80cm
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5.4. Test Procedure
Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.
Indirect application of discharges to the EUT: Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.
5.5. Test Specification
According to EN 61000-4-2:1995+A1: 1998+A2: 2001
5.6. Uncertainty
± 6.003 %
5.7. Test Result
The measurement of the electrostatic discharge was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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6. Radiated Susceptibility (RS)
6.1. Test Equipment
Item Equipment Manufacturer Model No. / Serial No. Last Cal.
1 Signal Generator R & S SMY02 / 825454/029 Oct., 2006
2 Power Amplifier A & R 100W10000M7 / A285000010
N/A
3 RF Power Amplifier OPHIRRF 5022F / 1075 N/A
4 Bilog Antenna Chase CBL6112B / 2452 Sep., 2006
5 Power Meter R & S NRVD / 100219 Jan., 2007
6 Directional Coupler A & R DC6180 / 22735 Jan., 2007
7 No.5 EMC Fully Chamber
Note: All equipments are calibrated every one year.
6.2. Test Setup
6.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Enclosure Port
Radio-Frequency
Electromagnetic Field
Amplitude Modulated
MHz
V/m(Un-modulated, rms)
% AM (1kHz)
80-1000
1400-2000
3
80
A
EUT
Sensor
80cm
3 m
1m
Full-Anechoic Chamber
Power Amplifier
Signal Generator
Field Meter
Computer controller
Camera system
Camera Monitor
Antenna Mast
Load
Power Meter
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6.4. Test Procedure
The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.
All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal 3. Scanning Frequency 80MHz - 1000MHz, 1400MHz - 2000MHz 4 Dwell Time 3 Seconds
5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s
6.5. Test Specification
According to EN 61000-4-3:1996+A1: 1998+A2: 2001
6.6. Uncertainty
± 6.17 %
6.7. Test Result
The measurement of the radiated susceptibility was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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7. Electrical Fast Transient/Burst (EFT/B)
7.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Fast Transient/Burst Generator
SCHAFFNER NSG 2050 S/N: 200124-031AR
June, 2006
2 No.2 Shielded Room
Note: All equipments are calibrated every one year.
7.2. Test Setup
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Page: 22 of 50 Version:1.0
7.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Ports for signal lines and control lines
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+0.5
5/50
5
B
Input DC Power Ports
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+0.5
5/50
5
B
Input AC Power Ports
Fast Transients Common Mode
kV (Peak)
Tr/Th ns
Rep. Frequency kHz
+1
5/50
5
B
7.4. Test Procedure
The EUT and load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. For Signal Ports and Telecommunication Ports:
The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1min.
For Input DC and AC Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 min. The length of power cord between the coupling device and the EUT shall be 1m.
7.5. Test Specification
According to EN 61000-4-4:1995+A1: 2001+A2: 2001
7.6. Uncertainty
± 8.80 %
7.7. Test Result
The measurement of the Electrical Fast Transient/Burst was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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Page: 23 of 50 Version:1.0
8. Surge
8.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Surge Generator SCHAFFNER NSG 2050 S/N: 200124-031AR
June, 2006
2 No.6 Shielded Room
Note: All equipment upon which need to calibrated are with calibration period of 1 year.
8.2. Test Setup
8.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
Telecommunication Ports (See 1) and 2))
Surges Line to Ground
Tr/Th us kV
1.2/50 (8/20) ± 1 B
Telecommunication Ports in Telecom Centres (See 1) and 2))
Surges Line to Ground
Tr/Th us kV
1.2/50 (8/20) ± 0.5 B
AC Input and AC Output Power Ports
Surges
Line to Line Line to Ground
Tr/Th us kV kV
1.2/50 (8/20) ±1 ± 2
B
AC Input and AC Output Power Ports in Telecom Centres
Surges
Line to Line Line to Ground
Tr/Th us kV kV
1.2/50 (8/20) ±0.5 ± 1
B
Notes: 1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables. 2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity
test shall be required.
Surge Generator
EUT Load PC
Non-Conducted Table Non-Conducted Table
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Page: 24 of 50 Version:1.0
8.4. Test Procedure
The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) device couples to the signal and Telecommunication lines of the EUT.
For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.
8.5. Test Specification
According to EN 61000-4-5:1995+A1+ 2001
8.6. Uncertainty
± 7.93 %
8.7. Test Result
The measurement of the Surge was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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Page: 25 of 50 Version:1.0
9. Conducted Susceptibility (CS)
9.1. Test Equipment
Item Equipment Manufacturer Model No. / Serial No. Last Cal.
1 CS SYSTEM SCHAFFNER NSG 2070 March, 2007
2 CDN SCHAFFNER CDN M016S / 20822 Dec., 2006
3 CDN SCHAFFNER CDN M016S / 20823 Dec., 2006
4 FIXED PAD SCHAFFNER INA 2070-1 / 2115 N/A
5 EM Clamp KEMZ 801 / 21024 March, 2007
6 No.6 Shielded Room
Note: All equipments are calibrated every one year.
9.2. Test Setup
9.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
AC Input and AC Output & DC Input and DC output Power Ports & Functional Earth Ports
Radio-Frequency
Common Mode.
Amplitude Modulated
MHz
V (rms, Unmodulated)
% AM (1kHz)
Source Impedance Ω
0.15-80
3
80
150
A
Aux equipment
EUT
CDN
RF-Generator
T2Ground Reference Plane
Non-Conducted Table
CDNAux
equipment
T
PA
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Page: 26 of 50 Version:1.0
9.4. Test Procedure
The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports
The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT.
For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires.
All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz sinusoidal audio signal 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds
5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s
9.5. Test Specification
According to EN 61000-4-6:1996 +A1: 2001
9.6. Uncertainty
± 6.17 %
9.7. Test Result
The measurement of the Conducted Susceptibility was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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10. Voltage Dips and Interruption
10.1. Test Equipment
Item Instrument Manufacturer Type No/Serial No. Last Calibration
1 Voltage Dips Generator SCHAFFNER NSG 2050 S/N: 200124-031AR
June, 2006
2 No.6 Shielded Room
Note: All equipments are calibrated every one year.
10.2. Test Setup
10.3. Test Level
Item Environmental Phenomena Units Test Specification Performance Criteria
AC Input and AC Output Power Ports
Voltage Dips % Reduction
ms
30
10 B
Voltage Dips % Reduction
ms
60
100 C
Voltage Interruptions % Reduction
ms
> 95 %
5000 C
Voltage Dips/ Interruptions /Variations Simulator
EUT Load
To AC Line
Controller Computer Printer
Non-Conducted Table 80cm
AC Power Line to EUT
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Page: 28 of 50 Version:1.0
10.4. Test Procedure
The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test:
The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 10ms, with a sequence of three voltage dips with intervals of 10 seconds, for 60% voltage dip of supplied voltage and duration 100ms with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 5000ms with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the voltage.
10.5. Test Specification
According to EN 61000-4-11:1994+A1: 2001
10.6. Uncertainty
± 2.03 %
10.7. Test Result
The measurement of the Voltage Dips and Interruption was investigated and test result was shown in section 12. The EUT complies the acceptance criterion and passes the test.
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11. EMC Reduction Method During Compliance Testing
No modification was made during testing.
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12. Test Result
The test results in the emission and the immunity were performed according to the requirements of measurement standard and process. Quietek Corporation is assumed full responsibility for the accuracy and completeness of these measurements. The test data of the emission is listed as below. All the tests were carried out with the EUT in normal operation, which was defined as:
EMI Mode Mode1: Normal Operation (AR5BXB63+MS-6837D)
EMS Mode Mode1: Normal Operation (AR5BXB63+MS-6837D)
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Page: 31 of 50 Version:1.0
12.1. Test Data of Conducted Emission
Product : Notebook Test Item : Conducted Emission Test Site : No.1 Shielded Room Power Line : Line 1 Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
LINE 1
Quasi-Peak
0.334 0.214 47.440 47.654 -13.089 60.743
0.681 0.229 46.870 47.099 -8.901 56.000
0.947 0.232 47.570 47.802 -8.198 56.000
1.373 0.248 47.120 47.368 -8.632 56.000
1.697 0.262 42.520 42.782 -13.218 56.000
2.670 0.304 39.090 39.394 -16.606 56.000
Average
0.334 0.214 29.120 29.334 -21.409 50.743
0.681 0.229 29.300 29.529 -16.471 46.000
0.947 0.232 29.540 29.772 -16.228 46.000
1.373 0.248 29.400 29.648 -16.352 46.000
1.697 0.262 28.260 28.522 -17.478 46.000
2.670 0.304 26.770 27.074 -18.926 46.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 32 of 50 Version:1.0
Product : Notebook
Test Item : Conducted Emission Test Site : No.1 Shielded Room
Power Line : Line 2 Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
LINE 2
Quasi-Peak
0.341 0.214 49.970 50.184 -10.359 60.543
0.662 0.218 46.530 46.748 -9.252 56.000
0.939 0.232 47.590 47.822 -8.178 56.000
1.369 0.248 46.330 46.578 -9.422 56.000
2.056 0.277 40.400 40.677 -15.323 56.000
3.119 0.321 35.320 35.641 -20.359 56.000
Average
0.341 0.214 33.420 33.634 -16.909 50.543
0.662 0.218 25.980 26.198 -19.802 46.000
0.939 0.232 30.070 30.302 -15.698 46.000
1.369 0.248 28.710 28.958 -17.042 46.000
2.056 0.277 27.680 27.957 -18.043 46.000
3.119 0.321 20.500 20.821 -25.179 46.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 33 of 50 Version:1.0
Product : Notebook
Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room
Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)(LAN Cable-100 Mbps)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
Quasi-Peak
1.021 9.820 56.170 65.990 -8.010 74.000
1.267 9.820 57.390 67.210 -6.790 74.000
3.041 9.810 49.140 58.950 -15.050 74.000
4.412 9.800 55.320 65.120 -8.880 74.000
9.388 9.780 51.790 61.570 -22.430 84.000
12.748 9.905 60.490 70.395 -13.605 84.000
Average
1.021 9.820 42.940 52.760 -11.240 64.000
1.267 9.820 44.360 54.180 -9.820 64.000
3.041 9.810 44.240 54.050 -9.950 64.000
4.412 9.800 46.010 55.810 -8.190 64.000
9.388 9.780 50.320 60.100 -13.900 74.000
12.748 9.905 57.650 67.555 -6.445 74.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 34 of 50 Version:1.0
Product : Notebook
Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room
Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)(LAN Cable-10 Mbps)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
Quasi-Peak
0.338 9.880 25.290 35.170 -43.459 78.629
0.408 9.874 24.950 34.824 -41.805 76.629
2.048 9.820 48.520 58.340 -15.660 74.000
4.998 9.800 45.720 55.520 -18.480 74.000
9.986 9.780 57.410 67.190 -16.810 84.000
11.673 9.818 35.040 44.858 -39.142 84.000
Average
0.338 9.880 9.410 19.290 -49.339 68.629
0.408 9.874 10.990 20.864 -45.765 66.629
2.048 9.820 48.510 58.330 -5.670 64.000
4.998 9.800 19.250 29.050 -34.950 64.000
9.986 9.780 29.570 39.350 -34.650 74.000
11.673 9.818 14.810 24.628 -49.372 74.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 35 of 50 Version:1.0
Product : Notebook
Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room
Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D) (Telecom)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
Quasi-Peak
0.193 9.896 50.630 60.526 -22.245 82.771
0.455 9.870 42.070 51.940 -23.346 75.286
2.048 9.820 48.760 58.580 -15.420 74.000
2.673 9.810 31.000 40.810 -33.190 74.000
12.056 9.852 38.730 48.582 -25.418 74.000
23.998 9.910 53.190 63.100 -10.900 74.000
Average
0.193 9.896 47.370 57.266 -15.505 72.771
0.455 9.870 38.530 48.400 -16.886 65.286
2.048 9.820 48.750 58.570 -5.430 64.000
2.673 9.810 28.730 38.540 -25.460 64.000
12.056 9.852 35.340 45.192 -18.808 64.000
23.998 9.910 50.780 60.690 -3.310 64.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 36 of 50 Version:1.0
Product : Notebook
Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room
Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D) (GIGA CUR)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
Quasi-Peak
0.455 0.200 8.990 9.190 -22.096 31.286
0.818 0.200 18.300 18.500 -11.500 30.000
1.123 0.200 24.790 24.990 -5.010 30.000
1.300 0.200 22.760 22.960 -7.040 30.000
1.685 0.200 22.580 22.780 -7.220 30.000
23.998 0.400 11.880 12.280 -17.720 30.000
Average
0.455 0.200 5.020 5.220 -16.066 21.286
0.818 0.200 8.890 9.090 -10.910 20.000
1.123 0.200 16.630 16.830 -3.170 20.000
1.300 0.200 16.410 16.610 -3.390 20.000
1.685 0.200 13.670 13.870 -6.130 20.000
23.998 0.400 10.630 11.030 -8.970 20.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level.
3. Measurement Level = Reading Level + Correct Factor
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Page: 37 of 50 Version:1.0
Product : Notebook
Test Item : Impedance Stabilization Network Test Site : No.1 Shielded Room
Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D) (GIGA VOL)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV dB dBuV
Quasi-Peak
0.455 20.200 42.940 63.140 -12.146 75.286
0.588 20.200 38.580 58.780 -15.220 74.000
1.107 20.200 37.240 57.440 -16.560 74.000
2.087 20.200 39.400 59.600 -14.400 74.000
6.912 20.200 42.750 62.950 -11.050 74.000
23.998 20.400 41.010 61.410 -12.590 74.000
Average
0.455 20.200 39.880 60.080 -5.206 65.286
0.588 20.200 37.370 57.570 -6.430 64.000
1.107 20.200 35.460 55.660 -8.340 64.000
2.087 20.200 37.630 57.830 -6.170 64.000
6.912 20.200 38.070 58.270 -5.730 64.000
23.998 20.400 40.870 61.270 -2.730 64.000
Note:
1. All Reading Levels are Quasi-Peak and Average value.
2. " " means the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
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Page: 38 of 50 Version:1.0
12.2. Test Data of Radiated Emission
Product : Notebook Test Item : General Radiated Emission Test Site : No.3 OATS Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Frequency Correct Reading Measurement Margin Limit
Factor Level Level
MHz dB dBuV dBuV/m dB dBuV/m
Horizontal 135.250 14.047 9.900 23.947 -6.053 30.000
174.810 11.656 8.800 20.456 -9.544 30.000
240.000 13.996 15.700 29.696 -7.304 37.000
360.210 17.853 11.900 29.753 -7.247 37.000
480.050 21.788 7.140 28.928 -8.072 37.000
667.319 24.554 5.910 30.464 -6.536 37.000
Vertical 51.000 8.137 12.990 21.127 -8.873 30.000
126.050 12.732 8.740 21.472 -8.528 30.000
188.030 11.061 11.520 22.581 -7.419 30.000
360.000 18.481 10.300 28.781 -8.219 37.000
480.000 21.498 6.570 28.069 -8.931 37.000
900.000 28.404 2.670 31.074 -5.926 37.000
Note:
1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary.
2. “ ” means the worst emission level. 3. Measurement Level = Reading Level + Correct Factor
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Page: 39 of 50 Version:1.0
12.3. Test Data of Power Harmonics, Voltage Flucturation and Flicker
Product : Notebook Test Item : Power Harmonics Classification : Class D Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Test Result: Pass Source qualification: Normal
Current & voltage waveforms
-0.6-0.4-0.20.00.20.40.6
-300-200-1000100200300
Cur
rent
(Am
ps)
Voltage (V
olts)
Harmonics and Class D limit line European Limits
0.000.050.100.150.200.250.300.350.400.45
Cur
rent
RM
S(A
mps
)
Harmonic #4 8 12 16 20 24 28 32 36 40
Test result: Pass Worst harmonic was #7 with 13.63% of the limit.
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Test Result: Pass Source qualification: Normal THC(A): 0.06 I-THD(%): 16.94 POHC(A): 0.004 POHC Limit(A): 0.037 Highest parameter values during test:
V_RMS (Volts): 229.76 Frequency(Hz): 50.00 I_Peak (Amps): 0.626 I_RMS (Amps): 0.390 I_Fund (Amps): 0.377 Crest Factor: 1.669 Power (Watts): 86.9 Power Factor: 0.969
Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.000 3 0.051 0.295 17.2 0.055 0.443 12.35 Pass 4 0.000 5 0.030 0.165 18.1 0.031 0.243 12.54 Pass 6 0.000 7 0.017 0.087 19.6 0.017 0.128 13.63 Pass 8 0.000 9 0.005 0.043 12.4 0.006 0.065 9.28 Pass 10 0.000 11 0.001 0.030 4.4 0.002 0.046 4.42 Pass 12 0.000 13 0.002 0.026 7.2 0.003 0.039 6.62 Pass 14 0.000 15 0.004 0.023 15.7 0.004 0.033 11.76 Pass 16 0.000 17 0.003 0.020 15.1 0.003 0.030 10.75 Pass 18 0.000 19 0.002 0.018 11.5 0.002 0.026 8.71 Pass 20 0.000 21 0.001 0.016 8.9 0.002 0.024 7.12 Pass 22 0.000 23 0.001 0.015 8.2 0.002 0.022 6.98 Pass 24 0.000 25 0.001 0.013 10.6 0.002 0.020 8.72 Pass 26 0.000 27 0.002 0.012 14.9 0.002 0.019 11.55 Pass 28 0.000 29 0.001 0.012 13.0 0.002 0.017 10.18 Pass 30 0.000 31 0.001 0.011 9.3 0.001 0.016 8.11 Pass 32 0.000 33 0.001 0.010 9.2 0.001 0.015 6.89 Pass 34 0.000 35 0.001 0.010 11.0 0.001 0.014 8.25 Pass 36 0.000 37 0.001 0.009 11.8 0.001 0.014 8.62 Pass 38 0.000 39 0.001 0.009 11.3 0.001 0.013 8.46 Pass 40 0.000
1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the same window as
the maximum harmonics/limit ratio.
2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power >75W. Others
the result should be pass.
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Page: 41 of 50 Version:1.0
Product : Notebook Test Item : Voltage Fluctuations and Flicker Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Test Result: Pass Status: Test Completed
Psti and limit line European Limits
0.25
0.50
0.75
1.00
Pst
13:2
5:5
5
Plt and limit line
0.10.20.30.40.50.6
Plt
13:25:55
Parameter values recorded during the test:
Vrms at the end of test (Volt): 229.58
Highest dt (%): 0.00 Test limit (%): 3.30 Pass
Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass
Highest dc (%): 0.00 Test limit (%): 3.30 Pass
Highest dmax (%): 0.00 Test limit (%): 4.00 Pass
Highest Pst (10 min. period): 0.182 Test limit: 1.000 Pass
Highest Plt (2 hr. period): 0.079 Test limit: 0.650 Pass
Report No. 074L146-RFCEP02V01
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12.4. Test Data of Electrostatic Discharge
Product : Notebook Test Item : Electrostatic Discharge Test Site : No.3 Shielded Room Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Item Amount of Discharge
Voltage Required Criteria
Complied To Criteria (A, B, C)
Results
Air Discharge 10
10
+8kV
-8kV
B
B
B
B
Pass
Pass
Contact Discharge 25
25
+4kV
-4kV
B
B
B
B
Pass
Pass
Indirect Discharge
(HCP)
50
50
+4kV
-4kV
B
B
B
B
Pass
Pass
Indirect Discharge
(VCP Front)
50
50
+4kV
-4kV
B
B
B
B
Pass
Pass
Indirect Discharge
(VCP Left)
50
50
+4kV
-4kV
B
B
B
B
Pass
Pass
Indirect Discharge
(VCP Back)
50
50
+4kV
-4kV
B
B
B
B
Pass
Pass
Indirect Discharge
(VCP Right)
50
50
+4kV
-4kV
B
B
B
B
Pass
Pass
Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
NR: No Requirement
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.
Report No. 074L146-RFCEP02V01
Page: 43 of 50 Version:1.0
12.5. Test Data of Radiated Susceptibility
Product : Notebook Test Item : Radiated Susceptibility Test Site : No.5 EMC fully Chamber Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Frequency (MHz)
Position (Angle)
Polarity(H or V)
Field Strength (V/m)
Required Criteria
Complied To Criteria
(A, B, C) Results
80-1000 Front H 3 A A Pass 80-1000 Front V 3 A A Pass 80-1000 Back H 3 A A Pass 80-1000 Back V 3 A A Pass 80-1000 Left H 3 A A Pass 80-1000 Left V 3 A A Pass 80-1000 Right H 3 A A Pass 80-1000 Right V 3 A A Pass 80-1000 Top H 3 A A Pass 80-1000 Top V 3 A A Pass 80-1000 Down H 3 A A Pass 80-1000 Down V 3 A A Pass
1400-2000 Front H 3 A A Pass 1400-2000 Front V 3 A A Pass 1400-2000 Back H 3 A A Pass 1400-2000 Back V 3 A A Pass 1400-2000 Left H 3 A A Pass 1400-2000 Left V 3 A A Pass 1400-2000 Right H 3 A A Pass 1400-2000 Right V 3 A A Pass 1400-2000 Top H 3 A A Pass 1400-2000 Top V 3 A A Pass 1400-2000 Down H 3 A A Pass 1400-2000 Down V 3 A A Pass
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m
at frequency MHz. No false alarms or other malfunctions were observed during or after the test.
Report No. 074L146-RFCEP02V01
Page: 44 of 50 Version:1.0
12.6. Test Data of Electrical Fast Transient
Product : Notebook Test Item : Electrical Fast Transient Test Site : No.2 Shielded Room Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line . No false alarms or other malfunctions were observed during or after the test.
Inject Line
Polarity Voltage
(kV)
Inject Time
(Second)
Inject Method
Required Criteria
Complied to Criteria Result
L + N +PE ± 1 60 Direct B A Pass
LAN ± 0.5 90 Clamp B A Pass
Telecom ± 0.5 90 Clamp B B Pass
Report No. 074L146-RFCEP02V01
Page: 45 of 50 Version:1.0
12.7. Test Data of Surge
Product : Notebook Test Item : Surge Test Site : No. 6 Shielded Room Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Inject Line
Polarity AngleVoltage
(kV)
Time Interval
(Second)
Inject Method
Required Criteria
Complied to Criteria Result
L-N ± 0 1 60 Direct B A Pass
L-N ± 90 1 60 Direct B A Pass
L-N ± 180 1 60 Direct B A Pass
L-N ± 270 1 60 Direct B A Pass
N-PE ± 0 2 60 Direct B A Pass
N-PE ± 90 2 60 Direct B A Pass
N-PE ± 180 2 60 Direct B A Pass
N-PE ± 270 2 60 Direct B A Pass
L+PE ± 0 2 60 Direct B A Pass
L+PE ± 90 2 60 Direct B A Pass
L+PE ± 180 2 60 Direct B A Pass
L+PE ± 270 2 60 Direct B A Pass
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line . No false alarms or other malfunctions were observed during or after the test.
Report No. 074L146-RFCEP02V01
Page: 46 of 50 Version:1.0
12.8. Test Data of Conducted Susceptibility
Product : Notebook Test Item : Conducted Susceptibility Test Site : No. 6 Shielded Room Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Frequency
Range
(MHz)
Voltage
Applied
dBuV(V)
Inject
Method
Tested Port of
EUT
Required
Criteria
Performance
Criteria
Complied To
Result
0.15~80 130(3V) CDN AC IN A A PASS
0.15~80 130(3V) Clamp LAN A A PASS
0.15~80 130(3V) Clamp LAN GIGA A A PASS
0.15~80 130(3V) Clamp Telecom A A PASS
Note:
The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
EUT stopped operation and could / could not be reset by operator at kV of
Line . No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Report No. 074L146-RFCEP02V01
Page: 47 of 50 Version:1.0
12.9. Test Data of Voltage Dips and Interruption
Product : Notebook Test Item : Voltage Dips and Interruption Test Site : No.6 Shielded Room Test Mode : Mode1: Normal Operation (AR5BXB63+MS-6837D)
Voltage Dips and
Interruption Reduction (%)
Angle Test Duration
(ms)
Required Performance
Criteria
Performance Criteria Complied
To
Test Result
30 0 10 B A PASS 30 45 10 B A PASS 30 90 10 B A PASS 30 135 10 B A PASS 30 180 10 B A PASS 30 225 10 B A PASS 30 270 10 B A PASS 30 315 10 B A PASS 60 0 100 C A PASS 60 45 100 C A PASS 60 90 100 C A PASS 60 135 100 C A PASS 60 180 100 C A PASS 60 225 100 C A PASS 60 270 100 C A PASS 60 315 100 C A PASS
>95 0 5000 C A PASS >95 45 5000 C A PASS >95 90 5000 C A PASS >95 135 5000 C A PASS >95 180 5000 C A PASS >95 225 5000 C A PASS >95 270 5000 C A PASS >95 315 5000 C A PASS
Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information
The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV of
Line . No false alarms or other malfunctions were observed during or after the test. The acceptance
criteria were met, and the EUT passed the test.
Report No.: 074L146-RFCEP02V01
Page : 1 of 10 Version:1.0
Attachment 1: EUT Test Setup Photographs
Front View of Conducted Test
Back View of Conducted Test
Report No.: 074L146-RFCEP02V01
Page : 2 of 10 Version:1.0
Front View of Conducted Test (ISN)
Back View of Conducted Test (ISN)
Report No.: 074L146-RFCEP02V01
Page : 3 of 10 Version:1.0
Front View of Conducted Test (GIGA CUR)
Back View of Conducted Test (GIGA CUR)
Report No.: 074L146-RFCEP02V01
Page : 4 of 10 Version:1.0
Front View of Conducted Test (GIGA VOL)
Back View of Conducted Test (GIGA VOL)
Report No.: 074L146-RFCEP02V01
Page : 5 of 10 Version:1.0
Front View of Radiated Test
Back View of Radiated Test-Clamp
Report No.: 074L146-RFCEP02V01
Page : 7 of 10 Version:1.0
Radiated Susceptibility Test Setup
EFT/B Test Setup
Report No.: 074L146-RFCEP02V01
Page : 9 of 10 Version:1.0
Conducted Susceptibility Test Setup
Conducted Susceptibility Test Setup- Clamp
Report No.: 074L146-RFCEP02V01
Page : 1 of 7 Version:1.0
Attachment 2 : EUT Detailed Photographs (1) EUT Photo
(2) EUT Photo