znse detectors - experimental methods and results 2011

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Study of X-ray induced conductivity of ZnSe and the development of high-temperature detectors of ionizing radiation Andrii Sofiienko Chief Physicist, Head of research laboratory, Ph.D. Volodimir Degoda Director of RPC “Arvina”, Dr. Sci. Phys. 2011 1

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Page 1: ZnSe detectors - experimental methods and results 2011

Study of X-ray induced conductivity of ZnSe

and the development of high-temperature

detectors of ionizing radiation

Andrii Sofiienko – Chief Physicist, Head of research laboratory, Ph.D.

Volodimir Degoda – Director of RPC “Arvina”, Dr. Sci. Phys.

2011

1

Page 2: ZnSe detectors - experimental methods and results 2011

Table of contents

General information about ZnSe.

Methods to investigate the conductivity and

luminescence.

Research results.

Design of detectors based on ZnSe.

2

Page 3: ZnSe detectors - experimental methods and results 2011

General information about ZnSe

ZnSe - binary diamond-like semiconductors with a

band gap of 2.7 - 2.8 eV.

ZnSe is used for the manufacture of optical

components (windows, lenses, prisms and mirrors) for

the visible and infrared range (0.5-22) microns in

optical systems and laser CO2 optics. ZnSe has a

high transmittance value, strength, hardness, optical

uniformity, wide transparency range, erosion and

thermal stability.

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Page 4: ZnSe detectors - experimental methods and results 2011

General information about ZnSe

4

Fig. 1 The samples of ZnSe

Page 5: ZnSe detectors - experimental methods and results 2011

General information about ZnSe

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Parameter

Semiconductors

ZnSe CdTe CdZnTe Si Ge GaAs SiC

Eg (300 K), eV 2.80 1.51 1.57 1.11 0.67 1.43 2.86

Т(smelting), 0С 1798 1090 1100 1420 940 1240 2800

ρ, g\cm3 5.4 5.9 6.0 2.3 5.3 5.3 --

μе, cm2/V∙s

μh, cm2/V∙s

700

25÷40

1050

100

1000

100

1500

480

4500

1900

8500

450

1200÷800

80÷140

α (300 К), К-1 7.5 4.9 5.0 2.4 5.8 6.0 ≈ 3.0

Radiation

resistance to γ,

Gy

107 < 105 < 106 < 105 < 106 ≈ 3∙105 ≈ 106

Radiation

resistance to n,

1/cm2

1016 < 1013 < 1014 < 1012 < 1014 < 1012 < 1015

The threshold

energy for defect

formation, eV

~ 40 6 ÷ 8 6 ÷ 8 11 ÷ 20 12 ÷ 20 8 ÷ 20 50 ÷ 150

ρR, Ohm∙cm 1011 109 1011 105 104 108 109

Page 6: ZnSe detectors - experimental methods and results 2011

Experimental methods

The main directions of research on the physical

characteristics of wide band-gap semiconductors:

photo and X-ray luminescence

photo and X-ray conductivity;

relaxation of the current and phosphorescence;

thermally stimulated luminescence and conductivity.

Generally used for more than 10 techniques to study

the characteristics of semiconductors in the temperature range from -265 0C to 300 0C.

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Page 7: ZnSe detectors - experimental methods and results 2011

Experimental methods

Fig. 2 A schematic of the experimental setup

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Page 8: ZnSe detectors - experimental methods and results 2011

Research results

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0 50 100 150 200 25010

0

101

102

103

104

105

up to 1000 times

E ~ 1.0 eV

single crystal

E ~ 0.82 eV

polycrystal

Intr

insic

co

nd

uctivity, pA

T, 0C

1

2

Fig. 3 Temperature dependencies of intrinsic conductivity of polycrystalline ZnSe (1)

and single-crystal (2), Е0 = 400 V/cm

Page 9: ZnSe detectors - experimental methods and results 2011

Research results

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-50 0 50 100 150 200 250 30010

-12

10-11

10-10

10-9

10-8

10-7

10-6

10-5

C

ond

uctivity,

A

T, 0C

103 times10

5 times

1, X-ray conductivity (~ 1 kGy/h)

2, intrinsic conductivity

Temperature stabilization of

X-ray conductivity

Fig. 4 Temperature dependencies of X-ray conductivity of single-crystal ZnSe (1) and

intrinsic conductivity (2), Е0 = 400 V/cm

Page 10: ZnSe detectors - experimental methods and results 2011

Research results

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0.0 2.0x103

4.0x103

6.0x103

8.0x103

1.0x104

0.00

0.06

0.12

0.18

0.24

0.30

0.36

i(600 V) D1.36

i(400 V) D1.60

D, Gy/h

I X(D

),

A

1

2

3

i(200 V) D1.75

Fig. 4 Dose dependencies of X-ray conductivity of single-crystal ZnSe:

U = 200V (1), U = 400V (2), U = 600V (3)

Page 11: ZnSe detectors - experimental methods and results 2011

Design of detectors based on ZnSe

When we design a high-temperature detectors based

on ZnSe, we consider the following requirements:

high optical quality of crystals;

minimum intrinsic conductivity;

possibility of compensating for the intrinsic

conductivity in the on-line;

temperature range up to 200 0C without cooling;

high efficiency of absorption of ionizing radiation.

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Page 12: ZnSe detectors - experimental methods and results 2011

Design of detectors based on ZnSe

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Fig. 5 Single-crystal multielectrode detector with automatic compensation of intrinsic

conductivity

Page 13: ZnSe detectors - experimental methods and results 2011

Design of detectors based on ZnSe

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Fig. 6 Double-crystal multielectrode detector with automatic compensation of

intrinsic conductivity

Page 14: ZnSe detectors - experimental methods and results 2011

Design of detectors based on ZnSe

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Fig. 7 Detection efficiency of gamma radiation of ZnSe detectors, [d] = cm

Page 15: ZnSe detectors - experimental methods and results 2011

Design of detectors based on ZnSe

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Fig. 8 A Schematic of the measuring system for isotopic thickness gauge

Page 16: ZnSe detectors - experimental methods and results 2011

CONCLUSIONS

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Change of intrinsic conductivity of ZnSe specimens within the range of

temperatures from 10 0С up to 240 0С showed that single-crystal specially

undoped ZnSe has extremely low intrinsic conductivity. This attribute of obtained

specimens can be used during the designing and manufacturing of gamma and X-

ray radiation detectors for the application in radiation hot rolling thickness gauges

which are widely used in the metallurgy. Distinctive feature of such detectors is

that there is no necessity to perform additional cooldown which considerably

simplifies measuring part of thickness gauge.

It was determined that “dose rate - current” calibrating characteristic of analyzed

specimens approaches to the linear one when electric field is increased in the

specimen up to Е0 ≥ 1400 V/cm. However, since the current of X-ray induced

conductivity is described precisely enough with simple power function of the

following type IX ~ Db, which is linearized in double logarithmic scale, then in

practice significantly lesser electric fields 500-1000 V/cm can be used what

decreases the probability of surface breakdown of sensors.

Page 17: ZnSe detectors - experimental methods and results 2011

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Director General : Petrenko Valeriy Stepanovich

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Tel/fax: +38 044 5016178

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