zdot™opticalprofiler optical profiler multi‐mode optics · 2018-10-25 · optical profiler yppy...

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ZDotOptical Profiler Zeta3D™ Measurement System Zeta’s unique and patented ZDot™ technology is ideal that are transparent and multi‐layer, have low reflectiv variations. ZDot has also demonstrated unmatched pe provides the most efficient light path possible in a 3D possible with white light interferometers or laser confo Powered by this exceptional capability , the Zeta‐300 p ZDot Optical Profiler form factor is an ideal solution for all types of research Multi‐Mode Optics The Zeta‐300 is available with several advanced techniques: ZDot TM innovative 3D imaging is standard on all our opti ZDot™ technology with our unique transmissive and dark illumination schemes as well as a variety of objectives allo handle the most ‘difficult’ of surfaces. ZIC Zeta’s enhanced differential interference contrast im nanometer level surface roughness ZSI Zeta Shearing Interferometer provides Angstrom leve resolution independent of the objective used ZX5, ZX100 vertical scanning interferometry for nanom over large field of view ZFT reflectometry based Zeta Film Thickness measurem Microfluidic Device (mm) Film Contamination (Å) Solar Cell (µm) VCSEL (µm) lly suited for measuring difficult surfaces, including those vity, low contrast, high roughness or large height erformance on high aspect ratio holes and trenches. ZDot D profiler, enabling accurate z‐height metrology not ocal microscopes. latform with its built‐in vibration isolation and compact h and production applications. cal profilers. The k field ows the tool to maging for el vertical eter heights ment Measurement Channels and Sensitivity © Copyright 2015 Zeta Instruments Inc., All rights reserved MEMS Device (µm) Micro Gear (mm) IC Wafer Surface (nm)

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Page 1: ZDot™OpticalProfiler Optical Profiler Multi‐Mode Optics · 2018-10-25 · Optical Profiler yppy form factor is an ideal solution for all types of research Multi‐Mode Optics

ZDot™ Optical Profiler

Zeta3D™ Measurement System

Zeta’s unique and patented ZDot™ technology is idealthat are transparent and multi‐layer, have low reflectivvariations.  ZDot has also demonstrated unmatched peprovides the most efficient light path possible in a 3Dpossible with white light interferometers or laser confo

Powered by this exceptional capability, the Zeta‐300 p

ZDot  Optical Profiler

y p p y pform factor is an ideal solution for all types of research

Multi‐Mode OpticsThe Zeta‐300 is available with several advanced techniques:

• ZDotTM innovative 3D imaging is standard on all our optiZDot™ technology with our unique transmissive and darkillumination schemes as well as a variety of objectives allohandle the most ‘difficult’ of surfaces.

• ZIC Zeta’s enhanced differential interference contrast imnanometer level surface roughness

• ZSI Zeta Shearing Interferometer provides Angstrom leveresolution independent of the objective used

• ZX5, ZX100 vertical scanning interferometry for nanom, g yover large field of view

• ZFT reflectometry based Zeta Film Thickness measurem

Microfluidic Device (mm)Film Contamination (Å)

Solar Cell (µm)VCSEL (µm)

lly suited for measuring difficult surfaces, including those vity, low contrast, high roughness or large height erformance on high aspect ratio holes and trenches. ZDot D profiler, enabling accurate z‐height metrology not ocal microscopes. 

latform with its built‐in vibration isolation and compact ph and production applications.

  

cal profilers.  The k field ows the tool to 

maging for 

el vertical 

eter heights g

ment

Measurement Channels and Sensitivity

© Copyright 2015 Zeta Instruments Inc., All rights reserved

MEMS Device (µm) Micro Gear (mm) IC Wafer Surface (nm)

Page 2: ZDot™OpticalProfiler Optical Profiler Multi‐Mode Optics · 2018-10-25 · Optical Profiler yppy form factor is an ideal solution for all types of research Multi‐Mode Optics

20 i i d i h SI20nm pit imaged with ZSI

Solar Cell Textur

HDD Slider

Technical Specifications

Patterned Sapphire(PSS)

Dimensions (inches) Operating SpecificationsMicroscope (with Computer): Voltage: 100 ‐ 230 VAC32 x 37 x 61 Current: 4AMonitor: 22 x 5 x 16 Op. Temp.: 18‐30° C, non‐Total Weight: 360lbs/164 kg condensing, ±1° C per hour

Optical Specifications 

  5x  10x  20x  50x  100x

N.A.  0.15  0.30  0.45  0.80 0.90

FOV (µm)1  1894 x 1420  944 x 708  468 x 351  189 x 142 93 x 70

FOV (µm)2  4697 x 3522  2327 x 1745  1169 x 877  466 x 349 234 x 17

1 1/3” CCD Camera with 0.5x Coupling Lens2 2/3” CCD Camera with 0.35x Coupling Lens3 Static repeatability based on VLSI 0.94 μm step‐height standard, 100x/0.9NA objective, piezo stage, and standard ZDot™ imaging mode

ZETA Instruments 2528 Qume Drive Suite 12  San Jose CA 95131 Tel +1.408.573.7285  Fax +1.408.573.7627

www.zeta‐inst.com

System Information

Application Specific PackagesThe Zeta‐300 can be configured with specific optics, 

h k ll d l fstages, chucks, illumination and analysis software to optimize the performance for a specific application. These packages are ideal for production environment where easy and reliable data collection is important. Here are a couple of examples:

PSS Metrology & Defect analysisHeight, Diameter & Pitch for PSSPhoto‐resist or post‐etch PSS bumps

rePhoto resist or post etch PSS bumpsDefect Classification and AOI2”, 4” & 6” wafer vacuum chucks

Micro‐fluidics and MEMSTransparent multi surface profilingDeep trench & high aspect ratio capabilityProgrammable recipes for automated scans

Flexible Hardware OptionsFlexible Hardware OptionsDark Field or Transmissive IlluminationDiamond Scribe6‐objective Auto‐TurretDiamond Wire measurementWafer or Disk Chamfer measurement Long Working Distance, Refractive Index Corrected or Liquid Immersion objectivesq j… and many more …

Performance Configuration3D Acquisition: ~ 1 sec/site typical (ZIC) 

~ 10 sec/site typical (ZSI) ~ 30 sec/site typical (ZDot)

Pixel (XY)  Res: 0.09 μm with 0.5x coupler and 100xMin Z‐Step: 2 nm with available piezo stage

13 nm with standard Z driveZ‐Resolution: 0.1Å with ZSI option

0

5

13 nm with standard ZDot™Repeatability3:   ±15 nm (1σ) 3 (or ±1%)

System FeaturesCamera options:  640x480, 1024x768, 1280x960, 

1920x1440Magnification:  35,000x combined optical & digitalIllumination:  Dual Ultra‐Bright White LEDsMotorized Stage: Up to 200mm x 200mm XY travel

Objective specifications are nominal values for reference only.  Actual features included will depend on final configuration. 

Specifications subject to change without notice.‐‐‐‐.

Motorized Stage:  Up to 200mm x 200mm XY travelZ Travel:  40mm Standard (100mm optional)