yelo laser reliability burn in and lifetest for photonic devices
DESCRIPTION
Yelo Test Systems for Laser Reliability, Accelerated Lifetime tests, Lifetest, Burn-in and early failure detection and removalTRANSCRIPT
Yelo Laser Reliability Burn in and Lifetest for Active Photonic Device
Company History
1983 Yelo founded
2001 Acquired by Mindready Solutions
2008 Mindready acquired by Averna
2010 Management Buyout Out and rebrand Yelo
Clients
Yelo’s clients include Telecom Network Equipment Original Equipment Manufacturers, Photonic and opto-electronic device manufacturers, startups and contract manufacturers
Europe: UK, Germany, Sweden, Finland, France
North America: Canada, East and West coast USA
China: Shenzen
Over 110 systems installed with 34 clients globally
Laser Reliability,Burn-in and Lifetest Expertise
Over 100 man years of photonics experience
Ex Nortel / Bookham / Oclaro engineers
Photonic device manufacturing and QA expertise
Photonic device Qualification/Burn-in/Lifetest Equipment
Thermal Management
Device reliability-Telcordia standards
Device packaging (40Gb / 100 Gb)
Testing and fixturing (40Gb / 100 Gb)
Low Power Module Design
Low Power Module Designs
Probed Devices• VCSEL Array• Laser Array 10 channel• APD
Chip-on Carrier• Photonics Integrated Circuit (Lasers, Amplifiers, Modulator, Photodiode,
Thermistor)• SOA (Semi conductor Optical Amplifier)• Lasers• Laser Arrays• APD (150V)• PIN Photodiodes
Packaged• VCSEL
TO Headers• Mini DIL• Butterfly
Why Yelo?
Device fixturing research and development and expertise including
Tight temperature control of devicesSufficient downward pressure on devices to ensure good thermal contactAccurate electrical probing to drive and measure devicesOptical analysis
Photonics Domain expertiseWe have designed, manufactured and tested devices and understand the constraints
Time to marketModular approach using standard laser drive cards and standard flexible software enables new systems to be delivered faster than building your own
Laser Reliability, Burn-in, Lifetest & Qualification System
Lifetest and burn-in at different temperatures
Test different products and packages in different modules
Suitable for contract manufacturers, startups and mid volume
One control rack can test up to up to 2,048 devices per rack
Can be expanded by the addition of up to 2 slave racks as volume production increases
Independent Temperature Controlled Modules
A drawer can hold up to 8 modules
A module can hold up to 16 devices
This provides for up to 128 devices per drawer
Each module can operate at different temperature and testing cycle
Customised Module Design
Each module can hold up to 16 devices
The number of devices per module depends upon the complexity of the device
Devices held at temperature on hot plate
Light detectors can be added and cooled if required
High Power System
One control rack can test up to up to 480 devices per rack
Can be expanded by the addition of up to 2 slave racks as volume production increases
High Volume Drawer Based System
This system uses the same rack and laser drive cards.
Each rack contains 4 drawers with no modules.
Each drawer contains a customised heating plate allowing up to 256 devices to be loaded.
Suitable for packaged devices such as TO-CAN.
High Power Module
Uses a liquid-cooled baseplate with a peltier optionOff-the-shelf fixturing includes high accuracy pogo pins for chip-on-carrier devices, clamps for C-mount and W-mount devices, connectors for packaged devices and TO headersLiquid-cooled Integrating spheres dissipate high optical powers
Automation Software
Over 2 man years of software engineering developmentSophisticated temperature control algorithmsClear, flexible user interface displaying the status of units under test including module temperatureProgrammable alarm conditions and notification via emailData recording to any ODBC compliant databaseGraphical displays of device performance during testing including degradationLaser control constant current or constant power modesLIV sweep analysis & spot measurementsBurn-in at one temperature & characterize at another, with programmable cycle timesAll module parameters may be set independently (drive current, temperature, burn-in time etc.)
Main User Interface
Diagnostics & Configuration
Cost Effective Benchtop System
Suitable for laboratory or for low volume use
2 Modules – not expandable
Up to 32 devices
High Power Module Design
High Power Module Designs
Chip on Carrier• C Mount – 20 Amp • BA Mount – 40 Amp
Packaged• Butterfly – 20 Amp
Probed Photonic Integrated Circuit / Laser Bar Test & Qualification
Burn-in and lifetest of a 12 chip VCSEL array using a probe card.
Burn In and Life Test – Benefits
Easy reconfiguration for new products (wide range of modules)
Flexible use – Burn-in, Lifetest and Qualification at the same time
Automatic in-situ measurement (reduces handling time)
NIST standard measurement precision for every device
Ease of calibration / maintenance
Each drawer is independent of others (virtually no single point of failure)
Individual independent temperature zones in groups of 16
Price effective at low volume (suitable for R+D facilities)