what is going on here? standards for glass analysis satellite lines? beta lines?
TRANSCRIPT
What Is Going On Here?
230 240 250 260 270
Line N um bers
21800
21900
22000
22100cp
s p
er
30
nA
S i Ka O n-Peak C ountsSpec 2 , TAP15 keV , 30 nA , 20 sec
Q uartz S iO 2 G lass Q uartz SiO 2 G lass
Standards for Glass Analysis Satellite Lines? Beta Lines?
26000 28000 30000
sin theta * 10^5
1 0
1 0 0
1 0 0 0
1 0 0 0 0
1 0 0 0 0 0
cps
pe
r 3
0 n
A
S iO 2 G lassS iO 2 Q uartz
S i Ka Spec 2 TAP15 keV , 20 nA , 5 um beamVariab le step
80500 81000 81500 82000 82500 83000
sin theta * 10^5
1
10
100
1000
10000
cps
per
30 n
A
S iO 2 G lassS iO 2 Q uartz
S i Ka Spec 3 PET15 keV, 20 nA , 5 um beamVariable step
74000 76000 78000 80000 82000 84000
sin theta * 10^5
1
10
100
1000
10000
cps
pe
r 3
0 n
A
S iO 2 G lassS iO 2 Q uartz
S i Ka-K b S pec 4 P ET15 keV , 30 nA , Focussed beamVariab le step, 20 sec
Peak Shifts?Subtle peak shift effects demonstrated for different silicate minerals
Fournelle, 2004, 2005
Between glass and crystal SiO2?
27560 27600 27640 27680 27720 27760sin theta * 10^5
8000
12000
16000
20000
24000
cps
pe
r 3
0 n
A
SiO 2 G lass-1S iO 2 Q uartz-1S iO 2 G lass-2S iO 2 Q uartz-2S iO 2 G lass-3S iO 2 Q uartz-3S iO 2 G lass-4S iO 2 Q uartz-4
Si Ka-FW H M , Spec 2 TAP15 keV , 30 nA, 5 um beam30 sec per point
81160 81180 81200 81220 81240 81260 81280sin theta * 10^5
1200
1600
2000
2400
2800
cps
pe
r 3
0 n
A
SiO 2 G lass-1S iO 2 Q uartz-1S iO 2 G lass-2S iO 2 Q uartz-2S iO 2 G lass-3S iO 2 Q uartz-3S iO 2 G lass-4S iO 2 Q uartz-4
Si Ka-FW H M , Spec 4 PET15 keV , 30 nA, 5 um beam50 sec per point
Sample Damage?SiO2 Glass
SiO2 Quartz
Beam Damage? Si Ka
15 keV, 30 nA, focussed
0 20 40 60 80
Sequence N um ber (~ 30 m inutes)
198000
199000
200000
201000
202000
203000
Inte
nsity
Si Ka, Spec 2 TAPSiO 2 Q uartzS iO 2 G lass
Beam Damage? O Ka
0 20 40 60 80
Sequence N um ber (~ 30 m inutes)
56000
60000
64000
68000
72000
76000
Inte
nsi
ty O Ka, Spec 2 TAPSiO 2 Q uartzS iO 2 G lass
0 20 40 60 80E la sp e d Tim e (se c)
5600
5800
6000
6200
6400
6600
6800
Inte
nsi
ty (
cps)
S iO2 Qu a rtz- O K aLine 5
L ine 6
L ine 7
L ine 8
Or Sub Surface Charging?
For more information see:Cazaux, 2004
SiO2 Glass (80 sec elapsed time)ELEM: Si Si Si OAVER: 46.257 46.325 46.106 48.915SDEV: .120 .304 .299 .269
VOL%: .348 .426 .478 1.786
DEV%: .0 .1 .1 .1
SiO2 Quartz (80 sec elapsed time)ELEM: Si Si Si O AVER: 46.672 46.614 46.459 50.260SDEV: .145 .383 .327 .371
VOL%: .346 .038 .290 -8.022DEV%: .0 .1 .1 .2
0 20 40 60 80
Sequence N um ber (~ 30 m inutes)
2 3
2 3 . 5
2 4
2 4 . 5
2 5
2 5 . 5
2 6
nA
Absorbed Current, Spec 2 TAPSiO 2 G lassS iO 2 Q uartz